IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, VOL. 52, NO.
4, AUGUST 2005
Development of Real-Time Vision-Based
Fabric Inspection System
Che-Seung Cho, Byeong-Mook Chung, Member, IEEE, and Moo-Jin Park
Abstract—Quality inspection of textile fabric products is an im-
portant problem for fabric manufacturers. This paper presents an
automatic vision-based system for the quality control of web tex-
tile fabrics. Typical web material is 1–3 m wide and is driven with
speeds ranging from 20 to 200 m/min. At present, the quality in-
spection process is manually performed by experts. However, they
cannot detect more than 60% of the overall defects for the fabric
if it is moving faster than 30 m/min. To increase the quality and
homogeneity of fabrics, an automated visual inspection system is
needed for better productivity. Currently, the existing inspection
systems are too expensive for small companies. In this paper, a
PC-based real-time inspection system is proposed with benefits of
low cost and high detection rate. The proposed algorithm showed
good results for several types of fabric defects.
Index Terms—Automated inspection, fabric defects, textile
fabric inspection, vision-based system.
I. INTRODUCTION
R ECENTLY, optical devices are being incorporated into
mechatronic systems, and many machine-vision-related
technologies have contributed to integration of optical tech-
nology with mechatronics in order to have engineering systems
equipped with intelligence. These optomechatronic technolo-
gies have continued to play a leading role in the development
of intelligent systems for solving real-world problems using
machine vision [1], [2]. Applying machine vision techniques
in industry has received a great deal of attention, and many
systems for a variety of applications have been successfully
implemented in the last two decades. Most of the efforts in
vision research were devoted to making individual modules
more efficient in performing a specific task. The development
of a flexible, efficient, reliable, and integrated real-time vi-
sion system for industrial applications is an essential issue in
current and future research. The inspection of fabric quality
is also an important area in the textile industry. Like other
inspection processes, it has depended on workers’ experience
until now. However, the high cost of human visual inspection
has led to the development of online vision-based integrated
systems capable of performing inspection tasks [3]–[5]. The
implementation of an automated visual inspection system for
Manuscript received November 18, 2003; revised December 8, 2004. Abstract
published on the Internet April 28, 2005. This work was supported by the Brain
Korea 21 Project.
C.-S. Cho is with the Laboratory of Artificial Intelligent Control, Yeungnam
University, Gyongsan 712-749, Korea (e-mail: okrobo@yumail.ac.kr).
B.-M. Chung is with the Department of Mechanical Engineering, Yeungnam
University, Gyongsan 712-749, Korea (e-mail: bmchung@yu.ac.kr).
M.-J. Park is with Textec Company, Ltd., Daegu 704-320, Korea (e-mail: mj-
park@yumail.ac). kr.
Digital Object Identifier 10.1109/TIE.2005.851648
0278-0046/$20.00 © 2005 IEEE
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1073
fabric defects is critically important in the textile industry. In
particular, if there is a defect, it reduces the price of the fabric
by 45%–65%. To increase the overall quality, homogeneity of
fabric, and reliability, an automated visual inspection system is
needed for better productivity. A typical web material is 1–3 m
wide and is driven with speeds ranging from 20 to 200 m/min.
Even in the best cases, experts can detect no more than 60%
of the real defects, and they cannot deal with fabric wider than
2 m and moving faster than 30 m/min. Many attempts have
been made to solve these problems. For example, Cohen et
al. [6] used Markov Random Field (MRF) models for defect
inspection of fabric surfaces. Chen and Jain [7] used a structural
approach to detect defects in textured images. Dewaele et al.
[8] used signal processing methods to detect point defects and
line defects in texture images. Atalay [9] has implemented
an MRF-based method on a TMS320C40 parallel-processing
system for real-time defect inspection of fabrics. The majority
of automated inspection systems currently available in the
market are offline. Typical of these is the I-TEX inspection
system available from Elbit Vision System [10]. Also, Dorrity
[11] has implemented the charge-coupled device (CCD) camera
mounted on a weaving machine for online fabric defect detec-
tion. Running defects were detected by Fuzzy Wavelet Analysis
( FWA) and would alert the operator to correct mistakes. Kumar
[12] used the imaginary part of the Gabor function (IGF) for
the detection of the fabric defect.
