Professional Documents
Culture Documents
Procedures
1. Measure the grown oxide thickness using Digital reader (Nanometrics equipment).
Alternatively, we can also use Ellipsometer to measure the oxide thickness (Thickness (Å) =
TL + n * ORD) by calculating the theoretical thickness for “n”.
8. Hard bake
Put the wafer on hot plate at 140°C for 10 min.
9. Backside protection for single side oxide etching
(a) Use spin-coating to make a thick layer of PR AZ1518 on a 3” dummy wafer [Recipe 28].
• 500 rpm 10 sec for spreading
• 2,000 rpm 30 sec for spinning (2.5 μm)
(b) Place the PR-coated 2” wafer on top of the 3” dummy wafer coated with PR
(c) Use a cotton swab to paint the edge of the 2” wafer to prevent possible etching on the edge.
Also, cover the mark on the PR created by the tweezer.
(d) Wait at the room temperature for overnight.