Professional Documents
Culture Documents
Measurement of Stress XRD
Measurement of Stress XRD
X-RAY DIFFRACTION
PRESENTED BY
M.NANDHINI
1761032
INTRODUCTION
• X-ray diffraction(XRD) is a well established and accurate
method to investigate residual stresses on the surface layers
of the crystalline materials.
• X-ray diffraction for residual stress measurement is relatively
cost effective and widely available.
• In x-ray diffraction residual stress measurement, the strain in
the crystal lattice is measured, and the residual stress
producing strain is calculated, assuming a linear elastic
distortion of the crystal lattice.
• To determine the stress, the strain in the crystal lattice must
be measured for at least two precisely known orientations
relative to the sample surface.
• X-ray diffraction residual stress measurement is applicable to
materials
that are crystalline
relatively fine grained
produce diffraction of any orientation of the sample surface
that elastic constants are known.
• X-ray diffraction residual stress measurement is unique in that
macroscopic and microscopic residual stresses can be determined
nondestructively.
• Micro and macro stresses can be determined separately by
measuring the peak position and width.
MEASURMENT OF STRESS
DIFFRACTION BASED METHODS
m = 1+ν σᵩ.d₀
E
MEASUREMENT OF RESIDUAL STRESS
• A relation between broadening produced and non-uniformity of
strain is obtained by differentiating Bragg’s law,
• B=∆2θ=-2∆d tanθ, B is extra broadening
• Derivation of basic equation
• σy= F/A, Ԑy=∆L/L= (Lf -L₀)/L₀
• σy= E Ԑy, Ԑx= Ԑz = (Df -D₀)/D₀
• Due to increase in length, D decreases.
• If the material is isotropic,
• Ԑx =Ԑz =-νԐy where ν is Poisson’s ratio.
• This is done by two measurements, viz. one that of strain Ԑ₃, and
the other Ԑᴪ along OB, usually chosen to be 45° to the surface
normal.
Contd…
• Ԑ₃ is derived from spacing dn of planes parallel to the surface.
• Ԑᴪ is derived from spacing di of planes whose normal is inclined
along OB.
Since di, d₀ and dn are nearly equal to each other (di -dn) is small
compared to d₀, d₀ is thus substituted with dn
WILLIAMSON HALL METHOD
• Scherrer has derived an expression for broadening of x-ray
diffraction peaks due to only small cystallite sizes.
• Bsize = kλ
• L cosθ
• k - scherrer constant
• λ – x-ray wavelength
• L- crystallite size
• θ- Bragg’s angle
• B- FWHM
FWHM - Full Width at Half Maximum
The width of the diffraction peak in radians, at a height half-way
between background and the peak maximum.
Contd…
• The lattice strain in the material also causes broadening of the
diffraction peaks, which can be represented by the relationship
• Bstrain = Ƞ tanθ, where Ƞ is the strain in the material.
• From this equation it is clear that peak broadening is due to
crystallite size and lattice strain is increasing rapidly with
increasing θ.
• The width of the diffraction peak is considered as sum of the
widths due to crystallite size and lattice strain
• Br = Bsize + Bstrain
• Br = (kλ /L cosθ)+ Ƞtanθ
• Mutiplying this equation by cosθ we get
• B cosθ = (kλ/L) + Ƞsinθ
Contd…
• The above equation is the Williamson- Hall equation.
• A plot is drawn with sinθ along the x-axis and B cosθ along y-
axis.