Scientific / Metrology Instruments
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JEM-14.00Plus
JEM-1400Plus is a high resolution 120 kV transmission electron
microscope for a wide range of applications from biology to material
science. It provides high resolution imaging and high sensitivity
- elemental analysis while maintaining proven ease of operation,
Solutions for Innovation
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‘Sample: Au single crystal
Accelerating voltage: 120 kV
‘The new optic system achieves a TEM resolution of 0.14 nm at an
accelerating voltage of 120 kV. The microscope provides high
contrast, seamless imaging at all magnification levels from wide
areas of view to TEM lattice images, supporting a wide range of
applications. The simple, multi functional operating environment
helps any TEM novice acquire high resolution images with ease.
‘Sample : Single layer carbon nanotube Sample : Silicon singe erytal (110)
x _—_ | Accelerating votage : 120 kV Accelerating voltage : 120 kVJEM-1400Plus
Electron microscope
TEM/EDS system (optional)
‘The new high resolution objective lens, designed to enhance the sensitivity level of X-ray analysis, speeds up the
analytical process and supports micro analysis of extremely small areas,
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EDS maps
Sample: ORAM
Pixel: 2563258
Accelorting voltage: 120 kv
High resolution pole piece - Specifications
Ra a OT ST
Lattice image Resolution 014m
STEM Bright field image (edge to edge) 1.5mm
Accelerating voltage (20*) 40, 60, 80, 100, 120 kV
Magnification MAG mode x300~1,500,000 x10,000~2,000,000
LOW MAG mode x10~1,000 x120~4,000
Cameralength SA Diff 10~250 cm
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