、 文件编号

2-40-Q-E-0000-008
阿特斯酷组件 EL 检验标准 Document NO
版本/版次
CSI Ku Module EL Inspection Specification A/7
Version
工位名称 QC 工时（秒） N/A 人力 N/A 适用类型 通用

I、Purpose：To detect black spot, black core, broken cell (including crack & micro-crack), defect cells and soldering defect clearly by EL tester timely to

avoid problems during module production and improve process technology, which has important role on effectiveness & stability.

II、Scope: Canadian Solar Inc.

III、Object: Apply to CSI Ku Module，including MBB/HIKU（include BiHiKu）

IV、Standard:
① I-V curve should be smooth without steps, electrical performance, CTM is fine.
② Number of cells with defect: round the figure (product of defect cell percentage and total number of cells in single module)to the nearest whole
number
③ The cell’s number which refferred to as below is the number of cutted cells.

V. Letter Abbreviation
A：defect area( If discontinuous defects on a single piece, then calculate respectively) L：defect length W：Defect width
DA：ineffective area n：number of defects on one cell Q：Quantity of cells with defects
C：total number of cells in single module S：total area of single cell TQ：quantity of cells with one defect (One NO. below means one defect )

VI. Defect Severity Definition

Critical（Cr）
： Affects reliability and safety, electrical failures, and health hazards
Major（Ma）: A defect that does not constitute a fatal defect, but may result in a functional failure or degrade the original performance
Minor（Mi）
：Defects that have no or only minor effect on the performance of the product

VII、Sampling plan： S-4, per GB/T 2828.1：2012/ISO 2859-1：1999/IEC60410 standard；AQL：Cr, AQL=0；Ma：AQL=1.5；Mi：AQL=2.5

The first sampling is not in conformity with the permission of re-sampling and re-inspection, and the inspection standard and AQL are the same as the above

Page 1 of 14
 、 文件编号
2-40-Q-E-0000-008
阿特斯酷组件 EL 检验标准 Document NO
版本/版次
CSI Ku Module EL Inspection Specification A/7
Version
工位名称 QC 工时（秒） N/A 人力 N/A 适用类型 通用

provisions;

VIII、Inspection tools and methods

8.1 Inspector: the visual acuity reached 1.0, no color blindness
8.2 Inspection tools: inspection tooling, the display screen is 12-55 inches
8.3 Equipment and methods: ensure that the El picture is clear and complete, the inspection distance is 0.5-1m, and the inspection is carried out under the full EL image of the
module

IX、Failure area diagram

5BB 5BB half cell 9BB（156.75）

Page 2 of 14
、 文件编号
2-40-Q-E-0000-008
阿特斯酷组件 EL 检验标准 Document NO
版本/版次
CSI Ku Module EL Inspection Specification A/7
Version
工位名称 QC 工时（秒） N/A 人力 N/A 适用类型 通用

9BB（166） 10BB（182mm） 12BB（210mm）

Page 3 of 14
 、 文件编号
2-40-Q-E-0000-008
阿特斯酷组件 EL 检验标准 Document NO
版本/版次
CSI Ku Module EL Inspection Specification A/7
Version
工位名称 QC 工时（秒） N/A 人力 N/A 适用类型 通用

X、Requirement

Sn No. Type Severity Description Requirement Reference Picture

One or several cells

appear completely dark
1 Black cells Cr （caused by short Not allowed
circuit、busbar poor
soldering、crack）

Micro-crack in
line shape
（one per Ma DA≤5%*S， Q≤8%*C
cell） Single line

TQ≤10%*C

Micro-crack in
Crack line shape One or several cells
& （Y\V\X with line\Y\V\X\tree-
2
micro DA≤8%*S，Q≤5%*C
shape） Ma shaped dark lines L≤5mm，allowed
crack Length:
crossing point
to crack edge

Tree-shape
Not allowed
micro crack Ma

Page 4 of 14
、 文件编号
2-40-Q-E-0000-008
阿特斯酷组件 EL 检验标准 Document NO
版本/版次
CSI Ku Module EL Inspection Specification A/7
Version
工位名称 QC 工时（秒） N/A 人力 N/A 适用类型 通用

Sn No. Type Severity Description Requirement Reference Picture

No obvious separation
Black inactive area of the
3 Broken Cell Ma cells caused by Broken A≤3%*S，Q≤6%*C
cell 3%*S＜A≤5%*S，Q≤4%*C
TQ≤6%*C

Black point Φ≤3mm，allowed

4 Mi Φ＜8mm 3mm＜Φ≤8mm,n≤4, Q≤8%*C
(Φ> 8mm judged by black spot 1)

Areas close to main grid A≤2%*S，allowed

line are darker than 2%*S＜A≤10%*S，Q≤5%*C;
5 Poor Soldering Ma normal area， the areas
around the dark area are TQ≤20%*C
lighter than normal. U-shaped slot area shadow allowed

Page 5 of 14
、 文件编号
2-40-Q-E-0000-008
阿特斯酷组件 EL 检验标准 Document NO
版本/版次
CSI Ku Module EL Inspection Specification A/7
Version
工位名称 QC 工时（秒） N/A 人力 N/A 适用类型 通用

