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黑磷纳米带-Li J, Gao Z, Ke X, Lv Y 黑磷纳米带-李军
黑磷纳米带-Li J, Gao Z, Ke X, Lv Y 黑磷纳米带-李军
NANO MICRO
Communication
Nanobelts www.small-journal.com
Prof. J. Li, Y. Lv, H. Zhang, W. Chen, W. Tian, H. Sun, S. Jiang, Prof. X. Ke, Prof. M. Sui
Dr. X. Zhou, Dr. X. Tu, Prof. Y. Li, Prof. Y. Shi, Prof. J. Chen, Prof. B. Jin, Institute of Microstructures and Properties of Advanced Materials
Prof. L. Kang, Prof. W. Xu, Prof. H. Wang, Prof. P. Wu Beijing University of Technology
School of Electronic Science and Engineering Beijing 100124, China
Nanjing University E-mail: kexiaoxing@bjut.edu.cn
Nanjing 210046, China Prof. S. Tong
E-mail: junli@nju.edu.cn School of Chemistry
Prof. Z. Gao, T. Zuo, Prof. L. Xiao Sun Yat-sen University
Institute of Electrical Engineering Guangzhou 510275, China
Chinese Academy of Sciences Prof. K. Yamaura
Beijing 100190, China Graduate School of Chemical Sciences and Engineering
E-mail: gaozs@mail.iee.ac.cn Hokkaido University
Prof. Z. Gao, Prof. D. Tang, Dr. B. Da, Prof. K. Yamaura Sapporo 060-0810, Japan
National Institute for Materials Science Prof. L. Kang, Prof. P. Wu
Tsukuba 305-0044, Japan Synergetic Innovation Center of Quantum Information
and Quantum Physics
The ORCID identification number(s) for the author(s) of this article
University of Science and Technology of China
can be found under https://doi.org/10.1002/smll.201702501.
Hefei, Anhui 230026, China
DOI: 10.1002/smll.201702501
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Figure 2. SEM images of BP nanowires at the initial growth stage. a) SEM image of a nanowire-like BP. b,c) Energy dispersive X-ray (EDX) mapping
for Bi and P distributions, respectively. Here, the EDX mapping was overlapped onto the SEM image to indicate the distribution of elements referenced
to the nanowire and substrate. The capping nanoparticle of Bi is indicated by arrow in (b) whereas the presence of short nanowires is indicated by
arrows in (c).
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Figure 4. TEM image of a nanobelt. a) An individual nanobelt at low magnification, b) a corresponding FFT pattern where the (010) planes of BP are
confirmed, and c) a high resolution TEM image obtained from the boxed area in (a). The layered structure is stacked along [010] direction, i.e., b-axis
as confirmed from the TEM, and FFT. d) HAADF-STEM image of BP nanosheet at low magnification, and e) STEM-EDX analysis in two regions as
indicated in (d). Two regions have a difference in thickness, namely, Region A is thicker (as shown by higher intensity) and Region B is thinner. The
presence of Bi is confirmed in EDX spectra, where the thicker region has a higher intensity and the thinner region has a lower intensity.
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