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SEMICONDUCTOR
A pure semiconductor.
H o le s E le c tro n s
100
50
1 0 15 1 0 16 1 0 17 1 0 18 1 0 19 1 0 20
D o p an t C o n cen tratio n , cm -3
The variation of the drift mobility with dopant concentration in Si for
electrons and holes
From Principles of Electronic Materials and
Devices, Third Edition, S.O. Kasap (© McGraw-
Fig 5.19 Hill, 2005)
Ne = N h = N i
Ne- Number of free electrons per unit volume
Nh- Number of holes per unit volume
Ni – Number density of intrinsic carries
2 .4 1 0 1 3 c m -3
Ge
1012
109 1 .4 5 1 0 1 0 cm -3
Si
106
2 .1 1 0 6 cm -3
G aA s
103
2 .5 3 1
3 .5 4 1 .5 2
1 0 0 0 /T (1 /K )
The temperature dependence of the intrinsic concentration.
From Principles of Electronic Materials and
Devices, Third Edition, S.O. Kasap (© McGraw-
Fig 5.16 Hill, 2005)
lo g ( )
S em ic o n d u cto r
R e sistiv ity
LOGARITHMIC SCALE
IN T R IN S IC
M e ta l
lo g(n ) T
E X T R IN S IC
L a ttic e IO N IZ AT IO N
sca tterin g
-3 /2 3 /2
T T
lo g ( ) Im p u rity
sca tte rin g
1 /T
H ig h T em p e ra tu re L o w T e m p e ra tu re
Since each trivalent impurities atom accepts one electron from the
neighboring silicon atom, so it is known as acceptor impurities.
E
CB
Im p u ritie s
fo rm in g CB
E Fn
a band Ec Ec
g (E )
Ev Ev
E Fp
VB
(a ) (b )
Ne = N h = N i
Nh > Ne . In p-type semiconductor
Ne > Nh . In n-type semiconductor
THE DIFFERENCE OF
INTRINSIC EXTRINSIC
SEMICONDUCTOR SEMICONDUCTOR
It is pure elements like It is impure elements.
Ge and Silicon. Ne ≠ N h
Ne = N h High conductivity
Low conductivity Conductivity depends
Conductivity mainly on the temperature as
depend on their well as the amount of
temperature. impurity added in
them.
L igh t
L W
V Iph
E le c tro n D rift
L igh t x
H o le D iffu sio n
H o le D rift
Ex
D iffu sio n F lu x
D rift
N et cu rren t = 0
Non-uniform doping profile results in electron diffusion towards the less
concentrated regions. This exposes positively charged donors and sets up a
built-in field Ex . In the steady state, the diffusion of electrons towards the
right is balanced by their drift towards the left.
From Principles of Electronic Materials and
Devices, Third Edition, S.O. Kasap (© McGraw-
Fig 5.32 Hill, 2005)
h >Eg V o+ V r
E >> Eo
i p h o to
M etal n -S i
W S am p lin g
Vr
R esisto r, R