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2 g x ; 2 = a STD-ETA IS-749-ENGL 1998 MM 3234b00 0589292 375 mm EIA INTERIM STANDARD Rectified Mains Application Expected Wear-Out Lifetime Test EIA/IS-749 JANUARY 1998 ELECTRONIC INDUSTRIES ASSOCIATION ENGINEERING DEPARTMENT STD-EIA IS-749-ENGL 1998 MM 3234400 0589193 20] mm NOTICE EIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need, Existence of such Standards and Publications shall not in any respect preclude any member or ‘nonmember of EIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ELA members, ‘whether the standard is to be used either domestically or internationally. ‘Standards and Publications are adopted by EIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, EIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. EIA INTERIM STANDARDS. EIA Interim Standards contain information deemed to be of technical value to the industry, and are published at the request of the originating Committee without necessarily following the rigorous public review and resolution of comments which is procedural part of the development of an EIA Standard. EIA Interim Standards should be reviewed on an annual basis by the formulating Committee and a decision made ‘on whether to proceed to develop an EIA Standard on this subject. EIA Interim Standards must be cancelled by the Committee and removed from the EIA Standards Catalog before the end of their third year of existence. Publication of this EIA Interim Standard for tral use and comment has been approved by the Electronic Industries ‘Association. Distribution of this EIA Interim Standard for comment shall not continue beyond 36 months from the due of publication, It is expected that following this 36 month prod, this ELA Inrim Sunar, revised at necessary, will be submitted to the American National Standards Institute for approval as an American National Standard. Suggestions for revision should be directed to: Bemie Aronson, Engineering Department, Electronic Industries Association, 2500 Wilson Boulevard, Arlington, VA 22201. (From Project Number 3873, formulated under the cognizance of the ELA P-2.4 Aluminum Electrolytic Capacitors Subcommitice.) Published by, ELECTRONIC INDUSTRIES ASSOCIATION 1998 Engineering Department 2500 Wilson Boulevard Arlington, VA 22201 PRICE: Please refer to the current (Catalog of EIA, JEDEC, and TIA STANDARDS and ENGINEERING PUBLICATIONS or call Global Engineering Documents, USA and Canada (1-800-854-7179) International (303-397-7956) All rights reserved Printed in U.S.A. . STD-EIA IS-749-ENGL 1998 MM 3234400 O589194 148 me CONTENTS Page Preface Clause 1 Scope 1 2 Test circuit 1 3 Test fixtures 2 4 Preconditioning, 3 5 Initial measurement 3 6 Test environment 3 7 Recovery per test interval 3 8 ‘Measurement per test interval 3 9 Test completion 3 Table 1 Definition of wear-out failure 1 2 Test conditions 3 Figure i Suggested test circuit 1 2 Screw terminal style capacitor test fixture 2 3 Copper bus structure for screw terminal style capacitors 2 STD-EIA IS-749-ENGL 1998 MM 3234L00 0589195 O84 mm Preface This interim standard was developed under the cognizance of the P-2.4, Subcommittee on Aluminum Electrolytic Capacitors iii Pet ea Previous page is blank ee STD-EIA IS-749-ENGL 1998 MM 3234_00 058919 T10 ma EIAMS-749 Page I 1 Scope This test procedure determines the expected wear-out lifetime for aluminum electrolytic capacitors. It provides a measure of the operating time required for parametric changes to cause capacitors to become unusable as filter capacitors on rectified mains applications. While it measures the time till wear-out, it does not indicate failure rate during the operating life. Wear-out is defined by conditions specified in table 1, Measurements are to be taken periodically and the measurements are to be taken at the same temperature throughout the test Table 1 - Definition of wear-out failure Equivalent series resistance | Greater than 200% initial requirement for equivalent series resistance Capacitance ‘Less than 80% initial measured capacitance DC leakage current Greater than initial requirement for DC leakage current Visual inspection Evidence of mechanical damage, leakage of electrolyte, or venting. 2 Test circuit Specimens may be connected using the test circuit or equivalent as shown in figure 1 Specimens that fail during the test should be replaced by new devices to maintain the circuit integrity. A typical value for inductor L is 10 H. Figure I—Suggested test

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