This Is An Optical Illusion..

Vol. 19, No.
2 The Newsletter of the Measurement Quality Division, American Society for Quality June 2005
This is an optical illusion...

This is not! See inside for details...
The Standard TABLE OF CONTENTS
Vol 19, No. 2, June 2005 CHAIR’S COLUMN ......................................................................3
CHAIR-ELECT’S COLUMN ........................................................4
Editor and Publisher
Jay L. Bucher
CCT UPDATE ................................................................................6
6700 Royal View Dr. METROLOGY COMMUNITY NEWS .........................................6
De Forest, WI 53532-2775 THE METROLOGY HANDBOOK..................................................7
Voice: 608-277-2522 ASQ RECERTIFICATION PRIMER ............................................8
Fax: 608-846-4269 THE STANDARDS COMMITTEE ACTIVITY ...........................9
Email: yokota-69@charter.net
or jay.bucher@promega.com
THE LEARNING CURVE...........................................................10
THE LEARNING CURVE...........................................................11
Advertising ANNOUNCEMENTS...................................................................12
Submit your draft copy to Jay Bucher, with a METROLOGY JOB DESCRIPTION INITIATIVE ....................13
request for a quotation. Indicate size desired. MQD MEETING MINUTES .......................................................15
Since The Standard is published ‘in-house’ EVENTS CALENDAR ................................................................16
the requester must submit a photo or graphic
of their logo, if applicable. The following
MQD SPONSORED NCSLI SESSION .......................................21
rates apply: CORRECT & IMPROVED GAGE R&R MEASUREMENT
Business card size ............................ $100 STUDIES ......................................................................................22
1/8 page .......................................... $150 MQD OFFICERS AND COMMITTEE CHAIRS .......................33
1/4 page ........................................... $200
1/3 page ........................................... $250
½ page ............................................. $300
Full page ......................................... $550 FROM THE DESK OF THE EDITOR/PUBLISHER
Advertisements will be accepted on a ‘per
issue’ basis only; no long-term contracts will In this edition, you’ll find a double dose of The Learn-
be available at present. Advertising must be ing Curve, columns 40 and 41, beginning on pages 10
clearly distinguished as an ad. Ads must be and 11, respectively. Also, I’ve done most of my edito-
related to measurement quality, quality of rializing in my column on The Metrology Handbook.
measurement, or a related quality field. Ads Not enough space here, so I took the liberty of using
must not imply endorsement by the Measure- the available space. Our illustrious Chair, Dilip Shah
ment Quality Division or ASQ. gives his out-going remarks, while the Chair-elect,
Graeme Payne (it is pronounced ‘pain’...a little humor
Letters to the Editor from a friend; read his column and you’ll understand)
The Standard welcomes letters from mem- introduces himself and gets off to a running start. We
bers and subscribers. Letters should clearly also have a reprint from Professor, Dr. Donald S. Ermer. I may not be cor-
state whether the author is expressing opin- rectly using his titles in the previous sentence, but at least we published his
ion or presenting facts with supporting infor- important article. Thanks, Don, for resubmitting. I again ask our readers
mation. Commendation, encouragement,
constructive critique, suggestions, and alter-
for their submissions. Just email me, and we will go from there. Enjoy!
native approaches are accepted. If the con-
tent is more than 200 words, we may delete
portions to hold that limit. We reserve the The Standard is published quarterly by the Measurement Quality Division of
right to edit letters and papers. ASQ; deadlines are February 15, May 15, August 15 and November 15. Text infor-
mation intended for publication can be sent via electronic mail as an attachment in
Information for Authors MS Word format (Times New Roman, 11 pt). Use single space between sentences.
The Standard publishes papers on the qual- Graphics or illustrations must be sent as a separate attachment, in jpg format. Pho-
ity of measurements and the measurement of tographs of MQD activities are always appreciated. Publication of articles, product
quality at all levels ranging from relatively releases, advertisements or technical information does not imply endorsement by
simple tutorial material to state-of-the-art. MQD or ASQ. While The Standard makes every effort to ensure the accuracy of
Papers published in The Standard are not
articles, the publication disclaims responsibility for statements of fact or opinion
referred in the usual sense, except to ascer-
tain that facts are correctly stated and to as- made by the authors or other contributors. Material from The Standard may not be
sure that opinion and fact are clearly distin- reproduced without permission of ASQ. Copyrights in the United States and all
guished one from another. The Editor re- other countries are reserved. Website information: MQD’s homepage can be found
serves the right to edit any paper. at http://www.asq.org/measure. © 2005 ASQ, MQD. All rights reserved.
June 2005 The Standard MQD
CHAIR’S COLUMN For all these activities to happen, we require a core

group of volunteers. We have a good group that
By Dilip Shah has provided these success stories. Yet, we can al-
This is my last column in ways use more volunteers to mentor and provide
my capacity as Measure- for succession planning. Therefore, I am asking
ment Quality Division you to consider the Chair-Elect, Graeme’s plea for
Chair. I have not known more volunteers in his column.
how fast my time has
flown by. That means Graeme is part of the success story behind this di-
that I had very good ex- vision and I wish him well and I urge the division
periences working with to support him in his capacity as Division Chair as
the volunteers at the di- you have supported me.
vision and national level.
I have had an opportu- I would like to thank the many folks on the Divi-
nity to meet some of you sion Council who have helped the MQD in its suc-
at various conferences and events. cess story:
Many things have happened during my term as Di- • The late Phil Stein for coaxing me into the Chair
vision Chair. The CCT exam has really taken off. Position. He knew what was good for me before I
The latest news from the certification department knew it. Phil always delivered what he said he
was that a record 223 candidates had signed up to would. He was a good mentor and is sorely
take the June 2005 exam. The Division sponsored missed.
the publication of its first book under the auspices • Chris Grachanen for being who he is. A selfless
of ASQ’s Quality Press. The Metrology Handbook individual who has spent countless hours promot-
has had very good press reviews. As we go to ing various metrology causes (freeware Uncer-
press, it will be ready for its second print run. We tainty Calculator software; bringing the Certified
are leading efforts to classify metrology profes- Calibration Technician exam from an idea to re-
sions under the Department of Labor job listing. ality; and The Department of Labor Job Classifi-
This opportunity comes once every 10 years and it cation). Chris also has a day job at Hewlett Pack-
is imperative that we do it now or we have to wait ard.
another ten years for proper classification of me-
trology professionals. • Jay Bucher for leading The Metrology Handbook
project. Writing this handbook with eight co-
We had our first Division Conference in 5 years, authors across the country was a challenge that
jointly with the Inspection Division in September he managed with success. A perfect example of a
2004 in Heath, Ohio. This event attracted members good project management study to benchmark.
from both divisions and received very good feed-
back • Graeme Payne for his patience and wisdom when
working on The Metrology Handbook project and
We have increased our publicity by hosting ses- being able to deliver excellent written work for
sions at the Measurement Science Conference submission to Quality Progress.
(MSC) and the National Conference of Standards
• Duane Allen (Immediate Past Chair): For letting
Laboratories (NCSL) International. We have coop-
me develop into the Chair position and being
erated with these two fine organizations where we
there when needed and staying out of the way
have synergy to ensure that the metrology profes-
when not needed. I have valued my friendship
sion benefits from these activities. We have repre-
with Duane that has developed over the last two
sentation on Standards Committees that we sup-
years.
port. We continue to support the Joe Simmons
Scholarship co-sponsored by the Division, MSC (Continued on page 22)
and the NCSLI.
Vol. 19, No. 2 The Newsletter of the Measurement Quality Division, American Society for Quality Page 3
Chair-Elect’s Column issue, nor is it unique to MQD. I noted that past

