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Section & group no.: ________________ Roll No.

:________________

EE216:Electronic Devices & Circuits

Experiment 7
Objectives

• To compare the stability of different BJT biasing configurations

Components required

2 x 2N3904 BJTs, standard resistors nearest to the calculated values

NOTES

• Always measure the currents by measuring the voltage drop across the resistors
• Keep all connections as short as possible.
• Before applying DC power supplies to the circuit make sure that they are all set to
zero volts.
• Switch off the power supplies before making any change in the circuit.
• Always measure a resistor “out of circuit”
• Use a pencil to draw all the graphs.

BJT parameters like β and IS vary due to temperature or device replacement. This variation in β
and IS causes the operating point of the transistor (VCE, IC) to change. In this experiment, we will
compare the different BJT biasing configurations on the basis of the operating point stability
against β and IS variations. We will change the β and IS with the help of device replacement.

Figure 1-5 show the five BJT biasing configurations that you have designed and connected in the
prelab.

VCC

RC
RB

Figure 1 (Fixed bias)

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VCC

RC

RB

RE

Figure 2 (Emitter Feedback Bias)

VCC

RC

RB

Figure 3 (Collector Feedback bias)

VCC

RC

RB

RE

Figure 4 (Collector-Emitter Feedback bias)

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VCC

RC
R1

R2 RE

Figure 5 (Voltage Divider bias)

Repeat the following steps for the entire five configurations, noting down the measurements in
Table 1. Use the same two BJTs for all the five configurations. Show your measurements to
the lab instructor after every step.

1- Connect the biasing configuration using the resistor values designed in the prelab.

2- Apply VCC = 15 V.

3- Using DMM, measure VCE and IC. IC can be measured by measuring the voltage drop
across RC and dividing this drop by the value of RC. Note down the measurements in VCE1
and IC1 column in Table 1.

4- Now replace the transistor by inserting the second transistor in the biasing circuit.

5- Repeat step 3 and note down the measurements in VCE2 and IC2 column in Table 1.

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∆VCE
VCE IC VCE1 IC1 VCE2 IC2 ∆IC =
Biasing =|VCE1-
(DESIGN) (DESIGN) (MEAS.) (MEAS.) (MEAS.) (MEAS.) |IC1-IC2|
Circuit VCE2|
(V) (mA) (V) (mA) (V) (mA) (mA)
(V)

Fixed bias
(Figure1)

Emitter
Feedback
bias
(Figure2)
Collector
feedback
bias
(Figure3)
Collector-
Emitter
feedback
bias
(Figure 4)
Voltage
Divider bias
(Figure 5)

Table 1

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