Product Assurance Test Design S

R&D LGEIL R&D/TL QA/HOD

A I
G G
R
LG Electronics India P. Ltd. N
E Prepared by :
E
Model New Feature: -
Basic model
Name
Chassis Grade
Name

TEST PLAN Date:-

Classification:-Test required • Test not required x

Duratio Point Point
Min Application
S. No. TEST ITEM n, Purpose Of Test from from
Qty
Days DV PV MP DRBFM FFR
A As per F0 Std
F0-3002 Starting Characteristics Test 1 2

F0-3003 Cycling Test 2 3

F0-3004 Pulldown Test 1.5 2

Leakage Current/HV-IR / Ground
F0-3005 0.5 1
continuity Test
F0-3006 Voltage Alteration Test 2 2

F0-3007 Ice Making Test 1 2

F0-3008 Defrost Test 5 2

F0-3008 Low Amb Defrost Test 10 2

F0-3009 Dew-Adhesion Test 1.5 2

F0-3010 Temperature Distribution Test 2 2

F0-3011 Noise & Sound Level Test 1 2

F0-3012 Vibration Test 1 2

F0-3013 OLP Non-Operation Test 1 2

F0-3014 OLP Operation Test 2 2

F0-3015 Defrost Water Evaporation Test 4 2

F0-3016 High Humidity Test 1 2

F0-3017 Shield Test 1 2

F0-3018 Charge Determination Test 3 2

F0-3019 Energy Consumption Test 4 3

F0-3020 Ambient Variation Test 3 2

F0-3021 Safety Negligence Test 1 2

F0-3022 Aesthetic Strength Test 1 2

F0-3023 Structural Test 1 2

F0-3024 Odor Test 3 2

F0-3025 Load Test 5 2

F0-3027 Home Using Condition Test 4 2

F0-3028 Mechanical Strength of Shelves 0.5 2

Door Open/Close & Open Force
F0-3029 6 2
Test(Door endurance test)

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 Product Assurance Test Design S
R&D LGEIL R&D/TL QA/HOD
A I
G G
R
LG Electronics India P. Ltd. N
E Prepared by :
E
Model New Feature: -
Basic model
Name
Chassis Grade
Name

TEST PLAN Date:-

Classification:- Test required • Test not required x

Duratio Point Point
Min Application
S. No. TEST ITEM n, Purpose of test from from
Qty
Days DV PV MP DRBFM FFR
A As per F0 Std
F0-3035 Packing Strength Test 1 2

F0-3036 Gas Leakage Accident Prediction Test 2 2

F0-3038 Hot & Cold Cycle Test 5 2

F0-3038 Cold Negligence Assurance Test 7 2

F0-3039 Freezing Capacity Test 4 2

F0-3040 Voltage Dip Test 1 2

F0-3041 Veg Box Humidity Control Function Test 2 2

F0-3042 Inferred Function Test 1 2

F0-3043 Storage Temperature Test 5 2

F0-3044 Finger & Pin Test 0.5 1

F0-3045 Mechanical Strength Test for Electrical Parts Cover 1 2

F0-3047 Lamp Abnormal Test 1.5 1

F0-3048 Fuse Melting Temperature Test 1 1

F0-3049 Over Voltage Normal Operation Test 1.5 2

B As per ICTS
ICTS/CHM/001 Low Amb. Test 1 2

Internal Condensation Frost Accumulation

ICTS/CHM/002 4 2
& Defrost Water Evaporation Test for

ICTS/CHM/003 OLP Non Operation test 1 2

Internal Condensation Frost Accumulation

ICTS/CHM/004 & Defrost Water Evaporation Test for 4 2
Manual Defrost D.C Refrigerator

ICTS/CHM/005 High Amb. Load Test 1 2

ICTS/CHM/006 Noise ( Sound Power Test) 1 2

ICTS/CHM/007 Load Test for FF Model 2 2

ICTS/CHM/008 Load Test for DC Model 2 2

ICTS/CHM/009 Defrost Water Evaporation Test - FF 4 2

ICTS/CHM/010 Memory Backup Test 3 2

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 Product Assurance Test Design S
R&D LGEIL R&D/TL QA/HOD
A I
G G
R
LG Electronics India P. Ltd. N
E Prepared by :
E
Model New Feature: -
Basic model
Name
Chassis Grade
Name

TEST PLAN Date:-

Classification:- Test required • Test not required x

Application Point Point

Duration, Min
S. No. TEST ITEM Purpose of test from from
Days Qty DV PV MP DRBFM FFR
B As per ICTS
Fuzzy Control Verification Test for Internal
ICTS/CHM/011 1 2
Micom Dash Project FF Models
Super Cool Verification Test for External
ICTS/CHM/012 1 2
Micom Dash Project FF Models
ICTS/CHM/013 Energy Save mode Verification Test 1 2

