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3 of CMP)
Basics of Scattering
X‐Ray Diffraction: formulation of Bragg and Laue
Reciprocal Lattice
Laue Condition and Ewald’s Construction
X‐Ray, Neutron, and Electron
Why should we be interested?
Important terms for crystals
CRYSTAL PLANES AND MILLER INDICES
Lattice
1 2 4
points/cell
Number of
nearest 6 8 12
neighbours
nearest
neighbour
a 3/2 a a/2
distance
Diffracted
wave
a a a
3.0 1.5
6.0
Screen
Constructive interference d
In (a) above it is clear that the planes are the (1,0,0) set of planes.
If the path difference is simply one wavelength the Bragg condition
can be stated as
2d (1,0,0 ) sin
This is a first order reflection. If the path difference is
two wave lengths the Bragg condition becomes
2d (1,0,0 ) sin 2
and the reflection is a second order reflection.
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• A monochromatic beam of X-rays with coherent
radiations incident on a crystal
• The atoms are arranged as sets of parallel planes
and these atoms act as a reflection mirror for X-rays
Relation between plane spacing and
lattice constant
• For a cubic crystal,
STRUCTURE
REFINEMENT
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Diagram Of An Area Detector X-Ray Data Collection System.
Image Plate / CCD
The first crystallographic
data collection systems used Diffracted Beam & Spot
data collection took several days.
modern systems use area detectors
which measure 100s at a time.X-ray Beam
High symmetry can lead to reflections being systematically absent from the
data set. Absent reflections have no measurable intensity. There are two types
of absences, General Absences and Special Absences.
The general absences determine the lattice type;
Primitive (P) has no general absences and no restrictions on h, k or l.
End Cantered (C) h+k=2n+1 are all absent.
Face Cantered (F) only h, k, l, all even or all odd are observed.
Body Cantered (I) h+k+l=2n+1 are all absent.
The special absences refer to specific sets of reflections and are used to
detect the presence of glide planes and screw axes. Some Space Groups
are uniquely determined by special absences but in many cases several
Space Groups will have to be considered.
Computer programs are able to lay out the data in tables with absences
indicated and possible Space Groups can be suggested however the choice of
Space Group will often need much thought.
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Problems with X-ray Crystallography
The Need for Single Crystals - In order to carry out a detailed X-ray structure
determination, it is essential to have a crystal of the material in question.
Many compounds cannot be crystallised and thus are not amenable to
diffraction studies. There are also commercially important materials such
as glasses and many ceramics which owe their unique properties to their
amorphous nature. Being amorphous (no long range order), the structures
of these materials cannot be investigated in detail by diffraction techniques.
Low Temperature Structure Determination – When X-ray data are collected at
low temperature (<-150 ºC) thermal ellipsoids are smaller and better defined.
N.B. bond lengths show very little variation with temperature.
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POWDER X-RAY DIFFRACTOMETRY
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Uses of X-ray Powder Diffraction
In general, powder diffraction data are unsuitable for solving crystal structures.
Some advances have recently been made using the Rietveld method. However
this is far from trivial and it works best in relatively simple cases. It is very difficult
to be sure that the unit cell is correct as the reflections overlap and are difficult to
resolve from one another.
Important advantages and uses of powder diffraction:
1. The need to grow crystals is eliminated.
2. A powder diffraction pattern can be recorded very rapidly and the technique
is non-destructive.
3. With special equipment very small samples may be used (1-2mg.)
4. A powder diffraction pattern may be used as a fingerprint. It is often superior to
an infrared spectrum in this respect.
5. It can be used for the qualitative, and often the quantitative, determination of
the crystalline components of a powder mixture.
6. Powder diffractometry provides an easy and fast method for the detection of
crystal polymorphs. Powder patterns are provided when a drug is being
registered with the FDA. (Polymorphs are different crystal forms of the same
substance.)
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Calculations using X-ray powder diffraction patterns.
For an orthogonal system (a = b = = 90°) the relationship
between
interplanar spacing (d) and the unit cell parameters is given by the
expression:
1 h2 k 2 l 2
2
2 2 2
d ( h, k , l ) a b c
1 (h 2 k 2 l 2 )
2
d ( h,k ,l ) a2
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Important Cubic Lattice Types
Two of the most important cubic lattice types are the NaCl type and the
CsCl type.
In the CsCl structure both ions have coordination numbers of 8 and the structure
is a simple primitive one with no centring.
Formula Cs at centre = 1
8 x 1/8Cl = 1 = CsCl
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Cubic close packed spheres
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The Bragg equation may be rearranged (if n=1)
2
from n 2d sin to 2
sin 2
4d
If the value of 1/(dh,k,l)2 in the cubic system equation above is inserted into
this form of the Bragg equation you have
2 2
sin 2 (h k 2 l 2 )
2
4a
sin 2 A(h 2 k 2 l 2 )
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ANALYSIS OF X-RAY POWDER DIFFRACTION DATA
Question 1
Aluminium powder gives a diffraction pattern that yields the following eight
largest d-spacings: 2.338, 2.024, 1.431, 1.221, 1.169, 1.0124, 0.9289
and 0.9055 Å. Aluminium has a cubic close packed structure and its
atomic weight is 26.98 and l = 1.5405 A .
Index the diffraction data and calculate the density of aluminium.
The Bragg equation, 2d sin can be used to obtain sin, sin
2d
The ccp lattice is an F type lattice and the only reflections observed are those
with all even or all odd indices.
Thus the only values of sin2 in sin 2 A( h 2 k 2 l 2 ) that are allowed
are 3A, 4A , 8A, 11A, 12A,16A and 19A for the first eight reflections.
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Insert the values into a table and compute sin and sin2.
Since the lowest value of sin2 is 3A and the next is 4A the first
Entry in the Calc. sin2 column is (0.10854/3)*4 etc.
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Calculation of a
For the first reflection (for which h2 + k2 + l2 = 3)
sin2 = 3A = 3 ( l2 / 4a2 )
a2 = 3l2 / 4sin2
a = 4.04946 Å = 4.04946 x 10-8 cm.
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The X-ray powder diffraction pattern of AgCl obtained using radiation of
wavelength 1.54Å is shown below. The peaks are labelled with 2θ values
1. for a face centred lattice 3A, 4A , 8A, 11A, 12A and 16A
2. for a primitive lattice 1A, 2A, 3A, 4A, 5A and 6A
The second option is not possible as the first 2 are not in the ratio of 1:2.
To test the first option, divide the first by 3 and multiply the result by 4, 8 etc.
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Density of AgCl
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Preferred Orientation Effects in X-ray Powder Diffraction Patterns
It is possible to calculate the theoretical diffraction pattern if the
crystal structure is known.
Nifedipine
Calculated pattern
Observed pattern
There are no preferred orientation effects here as all reflections have their
expected intensity. pma 2010
Benzoic acid
Calculated pattern
002
Observed pattern
004
• Preferred orientation effects are often observed for needles and plates.
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