Sn No. Type Severity Description Requirement Reference Picture

A≤2%*S，allowed NG
6 Over soldering Ma Dark rectangle/ connect 2%*S＜A≤10%*S，Q≤5%*C;
with main grid line
TQ≤20%*C

Partial black area

on cell Slight black core is allowed;
7 Black spot 1 Ma Concentric circles is not A≤40%*S，Q≤15%*C
allowed

Black spot emerge as a

8 Black spot 2 Ma black lumps, with smooth Not allowed
edge

Etch acid residue

Page 6 of 14
、 文件编号
2-40-Q-E-0000-008
阿特斯酷组件 EL 检验标准 Document NO
版本/版次
CSI Ku Module EL Inspection Specification A/7
Version
工位名称 QC 工时（秒） N/A 人力 N/A 适用类型 通用

Sn No. Type Severity Description Requirement Reference Picture

OK
Visible Grid
Grid line breakage,Dark lines /
9 Ma A≤2%*S，allowed；2%*S＜A≤20%*S，Q≤25%*C
breakage areas appearing
rectangular to busbars

NG

Part are brighter than

10 Bright spot Ma normal circumstances Not allowed

Page 7 of 14
、 文件编号
2-40-Q-E-0000-008
阿特斯酷组件 EL 检验标准 Document NO
版本/版次
CSI Ku Module EL Inspection Specification A/7
Version
工位名称 QC 工时（秒） N/A 人力 N/A 适用类型 通用

Sn No. Type Severity Description Requirement Reference Picture

Slight dark edge

（sample） Serious Dark
Edge

Slight dark edge is allowed; OK

Regular & Series HiKu 5 module：W≤2.2cm，
Dark edge Dark Allowed；W＞2.2cm, Not allowed；
11 Ma Series HiKu 6 module：W≤2.5cm，Allowed；W＞
（Don't involve P5） area of cell edge 2.5cm, Not allowed
Series HiKu 7 module W≤2.8cm，Allowed；W＞
2.8cm, Not allowed OK

OK

diagonal length of black corner≤ 45mm，Allowed;

Black corner
12 （Don't involve P5） Ma Cell black corner diagonal length of black corner＞45mm，Not
allowed
NG

Page 8 of 14
、 文件编号
2-40-Q-E-0000-008
阿特斯酷组件 EL 检验标准 Document NO
版本/版次
CSI Ku Module EL Inspection Specification A/7
Version
工位名称 QC 工时（秒） N/A 人力 N/A 适用类型 通用

Sn No. Type Severity Description Requirement Reference Picture

A（No obvious tyre print）:

Reticulate Track print on cell（like
13 pattern Ma tyre print） Q≤15%*C
B（Obvious tyre print）:not allowed

Black stripe is parallel or Slighter than and equal to the left sample: allowed.
14 Black Stripe (PERC) Mi perpendicular to main grid Equal to or more serious than the left sample:
line n≤3，Q≤6；

Page 9 of 14
、 文件编号
2-40-Q-E-0000-008
阿特斯酷组件 EL 检验标准 Document NO
版本/版次
CSI Ku Module EL Inspection Specification A/7
Version
工位名称 QC 工时（秒） N/A 人力 N/A 适用类型 通用

Sn No. Type Severity Description Requirement Reference Picture

Slight mixed cell is allowed；

15 mixed cell efficiency Mi Brightness difference Clearly see the main grid line：
between cells Q≤15%*C
Can not clearly see the main grid line：not allowed

Page 10 of 14
、 文件编号
2-40-Q-E-0000-008
阿特斯酷组件 EL 检验标准 Document NO
版本/版次
CSI Ku Module EL Inspection Specification A/7
Version
工位名称 QC 工时（秒） N/A 人力 N/A 适用类型 通用

Sn No. Type Severity Description Requirement Reference Picture

A≤25%*S，Q is not limited

P5:
Cell crystallized,cell slice
1. Lighter than reference limited sample:
along the path of the cell Allowed;
16 Filament Mi to form irregular black
stripes
2. Heavier or equal to reference limited
sample:
A≤20%
【Ku】A≤40%；Q is not limited

Page 11 of 14
、 文件编号
2-40-Q-E-0000-008
阿特斯酷组件 EL 检验标准 Document NO
版本/版次
CSI Ku Module EL Inspection Specification A/7
Version
工位名称 QC 工时（秒） N/A 人力 N/A 适用类型 通用

Sn No. Type Severity Description Requirement Reference Picture

17 Scratches on Cell Mi Visible sratch on cell L≤10mm, allowed.

silicone surface L≤83mm，Q≤10%*C

Lighter than the limited sample or almost invisible：

18 Crystal boundary stripe Mi distribute along the crystal allowed. Invisible（Sample，allowed）
boundary Slight：Q≤10%*C
serious：not allowed Slight

Serious（Not allowed）

P5 Crystal boundary Distribute along the

19 Mi Allow
stripe crystal boundary

Page 12 of 14