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PD - 95707E

IRFB4410PbF
IRFS4410PbF
IRFSL4410PbF
Applications
HEXFET® Power MOSFET
l High Efficiency Synchronous Rectification in SMPS
l Uninterruptible Power Supply
l High Speed Power Switching
D
VDSS 100V
l Hard Switched and High Frequency Circuits RDS(on) typ. 8.0m:
G max. 10m:
S ID 88A
Benefits
l Improved Gate, Avalanche and Dynamic dV/dt
Ruggedness
l Fully Characterized Capacitance and Avalanche
SOA
l Enhanced body diode dV/dt and dI/dt Capability
S S S
l Lead-Free D D D
G G G
TO-220AB D2Pak TO-262
IRFB4410PbF IRFS4410PbF IRFSL4410PbF

Absolute Maximum Ratings


Symbol Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 88cl A
ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 63cl
IDM Pulsed Drain Current d 380
PD @TC = 25°C Maximum Power Dissipation 200 l W
Linear Derating Factor 1.3 l W/°C
VGS Gate-to-Source Voltage ± 20 V
dv/dt Peak Diode Recovery f 19 V/ns
TJ Operating Junction and -55 to + 175 °C
TSTG Storage Temperature Range
Soldering Temperature, for 10 seconds 300
(1.6mm from case)
Mounting torque, 6-32 or M3 screw x
10lb in (1.1N m) x
Avalanche Characteristics
EAS (Thermally limited) Single Pulse Avalanche Energy e 220 mJ
IAR Avalanche Current c See Fig. 14, 15, 16a, 16b A
EAR Repetitive Avalanche Energy g mJ

Thermal Resistance
Symbol Parameter Typ. Max. Units
RθJC Junction-to-Case k ––– 0.61 l
RθCS Case-to-Sink, Flat Greased Surface , TO-220 0.50 ––– °C/W
RθJA Junction-to-Ambient, TO-220 k ––– 62
RθJA Junction-to-Ambient (PCB Mount) , D2Pak jk ––– 40

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05/02/07
IRFB/S/SL4410PbF
Static @ TJ = 25°C (unless otherwise specified)
Symbol Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage 100 ––– ––– V VGS = 0V, ID = 250µA
∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient ––– 0.094 ––– V/°C Reference to 25°C, ID = 1mA d
RDS(on) Static Drain-to-Source On-Resistance ––– 8.0 10 mΩ VGS = 10V, ID = 58A g
VGS(th) Gate Threshold Voltage 2.0 ––– 4.0 V VDS = VGS, ID = 150µA
IDSS Drain-to-Source Leakage Current ––– ––– 20 µA VDS = 100V, VGS = 0V
––– ––– 250 VDS = 100V, VGS = 0V, TJ = 125°C
IGSS Gate-to-Source Forward Leakage ––– ––– 200 nA VGS = 20V
Gate-to-Source Reverse Leakage ––– ––– -200 VGS = -20V
RG Gate Input Resistance ––– 1.5 ––– Ω f = 1MHz, open drain
Dynamic @ TJ = 25°C (unless otherwise specified)
Symbol Parameter Min. Typ. Max. Units Conditions
gfs Forward Transconductance 120 ––– ––– S VDS = 50V, ID = 58A
Qg Total Gate Charge ––– 120 180 nC ID = 58A
Qgs Gate-to-Source Charge ––– 31 ––– VDS = 80V
Qgd Gate-to-Drain ("Miller") Charge ––– 44 ––– VGS = 10V g
td(on) Turn-On Delay Time ––– 24 ––– ns VDD = 65V
tr Rise Time ––– 80 ––– ID = 58A
td(off) Turn-Off Delay Time ––– 55 ––– RG = 4.1Ω
tf Fall Time ––– 50 ––– VGS = 10V g
Ciss Input Capacitance ––– 5150 ––– pF VGS = 0V
Coss Output Capacitance ––– 360 ––– VDS = 50V
Crss Reverse Transfer Capacitance ––– 190 ––– ƒ = 1.0MHz
Coss eff. (ER) Effective Output Capacitance (Energy Related) ––– 420 ––– VGS = 0V, VDS = 0V to 80V i, See Fig.11
Coss eff. (TR) Effective Output Capacitance (Time Related) h ––– 500 ––– VGS = 0V, VDS = 0V to 80V h, See Fig. 5
Diode Characteristics
Symbol Parameter Min. Typ. Max. Units Conditions
IS Continuous Source Current ––– ––– 88 c A MOSFET symbol D

