Professional Documents
Culture Documents
E
lectronic
Equipment for
Measuring and
Control
Course nr. 2
STRUCTURE AND GENERAL CHARACTERISTS FOR ELECTRONICS
EQUIPMENTS FOR MEASURING AND CONTROL
y= a+k x (1.3)
β = arctg k
a
x
0
Fig. 1.3
xmin and to xmax values or limits from ymin and from ymax is
working range of the item. Working range on measuring input x
is given by (1.4):
y
Real characteristic
Fig. 1.5
b. Choose right and plot that best fit the actual feature of the
item using a criterion determined.
The most common is the criterion of least squares, which
minimize the sum of squares of the deviations of the right
vertical chosen to curve or actual data.
y
The near linear
aproximation
y
Real characteristic
Fig. 1.5
c. We establish that:
y x xy x
2 N xy x y
a (1.6) k (1.7)
N x x
2 2
N x 2 x
2
y
The near linear
aproximation
y
Real characteristic
β = arctg k
x
a
x
Fig. 1.5
y x xy x
2
N xy x y
a (1.6) k (1.7)
N x x
2 2
N x 2 x
2
y
Real characteristic
β = arctg k
x
a
x
Fig. 1.5
y
aproximaţia
liniară cea mai
apropiată
y
caracteristica reală
β = arctg k
x
a
x
Fig. 1.5
Transfer coefficient:
1. The ratio of the output range of the element size and the size
of the input range, in which case it is called a transfer medium
or static coefficient ks and is defined by equation (1.8):
y
ks= (1.8)
x
dy y
kd = (1.9)
dx x
The values of ks and kd transfer coefficients depend on the function
y = f (x) and generally varies differently to changes in the quantities x
and y. In the particular case of a linear static characteristics passing
through the origin transfer coefficients are constant and equal
portions to all the values of x and y.
y
Ss= (1.10)
x
The differential sensitivity is:
d y y
Sd = (1.11)
d x x
y / y
Sr = (1.12)
x / x
Meaning that the ratio between the relative variation of the output
quantity and the relative variation of the input quantity. This kind of
approach allows transducers for measuring the comparative study of
the same size, but based on different physical principles. The relative
susceptibility is a dimensionless value.
Temp [ ºC ]
100 water
80 Semiconductor
thermometre
60 Ideal dynamic
response
40 Hg thermometre
20
t [s]
0
10 20
Fig. 1.6
K ( j ) = A ( ) e j ( )
(1.18)
E lectronic
E quipment for
M easuring and
C ontrol
Course nr. 2
STRUCTURE AND GENERAL CHARACTERISTICS OF ELECTRONIC
EQUIPMENTS FOR MEASURING AND CONTROL
Errors of elements
Technical University “Gheorghe Asachi” from Iaşi
Faculty of Electronics, Telecommunications and Information Technology
Real characteristic
n [rot/min]
750 2000
Fig. 1.7
y
y ( % )= 100 (1.20)
y0
The static error that appears when all the measuring conditions
are unchanged between some limits (standard conditions) and
are caused to intern limits of the element or the measuring
device is called instrumental error, constructive or
fundamental.
The static errors that appear when the measuring conditions
differ from standard conditions are called additional errors.
15 V 15 V 15 V
7,5 V 5V
100 kΩ 100 kΩ
V (100 kΩ
Rin = 50 kΩ
100 kΩ)
100 kΩ
Fig. 1.8
y t = f ( xt ) - y ( t ) (1.22)
where:
f(xt ) is the output value y in the static characteristic for the
input value xt at t moment;