ICTS/CHM/014 Humidity Resistance Test 2 2

Super Cool Verification Test for Internal Micom
ICTS/CHM/015 1 2
Dash Project FF Models
ICTS/CHM/016 Drop Test 1 1

ICTS/CHM/017 Door Open Force Test 1 2

ICTS/CHM/018 Transportation Worthiness Test 1 2

ICTS/CHM/019 Transportation Worthiness Test for CKD Parts 1 2

ICTS/CHM/020 Anti ripening test/ Disinfectant test 5 2

ICTS/CHM/021 Temperature Retention Test FF 1 2

ICTS/CHM/022 Temperature Retention Test DC 1 2

ICTS/CHM/023 Stacking test 5 1

ICTS/CHM/024 Low amb Defrost test 15 2

ICTS/CHM/025 Cold start ability test 2 2

ICTS/CHM/026 Dispend water temp & ice making test 5 2

ICTS/CHM/027 Customer usage test-DC 3 2

ICTS/CHM/028 Anti Bacterial agent effectiveness test -FF 5 2

ICTS/CHM/029 Customer usage test-FF 5 2

ICTS/CHM/030 Low & High Voltage customer test 2 2

ICTS/CHM/031 Internal condensation & frost accumulation test 4 2

ICTS/CHM/032 OLP operation test 1.5 2

ICTS/CHM/033 Dew-Adhesion Test 2 2

ICTS/OUT/001 ESCR Test 7 2

ICTS/OUT/002 Water Discharge Test 5 2

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 Product Assurance Test Design S
R&D LGEIL R&D/TL QA/HOD
A I
G G
R
LG Electronics India P. Ltd. N
E Prepared by :
E
Model New Feature: -
Basic model
Name
Chassis Grade
Name

TEST PLAN Date:-

Classification:- Test required • Test not required x

Duratio Point Point
Min Application
S. No. TEST ITEM n, Purpose of test from from
Qty
Days DV PV MP DRBFM FFR
B As per ICTS
ICTS/OUT/007 Compressor Reliability Test 90 1

ICTS/OUT/008 Kangaroo Tray Tilt Test 1 1

ICTS/OUT/009 Door Basket (small) Movement Test 1 1

ICTS/OUT/010 Door load Tilt Test 1 1

ICTS/OUT/011 Cover TV Mechanical Strength Test 1 1

C As per ISO & other Export Stds
C1 Testing air-tightness of doors, lids or drawer seals 1 2

C2 Testing opening force of doors or lids 1 2

C3 Testing the durability of doors, lids and drawers 1 2

C4 Testing mechanical strength of shelves and similar components 1 2

C5 Storage Temperature Test 8 2

C6 Water vapor condensation Test 2 2

C7 Energy Consumption Test 7 2

C8 Temperature rise Test 2 2

C9 Freezing Capacity Test 5 2

C10 Ice Making Test 2 2

C11 Pulldown Test 1.5 2

D As per AS/NZs
As/NZs:1997 Pulldown Test 1 2

As/NZs:1997 Energy Consumption Test 3 2

As/NZs:1997 Volume Measurement Test 2 2

As/NZs:1997 Ice Making Test 1 2

E As per IS
E1 Testing air-tightness of doors, lids or drawer seals 1 1

E2 Testing opening force of doors or lids 1 1

E3 Testing the durability of Hinges& handles of doors & lids 1 1

E4 Testing mechanical strength of shelves and similar components 1 1

E5 Storage Temperature Test 8 2

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 Product Assurance Test Design S
R&D LGEIL R&D/TL QA/HOD
A I
G G
R
LG Electronics India P. Ltd. N
E Prepared by :
E
Model New Feature: -
Basic model
Name
Chassis Grade
Name

TEST PLAN Date:-

Classification:- Test required • Test not required x

Duratio Point Point
Min Application
S. No. TEST ITEM n, from from
Qty
Days DV PV MP DRBFM FFR
E As per IS
E6 Water vapor condensation Test 2 2

E7 Energy Consumption Test 6 2

E8 Temperature rise Test 2 2

E9 Pulldown Test 1 2

E10 HV/IR / Ground continuity Test 1 2

E11 Ice Making Test 1 2

F General Measurements
F1 Cabinet structural Measurement 3 1

F2 3F/CSI check 1 1

F3 PL / Safety check 1 1

F4 Function & feature test 1 1

F5 Voltage variation test 3 2

F6 STLT test 14 2

F7 *Surge Test As per IEC 1 1

F8 *ESD check 1 1

F9 * EMI /EMC check 1 1

F10 Reliability Test 150 2

F11 Service check 1 1

F12 Cabinet Weight Measurement 1 1

F13 Foam Density 1 1

Total

Note: ->
1)Test will be selected event wise based on change content
2) Performance Sample can be used for Reliability testing
3)Compliance test Items require min 03 samples.
4) If any Test was rejected in Pervious stage , test to be reverfiy in Next event
* Test to be done in Division or ERTL Lab

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