This document contains a list of 13 experiments to be conducted in the B.Tech II Year EDC lab in 2012-2013. The experiments include measuring the forward and reverse bias characteristics of a diode, the characteristics of a transistor in CB configuration, half-wave and full-wave rectifiers with and without filters, FET characteristics, measuring the h-parameters of a transistor in CE configuration, and measuring the frequency response of various amplifiers including CE, CC, and common source FET amplifiers. The list is signed by the head of the ECE department.
This document contains a list of 13 experiments to be conducted in the B.Tech II Year EDC lab in 2012-2013. The experiments include measuring the forward and reverse bias characteristics of a diode, the characteristics of a transistor in CB configuration, half-wave and full-wave rectifiers with and without filters, FET characteristics, measuring the h-parameters of a transistor in CE configuration, and measuring the frequency response of various amplifiers including CE, CC, and common source FET amplifiers. The list is signed by the head of the ECE department.
This document contains a list of 13 experiments to be conducted in the B.Tech II Year EDC lab in 2012-2013. The experiments include measuring the forward and reverse bias characteristics of a diode, the characteristics of a transistor in CB configuration, half-wave and full-wave rectifiers with and without filters, FET characteristics, measuring the h-parameters of a transistor in CE configuration, and measuring the frequency response of various amplifiers including CE, CC, and common source FET amplifiers. The list is signed by the head of the ECE department.
(Good) Ian H. Witten, Eibe Frank, Mark A. Hall Data Mining - Practical Machine Learning Tools and Techniques, Third Edition (The Morgan Kaufmann Series in Data Management Systems) 2011