(Body Diode) showing the


ISM Pulsed Source Current ––– ––– 380 A integral reverse G

(Body Diode) d p-n junction diode. S

VSD Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 58A, VGS = 0V g
trr Reverse Recovery Time ––– 38 56 ns TJ = 25°C VR = 85V,
––– 51 77 TJ = 125°C IF = 58A
Qrr Reverse Recovery Charge ––– 61 92 nC TJ = 25°C di/dt = 100A/µs g
––– 110 170 TJ = 125°C
IRRM Reverse Recovery Current ––– 2.8 ––– A TJ = 25°C
ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)

Notes:
 Calculated continuous current based on maximum allowable junction † Coss eff. (TR) is a fixed capacitance that gives the same charging time
temperature. Package limitation current is 75A. as Coss while VDS is rising from 0 to 80% VDSS .
‚ Repetitive rating; pulse width limited by max. junction ‡ Coss eff. (ER) is a fixed capacitance that gives the same energy as
temperature. Coss while VDS is rising from 0 to 80% VDSS .
ƒ Limited by TJmax, starting TJ = 25°C, L = 0.14mH ˆ When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended
RG = 25Ω, IAS = 58A, VGS =10V. Part not recommended for use footprint and soldering techniques refer to application note #AN-994.
above this value. ‰ Rθ is measured at TJ approximately 90°C.
„ ISD ≤ 58A, di/dt ≤ 650A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C. Š RθJC (end of life) for D2Pak and TO-262 = 0.75°C/W. Note: This is the maximum
… Pulse width ≤ 400µs; duty cycle ≤ 2%. measured value after 1000 temperature cycles from -55 to 150°C and is
accounted for by the physical wearout of the die attach medium.

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IRFB/S/SL4410PbF
1000 1000
VGS VGS
TOP 15V TOP 15V
10V 10V
8.0V 8.0V
ID, Drain-to-Source Current (A)

ID, Drain-to-Source Current (A)


6.0V 6.0V
100 5.5V 5.5V
5.0V 5.0V
4.8V 100 4.8V
BOTTOM 4.5V BOTTOM 4.5V

10

4.5V
10
1
4.5V
≤60µs PULSE WIDTH ≤60µs PULSE WIDTH
Tj = 25°C Tj = 175°C
0.1 1
0.1 1 10 100 1000 0.1 1 10 100 1000
V DS, Drain-to-Source Voltage (V) V DS, Drain-to-Source Voltage (V)

Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics


1000 3.0
ID = 58A

RDS(on) , Drain-to-Source On Resistance


VGS = 10V
ID, Drain-to-Source Current (Α)

2.5
100

T J = 175°C
2.0
(Normalized)

10

1.5
T J = 25°C

1
1.0
VDS = 25V
≤60µs PULSE WIDTH
0.1 0.5
2 3 4 5 6 7 8 9 10 -60 -40 -20 0 20 40 60 80 100 120 140 160 180

T J , Junction Temperature (°C)


VGS, Gate-to-Source Voltage (V)

Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance vs. Temperature

100000 12.0
VGS = 0V, f = 1 MHZ
ID= 58A
C iss = C gs + C gd, C ds SHORTED
C rss = C gd 10.0 VDS= 80V
VGS, Gate-to-Source Voltage (V)

