You are on page 1of 21
IEEE SA IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers with Rated Maximum Voltage Above 1000 V Corrigendum 1 IEEE Power and Energy Society Developed by the ‘Switchgear Committee IEEE Std C37.09"-2018/Cor 1-2021 (Corrigendum to IEEE Std C37.09-2018) IEEE ISTANDARDS | a IEEE sid 37.09.2016 Cort-2021 IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers with Rated Maximum Voltage Above 1000 V Corrigendum 1 Developed by the ‘Switchgear Committee of the IEEE Power and Energy Society ‘Approved 9 May 2021 IEEE SA Standards Board IEEE sid 37.09.2016 Cort-2021 Abstract: This corrigendum is to improve the current IEEE Std C37.09™ Keywords: arcing time, direct test, IEEE C37.09™, mechanical endurance, operating duty, power frequency, short-circuit current, shortdine fault, single-phase testing, synthetic test, test data reporting, three-phase testing, transient recovery voltage, unit test Pat ava New Yer Nv toes Sn Geng 22% bythe isu of lca and leo Enginoos ne ‘ites rosea Putten une 202% Pad he Usd Sates rca EE lea region vader inthe US, Patent & Trademark Oe, owned by The stu of Elecreal and Elecrones Engineers Incorporated {EEE promot seria, harassment an bye. Fer more fomaton, ish ups uw nos epbesscopersioveraren 28 ek, ha part ofr ptieaon may be reproduc n any fom, nan eect retival system or eherws, whofe prio writen parmisen ofthe puisner IEEE sid 37.09.2016 Cort-2021 Important Notices and Disclaimers Concerning IEEE Standards Documents IEEE Standards documents are made available for use subject to important notices and legal disclaimers ‘These notices and disclaimers, or a reference to this page (hiips//standards.ieve.orw/ipr/disclaimers.htnl), appear in all standards and may be found under the heading “Important Notices and Disclaimers ‘Concerning IEEE Standards Documents.” Notice and Disclaimer of Liability Concerning the Use of IEEE Standards Documents IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating ‘Committees of the IEEE Standards Association (IEEE SA) Standards Board. IEEE develops its standards through an accredited consensus development process, which brings together volunteers representing ‘varied viewpoints and interests to achieve the final product. IEEE Standards are documents developed by volunteers with scientific, academic, and industry-based expertise in technical working groups. Volunteers are not necessarily members of IEEE or IEEE SA, and participate without compensation from IEEE. While IEEE administers the process and establishes rules 10 promote faimess in the consensus development process, IEEE does not independently evaluate, test, or verify the accuracy of any of the information or the soundness of any judgments contained in its standards IEEE makes no warranties or representations concerning its standards, and expressly disclaims all ‘warranties, express or implied, concerning this standard, including but not limited to the warrantics of ‘merchantability, fitness for a particular purpose and non-infringement. In addition, IEEE does not warrant ‘or represent that the use of the material contained in its standards is free from patent infringement, IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE Standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed athe time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. In publishing and making its standards available, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity, nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizing any IEEE Standards document, should rely upon his or her own independent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the adviee of a competent professional in determining the appropriateness of given IEEE standard, IN NO EVENT SHALL IEBE BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: THE NEED TO PROCURE SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. IEEE sid 37.09.2016 Cort-2021 Translations ‘The IEEE consensus development process involves the review of documents in English only. In the event that an IEBE standard is translated, only the English version published by IEEE is the approved IEEE standard, Official statements ‘A statement, written oF oral, that is not processed in accordance with the IEEE SA Standards Board Operations Manual shall not be considered or inferred to be the official position of IEEE or any of its ‘committees and shall