The automatic visual inspection consists of a three-step
process—image acquisition, processing, and analysis. There
are several ways to get an image. For example, the first way
is to use an area camera where an element is arranged in a
two-dimensional CCD. The other way is to use a line scan
camera where an element is arranged in a one-dimensional
CCD. The area camera can easily acquire a two–dimensional
(2-D) image with a onetime exposure. However, when images
are acquired from an area camera, it has several disadvantages,
such as blurring, inspection speed, restriction of inspection
range, etc. For solving these problems, a line scan camera
that has a fast image acquisition speed, low signal noise, and
high resolution of 7000 pixels or above is used. A line scan
camera is suitable for the inspection system that has a con-
tinuous stream of objects, such as paper, fiber, plywood, or
iron plates. Because the inspection system using a line scan
camera has to deal with a large quantity of image data, there
are a lot of cases that use a digital signal processor (DSP) board
[13]–[15]. However, the existing equipment is too expensive
for small companies to purchase and they are not suitable for
field application. In addition, although there are many kinds of
fabric defects, it is hard to immediately reflect these various
1074
Fig. 1. Experimental equipment.
defects in an inspection system. Therefore, we propose a cheap
and fast fabric inspection system for industrial application. The
proposed system is designed to extract minimal-sized defects
without classifying the kinds of defects because of the speed.
To reduce the cost, it uses double buffer memory for parallel
processing of the PC-based system instead of the professional
DSP board.
II. SYSTEM CONFIGURATION
The overall architecture of the experimental system is pre-
sented in Fig. 1. It consists of the fabric inspection table,
lighting equipment, and image processing system. The fabric
feeding machine is an HS113-6 Model made by Heesu En-
gineering Company (Korea), and the feeding speed can be
constantly controlled. The fabric is scanned in “warp direction”
by a line scan camera. It is the TL-7450UFD model made
by Takex Company (Japan), and has a 40-MHz pixel clock
(25 ns/pixel) and 7450 pixels per line with an acquisition speed
of about 5000 lines per second. The frame grabber board is
Meteor- -DIG/4/L [Matrox (USA)], supporting low-voltage
differential signal (LVDS) differential signaling standards. The
shielded cable between camera and image board is connected
with LVDS connection, so high-frequency noise-induced elec-
tric motor drive is rarely affected. A Pentium 4 (2.4 GHz)
PC for image processing and Visual C++ language in an MS
Windows environment are used.
Generally, the illumination condition is very important in
the visual inspection system. When the surface of an object is
inspected, the surface color is changed by surface reflectivity
or the reflection angle. Therefore, lighting equipment must
be installed with consideration for surface characteristics so
that defects are well revealed while reducing the influence of
noise. The illumination of a line scan camera is supplied from
a special lighting device with a strong light. However, due
to its lower cost we used the general tungsten halogen lamp
that emits light of the visible spectrum. The intensity of the
tungsten halogen lamp is kept uniformly at a high strength. In
addition, it has a relatively low price so that it can maintain
a stable illumination environment. The halogen lamp model
is a large 750T3Q/CL/P made by Philips. They are serially
installed to maintain a nearly constant lux according to the
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IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, VOL. 52, NO. 4, AUGUST 2005
Fig. 2. Focal length of lens.
width direction using an illuminance meter. However, because
the spatial distribution of light about the overall area is not
uniform, an illumination guide is necessary to supplement it.
Fig. 2 shows a way to calculate focal length for the selec-
tion of an optical lens and this produces the following relational
equation:
(1)
From (1), focal length is as follows:
(2)
Angle of view is a range of captured images. It is as follows:
(3)
If an angle of view grows larger, namely, if grows smaller,
distortion of the lens increases. If grows larger, light intensity
decreases because the distance between the camera and fabric
increases. In the experiment, when is set up as 60 mm, and the
inspection range is restricted as 745 mm, the distance between
the camera and the fabric is
mm mm
m (4)
mm
The lens used is an AF 60-mm micro (F2.8D, Nikon). At this
time, if the resolution is 0.2 mm per pixel in each direction, the
transfer speed is 1000 mm/s
5000 lines s 0.2 mm 1000 mm s (5)
If the resolution is set up as 0.4 mm per pixel vertically, the
fabric transfer speed becomes 2000 mm/s. Therefore, a defect
can be detected faster. If the resolution is decreased, namely, if
the moving speed of fabric is increased, the defect recognition
rate will also decrease. In experiments, the resolution is set to
0.2 mm per pixel in each direction, and the minimum defect size
that may be detected set up at 1 mm (25 pixels). We restricted
test fabrics to those with a fine surface because the most highly
valued fabric products are made of very thin thread and have a
fine fabric surface.