Chairs Duane Allen and Mark Schoenlein wrote
Graeme C. Payne
about the same thing in the Fall 2000 issue of The
Standard. I saw the same challenge as a Section
I want to take a few min-
utes to introduce myself, Chair 10 years ago, and in a few other places and
and some information that I organizations.
have learned about the
Measurement Quality Divi- There are a number of personal benefits to serving
sion. By the time this is MQD as a volunteer. The primary one I see is the
published I may have met personal satisfaction derived from doing work that
you and other members of benefits the Division, the metrology community at
the Division in Seattle but I large, and ASQ. Another benefit is the opportunity
am reasonably confident to expand your network of professional contacts.
that not everyone will have For many people, volunteer work is an opportunity
been there. to develop leadership, management and communi-
cation skills. Another important benefit of ASQ
I know that people I have not met – that is, most of volunteer service is recertification points. Finally,
you – first want to know how to pronounce my if you, like me, have an employer that does not
name. Just say it as if it is spelled “graham”. The give financial support for your ASQ work it is also
variation in spelling is regional; “Graham” is from an opportunity to accumulate deductible expenses
Scotland and “Graeme” is from southern England, and increase your income tax refund. An important
where I was born. The name with my spelling is benefit to the Division is the vitality developed
common in England, somewhat less common in from new ideas from new volunteers.
Canada, Australia and New Zealand, and very rare
in the United States. The Measurement Quality Division has many op-
portunities for volunteer work. The bylaws man-
While preparing to take over as Chair in July, I date a leadership team composed of the elected
have been reviewing the state of the Measurement officers, standing committees and regional council-
Quality Division, who we are and what we do. I ors; and the Division has created additional com-
have been reading the bylaws, policies and proce- mittees for certain tasks. We also have an ongoing
dures; double-checking various lists of volunteers; need for members who are Certified Calibration
reviewing old copies of The Standard to see what Technicians to review and maintain the CCT ex-
previous Chairs have said and done; talking with amination and body of knowledge.
several of you, and so on. Even though I have been
a member of the Division since 1991, I did find a Another thing I learned in my review was the num-
few things that surprised me. For example, I am ber and variety of volunteer opportunities in the
sure you know that ASQ is a global organization. Division. I had been aware of only a few, so I want
A quick look at the MQD membership list shows to briefly list the volunteer positions. They fall into
that almost 87% of our members are in the USA, categories of elected officers, roles listed as re-
including Puerto Rico and military members sta- quired in the bylaws, and other committees estab-
tioned overseas. Another 5.6% of our members are lished by the leadership team.
in Canada, spread from the Maritime provinces to
British Columbia. The rest of our members are lo- The MQD leadership team includes all of the
cated in 58 other countries, showing the global na- elected officers, committee chairs and regional
ture of the Division and the global importance of councilors listed below. In addition to the responsi-
metrology. bilities of the function, each of these people should
make every effort to attend the Division leadership
One thing that did not surprise me was the ongoing meetings. The officers are elected for one-year
need for people to volunteer to be active in leader- (Continued on page 5)
ship and committee positions. This is not a new
(Continued from page 4) term development. At least one member must

terms, and the Chair and Treasurer are limited to be a past Chair of the Division.
two consecutive terms in those positions. The by-
laws define several permanent or “standing” com- The bylaws also permit the Division to have Re-
mittees; the chairs of those committees are voting gional councilors, defined as non-voting members
members of the leadership team. of the Division leadership team. As well as being
advisory members of the leadership team, they are
Chair: the chief executive of the Division. Cannot a local point of contact for members, organizations
serve more than 2 consecutive terms. and other parties in their regions. We should have
Chair-Elect: acts as Chair in his/her absence. As- at least one RC for each region, and they may also
sists the Chair in managing the Division. appoint assistants.
Secretary: provides meeting notices, takes minutes
and keeps records. The bylaws allow the Division to create other com-
Treasurer: the financial manager and record-keeper mittees as needed. Committee chairs are appointed
of the Division. Cannot serve more than 2 con- by the Division Chair for a term of 2 years. The
secutive terms. Chairs of these committees are non-voting mem-
Bylaws committee: this committee is to bers of the leadership team. The leadership team
“observe & apply” the bylaws. If changes are can vote to make a committee chair a voting mem-
desired, the committee presents the change to ber of the team; that must be renewed each fiscal
the Division leadership, and manages the year. In this category, we currently have a Certifi-
change approval as it moves through the ASQ cation committee that plans and manages the Certi-
Division Affairs Council, ASQ Bylaws Com- fied Calibration Technician Body of Knowledge,
mittee and finally the ASQ Board of Directors. and the examinations.
Examining committee: this committee nominates
members for grade advancement and awards. MQD also has a volunteer liaison to NCSL Interna-
The committee Chair and all members must be tional. A liaison person reports relevant informa-
Senior Members, ASQ Fellows or Honorary tion between the organizations, serves as a contact
Members. person, and helps coordinate joint activities. I
Nominating committee: this committee accepts would also like to see liaisons to other ASQ Divi-
nominations and searches for candidates for all sions – this is an idea that was first proposed by
of these positions. They have to qualify and Duane Allen several years ago and I believe it still
nominate at least one candidate for each has merit. If you are a member of another Division,
elected office & regional councilor position. consider how metrology affects that area and then
The Division Immediate Past Chair and the consider becoming a liaison volunteer.
Chair-Elect are automatic members of this
committee, and the Immediate Past Chair is the I always encourage participation and feedback.
committee chair. You are the customer of the Division leadership
Programs committee: this committee plans & man- team, and the voice of the customer is just as im-
ages Division events, such as the Fall Techni- portant here as the voices of your customers are to
cal conference and the Division’s participation you. MQD generally has four or five leadership
in the ASQ WCQI, the NCSL International team meetings each year, and any member can at-
Symposium and the Measurement Science tend. All of the meetings can be attended by tele-
Conference. The committee chair is the liaison conference – ask any officer for details. Three of
to the ASQ & Regional Conference Boards. the meetings are held during conventions and can
Publications committee: this committee plans & be attended in person. Those meetings are held dur-
manages Division publications, such as this ing these events:
newsletter. The committee chair is the liaison
to ASQ Publication Management Board. • ASQ World Congress on Quality and Improve-
Strategic Planning committee: this committee is ment (WCQI, formerly AQC), held annually in
responsible for planning the Division’s long (Continued on page 6)
(Continued from page 5)

May. For the purposes of the bylaws, this is
Metrology Community News
considered the Division’s annual meeting.
Note: neither ASQ nor MQD endorses any accred-
• NCSL International Workshops and Sympo-
iting agency, training programs, or institutions;
sium, held annually in August.
and this news is only provided as a service to the
• Measurement Science Conference, held annu-
measurement community.
ally in January, in Anaheim, California. (Due
to venue scheduling conflicts, the 2006 confer-
ence will be in February.)
Fall 2005 Training Course Schedule
Provided by A2LA
Your Division is currently working on several pro-
jects. For example, we held a technical conference Title: Introduction to Measurement Uncertainty
in September 2004 as a joint event with the Inspec-
tion Division, and we are now working on plans for • September 26-27, 2005 – Novi, MI ($795.00,
another one in September 2005 – that will be held $745.00)
in Norco, California. I look forward to supporting November 14-15, 2005 – Orlando, FL ($795.00,
this and other projects in the coming months. $745.00)
Please feel welcome to contact me with your com-
ments, concerns, or offers to help. Title: ISO/IEC 17025 and Accreditation
Graeme C. Payne
• September 28 – 30, 2005 –Novi, MI ($995.00,
E-mail: Graeme@gksystems.biz
$945.00)
Fax: 1-866-887-9344 (USA & Canada only, toll-
November 16-18, 2005 – Orlando, FL ($995.00,
free)
$945.00)
CCT UPDATE Title: Control Charting for Metrology Applica-
By Chris Grachanen tions
MQD Certification Chair
October 3-4, 2005 – Cleveland, OH ($795.00,
ASQ headquarters, $745.00)
in a show of flexibil-
ity and responsive- Title: The World of EMC Standards-Present and
ness for ‘future’ Future
ASQ member needs,
extended the April October 5, 2005 – Cleveland, OH ($395.00,
2005 application $345.00)
deadline for its June
2005 CCT exam offering. This unusual extension Title: Assessment of Laboratory Competence
was granted to accommodate CCT exam applicants
who requested more time in order to get their appli- October 17-21, 2005 – Annapolis, MD ($1595.00,
cation paperwork processed through their com- $1545.00)
pany’s continuing education departments. As of
this writing (early May 2005), there are a total of For additional information, please contact Ms. Julie
233 applicants for the June 2005 CCT exam offer- Stevens, A2LA Training Coordinator, at 301 644
ing, a new record! Previous record for total number 3235 or jstevens@a2la.org.
of CCT exam applicants was 139.
Good luck to those taking the June 2005 CCT
exam but of course luck has little to do with pass-
ing it.
The Metrology Handbook sheet information, and gone to press for its second
printing. How would our illustrious readers know
By Jay L. Bucher which edition they have in their possession? Here’s
Editor & co-author the scoop on identifying which is which. On page
iv (the page opposite the Table of Contents), at the
Allow me to start this edition by top, there is a number code that currently reads as
thanking the readers that took follows: 12 11 10 09 08 07 06 05 04 5 4 3 2 1.
time out of their busy schedules The next printing will change from ‘1’ to ‘2’. So
to provide me feedback on our the last five digits
new electronic edition of The will read 5 4 3 2 2.
Standard. Some items brought At least this is what
to my attention never crossed my acquisition editor
my mind, while others sugges- informs me. Please
tions might have been beat to keep in mind this is a
death long before we went to reprint of the original
press. From the feedback I’ve received, both book, with the cor-
through email and second hand from my fellow rections listed on the
MQD officers, we were not too far off the mark in errata sheet, which
both publishing electronically, and in the format can also be found on
and content. I think a big thank you should go to the MQD website,
Dilip Shah, Graeme Payne, Chris Grachanen, Karl and down loaded for
Wigdal, Keela Sniadach, and Cori Pinchard for free. This is NOT a
their suggestions, comments and reviews. Without revision, incorporat-
the inputs from non-biased members of MQD, I ing new information.
could not have gotten this “rag” off the ground in a When we start any
timely manner. revision, you’ll be the first to hear any calls for
authors, or reviewers, right here in The Standard.
This is the last edition for our current Chair, Dilip
Shah, to grace our publication with his words of Here is another optical illusion...as you fixate on
wisdom, foresight, and guidance. It has truly been a the central dot and move closer and further from
pleasure for me to work with Dilip over the past the page, the pair of circles will appear to rotate.
couple of years; as an SME during CCT work-
shops, a co-author of The Metrology Handbook,
and finally as an officer with the MQD. ‘Thank
you’ doesn’t seem to quite do it justice, but we
have many more years of working together within
the MQD, and on future projects to continue our
friendship. I continue to rely on his vast knowledge
and experience to expand my own ‘tool box’.
On that note, this edition contains a brief introduc-

tion from our Chair-elect, Graeme Payne. I have
also worked with Graeme as an SME, co-author,
and officer in the MQD. I’m excited about where
Dilip has taken the MQD, and the path Graeme
will continue to lead us down during his term as
Chair. The passing of the torch is July 1st.
I suppose it is time to write about The Metrology

