Professional Documents
Culture Documents
Submitted by:
Komal Yadav and Sarita Dhakar
(Master Of Science)
1. What is AFM 11. Types of Fibre
2. Background of AFM 12. Abilities
3. The First AFM Device 13. Experimental Procedure
4. Components 14. Advantages
5. Principle 15.Disadvanatges
6 Modes of Tip Pointer 16. Comparison
7.AFM Tips 17. Applications
8. Origin Of intermolecular Forces 18. References
9. Mechanism
10. Imaging Modes Of Operation
SCANNING PROBE MICROSCOPY
FAMILY
Scanning
ATOMIC SCANNING Near- Field
FORCE TUNNELING Optical
MICROSCOPY MICROSCOPY MICROSCOPY
• Atomic Force Microscopy is a very-high-
resolution type of SCANNING PROBE
MICROSCOPY
• Resolution on the order of fractions of a nanometer,
more than 1000 times better than the Optical
Diffraction limit.
The AFM was invented by IBM scientists- Gerd
Binnig and Heinrich Rohrer in 1981.
Earned them the 1986 Nobel Prize for Physics.
The first commercially available atomic force
microscope was introduced in 1989.
Components
1. LASER diode
2. Mirror
3. Position Senstive
Photo Detector
4. Cantilever
5. Probe Tip
6. Piezoelectric
Scanner
7. Computer
AFM TIPS
Functioning of Tip
PRINCIPLE
It is based on the
microscopic technique in
which a laser beam is
focused on the back of
cantilever that moves up
and down on the Surface
and the deflections of the
beam are captured by a
diode.
Beam Deflection Detection
SCANNING MODES:
Contact Mode: Hard Stable Sample in
air or Liquid
Non-Contact Mode: Non invasive
sampling.
Tapping (Intermittent contact): No
shear and damaging Samples
Origin of Intermolecular Force
Range of Force- 10-13 – 10-06 N.
The interaction Force b/w the sample and
the tip originates due to attractive vander
wall’s interaction.
Between two molecules- attractive- 1/r6
Between Two surfaces – scaling or decay
shows – 1/r2.
MECHANISM:
Imaging Modes of Operation
Scanning of the Sample Surface
Three-dimensional AFM images