not be considered to be, nor be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on TEEE standards shall ‘make it clear that the presenter’s views should be considered the personal views of that individual rather than the formal position of IEEE, IEEE SA, the Standards Committee, or the Working Group, ‘Comments on standards ‘Comments for revision of IEEE Standards documents are weleome from any interested party, regardless of ‘membership affiliation with IEEE or IEEE SA. However, IEEE does not provide interpretations, ‘consulting information, or advice pertaining to IEEE Standards documents. ‘Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Since IEEE standards represent a consensus of concerned interests, itis important that any responses to comments and questions also receive the concurrence of a balance of interests. For this reason, IEEE and the members of its Societies and Standards Coordinating Committees are not able to provide an instant response fo comments, or questions except in those cases where the matter has previously been addressed. For the same reason, [EEE does not respond to interpretation requests. Any person who would like to participate in evaluating comments or in revisions to an IEBE standard is ‘welcome to join the relevant IEEE working group. You can indicate interest in a working group using the Interests tab in the Manage Profile & Interests arca of the IEEE SA myProject system, An IEEE Account is needed to access the application, ‘Comments on standards should be submitted using the Contact Us form. Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not constitute compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these dacuments may not be construed as doing so. Data privacy Users of IEEE Standards documents should evaluate the standards for considerations of data pri data ownership in the context of assessing and using the standards in compliance with applicable laws and regulations IEEE sid 37.09.2016 Cort-2021 Copyrights IEEE draft and approved standards are copyrighted by IEEE under US and international copyright laws. ‘They are made available by IEEE and are adopted for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making these documents available for use and adoption by public authorities and private users, IEEE does not waive any rights in copyright to the documents Photocopies Subject to payment of the appropriate licensing fees, IEEE will grant users a limited, non-exclusive license to photocopy portions of any individual standard for company or organizational internal use or individual, znon-commercial use only. To arrange for payment of licensing fees, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400; hutps://www.copyright.com/, Permission to photocopy portions of any individual standard for educational Classroom use can also be obtained through the Copyright Clearance Center. Updating of IEEE Standards documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, ccortigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least every 10 years. When a document is more than 10 years ‘old and has not undergone a revision process, itis reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art, Users are cautioned to check to determine that they have the latest edition of any TEEE standard, In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit IEEE. Xplote or contaet IEEE, For more information about the IEEE SA or IEEE’s standards development process, vist the IEEE SA Website. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE SA Website, Search for standard number land year of approval to access the web page of the published standard. Errata links are located under the Additional Resources Details section. Errata are also available in IEE Xplore, Users are encouraged to periodically check for errata. Patents IEEE Standards are developed in compliance with the IEEE SA Patent Policy. Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights, By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. Ifa patent holder or patent applicant has fled a statement of assurance via an Accepted Letter of Assurance, then the statement is li IEEE sid 37.09.2016 Cort-2021 IEEE SA Website at hitps:/standards ieee org/about/sasbipatcom/patents.html. Letters of Assurance may icate whether the Submitter is willing or unwilling to grant licenses under patent rights without ‘compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-diseriminatory. Users of this standard are expressly advised that ‘determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained fom the IEEE Standards Association, IMPORTANT NOTICE IEEE Standards do not guarantee or ensure safety, security, health, or environmental protection, or ensure against interference with or from other devices or networks. IEEE Standards development activities consider research and information presented to the standards development group in developing any safety recommendations. Other information about safety practices, changes in technology or technology implementation, or impact by peripheral systems also may be pertinent to safety considerations during implementation of the standard, Implementers and users of IEEE Standards documents are responsible for determining and complying with all appropriate safety, security, environmental, health, and interference protection practices and all applicable laws and regulations. IEEE sid 37.09.2016 Cort-2021 Participants At the time this draft standard test procedure was completed, the IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Curtent Basis Working Group had the following ‘membership Jan Weisker, Chair John Webb, Secretary Harm Bannink John Hall Daniel Schiffbauer Ted Burse Jeremy Hensberzer Carl Sehuet Plerige Byron Viewor Hermosillo Sushil Shinde Stephen Cary Roy Hutehins Mike Skidmore ‘Steven Chen “Todd Irwin Robert Smith ‘Vincent Chiodo (Christopher Jamigan James Stage ‘Andrew Chonanee Dave Johnson Donald Swing Michael Christian ‘Thomas Keels Vernon Toups Lucas Collete David Lanning, James van de Ligt Bianca Cosby ua Ying Liu Jefey Ward Michael Crawford Vincent Marshall Casey Weeks Jason Cunnigham Peter Marzac William Weishubn Patrick Di Lillo, Steven May Matt Westerdale Denis Dufounet Neil McCord Terrance Woodyard Kenneth Edwards Andrew Peterson Richard York Emely Eftink Lise Phan Marcus Young, Sergio Flores Anthony Riccius XiZhu Jon Rogers ‘The following members of the individual Standards Association balloting group voted on this standard test procedure. Balloters may have voted for approval, disapproval, or abstention, Roy Alexander Wemer Hoelz! Pathik Patel “Thomas Bames Jingxuan Hu John Phourinh Paul Barnhart “Todd Irwin Patty Polpatana WJ. Bill) Bergman Richard Jackson Lakshman Raut Steven Berner Andrew Jones Anthony Rieciutt Wallace Binder Laselo Kadar Frank Blalock John Kay, ‘Anne Bosma ‘Thomas Kecls Devki Sharma, Ted Burse ‘Chad Kennedy Jerry Smith Paul Cardinal James Kinney Gary Smullin Michael Christian Boris Kogan James Stage Lueas Collette Chung-Yiu Lam Ryan Stone Gary Donner Hua Ying Liu Donald Swing. Denis Dufournet Federico Lopez David Tepen Edgar Dalln Neil MeCord James van de Ligt “Thomas Dunmore I Jeffrey McElray John Versis Donald Dunn David Mitchell Michael Wactor Tanner Esco Daleep Mohla Lanyi Wang, Douglas Giraud Dennis Neitzel Jan Weisker Lou Grahor Jeffrey Nelson Kenneth White Paul Grein ‘Arthur Neubauer Tain Wright Tohn Hatley doe Nims Richard York Victor Hermosillo Mary Owens Wei Zhang. Jared Hines Lorraine Padden Leo Zibert Bansi Patel IEEE sid 37.09.2016 Cort-2021 When the IBEE SA Standards Board approved this standard test procedure on 9 May 2021, it had the following membership: Gary Hoffman, Chair Jon Walter Rosdahl, Vice Chair John D. Kulick, Past Chair Konstantinos Karachalios, Secretary Edward A. Addy Howard Li Mehmet Ulema Doug Edwards Daozhuang Lin Lei Wang Ramy Ahmed Fathy Kevin Lu E. Keith Waters J. Travis Geitfith Daleep C. Mobia Thomas Koshy (Chenfui Niu Toseph L. Koepfinges Damir Novosel Howard Wolfman David J. Law Annette Reilly Dad Zhone Dorothy Stanley *Member Emeritus IEEE sid 37.09.2016 Cort-2021 Introduction “This introduction isnot part of IEEE Std C37.09-2018 Cor1-2021, IEEE Standard Test Procedure for AC High-Voltage Cieuit Breakers with Rated Maximum Voltage Above 1000 V Corrigendum | ‘This corrigendum is fo improve the current IEEE Std C37.09™, The following, items are included as ‘mentioned in the PAR: — Subelause 4.10.4 the ratio of zero and positive sequence currents in single phase capacitive sovitehing procedure should be less than 3.0 rather than greater than 3.0, — Errors in clause 4.10.9.1.8 and 4.10.9.2.7 regarding reference to the procedure for separate making tests 4,10.9.1.3 change in punctuation for clarity. — Throughout