Handbook. It has incorporated all of the errata
ASQ RECERTIFICATION PRIMER quality standards, shifting industry accepted prac-

tices and new data reporting schemes/formats.
Christopher L. Grachanen Without being actively involved (to some level) in
Recertification, within a specified timeframe, is the Metrology field, most CCT committee mem-
required for many bers agreed that a CCT graduate would become
ASQ peer certifica- outdated in regards to new Metrology concepts,
tion programs. MQD methodologies and hardware that they either knew
sponsored Certified nothing about or possessed inadequate knowledge
Calibration Techni- about. CCT committee members also generally
cian (CCT) program agreed that Metrology knowledge would ‘fade’
is one such program over time unless put into practice and/or reviewed
that requires recerti- periodically.
fication. The time-
frame for CCT recertification is once every three CCT committee members strongly felt it essential
years. So, what is recertification? What are the that any ASQ Metrology based certification pro-
criteria for recertification? What is the recertifica- gram should require recertification in order to
tion process? These are a few of the questions that maintain an acceptable level of competence relative
will be addressed in this primer along with some to subject matter deemed necessary for satisfacto-
pointers on to how to make the task of recertifica- rily performing Metrology related tasks. Of course
tion a little easier. For many seasoned ASQ alumni the definition of what is an ‘accepted level of com-
this information may be old news but for many petence’ is subjective in nature and must be estab-
CCT graduates, that do not hold other ASQ certifi- lished for all ASQ certification exams as a ‘pass/
cations, the requirements for recertification may fail’ threshold based on statistical significance and
seem daunting. peer review. Note: Without an ‘accepted level of
competence’ it is difficult to determine marginal
Simply put, recertification is the ‘act of attesting to performance limits in contrast to performance ex-
meeting a standard, again’. With this simple defini- tremes which are easily classified as being satisfac-
tion in mind, why would someone want to make tory or unsatisfactory. To summarize the mind set
recertification a requirement if one had already of the CCT committee, most members agreed that
proven themselves capable of meeting a standard in recertification was needed to 1) help keep CCT
the first place? I think it would be helpful to define alumni updated about changes in the field and 2)
standard at this time relative to ASQ peer certifica- help them from getting ‘too rusty’ regarding the
tion programs, as ‘demonstrating acceptable com- knowledge needed to perform required tasks. It
prehension (as defined by ones peers) of a specific was also felt that recertification would eventually
body of knowledge (also defined by ones peers) at weed out one time, ‘cram for the exam, pass and
a particular point in time’. With that being said, I not remain active in the field’ graduates.
would like to regress to the time when the CCT
program was but a glimmer in a few volunteer Now that we have addressed the ‘whys’ of recerti-
eyes, long before the program was officially ac- fication let us now focus on the criteria needed for
cepted by both ASQ’s Certification Board and ASQ recertification. First, one can be recertified by
ASQ’s Board of Directors. During multiple, on- again taking and passing an ASQ certification
line ‘virtual’ debates CCT committee members exam (not normally the preferred method for get-
were generally of the consensus that recertification ting recertified due to the chance of failing the
was a necessary evil because they perceived that a exam and the cost incurred - $105 retake fee). Re-
significant portion of the CCT body of knowledge certification can also be granted by compiling a
was dynamic in nature and that the requisite to minimum number of Recertification Units (RU)
keep updated was self evident. This was particu- over a specific timeframe (most preferred method
larly true in areas impacted by technology changes for getting recertified - $30 application fee). RUs
such as instrumentation hardware, software valida- are granted for participation in activities deemed
tion and automation techniques as well as changing (Continued on page 19)
THE STANDARDS COMMITTEE on the value of an effective quality management

system, management may be promoting the inef-
ACTIVITY fective audits. In short, if you blow the whistle, you
By Bill McCullough may be looking for work. If that is the case, I am
offering to be the clearing-house of anonymous
The US Technical Advisory
concerns, stories and antidotes having to do with
Group (TAG) met in the
the credibility of 9001. Email me at billmccul-
sunny-southland for our
lough@gbis.com with “confidential” in the subject
spring meeting, Atlanta Geor-
line and before I even read it, I will erase your
gia to be exact.
name and company. If that is not anonymous
enough, snail-mail it to me without a return ad-
This meeting’s focus was to
dress.
move the work on the design
specifications for the next
The next TAG will be in Washington DC the last
ISO 9001 and 9004 revision
week of August. I will deliver your inputs then.
forward. The TAG is on tar-
get and schedule at this point.
The NCSLI 174 (Z540-1 update) Work Group cir-
culated a draft document to the full committee for
One of the general topics of concern to the TAG is
comment. The working group discussed those com-
a subject that I have touched on in the past; the
ments, and based a new draft document on those
credibility of the ISO certificate. It is extremely
comments. We will meet this month to refine this
important that ISO 9001 certificates identify only
draft and present the results to the committee at the
firms that have met all the requirements of the stan-
August NCSLI Conference. I have reviewed the
dard. The TAG is attempting to identify issues
new draft and think that it is truly a superior cali-
where that is not the case and most importantly,
bration standard. I am proud of the hard work of
why? One issue under discussion is fierce comple-
our leader Del Caldwell, the working group, and
tion among assessors to get and certify firms. Com-
honored to be part of it.
petition is generally a good thing but is it in this
INTERACTIVE SECTION
case; it is easy to see resultant problems.
When performing a calibration or designing a test
The certificate, not the quality system, be-
specification or procedure, how many test-points
comes the goal
are sufficient?
The firm is purchasing the certificate from
the lowest bidder
ISO 9001 says, “…provide evidence of conformity
If one certifying firm becomes too demand-
of product to determined requirements.” Most of
ing, the firm can buy the certificate
the time determined requirements means the instru-
elsewhere
ments specifications. ISO 17025 says: “appropriate
It is in the best interest of the certifying
methods and procedures for all tests and/or calibra-
firm to pass his customer
tions within its scope.” Does “scope” mean instru-
A permissive certifying firm undermines
ment specification? Z540-1(R2002) says:
internal auditors and consultant’s sug-
“Calibration procedures shall contain the required
gestions and findings
ranges or uncertainty of each item or unit parame-
ter being calibrated.” Z540 get closer but have any
In the United States, we do not seem to have good
of these standards provided guidance for what
answers to these issues. In other countries, their
needs to be tested or calibrated?
governments may be involved. It would seem that
we, the users of ISO 9001, are the best resource to
When discussing generalized calibration, an audio
identify or resolve the issues, but I understand that
amplifier is a good example because it is some-
such input can be sensitive. As ISO 9001 users, we
are caught in the middle between our management (Continued on page 12)
and the auditors. If we have not sold management
THE LEARNING CURVE observations he expressed concerning the Ameri-

