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AC

FHI

Diffuse Reflectance IR and UV-vis Spectroscopy


Modern Methods in Heterogeneous Catalysis
Friederike Jentoft

December 10, 2004

Outline
I. Background 1. UV-vis, NIR and IR spectroscopy 2. Transmission 3. Specular & Diffuse Reflectance 4. Mie and Rayleigh Scattering Theories 5. Kubelka-Munk Theory II. Experimental & Examples 1. White Standards 2. Integrating Spheres 3. Mirror Optics 4. Fiber Optics

2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

UV- vis- NIR MIR

v electronic transitions, vibrations (rotations) v Diffuse reflectance UV-vis spectroscopy (DR-UV-vis spectroscopy or DRS) v Diffuse reflectance Fourier-transform infrared spectroscopy (DRIFTS)
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Interaction of Light with Sample


scattered light

incident light

transmitted light

reflection at phase boundaries absorption of light v how to extract absorbing properties from transmitted light? v how to deal with reflection and scattering?
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

How to Deal with Reflection (1)

incident light reflection at phase boundaries

transmitted light

v fraction of reflected light can be eliminated through reference measurement with same materials (cuvette+ solvent)
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

How to Deal with Reflection (2)

incident light

transmitted light

reflection at phase boundaries v fraction of reflected light can be eliminated through variation of sample thickness: number of phase boundaries remains the same
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Scattering
v scattering is negligible in molecular disperse media (solutions) v scattering is considerable for colloids and solids when the wavelength is in the order of magnitude of the particle size Wavenumber 3300 to 250 cm-1 12500 to 3300 cm-1 50000 to 12500 cm-1 Wavelength 3 to (25-40) m (700-1000) to 3000 nm 200 to 800 nm

Mid-IR (MIR) Near-IR (NIR) UV-vis

v scattering is reduced through embedding of the particles in media with similar refractive index: KBr wafer (clear!) technique, immersion in Nujol
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Transmittance
I I0

I0 Sample I

if luminescence and scattering are negligible: 1=++ (T) absorptance, absorption factor, Absorptionsgrad transmittance, transmission factor, Transmissionsgrad reflectance, reflection factor, Reflexionsgrad

if we manage to eliminate reflection: 1=+ in this case, the absorption properties of the sample can be calculated from the transmitted light
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Transmitted Light and Sample Absorption Properties

I0 I

I I0

dI = I c dl
dI = c dl I I0 0
I l

decrease of I in an infinitesimally thin layer c: molar concentration of absorbing species [mol/m-3] : the molar napierian extinction coefficient [m2/mol] separation of variables and integration sample thickness: l

2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

I ln = c l I0

Transmitted Light and Sample Absorption Properties

I = = e c l = 1 I0 Ae = B = c l = ln(1 ) A10 = c l = log(1 )

Lambert-Beer Law napierian absorbance Napier-Absorbanz (decadic) absorbance dekadische Absorbanz standard spectroscopy software uses A10!

extinction absorbance

E (means absorbed + scattered light) A (A10 or Ae)

optical density O.D. all these quantities are DIMENSIONLESS !!!!


2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Limitations of Transmission Spectroscopy


50

self-supporting wafers

40
2118 2036

H4PVMo11O40 Cs2H2PVMo11O40 Cs3HPVMo11O40 Cs4PVMo11O40 1379

Transmission (%)

30

2119 2040

10

1934

1632

0 4000 3500 3000 2500 2000


-1

1500

1612

1625

1257

20

CaF2WindowAbsorption

1000

Wellenzahl (cm )
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

But.Reaction with Material Used for Embedding


H4PVMo11O40
Transmission (%) 60
(NaCl) (KBr) (CsCl)

40

20

1083 1073 1059 896 862 788

983 960

1100

1000

900
-1

800

700

Wavenumbers (cm )

v reaction with diluent possible


2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Limitations of Transmission Spectroscopy


0.07 0.06 Transmittance 0.05 0.04 0.03 0.02 0.01 0.00 5000 4000 3000 2000
-1

sulfated ZrO2 after activiton at 723 K

1000

Wavenumber / cm

v transmission can become very low! even in IR regime! v catalysts are fine powders (high surface area) v embedding (KBr) not desirable for in situ studies (heating, reaction)
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Can We Use the Reflected Light?


v instead of measuring the transmitted light, we could measure the reflected light v can we extract the absorption properties of our sample from the reflected light?