document unify terms for rated voltage, including in equations to use “Ur" rather than on Clause 4.1.2 i) is missing some words required for clear meaning, — Correct references and terms used by both IEEE Std C37.04 and IEEE Sid C37.09 so they are identical. — Remove classification of tests in the Seope as only design tests are covered. — Subelause 4.5.7 and 4.5.8.1 to make clear that average of the test impulses shall be equal or higher than rated value. — Clarity in 48.2.7 which tests to be performed at minimum control voltage — Correct item list in 48.2.3, — Comet ttle of Figure 3 and correct Figure 4 (example for incorrect grounding condition given), — Correct arcing window/multplier in Table S — Correct item lst in 48.543. — Correct the steps of cletrical degrees for capacitance switching duties in 4.10.92.7 (30° for single- ‘phase and 10° for thece-phase). 9 Copyright © 2021 IEEE. All rights reserved. IEEE sid 37.09.2016 Cort-2021 Contents 1. Scope. 4.5.7 Chopped wave lightning impulse withstand voltage tests 4.5.8.1 Waveform for switching impulse voltage tests. 4.8.2.3.3 Arcing time for throe-phase test duty T100a 4.8.2.34 Arcing time for three-phase tests covering both conditions for kp ~ 1.3 and Ky 48.2.7 Control voltage 1 4.8.3.4 Single-phase tests with splitting of test dui in test series taking into account associated TRY for each pole-to-clear 1B 48.4.4 Test duty T1000. 1B 4.8.5.4.3 Condition check after meeting service capability tests. B 4.10.4 Grounding of the supply CifCUit sen enn sold 4.10.7 Test voltage ernie sen sen se oar) 4.10.9 Test duties, 4 4,10.9.1.3 Class C2 alternative of separate making tests... Is 4.10.9.1.8 Three-phase line-charging and cable-charging current switching tests for lass C2 .uc.eusn 1S 4.10.9.2.7 Single-phase and three-phase capacitance current switehing tests for C1488 CV nr Is 4.12.4.1 Single phase. 16 5.6.1 Controlled pressure systems for gas. 16 5.6.2 Closed pressure systems for gas. 16 10 Copyright © 2021 IEEE. All rights reserved. IEEE Sid €97.09™-2018 Cort-2021 IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers with Rated Maximum Voltage Above 1000 V Corrigendum 1 NOTEThe editing instructions contained in this corrigendum define how to merge the material contained therein imo the existing base standard and its amendments wo form the comprehensive sta “The editing instructions are shown in bold italic, Four editing instructions are wsed: change, delete, insert, and replace Change is used to make corrections in existing text of tables. The editing instrction specifies the location of the change and deseribes what is being changed by using strikethrough (to remove old material) and underscore (to add new material). Delete removes existing material. Insert adds new material without disturbing the existing materia Insertions may require renumbering. IFso, renumbering instructions are given inthe editing instruction, Replace is used to-make changes in figures or equations by removing the existing figure or equation and replacing it with a new one Editing instructions, change markings, and this NOTE will not be carried over into future editions because the changes ‘ill be incorporated into the base standard Introduction Change the first sentence in the first paragraph as follows: ‘This standard is a_major revision of IEEE Std C37,09™.1999 —B23}* [B24]! that includes IEEE Std C37,09a™-2005 [B25] and IEEE Std C37.096™-2010 [526] 4. Scope Remove the text below the first paragraph: ‘This standard applies to ac high-voltage circuit breakers with rated maximum voltage above 1000 V. It defines vatious tests that are made on ac high-voltage circuit breakers, except for generator circuit breakers which are covered in IEC/IEEE 62271-37-013:2015 [B14}* (formerly IEEE Std C37.013"™-1997 (B29). It specifies the tests and describes the accepted methods used to verify assigned ratings defined in IEEE Std 37.04" It also describes the test procedures associated with production and field installation, “Fhe test procedures-are divided into the following classifications: 1 Copyright © 2021 IEEE. All rights reserve. IEEE Sid €97.09™-2018 Cort-2021 in IBC standards 4.5.7 Chopped wave lightning impulse withstand voltage tests ‘Change item b) as follows: b)_Theaverage peak voltage shall be equal to or greater than the rated chopped wave test voltage. 