III. INSPECTION ALGORITHM
A. Inspection Accuracy
In real-time inspection systems, the inspection accuracy is
very important. The greater the accuracy, the slower the speed
CHO et al.: DEVELOPMENT OF REAL-TIME VISION-BASED FABRIC INSPECTION SYSTEM
Fig. 3. Procedure for asynchronous grab using double buffer.
because it takes too much time to process the amount of data.
Processing time is a critical factor in the automatic visual in-
spection of fabrics. Consider a 1000-mm-wide fabric material
moving at 250 mm/s speed. If the camera resolution is set up as
0.2 mm per pixel, one line consists of 5000 pixels and 1250 lines
must be inspected per second at 250 mm/s. Therefore, it is nec-
essary to realize a data flow of 6.25 MB/s (5000 pixels line
1250 lines s 1 B pixel 6.25 10 B/s). For the real-time in-
spection, it is necessary to acquire the image and process it at the
same time. Generally, a computer does not use CPU resources
during image acquisition. Therefore, if we use a dual buffer to
save the images, it is possible to process the prior image during
acquisition of the new image.
Fig. 3 shows the image processing steps with a dual buffer.
The most important things to consider for a real-time inspection
are reduction of the processing time and raising of the recog-
nition rate. The previous image-processing step must be over
within the following image acquisition time for real-time image
acquisition.
When one line consists of 5000 pixels and 1250 lines are pro-
cessed for 1 s, 6.25 MB of memory is necessary. If we use double
buffer memory for a parallel process, 12.5 MB of memory is re-
quired. Moreover, if memory for image processing is included,
the memory size will be increased. To process so much data for
just 1 s, the inspection system does not only have a fast hard-
ware speed, but also possesses a simple software algorithm.
Fig. 4 shows the image acquisition time of the camera and the
binary processing time for extraction of defects. The upper line
is the image acquisition time, and the lower line is the time for
binary image processing when an Intel Pentium 4 (2.4 GHz) is
used. Because the simple image processing time is about 90%
compared with the image acquisition time, it is nearly impos-
sible to deal with other image processing such as noise removal,
defect searching, etc. When the frame grabber is set to acquire
400 lines per one frame, the grab time as shown in Fig. 4 is
about 74 ms (7450 pixels 400 lines). To secure the image pro-
cessing time for the defect detection, it is necessary to reduce
the inspection speed. When the moving speed of the fabric is
reduced to 250 mm/s, we can selectively use one line per four
lines because the line space is 0.05 mm. In this case, only 100
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1075
Fig. 4. Comparison grab time with thresholding time according to line number.
TABLE I
PART-TIME INSPECTION ALGORITHM (MILLISECONDS)
lines per frame are treated, and the processing time is reduced to
25%. Also, when the inspection width is restricted to 745 mm,
composed of 3725 pixels, we have sufficient time for real-time
inspection.
Table I shows the image acquisition time and image pro-
cessing time in each step when the data of 3725 pixels 100
lines is processed. If a defect is found, the inspection time in-
creases by the labeling process time . Because most defect
sizes are small, does not exceed 3 ms.
The overall inspection algorithm is shown in Fig. 5. At first,
the raw image is acquired from the frame buffer of a camera.
Several kinds of noises are removed by filters such as median
and mean value filters. A binary image is acquired with an
adapted threshold method that performs a binary operation to
obtain a precisely compensated threshold value from nonuni-
form brightness distribution. Next, an erosion process removes
the noises in the binary image, and the labeling algorithm with
a size filter can finally detect the fabric defects from the binary
image removed noises. If a defect successively appears, it is
stored in the memory queue until it does not. When the storing
is finished, the defects are extracted.
