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JASCO, Inc
Easton, MD
JASCO: Our Products
Seminar Overview
I. Sample considerations
II. Measurement parameter optimization
III. Data processing functions
What is Circular Dichroism?
▪ Difference in absorption of left and right circularly polarized light
LH ∆𝐴 = 𝐴𝐿 − 𝐴𝑅
RH
Why use CD?
1. Uniquely sensitive to asymmetry.
2. Information on molecular and electronic structure.
3. Experiments are relatively quick and easy to perform.
4. Non-destructive (can recover most samples).
5. Solution phase.
▪ Crystallation process could change molecular structure.
Beer’s Law
𝐴 =𝜀∙𝑙∙𝑐
e: molar absorptivity
l: pathlength
c: concentration
l
PMT PMT
I0 I
PMT
▪Difference in extent of scattering of left and right circularly polarized light by chiral sample
▪Can redshift and change magnitude of peaks
▪Reduce particulate size (~1/10 of incident light)
I0 I I0 I
Sample exhibiting
Isotropic sample
absorption flattening
1 mm rectangular
quartz cell Submicro cell
Demountable cell
10 mm rectangular
quartz cell
Microsampling Accessories
▪ Micro sampling Disc
▪ Optically inactive
▪ No sugars
50 mM
Phosphoric acid
Measurement
Parameter Optimization
Nitrogen Purge
1. Oxidation of mirrors → less reflectance → reduction in S/N
2. Avoid absorption of oxygen in far-UV
Intensity
Intensity
Wavelength Wavelength
Complete Monochromatic light Light from Monochromator
Bandwidth
▪ ACS Spectrum: ▪ Lysozyme Spectrum:
▪ Bands are far apart, separated by > 20 nm ▪ Bandwidth of 1 nm is more suitable
▪ Bandwidth of 2 nm is more than suitable
2 0 7
1 . 5
1st derivative
5
C D [ m d e g ]
C D [ m d e g ]
0
0
C D [ m d e g ]
- 2 0
- 1
- 5
1 7 5 2 0 0 2 2 0 2 4 0 2 5 0
W a v e l e n g t h [ n m ]
- 6
- 4 0 1 7 5 2 0 0 2 2 0 2 4 0 2 5 0
1 8 0 2 0 0 2 5 0 3 0 0 3 5 0
W a v e l e n g t h [ n m ]
W a v e l e n g t h [ n m ]
Scanning Modes
▪ Continuous Scan
▪ Measurement time does not depend on step Continuous Scan
resolution
Step Scan
▪ Suitable for obtaining data with better S/N in Difference between the two obtained spectra
short time
▪ Step Scan
▪ Stops wavelength based on data pitch
▪ Not used to improve S/N or high speed scan
▪Auto-step Scan
▪ Performs step scan while automatically
adjusting between upper and lower D.I.T. limits
D.I.T. and Scanning Speed
▪ D.I.T.: Time which the data obtained is integrated over.
▪ S/N ~ DIT1/2
▪ Scanning Speed: How quickly the monochromator moves to obtain data points.
Response-wavelength-width: 1.67 nm
× × × × × × × × × × × × × × × × × × × × ×
FWHM= 28.1nm
28.1/3 = 9.4 nm
D.I.T. and Scanning Speed
Determining the D.I.T. and Scanning Speed
a-helical b-sheet
Accumulations
𝑆ൗ = 𝐷. 𝐼. 𝑇. ∙ 𝑁
𝑁
N = number of accumulations
1 accumulation
3 accumulations
*data offset
CD Scale
To Summarize…..
▪ Increase the CD signal
1. Increase the concentration
2. Increase the pathlength
▪ Decrease the HTV/absorption
1. Decrease the buffer concentration (remove salts, imidazole, etc)
2. Decrease the sample concentration
3. Decrease the cell pathlength
4. Open the bandwidth up
▪ Increase the S/N
1. Increase the DIT (possibly have to decrease the scanning speed)
2. Increase the number of accumulations
3. Open the bandwidth up
▪ Shorten measurement time
1. Increase scanning speed (possibly have to decrease DIT)
2. Reduce number of accumulations if more than 1
Troubleshooting
▪HTV at 1000 V → something blocking the detector
▪ Is the spacer upside down?
▪HTV at 0 V
▪ Shutter is closed
▪ Sample compartment lid is open
Data Processing Functions
Baseline and Sample Measurement
Baseline
measurement
Solvent
Sample
measurement
Sample
Subtraction
CD Units
∆𝐴 𝜃
∆𝜀 = 𝜀𝐿 − 𝜀𝑅 = =
𝑐 ∙ 𝑙 𝑐 ∙ 𝑙 ∙ 3298 ΔA: Delta OD/CD Absorbance
θ: ellipticity (mdeg)
100 ∙ 𝜃 c: molar concentration
𝜃 = = 3298 ∙ ∆𝜀 l: pathlength (cm)
𝑐∙𝑙
[θ]: molar ellipticity
𝜃 𝑀𝑅 = 𝜃 ∙ 𝑐 ∙ 𝑙ൗ𝑅
Mean Residue Molar Ellipticity
File Converter
JASCO Educational Resources
Upcoming Webinars:
• FTIR Microscopy
• Raman Microscopy and Imaging
• SFC Theory and Applications
NEXT WEBINAR WILL BE ON
E-books and Tips and Tricks Posters FTIR Theory, Instrumentation, and
• Raman Techniques
• Fluorescence
• FTIR DR. JAMES BURGESS
TUESDAY MAY 5TH AT 2:00 PM EDT
• CD
KnowledgeBase
Thank you for attending our CD
Webinar Part 2!
ANY QUESTIONS?