4.5.8.1 Waveform for switching impulse voltage tests Change item 6) as follows: b) The average Peek peak voltage value equal to or greater than the rated switching impulse withstand voltage specified in IEEE Std 37.04, 4,8.2.3.3 Arcing time for three-phase test duty T100a Change the item list after the fourth paragraph as follows: ‘The intention is to achieve a series of three valid tests, and the duty is satisfactory if the following conditions are met. There is no preferred order to demonstrate the three valid tests a) One operation when are extinetion occurs in the first-pole-to-clear at the end of a major current Toop in the first phase with the required asymmetry criteria and with the longest possible a time. Change the item b) to main text under item a): 'b}-The longest possible areing time fox for the fist-pole-to-clear is achieved when the following condition is met da 360° ‘Change the item 6) to item b): b) _¢} One operation when arc extinction occurs at the end of an extended major current loop in the second phase with the required asymmetry erteria and with the longest possible arcing Change the item d) to main text under item b): R Copyright © 2021 IEEE. All rights reserved. IEEE Sid €97.09™-2018 Cort-2021 The longest possible arcing time fa forthe last-pole-to-clear for circuit breakers intended to be used in non-effectively grounded neutral systems is achieved when the following condition is met: (‘am 7» AS), . 3607) Change the item ¢) 19 main text under item b): ‘¢} The longest possible arcing time fy.) for the second-pole-to-clear for circuit breakers intended to be in effectively grounded neutral systems is achieved when the following condition is met: tape TA 4 t, 360°) ¢) If the required conditions of item a) and item b) are fulfilled, in the third operation, ate ex ‘may occur at the end ition 1) Of major current loop for first-pole-to-clear conditions 2) Of an extended major current loop for last-pole-to-clear conditions for circuit breakers rated for hyp = 15 3) Ofan extended major current loop for second-pole-to-clear conditions for circuit breakers rated for frp = 1.3 Change the tle of Figure 3 as follows (noneffectively to non-effectively): Figure 3—Example of the three valid asymmetrical oper: ns for three-phase test non-effectively grounded neutral system (first -pole+to-clear factor 1.5) B Copyright © 2021 IEEE. All rights reserved. IEEE Sid €97.09™.2018 Cort-2021 Replace Figure 4 with the following figure imag +"'valid breaking operation First-pole-to-clear after a major loop with the required asymmetry and | Mm - maximum arcing time 2 vals breaking Operation Lastpoe-to-lar after an extended major loop with the Recovery votage lpi ang ~ a trace inrea Ee = ane ws (Current trace in blue Contact separation at vertical lines in green 9 valid breaking ‘operation Last pole-to-clear after an extended ‘major loop with the required asymmetry, ‘no requirement Ez regarding rng time Time (ms) 4 Copyright © 2021 IEEE. Al rights reserve. IEEE Sid €97.09™-2018 Cort-2021 4.8.2.3.4 Arcing time for three-phase tests covering both conditions for kyo = 1.3, and kee = 1.5 Change item b) as follows: b) Additional sing phase test with asymmetrical current: ‘An additional single-phase fault test with an asymmetrical current that fulfills the asymmetry criteria as defined in 4,8.2.3.30 4,8,2.3.3 shall be performed. This additional test demonstrates the performance of the second- and third-pole-to-clear under asymmetrical fault current on the extended major loop, ‘The test voltage to be applied is 126% for the verification of fy = 1.3 and may be reduced to U, / V3 after one quarter of a cycle of rated frequency after eurrent interruption, When the last current loop parameters are within the prescribed tolerances, the resulting deviations on the de component at current zero, the associated di / dé and the following TRV peak value are within acceptable limits compared with those calculated with rated values, ‘The arcing time shall be the maximum arcing time calculated for three-phase condition considering the minimum arcing time value found during test-duty T100s performed for ky = 1-5 fo, -Tx +t, “ 360°} ‘where Af isthe relevant time parameter to be selected from Table 2 and Table 3 4.8.2.7 Control voltage Change the text as follows: Its preferred that the minimum control voltage be used forall tests. However, for convenience of esting, it is acceptable