NAME: Rakan Sadee Alofie

ID NO: M11902076
NAND, NOR and XOR Gate

EXPERIMENT
Understand the symbols and characteristics of various logic gates.

EQUIPMENT REQUIRED
KL-31001 Digital Logic Lab, KL-33001 Basic Gate Experiment Module.

PREPARATION

1. What is the Boolean expression for a NAND gate? X =A . B

2. What is the Boolean expression for a NOR gate? X =A + B

3. What is the Boolean expression for a XOR gate? X =( A . B ) +( A . B)

PROCEDURE

(a) NAND gate Characteristics Measurement (Module KL-33001 Block d)

1. Integrated Circuits (IC) U1a of Block d will be used in this section.

2. Connect inputs A1, A2 to Data Switch SW0 and SW1 TTL level and output F1 to
Logic Indicator L1. Follow the input sequences below and record the output F1.

INPUT OUTPUT
STATE A2 A1 F1
1 0 0 1
2 0 1 1
3 1 0 1
4 1 1 0
(b) NOR gate Characteristics Measurement (Module KL-33001 Block d)

1. Integrated Circuits (IC) U2a of Block d will be used in this section.

2. Connect inputs A3, A4 to Data Switch SW0 and SW1 TTL level and output F2 to
Logic Indicator L1. Follow the input sequences below and record the output F2.

INPUT OUTPUT
STATE A2 A1 F2
1 0 0 1
2 0 1 0
3 1 0 0
4 1 1 0
(c) XOR Gate Characteristics Measurement (Module KL-33001 Block d)

1. Integrated Circuit (IC) U4a of Block d will be used in this section.

2. Connect inputs C4, C5 to Data Switch SW0 and SW1 TTL level and output F9 to
Logic Indicator L1. Follow the input sequences below and record the output F9.

INPUT OUTPUT
STATE C5 C4 F9
1 0 0 0
2 0 1 1
3 1 0 1
4 1 1 0