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The macroscopic exchange bias effect, i.e., the unidi- antiferromagnetic spins near the NiO(001) surface upon
rectional exchange coupling between an antiferromagnet deposition of the ferromagnetic film. More importantly,
(AFM) and a ferromagnet (FM), that appears when an they provide clear experimental evidence that symmetry
AFM-FM sandwich is grown or heated in a magnetic field, breaking at surfaces and interfaces will in general lead to
has been the subject of extensive studies because of its spin reorientation effects in antiferromagnets.
technological relevance and lack of scientific understand- The x-ray photoemission electron microscopy
ing [1,2]. In light of the difficulty of determining the AFM (XPEEM) experiments were performed on beam line
structure close to the FM interface most models have as- 7.3.1.1 at the Advanced Light Source using the PEEM2
sumed that the antiferromagnetic spin structure in the bulk, microscope [5]. The microscope has a lateral resolution
which in most cases is known from neutron diffraction, of about 50 nm when used for magnetic imaging. The
extends all the way to the interface. An example is the depth sensitivity is determined by the escape depth of the
recent study of the Fe兾NiO(001) system [3] where a bulk- secondary electrons. Because of the elemental specificity
like NiO(001) domain structure was assumed to model the of the x-ray absorption process we can distinguish the
AFM-FM coupling. signal from layers with different elemental composition
During the last year, progress made with imaging with a 1兾e probing depth of about 2 nm for each layer
methods based on variable polarization x rays has allowed [6]. The bending magnet x-ray source and the spherical
the observation of the microscopic spin structure on grating monochromator provide monochromatic x rays
both sides of an AFM-FM interface [4]. Studies of the with an energy resolution of 0.6 eV at 850 eV and ad-
Co兾LaFeO3 (100) system convincingly showed the direct justable polarization ranging from linear (⬃90%) to left-
correlation of the antiferromagnetic and ferromagnetic or right-handed circular (⬃80%). Figure 1 shows the
spin structure near the interface and the existence of local experimental geometry. X rays are incident on the sample
exchange bias, domain by domain. However, because at an angle u 苷 30± from the surface.
of the complex antiferromagnetic structure of twinned For x-ray magnetic linear dichroism (XMLD) measure-
epitaxial LaFeO3 共100兲 the three-dimensional correlation ments we typically use linearly polarized x rays with the
between the ferromagnetic and antiferromagnetic spin electric field vector E parallel to the sample surface. In
directions could not be determined. Using the well-studied all XMLD measurements we use the experimentally ob-
antiferromagnet NiO, coupled to either a thin Fe or Co served fact that the intensity of the higher energy peak
layer, we are able to experimentally determine here the at the Ni L2 -edge is at a maximum when the E vector is
relative alignment of the antiferromagnetic and ferromag- aligned parallel to the antiferromagnetic axis [7,8]. By ro-
netic spin systems. We show that the magnetic spins near tating the sample about the surface normal we can change
the surface of a NiO(001) single crystal and those in a thin the azimuthal angle f between the in-plane E k vector and
film of Co or Fe deposited on top align perfectly parallel the 关100兴 direction of the NiO crystal. This allows us to
to each other. Our finding is in complete contrast to the determine the in-plane orientation of the antiferromagnetic
recent conclusions of Matsuyama et al. [3] for the same axis. We cannot rotate the direction of the linearly polar-
system, who assumed a bulklike NiO spin structure at the ized x rays but we can obtain out-of-plane XMLD sen-
interface. Rather, our results reveal a reorientation of the sitivity by using circularly polarized x rays. In this case
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VOLUME 86, NUMBER 13 PHYSICAL REVIEW LETTERS 26 MARCH 2001
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VOLUME 86, NUMBER 13 PHYSICAL REVIEW LETTERS 26 MARCH 2001
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