to use rated or maximum control voltage to minimize the variations in the contact making and contact parting times as long as it does not affect the making or breaking performance, provided that at least one making.test and one breaking test of 7100s is made at the minimum control voltage. Is Copyright © 2021 IEEE. Al rights reserved. IEEE Sid €97.09™-2018 Cort-2021 4.8.3.4 Single-phase tests with splitting of test du associated TRV for each pole-to-clear sin test series taking into account Change Table 5 as follow Table 5—Interrupting window and standard multipliers for transient recovery voltage values for second and third clearing poles for rated voltages above 1 kV inerrupting window ‘alps Ind clearing pole | 3rd clearing pole | 2nd clearing pole | 3rd clearing pole Hletial degrees RRRV ne PRRRV | ne Forefeively grounded systems 13 emily | woe wee | as | as | om | 077 2.0 (Out-of-phase) a Fornnteevaly gounded sens TSGiwnimtiaty | a | owe] on | ow | om | om 2.5 (Ont-of;phase) wee me NOTE The ineaping window fre clrng pols 0 42" 4.8.4.4 Test duty T100a (Change the first paragraph as follows: ‘Test duty T100a in Table1 consists of a minimum of three opening operations made not more than 15 min apart at 100% of the rated short-circuit breaking current and power frequency recovery voltages as specified in Table 1 and 4.8.2.4, If additional tests are required to meet the required asymmetry criteria regarding the peak and duration of the last major loop and the related arcing, conditions given in 4.82330 48.2.3.3 and 4.8.2.34 for three-phase tests and in 4,8.2.3.5 for single-phase tests in substitution for three= phase tests, Fhese these tests may be performed at any convenient interval. 4,8.5.4.3 Condition check after meeting service capability tests Change the fist paragraph as follows: ‘A test circuit breaker insulation condition check ean shall be performed after current accumulation duty specified in the service capability duty requirements of IEEE Std C37.04. The voltage withstand test can be performed by direct method in the high-voltage laboratory or indirect method using synthetie circuit in the high-power laboratory as listed as follows. The direct method is preferred if the high-voltage laboratory is close to the high power laboratory and does not require recovery of used SFy gas from the short-circuit test to empty bottles for shipment tothe high-voltage laboratory 4) For circuit breakers rated <72.5 kV: Change item b) to main text under item a): by A one-minute power frequency withstand tests at 80% of the original rated withstand value. Rename remaining item list as below: b)_ ©}For circuit breakers rated 272.5 kV and <362 kV. 16 Copyright © 2021 IEEE. All rights reserved. IEEE Sid €97.09™-2018 Cort-2021 1) Ifthe test is done with the direct test method, a lightning impulse test with both polarities having a peak value equal to 80% of the rated lightning withstand voltage should be applied. The circuit breaker is to be tested with five impulse voltages and no disruptive discharge is allowed, 2) If the testis done with the synthetic test method, impulse waveforms with both polarit imilar to that of the applicable rated TRV as used in test duty T10 with a peak voltage equal to 60% of the corresponding rated lightning impulse should be applied. The circuit ‘breaker is to be tested with five impulse voltages and no disruptive discharge is allowed. ©) @) For circuit breakers rated 2362 kV: 1) I the testis done with the direct test method, a switching impulse test with both polarities having a peak value equal to 80% of the rated switching withstand voltage should be applied. The circuit breaker is to be tested with five impulse voltages and no disruptive discharge is allowed, 2) IF the testis done with the synthetic test method, impulse waveforms with both polarities similar to that of the applicable rated TRV as used in test duty T10 with a peak voltage equal to 80% of the corresponding rated switching impulse should be applied. The circuit breaker is to be tested with five impulse voltages and no disruptive diseharge is allowed. 