Data Sheet Probe FS40 family

Probe model FS40 FS40LF FS40HF

Part no.* 605-209 605-211 605-210
Applications The probes measure the specific electrical conductivity of non-ferrous metals in accordance with DIN
EN 2004-1 and ASTM E 1004. Because of the integrated temperature sensor all probes are suitable
for temperature corrected measurements with automatic display of the conductivity value normalized to
20 °C. All probes work with different frequencies and therefore are able to measure up to various mate-
rial depths. The used measuring method allows contact-free measurements and measurements under
non-conductive top coatings as lacquer coatings or plastic covers.
Examples Probe FS40, standard version Probe FS40LF optimized for: Probe FS40HF optimized for:
1 •Material sorting •Testing the authenticity of coin •Near-surface measurements
Such applications are based
solely on specific empirical values •Inspection for heat damage and alloys and small precious - Measurements of thin sheets
material fatigue1 bullions1 - Conclusion about the level of
•Conclusion about the hardness wear for thin coatings1
and strength of heat treated
materials1
•Determination of metal purity1
•Criterion for the quality of
alloys1

Probe design Axial single tip probe with fixed measuring system
Applications Determination the electrical conductivity of non-ferrous metals (NF)
Measurement range 0.5 ... 108 %IACS
Probe frequency 60, 120, 240, 480 kHz 15, 30, 60, 120 kHz 1000, 2000 kHz
Trueness
based on factory calibration 1 ... 100 %IACS: ≤ 1 % of nominal value
standards of the Helmut Fischer
GmbH with +20 °C material tem-
perature

Repeatability precision
based on factory calibration
standards of the Helmut Fischer
GmbH, 5 single readings per
standard, standard with +20 °C
material temperature
Influences
The following values are valid for a sufficient material thickness which depends on the used probe frequency.
Material thickness Th
Th
Beispiele
Depending on probe frequency Depending on probe frequency Depending on probe frequency
460 kHz: ≤ 0,10 %IACS 15, 30, 60 kHz: ≤ 0.1 %IACS 1000 kHz: ≤ 0,35 %IACS
120 kHz: ≤ 0,15 %IACS 120 kHz: ≤ 0,15 %IACS 2000 kHz: ≤ 1 %IACS
240 kHz: ≤ 0,20 %IACS
480 kHz: ≤ 0,35 %IACS
Depending on material and used probe frequency
No measurement error as of Th ≥ Thmin
Depending on the used probe frequency the minimal material thickness Thmin can be computed accord-
ing to the following equation:
656.5 i f = Probe frequency in Hz
Th min = 3  ---------------- mm  = Electrical conductivity of the material in %IACS
f 
For probe frequency 120 kHz For probe frequency 15 kHz For probe frequency 1000 kHz
0,57 mm for 100 %IACS (Cu) 1,61 mm for 100 %IACS (Cu) 0,20 mm for 100 %IACS (Cu)
0,79 mm for 51.7 %IACS (Al) 2,24 mm for 51.7 %IACS (Al) 0,27 mm for 51.7 %IACS (Al)
4,34 mm for 1.72 %IACS 12,3 mm for 1.72 %IACS 1,50 mm for1.72 %IACS

Coating Thickness Material Analysis Microhardness Material Testing

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Data Sheet Probe FS40 family

Probe model FS40 FS40LF FS40HF

Influences Depending on material and used probe frequency
The following values are valid for a sufficient material thickness which depends on the used probe frequency.
Edge distance (R), specification of the center of the probe diameter
Measuring spot For all probe frequencies
in the center of No measurement error as of R ≥ 7 mm
the circular sur-
face Probe needs a minimum of R = 7 mm

Edge distance (X), specification of the center of the probe diameter

Measuring For all probe frequencies
spot No measurement error as of X ≥ 7 mm

Curvature (R), measurement with reference to master calibration on flat surface

Measuring
spot
Measurement with measurement
prism (grip ring 2) from the scope No error as of R ≥ 50 mm
of supply
Distance compensation
(Measurement through a lacquer
or plastic coating)
Admissible ambient temper- -10 °C ... +40 °C
ature at operation
Surface temperature
Humidity protection
Probe tip material
Probe tip replaceable
Measuring method
Scope of supply
Works with instruments
Dimensions
For 60, 120, 240, 480 kHz For 15 kHz For 1000, 2000 kHz
Compensation of curvature for No error as of R ≥ 48 mm Error ≥ 10 % for R < 12,5 mm
R = 3 ... 50 mm by entering the Error ≥ 10 % for R  10.3 mm
diameter of curvature into the
For 30 kHz:
instrument
No error as of R ≥ 45 mm
Error ≥ 10 % for R  9.5 mm
For 60 kHz and 120 kHz:
Compensation of curvature for
R = 3 ... 50 mm by entering the
diameter of curvature into the
instrument
No error as of R ≥ 50 mm
Probe needs a minimum of R = 1 mm (Measurement with measurement prism (grip ring 2) from the scope of supply)
Thickness of an air gab, plastic foil or lacquer coating
0 ... 500 μm 0 ... 500 μm
Max. error: 1 % of reading Max. error: 2 % of reading
max. +40 °C
No
Plastic
No
Phase sensitive eddy current method
Probe, measurement prism (grip ring 2), Cu standard approx. 100 %IACS
SIGMASCOPE® SMP350
Ø 18 mm Ø 35 mm

Ø 14 mm

Cable length: 1.5 m / 59.06 ",

5 mm other cable lengths on request*
121 mm

* FS40, FS40LF and FS40HF probes with special cable lengths have own part no. and probe FE02.2/FE01 doc03/15
model names. This data sheet is also valid for this probes.

Coating Thickness Material Analysis Microhardness Material Testing

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