C oss = C ds + C gd VDS= 50V


VDS= 20V
C, Capacitance(pF)

10000 8.0
Ciss

6.0

1000 Coss 4.0

Crss
2.0

100 0.0
1 10 100 0 20 40 60 80 100 120
VDS, Drain-to-Source Voltage (V) QG Total Gate Charge (nC)

Fig 5. Typical Capacitance vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage
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IRFB/S/SL4410PbF
1000 1000
OPERATION IN THIS AREA
LIMITED BY R DS(on)

ID, Drain-to-Source Current (A)


ISD, Reverse Drain Current (A)

100µsec

100 100 1msec


T J = 175°C

10msec
T J = 25°C
10 10 DC

Tc = 25°C
Tj = 175°C
VGS = 0V Single Pulse
1 1
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 0 1 10 100 1000
VSD, Source-to-Drain Voltage (V) VDS, Drain-to-Source Voltage (V)

Fig 7. Typical Source-Drain Diode Forward Voltage Fig 8. Maximum Safe Operating Area

V(BR)DSS , Drain-to-Source Breakdown Voltage (V)


100 130

Limited By Package
125

75
ID, Drain Current (A)

120

50 115

110

25
105

0 100
25 50 75 100 125 150 175 -60 -40 -20 0 20 40 60 80 100 120 140 160 180

T C , Case Temperature (°C) T J , Temperature ( °C )

Fig 9. Maximum Drain Current vs. Case Temperature Fig 10. Drain-to-Source Breakdown Voltage

2.0 900
EAS , Single Pulse Avalanche Energy (mJ)

ID
800
TOP 6.7A
700 9.7A
1.5
BOTTOM 58A
600
Energy (µJ)

500
1.0
400

300
0.5
200

100

0.0 0
0 20 40 60 80 100 120 25 50 75 100 125 150 175

VDS, Drain-to-Source Voltage (V) Starting T J , Junction Temperature (°C)

Fig 11. Typical COSS Stored Energy Fig 12. Maximum Avalanche Energy vs. DrainCurrent
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IRFB/S/SL4410PbF
1

Thermal Response ( Z thJC ) D = 0.50

0.1 0.20
0.10
0.05
R1 R2
0.02 R1 R2 Ri (°C/W) τi (sec)
0.01 τJ τC
0.01 τJ τ 0.2736 0.000376
τ1 τ2
τ1 τ2 0.3376 0.004143
Ci= τi/Ri
SINGLE PULSE Ci i/Ri
0.001 ( THERMAL RESPONSE )
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
0.0001
1E-006 1E-005 0.0001 0.001 0.01 0.1

t1 , Rectangular Pulse Duration (sec)

Fig 13. Maximum Effective Transient Thermal Impedance, Junction-to-Case


1000

Allowed avalanche Current vs avalanche


100 pulsewidth, tav, assuming ∆Tj = 150°C and
Tstart =25°C (Single Pulse)
Avalanche Current (A)

Duty Cycle = Single Pulse

0.01
10 0.05
0.10

1
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming ∆Τ j = 25°C and
Tstart = 150°C.

0.1
1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01

tav (sec)
Fig 14. Typical Avalanche Current vs.Pulsewidth
250 Notes on Repetitive Avalanche Curves , Figures 14, 15:
TOP Single Pulse (For further info, see AN-1005 at www.irf.com)
BOTTOM 1% Duty Cycle 1. Avalanche failures assumption:
ID = 58A Purely a thermal phenomenon and failure occurs at a temperature far in
EAR , Avalanche Energy (mJ)