Detector

2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Specular & Diffuse Reflection


Reflection of radiant energy at boundary surfaces

mirror-type (polished) surfaces

mat (dull, scattering) surfaces

mirror-type reflection mirror reflection surface reflection specular reflection regulre Reflexion gerichtete Reflexion reflecting power called reflectivity
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

multiple reflections at surfaces of small particles

reflecting power called reflectance

Specular Reflection (Non-Absorbing Media)

incident beam

reflected beam n0 n1>n0

surface SIDE VIEW

n1

refracted beam

v fraction of reflected light increases with v depends on and ratio of the refractive indices (Snell law)
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Specular Reflection: Angular Distribution

incident beam

azimuth 180 azimuth <180 surface TOP VIEW

reflected beam

v the intensity of the specularly reflected light is largest at an azimuth of 180


2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Diffuse Reflection & Macroscopic Surface Properties

v randomly oriented crystals in a powder: light diffusely reflected

v flattening of the surface or pressing of a pellet can cause orientation of the crystals, which are elementary mirrors v causes glossy peaks if angle of observation corresponds to angle of incidence v solution: roughen surface with (sand)paper or press between rough paper, or use different observation angle!
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Light Reflection from Powders: Why is the Distribution Isotropic?


particle diameter d > v light partially reflected on elementary mirrors (crystal facets) inclined statistically at all possible angles to the macroscopic surface v light penetrates into sample, undergoes numerous reflections, refractions and diffraction and emerges finally diffusely at the surface particle diameter d v scattering occurs v Mies theory for single scattering says distribution is not isotropic v multiple scattering should produce isotropic distribution

2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

The Rayleigh Scattering Theory

v according to Rayleigh (Gans, Born) v electromagnetic wave induces vibrating dipole in molecule (i.e. d << ), electrons assumed to be in phase, molecular antenna v dipole emits electromagnetic waves in all directions, i.e. the primary wave is being scattered

I scat

1 4 0

2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

The Mie Scattering Theory


v rigorous theory for single scattering of a planar wave at spherical particles, both dielectric and absorbing, of any size v in the limit of infinite diameter, the Mie theory approaches a scattering distribution as can be obtained from the law of geometrical optics by dealing separately with reflection, refraction, and diffraction

v according to the Mie formula, there is no principle distinction between reflection, refraction, and diffraction on one hand and scattering on the other hand
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Typical Catalyst Particles

ca. 20 m

ZrO2
scanning electron microscopy image

v need theory that treats light transfer in an absorbing and scattering medium v want to extract absorption properties!
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

The Schuster-Kubelka-Munk Theory


Assumptions v incident light diffuse v isotropic distribution (Lambert cosine law valid) , i.e. no regular reflection v particles randomly distributed v particles much smaller than thickness of layer 2 constants are needed to describe the reflectance: absorption coefficient k scattering coefficient s

(1 R ) k F ( R ) = = 2 R s
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Kubelka-Munk function remission function

Kubelka-Munk Function
v mostly we measure R, i.e. not the absolute reflectance R but the reflectance relative to a standard v depends on wavelength F(R) v corresponds to extinction in transmission spectroscopy v in case of a dilute species is proportional to the concentration of the species (similar to the Lambert-Beer law):

c ) F ( R s

2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Deviations from & Limitations of the Kubelka-Munk Theory


incident radiation v should be diffuse and not directed, however, it is assumed that after a few scattering events the distribution is isotropic v directed incident radiation can be a problem on very rough surfaces: shadowing effects any regular reflection v will cause deviation low reflectance values v applicability of Kubelka-Munk theory questionable v smallest error between 0.2 < R < 0.6

2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Transmission vs. Reflection Spectroscopy


v for quantification and to be able to calculate difference spectra: calculate absorbance / Kubelka-Munk function

A = ln T
6

(1 R) 2 F ( R) = 2R
Kubelka-Munk-function

Absorbance / Kubelka-Munk

5 4 3 2 1 0 0.0

Absorbance

0.2

0.4

0.6

0.8

1.0

Transmission / Reflectance
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Transmission vs. Reflection Spectroscopy


1.0

Transmittance or Reflectance

0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0.0 200 400

TC+A

TC+A

A = ln T
1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0.0 200

600
1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0.0

800

(1 R ) 2 F ( R) = 2R

Wavelength / nm

lower transmission

Kubelka Munk units

Absorbance

lower reflectance

higher transmission

higher reflectance

400

600

800

200

400

600

800

Wavelength / nm
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Wavelength / nm

Spectroscopy in Transmission
Catalyst

Light Source

Detector

reference nothing = void, empty cell, cuvette with solvent

spectrum: transmission of catalyst vs. transmission of reference

v in IR transmission is widely applied for solids v in UV-vis transmission is rarely used for solids
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Reflectance Spectroscopy
Light Source

