Cloud-Based Online Ageing Monitoring for
IoT Devices
Harshad Danawale , Mohan Yelpale
Department of computer Engineering, NBN Sinhagad School of Engineering, Pune
danawaleharshad@gmail.com
Department of computer Engineering, NBN Sinhagad School of Engineering, Pune
mohansaeit@gmail.com
Abstract— In today's safety-critical
applications, such as automotive
electronics, electronic device reliability,
or whether it can perform reliably
during its designated lifetime in the
field (such as 10 or 15 years), is
becoming increasingly vital.
Traditionally, ageing has been done in
an offline setting, with stress tests used
to speed up the ageing process,
followed by the creation of a model to
make futuristic predictions. This type
of offline method has the disadvantage
of not being able to account for the
factor of a device's unique operating
condition and environment that it may
have encountered in the field. We
present the first cloud-based ageing
system in this paper. It provides a lot
of benefits. For starters, an IoT device's
ageing state may be monitored
remotely and in real time. Second, by
analysing data on a cloud server, more
information can be obtained .It is
possible to make an accurate
prediction. Finally, an ageing threat can
be forewarned before it occurs. Pre-
cautionary measures (such as online
repair or even a call-for-maintenance
request) can be taken in the event of a
strike taken ahead of time to avert
unnecessarily disastrous system failure
Measurement data will be acquired
through a prototype system using test
chips with built-in design-for-ageing-
monitoring circuits a server in the
cloud.
Key words: age monitoring, Iot devices, cloud
Introduction
The aggressive scaling of integrated circuit technology
has a number of benefits, including a smaller form
factor, faster speeds, and lower power consumption.
However, the requirement for long-term reliability in
safety-critical applications (e.g., vehicle electronics,
biomedical electronics, and other IoT devices) is
becoming increasingly difficult [1], [2]. An automotive IC,
for example, is frequently required to operate in the field
for more than 10 to 15 years. It is commonly known that
reliability (in terms of failure rate) is a function of time,
following a bathtub curve with three stages - infant
mortality, normal, and advanced .There are two stages of
ageing: lifespan and terminal ageing. The high infant
mortality rate is ideal. The mortality stage can be
bypassed by using stress testing (within reason).To
eliminate the weak, raise the temperature and/or
increase the VDD devices that may have hidden flaws It
is hoped that, for the most part Shipped gadgets can be
used in a system during normal operation. For certain, a
lifetime stage with a low failure rate is required a period
of time However, the ageing effect may begin after that
may take its toll on a device's functioning or possibly
cause it to fail disrupt its fuctionality. Bias Temperature
Instability (BTI), Electro-Migration (EM), Hot Carrier
Injection (HCI), and others are examples of ageing
mechanisms [3]–[6]. Thin-Oxide Breakdown, for example,
occurs when the ageing effect is turned on. It's possible
that a significant, unexpected functioning failure will
occur. As a consequence. During the design and
manufacturing stages of a safety-critical electronic
equipment, a set of anti-aging methods should be
implemented. stage, and in-field stage, in order to
achieve the desired level of reliability required.
I. III. PROPOSED CLOUD-BASED
AGEING MONITORING
The proposed cloud-based online ageing monitoring
methodology is described in this part, along with its
benefits, architecture, operation flow, and test chip.
A. INTRODUCTION
The data generated during the monitoring process for
an IC utilised in an Internet of Things (IoT) system can be
transferred to the cloud via an existing wireless internet
connection [19]. There are various advantages to using a
cloud-based monitoring system.
(1) An IC's ageing history (consisting of average ROCP
samples collected over its lifetime) can be seen at any
time and from any location on the planet.
monitored separately inside its own system, this
type of peer-based over-ageing detection is
difficult to achieve.
(3) As previously said, a monitoring system is made
up of both hardware and software. The software
responsible for "ageing data analysis" in a cloud-
based monitoring system can be run in the cloud
rather than on the edge device hosting the IC. This
type of setup is more modular and adaptable. We
merely need to install a new version of the "ageing
analysis algorithm" in the cloud whenever a new
version is released. There is no need to update the
software on the multiple edge devices, saving both
time and money.
A cloud-based monitoring system's architecture
can be separated into three domains, as shown in
Fig. 4, namely (1) user domain, (2) cloud domain,
and (3) IoT Edge domain.

(2) In the cloud, all ICs of the same type can have
their ageing histories gathered and compared,
allowing an IC with anomalous ageing conditions
to be easily detected as an outlier in terms of
particular attributes. When each IC is only
 acceleration process is repeated until
the IC under stress has reached a
predetermined age limit (say 10
percent ).

For example, we had three ICs under

stress in our test scenario, and we
recorded the average ROCP values of
all 16 RO monitors put in the IC once
a day until all three ICs have aged by
a threshold value of 10% (as
compared to their time zero
references).

Phase 2 (Develop a "Accelerated

Aging Model"):

An "accelerated ageing model" is

produced by fitting the accelerated
ageing data using the findings of the
aforesaid ageing acceleration
technique. As illustrated in Fig. 6, we
employ a polynomial of degree 5 as
the fitting function. The resulting
"accelerated ageing model,"
represented by A, is a function of
time (t).
There are four stages to it. After a
number of selected ICs have been
produced, Phase 1 and Phase 2 are
one-time efforts. Phases 3 and 4 are,
on the other hand, carried out in the
field at pre-determined monitoring
intervals for each edge device.

