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1 a optical cross-section of plasma nitrided AISI 316L at 723 K showing 15 mm thick homogeneous expanded austenite layer
and b XRD patterns of substrate and nitrided layer
Table 1 Chemical composition (wt-%) of AISI 316L stainless electron beam was adjusted to give a detecting dead time
steel between 30 and 40%. Crystallographic parameters were
determined from selected area electron diffraction
C Mn Si Cr Ni Mo N Cu Fe patterns (SAEDs), using a standard calibrated camera
length.
0.019 1.47 0.40 16.26 10.50 2.02 0.067 0.47 Bal.
3 Thin foil TEM images showing a fine chromium nitride precipitation and b amorphous region (A) near decomposed cN
area (D)
41?2u, 46?0u and 83?4u 2h scattering angles after nitriding energy. Therefore, higher stacking fault densities and
at 723 K respectively associated with {111}cN, {200}cN compressive residual stresses can be expected in the
and {311}cN expanded austenite reflections. The results expanded austenite. The presence of planar defects and
in Table 2 confirm the increase in the cN lattice their elastic strain fields have resulted in different shifts
parameter and its anomalous behaviour relating to for each cN reflection in the XRD pattern, according to
untreated fcc austenite (ao5359?11 pm) due to aniso- Warren’s theory.9 Thin foil observations made by TEM
tropic expansion.1 have confirmed a massive formation of stacking faults in
Atomic nitrogen in solid solution occupies an the expanded austenite layer as shown in Fig. 2.
octahedral interstitial site in the fcc lattice of austenite. Calculations performed from the SAED patterns indi-
Its presence promotes a decrease in stacking fault cate that lattice expansion of cN is slightly higher (14%)
4 a TEM image showing regions of expanded austenite (P1) and cN decomposition (P2), and b, c EDS microanalysis
spectra of P1 and P2 positions
than those obtained by XRD analysis which is due to the lower c stabiliser. This chemical behaviour is probably
lower level of compressive residual stress in thin foil related to microsegregation events, which may have
samples.10,11 occurred during manufacture of the rolled bar used
The TEM investigation showed the microstructure of as substrate, or during nitriding treatment of the
the expanded austenite layer to be complex. In some specimens.
regions, as shown in Fig. 3a, small rounded particles
(10–15 nm) were readily observable in the thin foils Summary
observed under dark field contrast. The ring type SAED The investigation of nitrided AISI 316L samples indi-
pattern indicates that there is a larger number of cates that fine chromium nitride cannot be identified by
diffracting particles with some preferential orientation XRD analysis, due to its low volume fraction, but can be
(texture) related to the substrate (not investigated). identified by TEM. Other evidence of expanded auste-
Indexing diffracted rings have shown that these particles nite decomposition was found on the nitrided surface.
are crystalline and compatible with cubic chromium Scattered regions of the expanded austenite layer were
nitride (CrN) whose volume fraction is considerably amorphous. The formation of these decomposed areas is
smaller than the detection limit of the XRD technique. related to enrichment in both chromium and molybde-
Amorphous expanded austenite was also observed in num (ferrite stabilisers) and to depletion of nickel
scattered regions of the nitrided layer, as shown in (austenite stabiliser) from of the expanded austenite.
Fig. 3b. This kind of structure presents typically an
image with monotone contrast and this is crystal- Acknowledgements
lographically confirmed by the presence of broad and
diffuse halos in a ring type SAED pattern. The localised The authors would like to thank Brazilian research
loss of crystallinity can be attributed to the effect of agencies CNPq (LCC and JG) and CAPES (FAPF) for
nitrogen implantation combined with the low diffusivity grants received which supported this work.
of substitutional elements such as chromium.12
Some regions of the expanded austenite layer pre- References
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