200
excess of Tjmax. This is validated for every part type.
2. Safe operation in Avalanche is allowed as long as neither Tjmax nor Iav (max)
is exceeded.
150 3. Equation below based on circuit and waveforms shown in Figures 16a, 16b.
4. PD (ave) = Average power dissipation per single avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase
100 during avalanche).
6. Iav = Allowable avalanche current.
7. ∆T = Allowable rise in junction temperature, not to exceed Tjmax (assumed as
50 25°C in Figure 14, 15).
tav = Average time in avalanche.
D = Duty cycle in avalanche = tav ·f
ZthJC(D, tav) = Transient thermal resistance, see Figures 13)
0
25 50 75 100 125 150 175
PD (ave) = 1/2 ( 1.3·BV·Iav) = DT/ ZthJC
Starting T J , Junction Temperature (°C) Iav = 2DT/ [1.3·BV·Zth]
EAS (AR) = PD (ave)·tav
Fig 15. Maximum Avalanche Energy vs. Temperature
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IRFB/S/SL4410PbF
5.0 20

4.5
VGS(th) Gate threshold Voltage (V)

4.0 15

3.5

IRRM (A)
3.0 10
ID = 150µA
2.5 ID = 250µA
ID = 1.0mA
2.0 IF = 19A
ID = 1.0A 5
VR = 85V
1.5 T = 25°C _____
J
T = 125°C ----------
J
1.0 0
-75 -50 -25 0 25 50 75 100 125 150 175 200
100 200 300 400 500 600 700 800 900 1000
T J , Temperature ( °C ) dif/dt (A/µs)

Fig 16. Threshold Voltage vs. Temperature Fig. 17 - Typical Recovery Current vs. dif/dt

20 400

350

15 300

250
IRRM (A)

Qrr (nC)

10 200

150

IF = 38A IF = 19A
5 100
V = 85V VR = 85V
R
T = 25°C _____ T = 25°C _____
J 50 J
TJ = 125°C ---------- T = 125°C ----------
J

0 0
100 200 300 400 500 600 700 800 900 1000 100 200 300 400 500 600 700 800 900 1000
dif/dt (A/µs) dif/dt (A/µs)

Fig. 18 - Typical Recovery Current vs. dif/dt Fig. 19 - Typical Stored Charge vs. dif/dt

400

350

300

250
Qrr (nC)

200

150
I = 38A
100 F
V = 85V
R
TJ = 25°C _____
50
TJ = 125°C ----------

0
100 200 300 400 500 600 700 800 900 1000
dif/dt (A/µs)

Fig. 20 - Typical Stored Charge vs. dif/dt


6 www.irf.com
IRFB/S/SL4410PbF
Driver Gate Drive
P.W.
D.U.T P.W.
Period D=
Period
+

ƒ VGS=10V*
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
- • Low Leakage Inductance D.U.T. ISD Waveform
Current Transformer
+
Reverse
‚ Recovery Body Diode Forward
-
„ + Current Current
- di/dt
D.U.T. VDS Waveform
Diode Recovery
 dv/dt
VDD

RG • dv/dt controlled by RG VDD Re-Applied


• Driver same type as D.U.T. + Voltage Body Diode Forward Drop
• I SD controlled by Duty Factor "D" - Inductor Current
Inductor Curent
• D.U.T. - Device Under Test

Ripple ≤ 5% ISD

* VGS = 5V for Logic Level Devices


Fig 20. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs

V(BR)DSS
15V
tp

L DRIVER
VDS

RG D.U.T +
V
- DD
IAS A
VGS
20V
tp 0.01Ω
I AS

Fig 21a. Unclamped Inductive Test Circuit Fig 21b. Unclamped Inductive Waveforms

LD
VDS VDS
90%
+
VDD -

D.U.T 10%
VGS VGS
Pulse Width < 1µs
Duty Factor < 0.1% td(on) tr td(off) tf

Fig 22a. Switching Time Test Circuit Fig 22b. Switching Time Waveforms
Id
Vds

Vgs

L
VCC
DUT Vgs(th)
0
1K

Qgs1 Qgs2 Qgd Qgodr

Fig 23a. Gate Charge Test Circuit Fig 23b. Gate Charge Waveform
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IRFB/S/SL4410PbF
TO-220AB Package Outline
Dimensions are shown in millimeters (inches)

TO-220AB Part Marking Information

(;$03/( 7+,6,6$1,5)
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TO-220AB packages are not recommended for Surface Mount Application.