Catalyst

reference white standard spectrum: reflectance of sample (catalyst) vs. reflectance of standard

Detector

v need element that collects diffusely reflected light v need to avoid specularly reflected light v need reference standard (white standard)
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

White Standards

v KBr: v BaSO4: v MgO:

IR (43500-400 cm-1) UV-vis UV-vis

v Spectralon: UV-vis-NIR

2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

White Standard MgO

v ages rapidly

2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

White Standard BaSO4


100 90 % Reflectance 80 70 60 50 40 0 500 1000 1500 2000 2500

Wavelength / nm

v reflects well in range 335 1320 nm v humid!


2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

White Standard Spectralon

Spectralon thermoplastic resin, excellent reflectance in UV-vis region

2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Gray Standards
100 Reflectance % 80 60 40 20 0
"20%=" 20Sp vs. Sp. "50%=" 50Sp vs. Sp. 100%= Sp vs. Sp.

500

1000

1500

2000

2500

Wavelength / nm

2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

The Collection Elements

v integrating spheres (UV-vis-NIR) v fiber optics (UV-vis-NIR) v mirror optics (IR and UV-vis-NIR)

2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Integrating Spheres
v also called: photometer spheres, Ulbricht spheres

fm fM 1 I P = I 0 W P K 2 F 1 K
F total internal surface of sphere fm,,fM relative fractions of measuring surface and opening aperture W absolute reflectance of wall P absolute reflectance of sample K absolute reflectance of sphere S screen blocks regular reflection

f + fE + fP fP K = 1 M + P W F F
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Integrating Spheres: Coatings

v BaSO4: UV-vis v MgO: UV-vis v Spectralon: UV-vis-NIR v Au: 800 nm to MIR

2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

In Situ Cell & Integrating Sphere


top view

v beam path equivalent for sample and reference beam v spectrometer background correction can be used v window (Suprasil or Infrasil): absorbs and reflects light
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Catalyst Deactivation: in situ UV-vis Spectroscopy


sulfated zirconia, 358 K 1.4 5 vol% n-butane

0.8 Reflectance 0.6 0.4 0.2 0.0 300 difference 400 500 600 700 800 after activation after reaction

250 200 150 100 50 0 0

1.2 1.0 0.8 0.6 0.4 0.2

60

120

180

240

300

360

0.0

Wavelength / nm

Time on stream / min

v formation of additional bands during n-butane isomerization v band at 310 nm, allylic cations? Analyzed using apparent absorption A=1-R v spectroscopic and catalytic data can be correlated
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Band area at 310 nm / a.u.

sulfated zircona, 378 K 5 vol% n-butane

-1 h-1 Rate of formation / mol g

1.0

300 isobutane propane

Mirror Optics
v can be placed into the normal sample chamber (in line with beam), no rearrangement necessary v good in IR v some disadvantages in UV-vis

2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

How to Avoid Specular Reflection (1)


SIDE VIEW TOP VIEW 120 90

sample surface

sample surface

v specular reflection is strongest in forward direction v collect light in off-axis configuration

2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

The Harrick Praying Mantis


v first ellipsoidal mirror focuses beam on sample v second ellipsoidal mirror collects reflected light v 20% of the diffusely reflected light is collected

alignment can be tested v align with flat mirror (= only specular reflection): minimize throughput v align with tilted mirror: maximize throughput
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Mirror Optics: Throughput in MIR Range

v throughput measured with tilted mirror v mirror optics work well in the IR range.
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Mirror Optics: Throughput in UV-vis-NIR Range


80 70 % Reflectance 60 50 40 30 20 10 0 0 500 1000 1500 2000 2500 Wavelength / nm
tilted mirror in sampling position
BC (100%): empty versus empty CBM=90 integration time NIR=0.24, UVvis=0.2 data points 1 per 1 nm (ca. 240 nm/min) slit 2 nm, gain (NIR) 1

8 June, 2004, Lambda 950, PERKIN ELMER Alignment Harrick Praying Mantis

v aluminum coating of mirrors absorbs light! Here: 7 mirrors v spectra will be more noisy in region of low throughput
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

The Harrick Praying Mantis Reaction Chamber

v quartz windows (high pressure version available) v up to 873 K (lot T version with Dewar available) v powder bed rest on stainless steel grid: flow through bed
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

v low dead volume

Mirror Optics: UV-vis-NIR Range with Quartz Dome and Spectralon


80 70 60 % Reflectance 50 40 30 20 10 0 0 500 1000 1500 2000 2500
Wavelength / nm
tilted mirror in sampling position reaction chamber with spectralon and dome
BC (100%): empty versus empty CBM=90 integration time NIR=0.24, UVvis=0.2 data points 1 per 1 nm (ca. 240 nm/min) slit 2 nm, gain (NIR) 1