can people none is more germane to our theme
By Phil Painchaud herein than:
This is the fortieth in a contigu-
“THE OUTSTANDING CHARACTERISTIC
ous series of rambling essays,
OF AMERICANS IS THEY ARE A PEOPLE
charted obstensively to be on
WHO ARE ALWAYS IN A HURRY” —
the subject of Metrology Educa-
tion, but which often wanders
Boss, it appears that ‘the more things change, more
astray at the whim of the author.
they stay the same’. It seems that despite 167 years
As this one gets underway, it
of alleged progress since de Tocqueville published
could do the same. Our readers
his observations, we are still in a blind hurry. I
do not seem to mind or at least
have been writing this column for twelve years
not enough of them have peti-
now and have literally lost track of the number of
tioned the MQD to exacerbate it. As usual, this will
times that individuals have approached me, written
be in the form of an open letter to our Boss the Edi-
to me, called me on the telephone, or e-mailed me
tor-in-Chief of this Journal.
asking in effect, “How can I become a Metrologist
instantly?” They never seem to ask me how they
Dear Boss:
can become a qualified Metrology Technician or
Certifiable Calibrator over night, they want the ul-
Have you ever noticed what a frenzied hurry-up
timate, the technological vertex, and they want it
world we seem to live in? We take our meals on
instantly, or at least in not so long a time that it
the run at fast food emporia. We frequent drive-
takes them away from their Monday night football.
thru banks and ATM machines for our financial
matters. We watch abbreviated encapsulated news
It is often a case where they have just been ap-
briefs on TV rather than read the whole story in
pointed by some dunderhead in Management to
newspapers. We want convenience stores on every
head a scientific unit within their employer organi-
corner. Why do we forget or fail to recognize that
zation. They ask me how they can suddenly be-
some things take time to develop? Fine wines do
come qualified to fill that position. What book can
not come directly off the vine. Concrete can take
they read? What video can they watch? What
up to 50 years to cure completely. It takes twelve
quickie on-line course can they subscribe to that
years of basic education and practice to produce a
will make them a learned experienced Metrologist
qualified physician, even before he is eligible to
before the boss finds out that they really are not
receive specialized training in a specific field. Why
qualified to fill that position. Sounds ridiculous
is it then that so many individuals seem to think
does it not? Improbable? I agree, but it has hap-
that Metrologists can be created instantly by ap-
pened to me innumerable times during the past sev-
pointment or by being exposed to some crash
eral years—and it will probably continue to happen
course?
indefinitely into the future.
The noted Nineteenth Century philosopher and po-
Sometimes these approaches come from the other
litical analyst de Tocqueville (full name: Alexis
extreme. I often receive one of these messages say-
Chales-Henri-Maurice-Clérel de Tocque-ville)
ing something like, “I graduated with honors form
toured the United States early in the 1830’s to
the DOD Calibration School at the XYZ Base (or
study the American democracy. After he returned
from the ABC Vocational School). I can calibrate a
to France, he complied and published a massive
multifrequency, syncrochannel, terahertz spectrum
two-volume pandect of his analyses of everything
analyzer in a half an hour flat; what’s more is there
he saw while here, particularly those things he ob-
to learn about Metrology?” I hear this or something
served concerning the American people them-
quite similar altogether too frequently. I could (and
selves. This work entitled “De la Democratie en
Amerique”, has been a sina qua non for scholars (Continued on page 18)
for the past century and a half. Of the hundreds of
THE LEARNING CURVE status with her heading it. From now on, it is to be
the COLLEGE OF EXTENDED AND INTERNA-
By Phil Painchaud TIONAL EDUCATION within the California State
University–Dominguez Hills. To you not familiar
This is the forty-first in a con-
with academia, let me explain that this is a tremen-
tiguous series of essays that be-
dous boost in academic status and prestige. It pro-
gan publication in this journal in
vides solidity and assurance for our Bachelor of
1992, with a charter of promot-
Science in Quality (Measurement Science Option).
ing Metrology Education. While
Furthermore, for those of us who were present, it
it has generally attempted to
changed our status from members of a temporary
adhere to that mandate, it has at
advisory committee to members of a permanent
times, and more frequently of
Curriculum Review Board. For those of you who
late, has deviated at the whim of
have been holding back because you were afraid
the author. As we progress in
that you could become involved in some “rickey
this iteration, it probably might do the same. As
tick” vocational training promotion, you can now
usual it will be in the format of an open letter to
be assured that an education you might receive
our Boss, the Editor-in-Chief of this periodical.
through the Dominguez Hills program will be fully
accredited and accepted worldwide.
Dear Boss:
Remember, you do not have to travel to the
If I may borrow a line from Lewis Carroll; “—The
Dominguez Hills campus in Carson, CA. You can
time has come, — to talk of many things: Of
do all of this on-line. The Dominguez Hills staff,
shoes—and ships—and sealing wax—of cab-
under Dr. Watson, for nearly fifteen years have
bages—and of kings—”. In other words, Boss we
been involved in “Distant Learning”; they have
have many different things to discuss in this issue.
unparallel experience in on-line teaching. To date
First in importance however is the review of a new
they have graduated nearly 300 Masters in Quality.
book entitled “THE METROLOGY HAND-
Why wait? Enroll now!
BOOK” of which you are the Editor and is spon-
sored by our Measurement Quality Division. But,
Those of you, who have been reading this column
let us leave that for later in this column and first
for any period of time, will recognize that I can be
tell of some important news about a Metrology
a stickler for the use of proper nomenclature. I am
Education program.
hard on people who try to invent new terms where
proper ones already exist and have been in the
On March 18, 2005 I received a telephone call
vocabulary for eons. I regularly receive e-mail
from Dr. Gene Watson (you should remember him,
advertising from a company that produces metrol-
he was, before his retirement, the Coordinator of
ogy related training seminars. I have never at-
the Quality and Measurement Sciences programs at
tended one of theirs, but if the instructors and the
California State University Dominguez Hills) tell-
material is only half as good as their advertising
ing me that my presence was requested at a special
copywriters, the seminars must be great. Recently
meeting to be held at Dominguez Hills on March
I received from them an announcement of a new
23. Naturally, I went and upon arrival, found most
seminar entitled “Analytical Metrology”. I have
of the old Curriculum Advisory Committee and
been around the Measurement Sciences for about
several new individuals, all of whom were intro-
sixty years and this was a new one on me. So I
duced as graduates of Dr. Watson’s earlier
wrote to the Sales Manager asking, “What is it?”
“Masters in Quality Program.
The answer came back, “It’s all about titration,
spectroscopy, chromatography, colorimetry, and
Dean Margate Gordon presided as usual and in-
the like in chemical measurements.” “Why are
formed us that because of the success of the Qual-
you not calling it ‘Stoichiometry’? That is the cor-
ity Assurance Program (that includes our Measure-
ment Science option) the University as elevated (Continued on page 14)
Extended Education Division to a full College
(Continued from page 9) low LSCCs shady example or to convince the boss
thing that most of us own that has specifications and more importantly the customer of the inade-
that we can understand. It has specified audio fre- quacy of LSCC’s procedure.
quency, amplitude ranges, and noise levels. Practi-
cally, we take the amplifier home, plug it into our The talking points are; shouldn’t the standards de-
CD and speakers, and see if it plays and sounds fine an adequate calibration? How should an ade-
good enough, but what if we actually wanted to quate calibration be defined in a standard without
calibrate the amplifier? A good starting point is to, requiring an infinite number of tests? Should the
as I called it, “test the corners.” That is, in respect knowledge that an instrument uses the same path or
to the 1 kHz reference point, to test the specifica- algorithm for more that one function or range be
tion at the highest power out at the highest and used to reduce the number of test points? New
lowest frequencies. Then repeat it for the lowest standards may use a standard resistor and voltage
amplitude or noise floor. Having done that is the source to effect calibration, is that calibration with-
amplifier calibrated? Taking it a step further, is the out further test points?
amplifier tested or calibrated? What is the differ-
ence? In the interactive section of my report I have pre-
sented a dilemma that could easily undermine our
ISO 17025 specifies test and calibration so the last industry. I am very interested in your solution to
question is relevant. Look at the difference be- the dilemma.
tween test and calibration, at least as we see it in
the U.S. It is more than the cal lab taking care to Bill McCullough
ensure that more of the instrument is tested. There McCullough Consulting
is a process difference. Because of cost and time 1936 June Cr
constraints, production test should be testing, as Carson City, NV 89706
little as possible that will ensure the product’s in- Phone 775-883-3042
tegrity. The key to adequate production testing is Cell 775-220-2464
keeping metrics on historical parameters. These Email billmccullough@gbis.com
metrics may come from internal data collection,
calibration, repair services or customer feedback.
When a metric identifies a parameter with a low
probability of failure, the test may be removed. ANNOUNCEMENTS
This is good test logic but is questionable calibra-
tion logic. Calibration should be testing all of the MQD is proud to announce that Mr. Dan Harper,
specifications. proprietor/retired of HQA received the Freund-
Marquardt Medal in recognition for an individual
Back to the audio amplifier, good Metrologists who has held positions of responsibility for devel-
know to sweep the frequency bandwidth or at least opment of standards that focus on the management
check some intermediate points along with linear- system of an organization. Congratulations Dan!
ity or distortion tests. The problem is the pointy We are proud of you for earning this well deserved
haired boss wants cost driven from calibrations award. Dan had been MQD's standards representa-
because the Lick-em and Stick-em Calibration tive for a long time before Bill McCullough took
Company (LSCC) is bringing their van in to the over.
territory. Their calibration procedure checks the 1
kHz reference point and calls the amplifier cali- ASQ ID/MQD Fall Conference, September 22nd &
brated. Too often large customer’s purchases cali- 23rd, 2005, in Norco, CA. The Inspection Division
bration like any commodity, from the lowest bid- and Measurement Quality Division of ASQ an-
der. The boss, a person with a MBA and no techni- nounce the 2005 fall conference. Call for papers
cal leanings could find nothing in the standards that and conference information is available at
defines what an adequate calibration is and thinks www.asq.org/measure.
that LSCC is on to something. Your choice is fol-
METROLOGY JOB DESCRIPTION INITIATIVE

By Chris Grachanen
As of this writing (end of April 2005), the National Conference of Stan-

dards Laboratories International (NCSLI) has sent a broadcast e-mail to its
constituents requesting job descriptions for Calibration Technician, Cali-
bration Engineer and Metrologist be sent to Pat Muenzen of Professional
Examination Services (PES). ASQ headquarters is planning to do the
same as well as sending out postcards to those MQD constituents that pre-
fer to be contacted by ‘snail’ mail.
Readers may remember the PES has been contracted to administer the
MJT initiative for the MQD and, as a first step in correcting inadequacies in the U.S. Dept. of Labor’s
Standard Occupational Listing (SOC) system, is requesting job descriptions be sent to them in order to
determine common requirements / expectations for each description. Once these requirements / expecta-
tions are compiled and summarized they will be used to develop questions for a national survey schedule
for the fall of 2005.
PES has received total of 130 job descriptions to date, including 50 from government and 85 from indus-
try sources. PES has compiled more job descriptions for Calibration Technicians (86) than for Metrolo-
gists and Calibration Engineers (49). PES will continue to accept job descriptions till the end of May
2005.
In support of the MJD initiative a core team has been established. The following MQD and NCSLI con-
stituents have volunteered for the core team:
Jay Bucher – Promega Corporation