B. Image Processing
As a 2-D image is recomposed from one–dimensional (1-D)
images acquired from a line scan camera, noise removal, bi-
nary operation, and defect search algorithms are successively
performed. An image signal transmitted by a camera includes a
1076 IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, VOL. 52, NO. 4, AUGUST 2005

Fig. 6. Result of median filter.

Fig. 5. Flowchart for the inspection algorithm.

noise occurring by a change of illumination, nonuniform bright-

ness distribution, web fabric structure, etc. These kinds of noises
are removed by filters such as a median filter, mean value filter,
adapted threshold method, and erosion process, etc.
The mean value filter that belongs to the low-pass filter re-
moves the high-frequency noise. The intensity value of each
pixel in the image substitutes for the middle intensity value
of the surrounding pixels. The intensity of neighboring pixels
aligns in ascending or descending order. After the middle value
is acquired, the intensity of the center pixel is substituted by the
mean value. This is for the purpose of removing noise such as a
Fig. 7. Initialization and thresholding procedure.
spike appearing in the scope of the filter mask. Fig. 6 shows the
results of a noise removed by a median filter. We can see that
the noise component of the spike is removed after filtering. method. At first, when the inspection process starts, and
Because the distribution of brightness in the image is not uni- are initially calculated from the 2-D image set with no
form according to the lighting condition or characteristic of the defects. Next, if a value is between and , the gray
camera, various errors will occur if a single threshold value is value is allocated as 1, one of the binary values because there
uniformly applied to an overall image. This problem can be is no defect. Otherwise, it is set at 0 because of the high prob-
solved with an adaptive threshold method that periodically re- ability for the defect. Equation (7) shows the binary algorithm
news the value, and is applied variably in an overall image. The to detect the defect
adaptive threshold method finds the maximum and minimum
if then
threshold value on each pixel of the -axis direction during in-
spection work. These values are calculated by an average and else (7)
standard deviation, and periodically renewed threshold value
where is a gray-level input image of the fabric, and
mean mean (6) is a binary image changed by the threshold value. In the
binary image, the value of 1 means no defect, and 0 means that
where means the weighting factor. It is decided by the the cell has a defect or noise.
experiment. The range between 3–4 is suitable for the fine grain Basically, to remove the high-frequency noise, the mean value
texture. and are the upper and lower threshold filter is used. However, any kind of noise component still ran-
values. is a sample set composed of the initial defect-free domly exists after the filtering. Therefore, these noises can be
lines. Fig. 7 shows the binary process by the adaptive threshold removed by using an erosion process. An erosion process based

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CHO et al.: DEVELOPMENT OF REAL-TIME VISION-BASED FABRIC INSPECTION SYSTEM
2
Fig. 8. (a) Gray-level fabric image f (i; j ) (200 200) with three defects. (b) Binary image B (i; j ) obtained as a result of thresholding operator. (c) Binary
f g
image obtained after filtering of image B (i; j ) by erode operation B = 1; 1; 1 . (d) Binary image obtained after labeling. (e)–(g) Defect subimages obtained
from input image f (i; j ).
on morphology is indicated as A B which means the erosion
of A by B (structuring element). When B passes through the
image from the top left to the bottom right, it convolutes B with
some area of the image. If the convoluted result is 1 in all scopes
of B, the center pixel of convoluted image area marks in 1. If no,
it marks 0. The size of structuring element B influences the cal-
culation speed. Therefore, a structuring element is decided on
by the maximum size of a noise and minimum size of a defect.
Fig. 8(c) shows the resulting image after the erosion process.
The structuring element B is . We can finally get ob-
vious defects having a clear form through the binary, filtering,
and erosion process.
C. Defect Extraction
To reduce the image-processing time, the mean value filter
and erosion algorithm are carried out on each line image. The
vertical noise component was not removed yet because of the
processing time. To remove the vertical noise, the predefined
size filter is used, and it is defined as the size of a minimal defect
(i.e., 1 mm ). When is calculated as in (8), the detected
defect is considered as a noise component if it is smaller than
the size filter
Minimum horizontal size of defect after erosion
process vertical length of defect (8)
Generally, the size filter is carried out during the labeling
process because it will increase the inspection time if it is carried
out after the labeling process. The labeling algorithm should find
all connected components in one image. If some components
are connected, it has the same labeling value. The labeling algo-
rithm used is row-by-row labeling. Fig. 8(d) shows the resulting
image from the labeling process. The minor noise components
of Fig. 8(c) were removed when the labeling and size filter were
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1077
applied. During a labeling process, other information of defects
(such as area, position, and width vertical size, etc.) can be ob-
tained. At this step, we found the areas and the number of de-
fects. If the labeling number is 1 or above, it is stored in queue
memory until it becomes 0 in the successive images. This is the
reason that there is a high probability to be continuously found
in the next image if any defect is found in one line image. If no
more defects appear in the next image, a size and kind of de-
fect are extracted from the stored information. Fig. 8(e) and (f)
shows the stored images in the queue memory after the labeling
process.
