Near-field scanning optical microscopy (NSOM) allows the collection of near-field information by scanning a subwavelength probe within nanometers of a sample surface. There are two main types of NSOM: aperture NSOM uses optical fiber tips with a metal-coated aperture to guide light and provide confinement, achieving 10-100nm resolution; apertureless NSOM relies on light scattering from the metallic AFM tip to radiate a field, achieving higher 1-20nm resolution without background signals but does not allow local excitation/detection. Both techniques transfer near-field data at the probe to far-field detectors.
Near-field scanning optical microscopy (NSOM) allows the collection of near-field information by scanning a subwavelength probe within nanometers of a sample surface. There are two main types of NSOM: aperture NSOM uses optical fiber tips with a metal-coated aperture to guide light and provide confinement, achieving 10-100nm resolution; apertureless NSOM relies on light scattering from the metallic AFM tip to radiate a field, achieving higher 1-20nm resolution without background signals but does not allow local excitation/detection. Both techniques transfer near-field data at the probe to far-field detectors.
Near-field scanning optical microscopy (NSOM) allows the collection of near-field information by scanning a subwavelength probe within nanometers of a sample surface. There are two main types of NSOM: aperture NSOM uses optical fiber tips with a metal-coated aperture to guide light and provide confinement, achieving 10-100nm resolution; apertureless NSOM relies on light scattering from the metallic AFM tip to radiate a field, achieving higher 1-20nm resolution without background signals but does not allow local excitation/detection. Both techniques transfer near-field data at the probe to far-field detectors.