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Introduction Experiment Characterization
The experiment Materials used,
XRD, FTIR, UV-Vis
overview sample preparation
04 05
Result & Discussion Conclusion
Data obtained from
the characterization
Introduction
4
Experiment
The Copper Nanowire Synthesis
6
The Copper Nanowire Synthesis
7
Characterization : XRD
Sample preparation for XRD was quite easy as the nanoparticles were in a powder form. The
nanoparticles powder was placed on the top of aluminum slide and spread out to cover up the
specified area. This step is important in order to ensure that a large enough area will be exposed
to the X-rays during data collection.
The mean size of nanocrystals was measured from the broadening of the diffraction peaks
corresponding to the most intensive reflections according to the JCPDS (Joint Committee on
Powder Diffraction Standards) database.
Scherrer equation was used to determine the crystallite size from XRD diffraction pattern
measured for nanoparticles:
where K is the Scherrer constant (shape factor, its value is 0.9), k is the X-ray wavelength (k =
0.154 nm), B is the line broadening at half the maximum intensity (FWHM) in radians, h is the
Bragg angle, (the position of the diffraction peak maximum) and d is the averaged dimension of
crystallites in nanometers.
Characterization : FTIR
FTIR is a rapid, nondestructive, time saving method that can
detect a range of functional groups and is sensitive to changes in
molecular structure. FTIR provides information on the basis of
chemical composition and physical state of the whole sample.
FTIR spectra have long been utilized as a powerful tool to
provide supplementary information on the nature of copper oxides.
The FTIR in this experiment was done on wave number ranging
from 650 /cm to 4000 /cm.
Characterization : UV-Vis
The current study compared dispersibility and light absorption
of the different nanostructures dispersed in aqueous solution.
Samples stabilities were determined with an ultraviolet visible (UV-
vis) spectrometer (Hitachi U – 3900) at wavelength ranging between
300 and 800 nm. The absorbance of the sample is proportional to the
thickness of the sample and the concentration of absorbance species.
UV-vis spectroscopy can be used to monitor the dynamics of the
dispersion process. The wavelength is virtually unaffected by the
ambient conditions of the particles. In addition, UV-vis
spectrophotometry measurements are used to quantitatively
characterize the colloidal stability of the dispersions. Generally,
higher absorbance indicates better dispersion and solubility of
particles in solution.
RESULT AND DISCUSSION
Sample Characterization : XRD
Peaks observed at 2θ values of 29,630 ; 36,490 ;
42,390 ; 61,480 ; 73,620 ; and 77,490 corresponds to
the (110), (111), (200), (220), (311), and (222) planes
of cuprite respectively, indicating the formation of
cubic Cu2O nanocrystals.
35,81257 ; 21,86421 ; 88,24838 ; 17,80657 ;
15,18177
Peaks observed at 2θ values of 43.390, 50.490 and
74.180 correspond to (111), (200) and (220) planes
of metallic Cu.
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