IV. EXPERIMENTAL RESULT
The proposed inspection system is for finding the contami-
nation or defects of textile fabrics with fine web surface in the
industrial field. Because the minimum size of a defect is 1 mm ,
the error will be detected in at least 25 pixels when the inspec-
tion resolution is set to 0.2 mm. According to the filtering al-
gorithm for noise, the defect larger than the area of 0.64 mm
composed of 16 pixels could be detected. The inspection algo-
rithm was applied on the representative defects such as the warp
float, broken pick, hole, oil spot, and spot. Fig. 9 shows the ex-
perimental results applied on five different defects. Fig. 9(c)–(e)
represent the nearly perfect recognition rate on an oily spot and
spot. However, Fig. 9(a) and (b) represents an 80% recognition
rate on the warp and pick float. The reason was that the den-
sity of the defects was different from each other. The density of
the oily spot and plain spot were relatively high, but that of the
warp and pick float were low. Nevertheless, the recognition rate
was more than 60% when compared with experts. If we want
to increase the recognition rate, it is necessary to decrease the
low-frequency noise as shown in Fig. 7. To reduce the range of
threshold value between and , it is possible to use spe-
cial lighting conditions such as a high-frequency fluorescent or
1078
Fig. 9. Detected (a) warp float, (b) broken pick, (c) hole, (d) oil spot, and (e) spot.
halogen lamp, etc. However, because the high-frequency light
equipment is very expensive, the cost of the inspection system
will rise.
V. CONCLUSION
In this paper, a real-time fabric inspection algorithm was
proposed for industrial application. The cost problem is very
important in the industrial application. However, if we use
cheaper equipment to reduce the cost, the inspection errors will
be increased, or the inspection speed will be slower because
of complications from the algorithm. To reduce the cost, the
PC-based system instead of the professional DSP board was
used, and double buffer memory for a parallel process was
used. For more speedy and exact inspection, the problems of a
line scan camera, such as a light, illumination, characteristics
of lens, etc., were considered. It was designed to extract a
minimal size of defect without classifying the kinds of defects
because of the speed. The important fabric inspection algorithm
is as follows. To remove the high-frequency noise such as a
spike, the mean value filter was used. To change an obvious
defect to a clear form, the erosion and labeling algorithms were
used. To compensate for nonuniform distribution of brightness
in an image, an adapted threshold method was periodically
used and applied to the overall image. If the value beyond the
threshold value is detected in the image, the image data of the
line are stored in queue memory continuously until no more
defects appear. After this, the size and position of defects are
determined from the stored image information, and displayed
on the monitor. Because the proposed inspection system is
designed to extract a minimal size of defect by lines, the type of
defect is not important. It is designed to find defects over 1 mm
in width and length. When it was applied to five representative
defects (warp float, broken pick, hole, oil spot, and spot) with
the inspection speed of 250 mm/s, the experimental result
shows nearly perfect recognition rates on oily spot and spot
with a large difference of illumination. But, the recognition rate
is a little low on warp and pick float with small difference of
illumination. However, the recognition rate for web inspection
is much more than 60% of the experts. Therefore, the proposed
PC-based real-time fabric inspection system is good for indus-
trial applications because of the low cost and high detection
rate.
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IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, VOL. 52, NO. 4, AUGUST 2005
REFERENCES
[1] C. C. Ma and C. H. Huang, “The investigation of three-dimensional vi-
bration for piezoelectric rectangular parallelepipeds using the AF-ESPI
method,” IEEE Trans. Ultrason., Ferroelectr., Freq. Control, vol. 48, no.
1, pp. 142–153, Jan. 2001.