Christopher L. Grachanen (Project Leader) - Hewlett-Packard Company
Shawn B Mason - St. Jude Medical
Gloria J Neely – US Navy, Naval Surface Warfare Center
Graeme C. Payne - GK Systems, Inc.
Don Ruth - US Army TMDE
Howard Zion – Transcat
These volunteers have a passion for the Metrology field and understand the need to help enable / attract
new comers to it. The core team is tasked with the following:
• Participation in overseeing the common job elements developed from submitted job descriptions
• Participation in the pilot job description survey
Participation in overseeing the final compiled job descriptions
(Continued from page 11) morals and ethics of many, including those in-
rect term for chemically related measurements”, I volved in Metrology, I doubt very much if he con-
asked. The answer I received astounded me, “Our tributed anything directly to the technology of our
instructor has never heard of the term, and he says science. Two days earlier, March 31, 2005 in a
that he wants to call the seminar ‘Analytic Metrol- small town in Kentucky, the Metrology and Cali-
ogy’. Our policy is to allow our instructors to use bration community lost an individual, virtually un-
whatever terms they desire”. I immediately went known to most practitioners in our field, yet one
to some reference sources to ascertain that I was who had at times exerted a tremendous influence
not the one at fault. According to my on hard disk on them. I am referring to retired U.S. Navy Master
dictionary, the American Heritage Dictionary of Chief Petty Officer Claude Fourroux. Unbe-
the English Language: knownst to most, his passing has caused a void to
: hundreds of you who passed through the DOD
STOICHIOMETRY: The quan- School at Lowry Air Force Base at Denver, Colo-
titative relationship between reactants and prod- rado. While he only taught a very few classes him-
ucts in a chemical reaction. self, in his primary role as Master Chief Instructor
(i.e., Superintendent of Instruction), from behind
I then tried some chemical references to see how the scenes, he controlled everything you were
far back I could go. I found it in The Wardsworth taught and how it was taught to you. He and I first
Dictionary of Science and Technology, 1995 Edi- met in1984 while he was trying to revive a com-
tion. Not old enough? How about the 1976 Edition mercial calibration operation he had acquired after
of The Handbook of Chemistry and Physics? Are his retirement. His honesty and integrity and down
there still doubts? Let’s try Norris’s. Organic to earth know how impressed me and we became
Chemistry, 1930 Edition or back further yet, Mar- close friends.
shall’s Notes on Chemical Lectures, 1888 Edition.
Now that is going back a ways! In fact, it goes In 1996, from his retirement home in Kentucky, he
back even further than I do—even before my fa- wrote me a long letter in support of the positions I
ther. Of course, all of these definitions are not pre- was presenting in these columns. The letter was
cisely the same. With different authors, it would intended for publication in this journal, but it “fell
not be logical to expect them to be, but they all do through the cracks” and somehow it never was. It
involve the measurements of chemical quantities is too lengthy to include fully here, however I
and/or reactions. This is a good example of why we would like to quote a few paragraphs to you now.
do need standardization of terms and vocabulary.
So let us settle for: ——I have been following your column in the
ASQC Measurement Quality Division newsletter,
—Stoichiometry is that branch of the "THE STANDARD" for some time. I am beginning
Measurement Sciences that encompasses all to be concerned with what I keep hearing from
measurements both in the theory and in the prac- various organiza-tions and individuals about Mili-
tice of the Chemical Sciences as well as those in tary Calibrators. What I am concerned about is the
Chemical Engineering.— self-promotion of military trained calibrators to the
title of Metrologist. In reality, this is an issue of
The moral of my homily here is: “Do not make a definition/terminology. I want you know that I
fool of yourself by broadcasting your ignorance; have a “thing” about using correct definitions. I
an ignorance characterized by inventing terms to believe that you firmly hit the nail on the head with
suit your fancy where well established terms al- your defining the two (2) key words; Education
ready exist! Do some research before you go off and Training.——
“half-cocked”!
At this point in his letter, he went into a long and
A month ago, April 2, 2005 to be precise, in Rome, detailed description of his thirty-year military his-
the world lost a prominent and influential individ- tory in both the Army and the Navy, and his ap-
ual. While he was probably a great influence on the (Continued on page 20)
MQD PHONE CONFERENCE

ASQ WORLD CONFERENCE ON QUALITY AND IMPROVEMENT
SEATTLE, WASHINGTON
17 MAY 2005
ATTENDEES - Present
Dilip Shah
Graeme Payne
Colleen Gadbois (Dan Harper’s daughter and past treasurer of MQD)
Dan Harper
Jeff Pfouts
ATTENDEES - Phone
Norm Belecki
Chris Grachanen
Keith Bennett
Phillip Painchaud
OPENING
Dilip and Graeme welcomed everybody. Dilip noted that we had a quorum to conduct the busi-
ness meeting. Dilip related that Dan Harper received the Freund-Marquardt Medal in recogni-
tion for an individual who has held positions of responsibility for development of standards that
focus on the management system of an organization. Congratulations Dan!
STANDARDS COMMITTEE – Dan Harper
The work on the final revision of NCSLI Working Group 1 for ANSI/BCSLI Z-540 is still con-
tinuing.
ANSI/ASQC M1-1996, American National Standard for Calibration Systems, is slated to expire
in 2006. The MQD is the owner of M1-1996. Dan related that in order to retain the knowledge it
contains (specifically about calibration systems) that probably the best thing to do is to withdraw
it from active ANSI standard status and keep it as an ASQ publication. Dan noted that sales for
M1-1996 is still strong and ASQ wants to keep it in its inventory. Dan and Bill McCullough will
draft a letter of recommendation to MQD regarding the future of M1-1996.
OPEN ACTION ITEMS FROM LAST MEETING – CCT Coin
Chris suggested that Keela’s CCT coin design be used for starting point. Dilip recommended
aligning the ASQ & MQD logos and making sure they are in agreement with formatting guide-
lines. Dilip will make any necessary changes to Keela’s design and submit to MQD officers for
comments.
NIST MEASURMENT INITIATIVE – Norm Belecki
NIST announced a Measurement Initiative ‘Roadmapping America's Measurement Needs for a
Stronger Innovation Infrastructure, A Private-Public Initiative for the Future,’ to develop a
comprehensive picture of the U.S. Measurement System as it exists now and what needs are ex-
pected in the future. NIST would like to partnership with other Metrology / Measurement asso-
ciations in order to:
Identify and analyzer existing roadmaps for the future

Identify most obvious gaps between reality and projected needs
Conduct workshops to generate white papers on obvious gaps
Norm led a discussion as to the reality of NIST having to re-appropriate existing funds towards
emerging technologies such that some existing services would probably be curtailed or discon-
(Continued on page 16)

tinued. Norm recommended that MQD get involved in this initiative and act as a bridge to ASQ.
Dilip recommended that all visit the NIST Measurement Initiative website and discuss plans for
participation. Dilip suggested this initiative may be an opportunity for partnership with NCSL
International. The NIST Measurement Initiative may be found at: http://usms.nist.gov/
JOE D. SIMMONS MEMORIAL SCHOLARSHIP UPDATE – Norm Belecki
Three applicants have been received for this year’s scholarship award. Norm led a discussion
about the rating system used to award the scholarship, in particular about assigning a weight to
an education level. Norm recommended that MQD develop an opinion about education level
weighting in regards to the Simmons Scholarship rating system.
CERTIFIED CALIBRATION TECHNCIAN (CCT) PROGRAM UPDATE – Chris
There are a total of 223 applicants for the June 2005 CCT exam offering, a new record! Previous
single record for total number of CCT exam applicants was 139. There are no scheduled work-
shops for remainder of 2005.
METROLOGY JOB DESCRIPTION (MJD) INITIATIVE – Chris
Professional Examination Service (PES) communicated that they had surpassed the minimum
requirement of 25 examples for each job description. They requested additional time (till the end
of May) to continue compiling job descriptions as they were still receiving a steady steam of E-
mails and wanted to have a good sampling from all over the U.S.
It is anticipated that by mid-June 2005, PES will submit their completed report to the MJD Ini-
tiative core team. This report will be used in developing a pilot questionnaire survey. An open
survey will be conducted later this year to solicit input on what Metrology/Calibration practitio-
ners believe should be included in the aforementioned job descriptions.
GENERAL DISCUSSION – All
Dilip is working with Georgia Harris. VP of NCSL International Education and Training, about
the possibility of ASQ granting CE units for NSCL International conferences.
MQD will be receiving a free booth for the NCSL International conference in Aug. 2005 –
MQD officers and other volunteers needed for ‘Booth’ duty.
MQD will be hosting a session at NCSL International Conference in Aug. 2005. Chris suggested
posting MQD papers abstracts in The Standard.
The Metrology Handbook is in its 2nd printing – NCSL International is offering it at a dis-
counted rate.
MQD’s 2005 conference will be co-sponsored by ASQ’s Inspection Division. Duane Allen,
MQD conference coordinator, is obtaining conference information (location, hotel accom-
modations, etc.) for publication in The Standard and MQD website. The conference is
scheduled for the week of Sept. 19th.
Graeme led discussion on listed MQD regional councilors who are not active in ASQ, are not
member of MQD, etc. He proposed giving a ‘vacant’ councilor status to those regions with-
out an active ASQ MQD member listed. Graeme noted that there are MQD members from
58 countries but only one region representing countries outside North America. Further dis-
cussion recommended on region representation.
Dilip was nominated for the 2005 Max J. Unis award in recognition for his outstanding leader-
ship and contributions to CCT program and metrology/ measurement community. MQD
officers unanimously approved the nomination.
NEW ACTION ITEMS:
Dilip – Revision and submittal of CCT coin design to MQD officers for comment
Dilip and Graeme – contact NIST regarding participation in their Measurement Initiative
MQD officers – visit : http://usms.nist.gov/ and discuss participation game plan
(Continued on page 17)

