Professional Documents
Culture Documents
TESCAN Wide Field Mode PF v02 Final
TESCAN Wide Field Mode PF v02 Final
5 mm 10 mm
c Wide-field image of a graphics card captured c Overview of the entire sample carousel captured
at analytical working distance and in Wide Field Optics™ mode on TESCAN MIRA
tilted (TESCAN VEGA). at maximum working distance.
Key benefits:
Ĭ Begin observation in the live SEM window at Ĭ Interpret images and analysis acquired at high
2× magnification for a detailed undistorted magnifications in real-world context by referring
overview, then zoom in using TESCAN´s to specific positions displayed in the large overview
continuous magnification Wide Field Mode to image of the samples acquired in Wide Field mode.
quickly arrive at the precise feature of interest.
Ĭ Acquire elemental EDS navigational data
Ĭ Tilt, move and rotate your samples while observing by combining Wide Field mode with TESCAN
them at their actual scale by using Wide Field Mode Essence™ EDS mapping to use the wide-
at fast SEM scanning speed to achieve the desired field-acquired EDS map for navigation.
image from the correct location and viewing angle.
Ĭ Navigate according to phases revealed
Ĭ Navigate accurately on tilted analytical samples by electron contrast or by color and/
by initiating the live SEM overview when using or reflection captured with the optional optical
special stages, devices and holders, such as those navigation and correlation camera (ONCam™)
for EBSD, with Wide Field Mode supporting scanning simultaneously at low magnifications using
geometry corrections, for example, tilt correction. the wide field electron image overlaid with
the optical image in the live SEM window.
Ĭ Supplement your results obtained at high
magnification with a contextual overview
image captured in Wide Field mode.
TESCAN ORSAY HOLDING reserves the right to change the document without notice. 2021.05.26 www.tescan.com