A Seminar on

Cloud-Based Online Ageing

Monitoring for IoT Devices
Under Guidance of Prof. Mohan Yelpale

Student Name: Harshad Rajendra Danawale

Class: TE-1
Roll no: T5431
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 INDEX

 Introduction
 Motivation
 Literature Survey
 Generalized system architecture
 Conclusion based on survey(Comparison)
 Advantages
 Conclusion
 References

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 INTRODUCTION
 The aggressive scaling of integrated circuit technology brings numerous
advantages, such as the reduction of the form factor, higher speed, and
lower power. However, the concern of reliability over a long lifetime as
required by safety critical applications (e.g., automobile electronics,
biomedical electronics, and various IoT devices) is getting more and more
challenging.
 There are several different types of ageing mechanisms e.g., Bias
Temperature Instability (BTI), Electro-Migration (EM), Hot Carrier
Injection (HCI), and Thin-Oxide Breakdown, etc. When the ageing effect
turns serious, sudden functional failure could occur.
 The ageing analysis is becoming more and more inevitable during the
design process for a reliability conscious IC product. Even though it may
not be very accurate, it does provide first-degree estimation and early
feedback to the design process for lifetime enhancement. 3
 Motivation:
 Traditionally, the ageing has been performed in an offline setting where stress
test has been applied to accelerate the ageing process and then a model is
established to make the futuristic prediction.

 But when it comes in today’s safety-critical applications such as automotive

electronics, reliability of an electronic device, concerning if it can function
reliably over its designated lifetime in the field (such as 10 or 15 years), has
become more and more important.

● It has many advantages. First of all, one can know of the ageing status of an IoT
device remotely and continuously. Secondly, through data analysis in a cloud
server, more accurate prediction can be achieved. Thirdly, an ageing hazard can
be alarmed in advance before it actually strikes, and thereby pre-caution actions
(such as online repair, or even call-for-maintenance request) can be taken in
advance to avoid unnecessary system fatal failure.
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Literature Survey
Sr Title Authors Methodology
No.
1 Inserting RO G.-H. Lian, S.-Y. Huang, These RO monitors are arranged into a special
monitors in the chip, and W.-Y. Chen architecture, so they can share the same clock period
one for each selected measurement circuit.
site of interest.
At any given time, only one RO monitor is active and
transfers its output clock signal, RO_CLK, to the Clock
Period Measurement (CPM) circuit.
2 Test chip design. C.-H. Hsu, S.-Y. Huang, D.- This test chip design is embedded with 16 monitors and a
M. Kwai, and Y.-F. Chou logic BIST (Built-In Self-Test) circuit. Based on our test
flow, the 16 monitors inserted would take turn to be
observed, each of which produces an RO_CLK signal
reflecting the ageing condition at the site it monitors.

Literature Survey Table

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Literature Survey
Sr No. Title
3 Aging and remaining
lifetime prediction
Authors Methodology
R. Nazari, N. There are three models to predict the ‘‘final ageing
Rohbani, H. Farbeh, model’’ for one chip by the coarse-stretching and
Z. Shirmohammadi, fine-stretching operations. The retire times of this
and S. G. Miremadi chip are indicated in the worst case, the typical case,
and the best case, respectively. With the information
of these retire times, the remaining lifetime can be
calculated thereby.
Literature Survey Table
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 System
Architecture

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Advantages
 The ageing history of an IC (consisting of the average ROCP samples
recorded over its lifetime) can be checked at anytime and from anywhere in
the world.
 In the cloud, the ageing histories of all ICs of the same type can be gathered
and compared, and therefore, an IC with abnormal ageing conditions from the
population can be easily identified as an outlier in terms of some features.
This kind of peer-based over-ageing detection cannot be easily performed
when each IC is only monitored individually inside its own system.
 Whenever there is a new version of ‘‘ageing analysis algorithm’’, we only
need to install it in the cloud. There is no need to update the software at the
numerous edge devices, which can save a lot of efforts and costs.

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Conclusion
1) I have proposed a more accurate method in this paper. Our contributions
can be summarized in two aspects.
2) First, the ageing and lifetime prediction can become more credible since it
is derived by not only the offline ‘‘accelerated ageing model’’, but also
online ‘‘ageing history’’ under normal workload. Also, one can produce a
unique ‘‘lifetime’’ prediction for each individual IC.
3) Second, an ageing monitoring system contains both hardware and
software, and involves the data analysis for a larger number of ICs
spreading around the globe. By adopting a cloud-based method, the
system integration and maintenance become easier as well.

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References
[1] G. A. Klutke, P. C. Kiessler, and M. A. Wortman, ‘‘A critical look at the bathtub
curve,’’ IEEE Trans. Rel., vol. 52, no. 1, pp. 125–129, Mar. 2003.

[2] J. H. Stathis and S. Zafar, ‘‘The negative bias temperature instability in MOS
devices: A review,’’ Microelectron. Rel., vol. 46, nos. 2–4, pp. 270–286, 2006.

[3]T. Wang, L.-P. Chiang, N.-K. Zous, C.-F. Hsu, L.-Y. Huang, and T.-S. Chao, ‘‘A
comprehensive study of hot carrier stress-induced drain leakage current degradation
in thin-oxide n-MOSFETs,’’ IEEE Trans. Electron Devices, vol. 46, no. 9, pp. 1877–
1882, Sep. 1999.

[4] M. Kimura, ‘‘Field and temperature acceleration model for time-dependent

dielectric breakdown,’’ IEEE Trans. Electron Devices, vol. 46, no. 1, pp. 220–229,
Jan. 1999
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