4.10.4 Grounding of the supply circuit Change item a) as follows: a) For eapacitor bank current switching tests, the neutral ofthe supply cireuit shall be grounded. For capacitor banks with grounded neutral, the zero-sequence impedance shall be ne less than three times the positive sequence impedance. For isolated neutral capacitor banks, this ratio is not relevant Change item 6) as follows: ©) For three-phase tests of a circuit breaker intended for use in grounded neutral systems, the neutral point ofthe supply circuit shall be grounded, and its zero-sequence impedance shall be ne-less than three times its positive sequence impedance 4.10.7 Test voltage Change the first and second paragraph as follows: For direct three-phase tests and for single-phase tests with the capacitive circuit to be switched according to the arrangement in item b) of 4.10.5.1, the test voltage measured between the phases a the circuit breaker location immediatcly prior to opening shall be not less than the rated voltage F¥4 [Ur] ofthe eireuit breaker. For direct single-phase laboratory tests, the test voltage measured at the circuit breaker location {nmediately before the opening shall be not less than the product of ¥ U; and the following capacitive voltage factor ky 4.10.9 Test duties Change the second sentence as follows: ‘The abbreviations of 4.10.5 4.10.2 apply. ” Copyright © 2021 IEEE. All rights reserved. IEEE Sid €97.09™-2018 Cort-2021 4.10.9.1.3 Class C2 alternative of separate making tests Change item 6) as follovss: b) ») Tho-making curtent-shall-be-appropriaie-to the capacitance current-swvitching-duty-to-demonsirate back-to-back eapacitor-bank-switehing-ratingsthe-making-current-shall-be-equal-to-the-rated Frac hob h-caphac ahi site ahah ceten tte oti Hie treeetiee sath be ll feast cel to the tested back-to-back eapaeitor bank inrush making frequeney (i The making current shall be appropriate to the capacitance current switching duty. To demonstrate back-to-back capacitor bank switching ratings, the making current shall be equal {0 the rated back-to-back capacitor bank inrush making current (J), and the frequency shall be at Teast equal to the tested back-to-back capacitor bank inrush making frequency (fx) 4.10.9.1.8 Three-phase line-charging and cable-charging current switching tests for class C2 ‘Change the third to last sentence as follows: ‘The C operations may be no-load operations. In this case, a series of separate making tests according to 04 4.10.9.1.3 shall be performed. 4.10.9.2.7 Single-phase and three-phase capacitance current switching tests for class C1 Change item a) as follows: a) Testduty 1 (LCI, CCI, BCD) 1) 60, distributed on one polarity (step: 30” for single phase tess, 10° fr thre phase tess) 2) 30 atminimum acing time on one polarity 3) 3.0.atminimum arcing time onthe other polarity 4) 60 .atmaximum arcing time on the other polarity 5) Additional tests to achieve 24, distributed (step: 30° fr single phase tests, 10° for three hase tess 6) For-lass C0, the maximum numberof operations required shall be 36 regardless of arcing time Change tem b) as follows: by. Test duty 2 (LC2, CC2, BC2) 1) 6CO, distributed on one polarity (step: 30° for single phase tests, 10° for three phase tests) 2) 3.CO at minimum arcing time on one polarity 3) 3CO at minimum arcing time on the other polarity 4) 6 CO at maximum arcing time on the other polarity Is Copyright © 2021 IEEE. All rights reserved. IEEE Sid €97.09™-2018 Cort-2021 5) Additional tests to achieve 24 CO, distributed (step: 30° for single phase tests, 10° for three phase tests) 6) For class C0, the maximum number of operations requited shall be 36 regardless of arcing time Change the second to last sentence as follows: ‘The C operations may be no-load operations. In this ease, a series of separate making tests according to 01 4.10.9.2.3 shall be performed. 4.12.4.4 Single phase Change item b) as fltows: ) For systems other than neutral grounded, the test volta voltage ¥ U, divided by V5 B shall be 2.5 times the rated ma 5.6.1 Controlled pressure systems for gas Change the text as follow: ‘Check relative leakage rate F, according to subclause 63 5.16.1 of IEEE Std C37,100.1-2007, 5.6.2 Closed pressure systems for gas Change the text as follows: Cheek absolute leakage rate F, according to subelause 63 5.16.2 of IEEE Std C37.100.1-2007, 19 Copyright © 2021 IEEE. All rights reserved. IEEE SA RAISING THE WORLD’S STANDARDS Connect with us on: BF Twitter: twitter.com/ieeesa BD nkeatn inten com/eroups/1791118 Bo Pevond standards blog: beyondstandards ieee org [B) Youtube: youtube-comyecesa standards.ieee.org Phone: +1 732 981 0060 IEEE

You might also like