Perform the Accelerated Aging

Process in Phase 1:

Stress tests are well known for their

ability to speed up the ageing
process. The goal of this step is to see
how a small number of ICs chosen for
characterisation during offline testing
age under stress. For example, in our
test case, we apply a "boosted supply
voltage" of 2 times the rated VDD
level, and then monitor their ageing
behaviours (as shown by the average
ROCP values) over time. The ageing Our "accelerated ageing model," like
the timing model for a standard cell,
is derived in three cases: (1) worst-
case, (2) typical-case, and (3) best-
case, with the worst-case "accelerated
ageing model" being obtained by
taking the top envelop of those
"accelerated ageing data" at each
recording time obtained during the
accelerated ageing process.
Similarly, the best-case scenario is
obtained by using the bottom
envelop, whereas the typical-case
scenario is obtained by using the
average "accelerated ageing data".
Our accelerated ageing procedure, as
shown in Fig. 6, achieves a 10%
ageing on these test chips in 14 days
in the worst case, 24 days in the
average case, and 32 days in the best
situation.
• Tworst: Using the worst-case
accelerated ageing model, the time
required to reach an ageing threshold
(e.g., 10% ageing).
• Ttypical: The time it takes for the
typical-case accelerated ageing
model to reach an ageing threshold.
• Tbest: Using the best-case
accelerated ageing model, the time
required to reach an ageing threshold
(e.g., 10% ageing).
Then Tworst = 14 days, Ttypical = 24
days, and Tbest = 32 days in our test
situation. Using Ttypical as a
reference, we derived two ratios to be
utilised later in the remaining lifespan
prediction, namely the
Ratio(worsttotypical) = 14/24 = 0.58
and the Ratio(worsttotypical) = 14/24
= 0.58. (or -42 percent ),
Best-to-typical ratio = 32/24 = 1.33
(or +33%). In various ways, the rate of
accelerated ageing varies between
[42 percent and 33 percent].
Phase 3 (Develop a "Probable"
Ageing Model):
While the accelerated ageing model
predicts how a device would age
under a certain stress situation, our
system's "predicted ageing model"
predicts how a device will age in the
field under regular workload. This
model is progressive and specific for
each IC in that it considers the real
ageing information of each IC when it
is used in the field, and we
dynamically update this "predicted
ageing model" over the lifetime of an
edge device based on the ageing
information seen thus far and store it
in cloud.
In general, the anticipated ageing
model is a timestretched version of
the accelerated ageing model in our
technique, and it is obtained using a
successive approximation procedure
in two steps – coarse-stretching and
fine-stretching, as detailed below.
(Section 3.1) Based on the following
operation, derive the coarse ageing
model.
1) OPERATION OF COARSE-
STRETCHING
Stretch the time-axis of the typical-
case accelerated ageing model A(t),
shown as the BLUE curve in Fig. 7,
into a function labelled as A(t/n), seen
as the GREEN curve in Fig. 7.
Our successive approximation
procedure, which tries to minimise
the ageing prediction error,
incrementally determines A(t) = A(t/ n
), where n is an integer, or called
coarse-stretching parameter, which is
incrementally determined by our
successive approximation procedure,
which tries to minimise the ageing
prediction error.
(Ageing Prediction Error) Definition 1:
The actual ageing data acquired so
far for a device under monitoring
constitutes an ageing history at any
given period. The ageing prediction
error can be calculated using the
mean square error between a "ageing
model" and the actual "ageing
history."
The determination of the coarse-
stretching parameter will become
easier as a result of the
aforementioned description — it
discovers a positive integer n through
an iterative procedure such that the
ageing forecast error is kept to a
minimum. The ageing prediction
error for n = 1, 2,..., 43 is listed in
Table 1. It can be seen that the error
decreases monotonically from 3032
percent to 2.781 percent (as n
increases from 1 to 42) before slightly
increasing to 2.789 percent when n is
increased to 43. As a result, for this
test instance, this coarse-stretching
technique will choose n = 42 as the
final coarse-stretching parameter. 2)
OPERATION OF FINE-STRETCHING
To make a fine ageing model, slightly
expand the time-axis of the typical-
case accelerated ageing model A(t)
with the following formula:
A(t) → A( t /n + 1 /Ttypical k ))
Note that n is the coarse-stretching
value that was previously established,
whereas k is a fine-stretching
parameter that will be computed at a
later stage.
Ttypical = 24 days in our test
situation. We gradually increase the
value of k from 1 to find a correct
integer value that minimises the total
ageing prediction error (versus actual
ageing history).
Phase 4 (Establish the Remaining Lifetime Range):
We can determine a given IoT edge device's "retire time in
the typical case" once we've calculated the final ageing
model in the typical case. The retire time in the typical
scenario is then multiplied by the two ratios we derived
previously in the "accelerated ageing models" - i.e.,
Ratio(worsttotypical) and Ratio((besttotypical)- to derive the
worst case and best case retire times. We can determine the
remaining lifespan once we know the retire times:
(Remaining Lifetime) - (Retire Time) = (Remaining Lifetime) -
(Retire Time) - (Retire Time) (Current Time)
V. CONCLUSION
A credible methodology that can demonstrate how long
an IC can operate reliably under the influence of ageing
is badly needed for safety-critical applications.
Traditional methods of entirely software-based
prediction may be insufficient, as the outcomes may be
sloppy. As a result, in this study, we suggest a more
accurate method.
Our contributions can be divided into two categories.
First, because the ageing and longevity prediction is
based on both an offline "accelerated ageing model"
and an online "ageing history" under normal workload, it
can become more believable. Also, for each individual IC,
a unique "lifetime" prediction can be generated. Second,
an ageing monitoring system includes both hardware
and software, as well as data analysis for a higher
number of ICs distributed globally. System integration
and maintenance are also simplified when using a cloud-
based technique. The efficiency of the proposed
methodology has been demonstrated using test chip
measurement data.
ACKNOWLEDGMENT
authors would like to thank the Taiwan
Semiconductor Research Institute (TSRI) for
providing the access to the EDA tools [26].
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