Chris – Contact Georgia Harris about the NIST Measurement Initiative regarding possibility of
partnering on it.
Dilip, Graeme, Norm – Develop MQD opinion on education level weighting in regards to the
Simmons Scholarship rating system
Dilip – Send Georgia Harris info on ASQ procedures on awarding CE units
Dilip – Send Jay NCSL International conference paper abstract for posting in The Standard
Graeme – Revise MQD regional Councilor status to reflect only listing of active ASQ MQD
members. Graeme to forward to Jay for posting in The Standard and Chris for posting to
MQD website.
Respectfully Submitted,
Christopher L. Grachanen
Financial Report (March 2005)

Submitted by Karl Wigdal, MQD Treasurer
The division continued to have a strong asset balance compared to its minimal liability load. All assets
were in cash and receivables.
The month’s membership revenue was up substantially from the same month last year ($2,428.80 vs
$1,591.40). Interest income from the division’s money market account was $57.13 for the month. The
division also recorded $3,357.43 in royalty revenue from ASQ Quality Press activity from the July thru
December 2004 sales cycle. This brought revenue for March to $5,843.36.
Total revenue for the first nine months of the current fiscal year was $36,669.80. This was an increase of
33.5% from the same nine month period total of $27,476.74 the previous year.
Expenses for the month were $6,129.09 and were primarily for travel reimbursements and professional
contract services. Total expenses for the nine months of the current fiscal year were $19,677.18. A 2%
increase from last year’s total of $19,234.12.
Total expenses less total revenues resulted in a net income surplus for the current fiscal year of
$16,992.62. A 106% improvement when compared to last year’s net surplus of $8,242.62 for the same
nine months.
Immersion in water makes the straight
seem bent; but reason, thus confused by
false appearance, is beautifully restored by
There shall be standard measures of wine, measuring, numbering and weighing; these
beer and corn...throughout the whole of drive vague notions of greater or less or
our kingdom, and a standard width of more or heavier right out of the minds of
dyed russet and cloth; and there shall be the surveyor, the computer, and the clerk
standard weights also. of the scales. Surely it is the better part of
thought that relies on measurement and
Clause 35, Magna Carta, 1215 calculation.
Plato (The Republic)
(Continued from page 10) Sciences, and the ability to direct similar activi-
sometimes do) ask, “Can you calibrate a Genovese ties among subordinate personnel. A Metrolo-
Suisse Coordinate Measuring Machine; or write the gist shall be competent to document for accurate
calibration procedure for your spectrum analyzer; communication and for archival, all activities
or develop and solve the algorithms for the error within a specific domain. A Metrologist shall, at
analysis of any of these calibrations?” Well natu- all times and without fail, hold personal and
rally, they cannot! professional ethics and integrity as para-
mount.—
Well then, what is a Metrologist? Of course, that
question must be answered before we can attempt Now, I ask you, can the specified combination of
to tell anyone how to become one. Many years ago, those attributes be acquired in a hurry? No way
long before the ASQC became the ASQ, my late normally! First of all the term “Professional” as
good friend Phil Stein headed a Task Group used in that definition, is the stand alone noun, not
charged to develop an incontestable definition of the word when used in its adjective sense. Next,
the term “METROLOGIST” (Note carefully that such a composition requires a genuine conflation of
this assignment was to develop a definition and not intensive and extensive scientific education, con-
a job description; i.e., it was to stress qualification siderable technical training, and long empirical ex-
factors and not functions performed.) Of the many perience in depth. I know of no way one can get
drafts considered, only one has survived. Unfortu- there from here overnight. Unfortunately, what we
nately for us about that time Mr. Stein’s responsi- see so frequently is that instead of trying to bring
bilities increased greatly (e.g., his personal busi- the aspirant individuals up to the specified levels
ness, his Chairmanship of the Measurement Qual- many people are constantly trying to lower the
ity Division, his Directorship in the ASQ, etc) and standards down to their existing levels.
he was forced to turn to more pressing matters. He
and I had discussed resuming the task when his Well Boss, that ought to wrap it up for this issue,
ASQ responsibilities diminished, but with his un- and as for our readers, I know that some of them
fortunate passing last June, the project vanished. may want to challenge what I have said above. I
Thus, that surviving draft never got through the solicit controversy. I answer all mail, USPS or oth-
acceptance process, but for what ever it is worth erwise, telephone calls, and/or Faxes. You might
here is a copy that I have hoarded for many years. not like my answer, but you will receive one—I
guarantee it! You can still reach me at the same old
METROLOGIST: A Metrologist is a Profes- stand:
sional; a Scientist, capable of practicing a profi-
ciency in the Theories, the Arts, and the Prac- Phil Painchaud
tices of the Measurement Sciences. A Metrolo- 1110 West Dorothy Drive
gist will have had a broad-spectrum educational Brea, CA. 92821-2017
background, which of necessity, shall have in- Phone: 714-529-6604
cluded in depth, the Studies and the Practices of FAX: 714-529-1109
Chemistry, of Mathematics, and of Physics. A E-Mail:
Metrologist shall have the demonstrative capa- painchaud4@cs.com or olepappy@juno.com
bility to Personally conduct independent re-
search and development in the Measurement
EVENTS CALENDAR
NCSLI August 7th ~ 11th, 2005 Washington, DC 303-440-3339 www.ncsli.org
ASQ ID/MQD September 22nd ~ 23rd, 2005 Corona, CA www.asq.org/measure
MSC February 27th ~ March3rd, 2006 Anaheim, CA 866-672-6327 www.msc-conf.com
(Continued from page 8) Unit, FT is Full Time, PT is Part Time

congruent with increasing / enhancing ones com-
prehension of a certification programs body of Information about RU’s may be found at http://
knowledge. Note: RUs must be substantiated by www.asq.org/cert/recert/rucredits/
supporting documentation to be valid. For each requirements.html .
recertification activity there is a specific number of
RUs allotted as well as a maximum number of RUs Acceptable documentation for substantiating par-
that will be accepted for each activity. CCT recerti- ticipation in a recertification activity includes, but
fication requires a minimum of 18 RUs over a 3 is not limited to:
year period. Recertification activities, RU credits
and their maximum totals allowed are: • Conference name badges, program agendas,
attendance registration sheets
• Past and present employment verification let-
ters
• Professional society meeting attendance re-
ceipts
• Letters of participation and/or continuing ser-
vice on professional society committees
• Student transcripts
• Training records—certificates, course outlines,
employee training records, attendance rosters
• Instructor records of courses taught (for in-
structor credit)
Letters from clients whom you have serviced (for
self-employed)
Let us now discuss the recertification process. The

recertification process is essentially broken down
into three steps: 1) Documenting (logging) recerti-
fication activities, 2) Obtaining documented evi-
dence of participation and 3) Submitting them to
ASQ headquarters along with a completed Appli-
cation for RU Credits Recertification. A RU Cred-
its journal and Application for RU Credits Recerti-
fication may be found at:
http://www.asq.org/cert/recert/rucredits/
application.html
To make the ASQ recertification process as un-

problematic as possible it is highly recommended
that recertification activity attendees document
Table 1 (log) the activity and obtain documented evidence
of participation as soon as practical. This reduces
Note: Employment RU credit must fall in the perti- the chances of forgetting to document (log) the ac-
nent certification(s) body of knowledge. All recer- tivity and increases the likelihood that documented
tification activities must fall in the pertinent certifi- evidence of participation is obtainable (it is often
cation(s) body of knowledge or be directly job en- next to impossible to obtain documented evidence
hancing/related. CEU is Continuing Education (Continued on page 22)
(Continued from page 14) that offers a four-year degree

