Presented by Reeta Sharma Moderated by Dr.
Amar Ranjan
Electron microscope is an instrument that used to see the small minute objects which can not be seen with Light microscope
Uses the beam of electron instead of light rays
Since wave properties were associated with beam of electron In 1924 Busch demonstrated that beam of electron could be focused by magnetic field Surrounding the beam These two characteristics of electron beam enabled
Ruska& knoll to construct the first
Transmission electron microscope in 1931
Instrument that uses beam of electrons which are deflected by electromagnetic lenses to form magnified image Gives much better resolution Having magnification power up to 10 lacks
High velocity homogenous beam of electrons passes through the specimen the emergent beam of electron is refracted by electromagnetic system to form magnified image
Numerical aperture of Electron microscope is 0.01
Resolution is smallest distance between two close points resolved by an instrument
In optical terms
R = Wavelength of electron / 2 N.A.
R = Resolution of microscope N.A. = Numerical aperture of objective lens
Magnification power of the microscope is power to produce highly magnified image of small minute objects MAGNIFICATION= EYE PIECE X OBJECTIVE
Electron gun Electromagnetic lenses Microscope column Electrical system Vacuum system chiller
Electron gun is Responsible for generation of electrons
PARTS OF ELECTRON GUN
FILAMENT May be of Tungsten & lanthanum hexabromide
v shaped in structure
WehnAlt shield apertured electrode
covering filament
- carries higher negative voltage
ANODE Aperture disk positioned as
short distance away from shield
Arranged in column of Electron microscope Surrounded by cooling piles
Consist of evacuated metal tube in which electron aligned over one another
Tungsten filament enclosed between anode & cathode plates , electromagnetic lenses, viewing screen in which image formed
Electrical system comprises of
High tension power supply Stabilize dc supply for lenses SMP supply for computer system
Vacuum system is necessary for the reasons(i) Electrons travel few micrometer in air before they stopped by collision with gas molecule
- As the distance between electron gun &image translating system is 1m ,EM -4 will operate with vacuum of 1.3 10 Pa
(ii) In absence or low vacuum, the life of filament is reduced due to oxidation , so EM column should be evacuated (iii) Gas molecule present in between the filament and anode will convert negatively charged particle into positively charged ions - bombardment with electrons Result the production of continuous discharge
Chiller is responsible for maintaining low temperature around
Electromagnetic lenses
Deflection coils
High voltage generator
Transmission electron microscope {TEM} Scanning electron microscope {SEM}
Transmission electron microscope - most common type of electron microscope - Having high resolution power
- Form two dimensional image
- Uses Tungsten bulb as light source
TRANSMISSION ELECTRON MICROSCOPE
Scanning electron microscope
PRINCIPLE
- Beam of electron scans the specimen - Secondary electron reflected is collected by secondary electron detector - then passed through photomultiplier to CRT where picture is displayed
SCANNING ELECTRON MICROSCOPE
3D image is formed
Thin and thick both sections can be used
Light source : Lanthanum hexabromide
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