[2] J. H. Kim, S. Ahn, J. W. Jeon, and J. E. Byun, “A high speed high reso-
lution system for the inspection of TFT LCD,” in Proc. IEEE Int. Symp.
Industrial Electronics, vol. 1, 2001, pp. 12–16.
[3] G. B. Wetherill, Sampling Inspection and Quality Control. London,
U.K.: Methuen, 1969.
[4] B. G. Batchelor and P. F. Whelan, Selected Papers on Industrial Vision
Systems, ser. SPIE Milestone. Bellingham, WA: SPIE, 1994.
[5] T. S. Newman and A. K. Jain, “A survey of automated visual inspection,”
Comput. Vis. Image Understand., vol. 61, pp. 321–262, 1995.
[6] F. S. Cohen, Z. Fan, and S. Attali, “Automated inspection of textile fab-
rics using textural models,” IEEE Trans. Pattern Anal. Mach. Intell., vol.
13, no. 8, pp. 803–808, Aug. 1991.
[7] J. Chen and A. K. Jain, “A structural approach to identify defects in tex-
tural images,” in Proc. IEEE Int. Conf. Systems, Man, and Cybernetics,
1988, pp. 29–32.
[8] P. Dewaele, P. V. Gook, and A. Oosterlinchk, “Texture inspection with
self-adaptive convolution filters,” in Proc. 9th Int. Conf. Pattern Recog-
nition, Rome, Italy, Nov. 1988, pp. 56–60.
[9] A. Atalay, “Automated defect inspection of textile fabrics using machine
vision techniques,” M.S. thesis, Bogazici Univ., Istanbul, Turkey, 1995.
[10] J. L. Dorrity and G. Vachtsevanos, “In process fabric defect detection
and identification,” presented at the Mechatronics’98, Skovde, Sweden,
Sep. 1998.
[11] , “On-line defect detection for weaving system,” in Proc. IEEE Tex-
tile, Fiber, and Film Industry Tech. Conf., May 1996, pp. 1–6.
[12] A. Kumar and G. K. H. Pang, “Defect detection in textured materials
using Gabor filters,” IEEE Trans. Ind. Appl., vol. 38, no. 2, pp. 425–440,
Mar./Apr. 2002.
[13] A. Baykut, A. Atalay, A. Ercil, and M. Guler, “Real-time defect inspec-
tion of textured surfaces,” Real-Time Imag., vol. 6, pp. 17–27, 2000.
[14] R. Stojanovic, P. Mitropulos, and C. Koulamas, “Real-time vi-
sion-based system for textile fabric inspection,” Real-Time Imag., vol.
7, pp. 507–518, 2001.
[15] C. Anagnostopoulos et al., “High performance computing algorithms
for textile quality control,” Math. Comput. Simul., vol. 60, pp. 389–400,
2002.
Che-Seung Cho was born in Daegu, Korea, in
1971. He received the M.S. and Ph.D. degrees in
mechanical engineering from Yeungnam University,
Gyongsan, Korea.
He is currently with the Laboratory of Artificial In-
telligent Control, Yeungnam University. His present
interests are robot vision, automated visual inspec-
tion, and knowledge-based control.
CHO et al.: DEVELOPMENT OF REAL-TIME VISION-BASED FABRIC INSPECTION SYSTEM
Byeong-Mook Chung (M’02) was born in Busan,
Korea, in 1960. He received the M.S. and Ph.D. de-
grees in mechanical engineering from the Korea Ad-
vanced Institute of Science and Technology, Daejeon,
Korea.
From 1985 to 1995, he was with LG Electronics
Inc., working in the field of automation and com-
puter-aided inspection. Since 1995, he has been a
Professor in the Department of Mechanical Engi-
neering, Yeungnam University, Gyongsan, Korea.
In 1999, he was a Visiting Scholar for one year
at the University of California, Berkeley. His special interests are automatic
inspection and knowledge-based control.
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1079
Moo-Jin Park was born in Uisung, Korea, in
1976. He received the M.S. degree in mechanical
engineering from Yeungnam University, Gyoengsan,
Korea, in 2003.
He is currently with Textec Company, Ltd., Daegu,
Korea, working in the field of textile machinery. His
present interests are factory automation, automated
visual inspection, and knowledge-based control.