8 June, 2004, Lambda 950, PERKIN ELMER Alignment Harrick Praying Mantis

v very low light yield


2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

v need spectrometer that works well under these conditions

Mirror Optics: UV-vis-NIR Range with Quartz Dome and Spectralon


10 9 8 % Reflectance 7 6 5 4 3 2 1 0 0 500 1000 1500 2000 2500
tilted mirror in sampling position reaction chamber with spectralon and dome

Wavelength / nm

v an attenuator may be necessary in the reference beam v artifacts from change of optical components (gratings, filters, detectors, lamps) may become visible
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Example: Catalyst Activation


9 June, 2004, Lambda 950, PERKIN ELMER cat.: AH222, heating in N2 from 50-500C (5 K/min)
Temperature / C 64 66 100 125 148 170 197 222 244 267 292 314 344 366 393 416 441 465 488 498 500 500

160 120 80 40 0

BC with different parameters!

% Reflectance

BC (100%): spectralon + dome versus 10%T CBM=90 integration time NIR=0.08, UVvis=0.08 data points 1 per 1 nm (ca. 570 nm/min) slit 2 nm, gain (NIR) 2

600

1200

1800

2400

Wavelength / nm

v UV-vis NIR gives information on valences and water content


2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Diffuse Reflectance IR (DRIFTS): Graseby Specac Selector Optics and Environmental Chamber

v ZnSe window (chemically resistant) v up to 773 K v no flow through be (rest in cup) v large dead volume (est. 100 ml)
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Comparison Transmission - Diffuse Reflectance


0.07 0.06 Transmittance 0.05 0.04 0.6 0.03 0.02 0.01 0.00 5000 4000 3000 2000
-1

sulfated ZrO2 after activation at 723 K

1.2 Transmission: self-supporting wafer Reflectance: powder bed 1.0 0.8 Reflectance

0.4 0.2 0.0 1000 Wavenumber / cm

v spectra can have completely different appearance v transmission decreases, reflectance increases with increasing wavenumber
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Comparison Transmission - Diffuse Reflectance


5.0 4.8 4.6 4.4 4.2 4.0 3.8 3.6 3.4 3.2 3.0 5000 0.0 4000 3000
-1

sulfated ZrO2 after activation at 723 K

Transmission: self-supporting wafer 1.0 Reflectance: powder bed


0.8 0.6 0.4

Absorbance ANapier

OH vibrations

SO vibrations
0.2

2000

Wavenumber / cm

v vibrations of surface species may be more evident in DR spectra


2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Kubelka-Munk Function

n-Butane Isomerization over MnSZ: In Situ DRIFTS


1.2 Kubelka-Munk units 1.0 0.8 0.6 0.4 0.2 0.0 1700 1650 1600 -1 Wavenumber / cm 1550 1630 1600
-1

1 kPa n-C4 323 K


Time on stream

250 200 150 100 50 0 0 10 20 30 40


-1

50 2% Mn-promoted sulfated zirconia, 323 K 40 30 20 sulfated zirconia, 358 K 10 0 50


-1

Isobutane formed / mol g h

-1

60

Band area (1600+1630 cm ) / cm

v bands at 1600 and 1630 cm-1 increase

v Rate of isomerization proportional to the amount of water formed v also range of C=C stretching vibrations, (induction period) but corresponding CH vibrations not ob
served v water bending vibration
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Fiber Optics

v light conducted through total reflectance v 6 around 1 configuration: illumination through 6 (45), signal through 1 avoids collection of specularly reflected light
2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

pictures: Hellma (http://www.hellma-worldwide.de) and CICP (http://www.cicp.com/home.html)

Fiber Optics

v fibers need to be coupled into spectrometer beam bath v problems: losses at couplers

picture: Hellma (http://www.hellma-worldwide.de) example shows transmission fiber 2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Summary

2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

Literature

v W. WM. Wendlandt, H.G. Hecht, Reflectance Spectroscopy, Interscience Publishers/John Wiley 1966, FHI: 22 E 13 v G. Kortm, Reflectance Spectroscopy / Reflexionsspektroskopie Springer 1969, FHI: missing

2004 F.C. Jentoft, Fritz-Haber-Institut der Max-Planck-Gesellschaft

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