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Question Bank in Electrical Engineering by J.B. Gupta Book
Question Bank in Electrical Engineering by J.B. Gupta Book
inate arate Ce ee ee eres 3 Someone ss Mactan een Stabe ees lp aacmee 8 Samer Het ™ Ynphpttnecinose Sretieetpeemcan @ meocamne or (2) allofineabove, 27 Seip ne sen Smee get (0) ead crystals, (@) sodiumechioride, > intense nace +) overcharging at sow rato, o een 3 ae > eared Fs aces terion @ eee See 8 eee 1. Stee oy eisai (©) loweapacity, (@) alofdeabove, 31 Cetin 4) warping of ptates, ‘oencestve temperature, © allotthe above, ‘302. Shor cteuktng of cell may be caused by (buckling of pats, (6) breakdowa of one cemore separators. (©) exeestiveencomelstion of sedimeis athe botiomof the cal (2) ead particles forming circuits between poslive and negative plates. (©) my of be stove, 3903, Shortcrcuiting of cll ests in (@) reduced gatsing ducing cburging. (©) sbnorma! hightemperature. (©) low specific gravity ofthe electrolyte, (@) allot he above. Armee: 790: (0 281 6). 282) 283), 24 (0), 28S. 286, 2.) ABR, 289. (), 290 (6), 291. (6,292.0), 299. @), 294.6), 795 (0 286.(6), 297. (0), 298. (2), 259, (4), 300. (2h 38200) 303