pointment as a Master Chief Instructor at the DOD in Metrology. However, a formal technical/
School at the Lowry AFB, establishing his qualifi- professional degree can provide the proper back-
cations for expressing the facts he was presenting ground to enable one to become a Metrologist with
herein. additional study and experience.”——
——“I am qualified to offer an opinion on ——“I too have been following Butler Commu-
the differ-ence between education and training. At nity College over the years. I realize that it is a this
all times the purpose of the Lowry Calibration moment only a two year institution but, it gives me
School was to train Calibrators...”—— hope that at last some reputa-ble institution will at
last take on the task of providing indus-
———“Our purpose and goal as DOD Cali- try with creditable, Professional Metrologists.
bration Instructors was to train a Calibration This country desperately requires formally edu-
Technician to perform a routine calibration, and cated Professional Metrolo-gists.”——
how to document that calibration properly accord-
ing to the individual service's requirements. When Remember that letter was written to me nine years
the Calibrator graduated from Lowry AFB, he was ago and that none of the italicized text above is
capable of entering a calibration laboratory and mine. It all came from the best possible authority.
calibrating a piece of test equipment. Within that If any of you should like a copy of the complete
framework, we were very successful. With time and text, just ask and I shall be happy to send you a
experience, that trainee could become a very com- copy. However, this was not the only thing that
petent Calibrator. It has never been the intention, Claude wrote. Most of you should be able to re-
the goal or the mission of this or any DOD training member that in circa 1991-92 friendly aircraft shot
facility to educate Metrologists. It must be firmly down a US Army helicopter over Northern Iraq
stated that the DOD schools are training facilities killing all onboard including several important
and not educational institu-tions. It must be re- Kurdish civilian officials who were traveling as
membered that despite the location of the Lowry passengers. Using his personal expertise in IFF
school on an Air Force facility, it is not an Air technology and data published through the several
Force School, it is a DOD school delegated to the news sources, Claude, sitting in his home in Ken-
Air Force to operate for the benefit of whichever tucky, was able to analyze the probable cause of
organizations DOD may designate.”—— this failure. He wrote a “White Paper” on the sub-
ject focusing the blame directly on the incompati-
——“Equally important is what we did not ble calibration policies among the three services.
train them to do. We did not train them to write a This document eventually found its way into the
calibration procedure; we did not train them to hands of a US Senator who was so impressed that
design a calibration process; we did not train them he had it read into the Congressional Record. This
in error analysis, we did not train them in deter- action caused Congress to force the US Air Force
mining calibration intervals; we did not teach them to cease the cover up and to openly investigate. If
mathematics, chemistry or phys-ics; we did not any of you should like a copy of that “White Pa-
teach them to be engineers or Metrologists.”—— per”, I will be pleased to oblige.
—
A couple of issues ago, I told you about Professor
——“Military trained Calibrators should be Louis Hart, of the West Liberty State College, in
proud of their title and training. If they want to West Liberty, West Virginia, and his efforts to es-
become Metrologists, they should go back to tablish a Measurement Science Curriculum within
school and study engineering or a science and earn that institution. I asked each of you to write him a
an appro-priate degree. I realize that there are not letter supporting his efforts; a letter that he might
many institutions of higher learning educating in- use to support those efforts before his academic
dividuals to become Metrologists. I have to admit management. Your response was underwhelming—
that I do not know of a single college or university (Continued on page 21)
(Continued from page 20) bibliography, and biographies of the eight contrib-
shame on you all! I am told that there are in excessuting authors.
of ten thousand potential readers of this column; ofAt first glance, the sheer scope and depth of the
that number, only one individual took the time to inventory of ingredients comprising this volume
write Dr. Hart a letter of support. Our congratula- can be overwhelming especially to the neophyte
tions to STEVE SCOTT of the Duffy Tool & beginning or contemplating a career in Metrology.
Stamping Co., of Muncie, Indiana. Steve was the But when one, already an advanced advisee in the
only one to write such a letter, he copied me and a Measurement Sciences, the author’s and Editor’s
fine letter it was. Thank you, Steve, and I know approach becomes quite logical. Part I gives a brief
that Dr. Hart thanks you also. historical background of the science as is usually
done in most texts on the subject. Part II in sixteen
Now let us get down to reviewing that new book chapters covers a detailed overview of Quality Sys-
that I promised at the outset of this column: tems applicable to Metrology practice, including
Title: METROLOGY HAND- recommendations of certificates, labels, standards,
BOOK, THE calibration intervals, traceability, records, and other
Editor: Bucher, Jay L. applicable documentation.
ISBN: 0-87689-620-3
LOC#: 2004-003464 Part III brings another five chapters covering the
Publisher: ASQ Quality Press basic Concepts of Metrology a subject vital to any-
Milwaukee, Wisconsin one organizing or managing a viable Metrology
Copywrite: 2004 organization. Part IV provides a refresher course of
Price: $95.00 USD List Price; $75.00 another five chapters in the use of Mathematics and
to ASQ Members if ordered Statistics as applied to the practice of Metrology.
from ASQ headquarters. [It is Part V in a single chapter discusses the use of those
important to note that our own mathematical concepts in the determination of
MQD receives a sizable rebate Measurement Uncertainty. Part VI entitled Meas-
when ordered from ASQ urement Parameters provides an introduction to
Headquarters.] (Amazon price several of the more common technical disciplines
$53.55, but no rebate to MQD) within the extremely broad scope of Metrology
You may recall a couple of issues ago I reviewed a The subject matter of Part VII, “MANAGING A
book with nearly the same title. i.e., Metrology, the METROLOGY DEPARTMENT OR CALIBRA-
Science of Measurement Handbook by Nobuo TION LABORATORY” could have been a entire
Suga. However, the resemblance ends there. Mr. shelf of ponderous volumes in itself, but the author,
Suga’s work is an excellent loose leaf bound, ‘how Mr. Bucher himself has managed to condense it
to do it’, Mitutoyo ‘catalogue cum text book’, lim- into seven chapters of thirty-six pages. The in-
ited to the discipline of Dimensional Metrology. cluded CD-ROM contains much of the resource
An excellent elementary text in itself, but of an material included in the tables in the hard copy (I
entirely different breed than what we are reviewing have already copied it to the Reference Folder on
here. my hard drive for quick reference when I am writ-
ing.) The only major complaint I have found so far
Our tome of interest is a hardbound volume con- is in Chapter 22, wherein his explanation of how
sisting of 544 pages and 98 illustrations/ figures/ work around specified but unavailable equipment,
tables, (with a supplemental CD ROM). It is not a he specifically names actual items of equipment by
textbook in the customary sense but rather a com- manufacture and model number. Such specific des-
pendium of monographs covering a broad spectrum ignations, even allowing that the mentioned gear is
of disciplines, by eight different authors, compiled, obsolete and no longer available on the market, is
unified, and edited by Mr. Bucher. It consists of never the less a tacit recommendation for that spe-
seven major sections or parts, divided into forty- cific item. Specific recommendations, tacit or oth
two chapters. It also includes seven appendices, a (Continued on page 22)

of participation years after a conference / meeting (Continued from page 3)
was attended). Remember to get completion certifi- I leave the division with good experiences and a
cates for any corporate mandated courses such as little wiser. I will not be completely gone as I will
electrical safety and hazardous material training volunteer my duties as Program Chair arranging
that may be germane to a certifications body of conferences and hosting sessions at other confer-
knowledge. Also many conferences and seminars ences.
have been granted CEU credits by academic insti-
tutions and, if applicable, can be used for recertifi- It has been a pleasure serving you.
cation credits (check with conference/seminar ad-
ministrators). Lastly, take advantage of multimedia Sincerely,
training and meeting opportunities that can be used Dilip A. Shah
for recertification credit such as web casts and net E = mc3 Solutions
meetings. The key to a relatively painless ASQ 197 Great Oaks Trail #130
recertification experience is to take advantage of Wadsworth, Ohio 44281-8215
recertification credit opportunities and to document Voice (330) 328-4400 / Fax (330) 336-3974
them as soon as possible E-mail: emc3solu@aol.com

erwise, of any commercial article in references of Volunteers aren't paid...
this sort are quite out of line. Not because they're worthless,
This book is obviously not a primer, that is an ele- but because they're priceless
mentary how to do it text for the raw green neo-
phyte in the Metrology/Calibration field; however, Please consider volunteering with MQD. If anyone
it could be a very desirable item for such an indi- has questions or needs more information, contact
vidual to keep nearby if he intends to upgrade him- any officer or committee chair.
self. On the other hand, I can seriously recommend Thank You!
that it be on the bookshelf of every Senior Calibra-
tor, Senior Metrology Technician, Metrological Another optical illusion…
Engineer, Metrologist, and Administrative This is the Ouchi illusion, named after Japanese
Metrologist. And don’t forget, order it from ASQ artist Hajime Ouchi. As you scan your eyes over
Headquarters. the figure the center disc appears to move.
This column has been a little longer than usual, but

as I said in the beginning, we had many things to
discuss this time. If you would like either of the
two documents I mentioned earlier or, want to ar-
gue with me, I can be reached at the same old
stand. And before I forget it, please write a letter of
encouragement to Professor Hart at West Liberty
State College and copy me.
Phil Painchaud
1110 West Dorothy Drive
Brea, CA. 92821-2017
Phone: 714-529-6604
FAX: 714-529-1109
E-Mail:
painchaud4@cs.com or olepappy@juno.com
Please join us for the Measurement Quality Division Sponsored session (Session 7C: 10:45 AM – 12:15
PM) at National Conference of Standards Laboratory International (NCSLI) on Wednesday, August 10,
2005. For information about the NCSLI Conference, please see the conference brochure elsewhere in the
newsletter or visit http://www.ncsli.org/conference/2005/
Speaker: Keith Bennett