8 www.irf.com
IRFB/S/SL4410PbF
TO-262 Package Outline
Dimensions are shown in millimeters (inches)

TO-262 Part Marking Information


(;$03/( 7+,6,6$1,5//
/27&2'( 3$57180%(5
,17(51$7,21$/
$66(0%/('21::
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3$57180%(5
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www.irf.com 9
IRFB/S/SL4410PbF
D2Pak (TO-263AB) Package Outline
Dimensions are shown in millimeters (inches)

D2Pak (TO-263AB) Part Marking Information


7+,6,6$1,5)6:,7+ 3$57180%(5
/27&2'( ,17(51$7,21$/
$66(0%/('21:: 5(&7,),(5 )6
,17+($66(0%/</,1(/ /2*2
'$7(&2'(
$66(0%/< <($5 
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3$57180%(5
,17(51$7,21$/
5(&7,),(5 )6
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352'8&7 237,21$/
$66(0%/< <($5 
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10 www.irf.com
IRFB/S/SL4410PbF

D2Pak (TO-263AB) Tape & Reel Information


TRR

1.60 (.063)
1.50 (.059)
1.60 (.063)
4.10 (.161) 1.50 (.059)
3.90 (.153) 0.368 (.0145)
0.342 (.0135)

FEED DIRECTION 1.85 (.073) 11.60 (.457)


1.65 (.065) 11.40 (.449) 24.30 (.957)
15.42 (.609)
23.90 (.941)
15.22 (.601)
TRL
1.75 (.069)
10.90 (.429) 1.25 (.049)
10.70 (.421) 4.72 (.136)
16.10 (.634) 4.52 (.178)
15.90 (.626)

FEED DIRECTION

13.50 (.532) 27.40 (1.079)


12.80 (.504) 23.90 (.941)

330.00 60.00 (2.362)


(14.173) MIN.
MAX.

30.40 (1.197)
NOTES : MAX.
1. COMFORMS TO EIA-418. 26.40 (1.039) 4
2. CONTROLLING DIMENSION: MILLIMETER. 24.40 (.961)
3. DIMENSION MEASURED @ HUB.
3
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.

Data and specifications subject to change without notice.


This product has been designed and qualified for the Industrial market.
Qualification Standards can be found on IR’s Web site.

IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.05/07
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Note: For the most current drawings please refer to the IR website at:
http://www.irf.com/package/
IMPORTANT NOTICE
The information given in this document shall in no For further information on the product, technology,
event be regarded as a guarantee of conditions or delivery terms and conditions and prices please
characteristics (“Beschaffenheitsgarantie”) . contact your nearest Infineon Technologies office
(www.infineon.com).
With respect to any examples, hints or any typical
values stated herein and/or any information
regarding the application of the product, Infineon WARNINGS
Technologies hereby disclaims any and all Due to technical requirements products may
warranties and liabilities of any kind, including contain dangerous substances. For information on
without limitation warranties of non-infringement the types in question please contact your nearest
of intellectual property rights of any third party. Infineon Technologies office.
In addition, any information given in this document Except as otherwise explicitly approved by Infineon
is subject to customer’s compliance with its Technologies in a written document signed by
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applicable legal requirements, norms and Technologies, Infineon Technologies’ products may
standards concerning customer’s products and any not be used in any applications where a failure of
use of the product of Infineon Technologies in the product or any consequences of the use thereof
customer’s applications. can reasonably be expected to result in personal
injury.
The data contained in this document is exclusively
intended for technically trained staff. It is the
responsibility of customer’s technical departments
to evaluate the suitability of the product for the
intended application and the completeness of the
product information given in this document with
respect to such application.

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