Title: Understanding Test Uncertainty Ratio Helps Improve Calibration Service
Abstract: Test and measurement equipment (T&ME) must be periodically calibrated to ensure it's op-
erating within its specified parameters. Of course, the uncertainty of the system used to cali-
brate the equipment shouldn't add appreciable error to this process. As TURs decrease the
confidence of the UUT being in tolerance also decreases.
Speaker: Graeme Payne
Title: The Metrology Handbook: Experiences of a Virtual Team
Abstract: Publication of The Metrology Handbook in April 2004 marked the end of a year-long team
effort. While working on the book itself, the team members also learned a lot about working
effectively together as members of a nationwide virtual team, use of enabling technology
that did not exist a few years earlier, and the intricate details of writing for book publication.
All of the team members are actively working in metrology as engineers, technicians, man-
agers, consultants, educators or auditors; none have written anything longer than a technical
report before. They were able to deliver the completed work on time, and the book is now in
its second printing. The things they learned about the process of working on this project can
be applied in many other areas.
Speaker: Dilip Shah
Title: ASQ’s Certified Calibration Technician Exam Update
Abstract: The ASQ’s Certified Calibration Technician (CCT) Exam has now been offered for more
than two years and over 400 candidates have passed the exam since its first offering in June
of 2003. This presentation provides the report on the exam progress, industry acceptance
and the body of knowledge covered. Misconceptions on the expectation of the exam are pre-
sented. The Measurement Quality Division’s involvement with the exam sponsorship, de-
velopment and exam volunteer opportunities are discussed.
Speaker: Christopher L. Grachanen
Title: Metrology Job Description Initiative
Abstract: In 2005, the U.S. Department of Labor, Bureau of Labor Statistics will be soliciting input
for updates and additions to the Standard Occupational Classification (SOC) listing for the
next formal release. The SOC system is used by all Federal statistical agencies to classify
workers into occupational categories for the purpose of collecting, calculating, and dissemi-
nating data. The SOC is updated every ten years. The last SOC update was completed in
2000. The SOC's current job descriptions for calibration practitioners are inaccurate in com-
municating job expectations. Educators use the SOC to provide students with career guid-
ance information. Without faithful job descriptions, it is unlikely that prospective candidates
will be steered into the Metrology field by educators. In addition, demographic information,
such as how many folks are in the Metrology profession, how many folks are leaving the
profession, etc., can not be accurately determined. In an effort to remedy these shortcomings
the American Society for Quality (ASQ) Measurement Quality Division (MQD) has teamed
up with the National Conference of Standards Laboratories International (NCSLI) to create
the Metrology Job Description (MJD) Initiative.
CORRECT AND IMPROVED GAGE R&R MEASUREMENT STUDIES*

By Dr. Donald S. Ermer
Why Do We Need Correct Quality Measurement Studies?
Many manufacturers are using statistical tools like Statistical Process Control
(SPC) and Design of Experiments (DOE) to monitor and improve product
quality and process productivity However, if the data collected are not accu-
rate and precise, they do not represent the true characteristics of the part or
product being measured even though organizations are using the quality im-
provement tools correctly. Therefore, it is very important to have a valid
quality measurement study beforehand to ensure that the gage R&R data col-
lected are accurate and precise, and that the power of SPC and DOE are fully
utilized. Accuracy, i.e., no bias, is the function of calibration and is per-
formed before a correct measurement study of the precisions of the gage and its operators.
In this paper, the “Gage” R&R study in the AIAG manual (1) is reviewed for its weakness in determin-
ing the true capability of the different parts of the measurement system. Then the paper uses a geometri-
cal approach to describe the components of the total measurement variance. This shows why the stan-
dard deviations or measurement errors of the equipment, appraiser, and product in the AIAG Method are
not additive and cannot be compared directly in a ratio. A useful worksheet for correctly executing a
measurement process capability study is also provided, which combines the advantages of the improved
measurement study discussed in the paper. The proposed method also uses the correct d2* values (d2
when k<25) and a small correction factor in the Average Range Method for the product or part variation.
The Gage R&R Study in the AIAG Manual
The Repeatability and Reproducibility (R&R) study in the AIAG Manual (1) uses a data collection sys-
tem that is very well structured and very helpful in collecting the proper data. However, the data are
then used to calculate the standard measurement errors or standard deviations of the equipment, ap-
praiser and product. The total measurement error or standard deviation is then obtained by taking the
square root of the sum of the squares of the equipment, appraiser and the product standard deviations.
Next, the measurement ratios are calculated by comparing the equipment and the appraiser standard de-
viations to the total measurement error or total standard deviation. These ratios are used to see how sig-
nificant the effects of the equipment, appraiser, and the product error variations are on the total measure-
ment system. Table 1 shows a summary of all the calculations that are used in this method, but only one
standard deviation is used, instead of finding a 95% Confidence Interval as in (1).
Unfortunately, there are two errors in the above AIAG R&R study. The first one is a minor incorrect
calculation of the part variation; i.e., there should be a correction factor which accounts for the variation
induced by the measuring equipment. If this correction factor (although it may be very small) is not fig-
ured into the calculation, then equipment variation would be “counted double” in the total variation.
The second and most significant error is that the final Variation Ratios (e.g., %EV, %AV, and %PV) are
calculated using standard deviations instead of variances, and the results obtained exaggerates the pro-
portional effects of the equipment, appraiser, and part variation, as shown in the second column of Table
2, the AIAG Method. Therefore, this incorrect type of study cannot provide an index of whether the
components of the measurement process are capable for the part or product under study.
*A more complete paper by Ermer and Yang E-Hok was originally published in the Winter 1997 issue of The
Standard, and then was republished in the June 1998 edition of Contributed Publications of the MQD.
The Correct Calculation of R&R
The measurement equipment error and product variation can be related by the following equation, as-
suming that measurement error is independent of the product variation within a range defined by the
natural process limits for the specified product.
2 = σ 2 +σ 2
σm p e
(1)
where
2
σm = Variance of Actual Product Measurement
σ 2p = True Variance of Product
σ 2e = Variance of Measurement Equipment Error
The above relationship can also be represented by a right triangle as shown in Figure 1. For example, if
32 9
sm=5, se=3, and sp=4, then 32 + 42 = 52, and
2
= = 0.36 , which is NOT equal to
5 25
3 4 2 16 4
= 0.60; and 2 = = 0.64 , and which is NOT equal to = 0.8 . This is a simple illustra-
5 5 25 5
tion of some of the misleading results for the final variation ratios in the AIAG method. Thus, a unit
change in either the True Product Standard Deviation (σp), or the standard deviation for Measurement
Equipment Error (σe), will not result in a unit change in the Standard Deviation for the Actual Product
Measurements (σm). On the other hand, one unit change in the True Product Variance ( σ 2p ) or
Measurement Equipment Error Variance ( σ 2e ) will respond to one unit change in the Variance of
2
σm 2 = σ 2 +σ 2
σm σm ≠ σ p +σe .
Actual Product Measurement ( ), since , i.e.,
p e
This shows that part of the results of the Gage R&R Report in the AIAG method is incorrect and there-
fore the person doing the study should use variances to find the true % R&R ratio values instead of the
standard deviations where:
WR
σˆ e =
d 2 ,e
(2)
Rp
σˆ m =
d *
2, m
(3)
and WR = Average of all of the within ranges of the trials for each part
R p = Range of the actual parts averages
d 2 ,e = 1.128 and 1.6926 for 2 and 3 trials respectively from Table 5 (assuming n=10 parts and
k=3 appraisers)
d * = 2.48 and 3.18 (see at bottom of Table 5) for 5 and 10 parts respectively and k=1; and
2, m see Table 5 for other d2* values (2).
Thus, if a correct R&R measurement analysis is not used, all the on-line or off-line quality improvement
efforts could lead to incorrect results and very limited product quality improvements.
Introduction of Appraiser Variation (A.V.)

Although the above proper variances indicate the capability of the measurement process, they are only
good when one operator is measuring the product, i.e., the appraiser variance is assumed to be insignifi-
cant. In actual situations, it is very difficult to isolate or eliminate the appraiser error in the measure-
ment process. Therefore, it is necessary to include the operator or appraiser variance(BC), as shown in
Figure 2, where:
R0
σˆ0 = = Appraiser/operator variation (4)
d *
2,0
R0 = Range of the operator averages
d * = 1.41 and 1.91 (see first row of Table 5) for 2 and 3 operators respectively.
2,0
With the addition of appraiser variation, the relationship among all the variances is changed as follows
(4): σ m2′ = σ 2p +σ 2e +σ o2 (5)
2
σm
where
′ = New Total Product Measurement Variation (assuming no interaction between Parts
and Appraiser) and substituting Equation 1, we get:
σ m2′ = σ m
2 +σ 2
o
(6)
The relationships among all the variations can be illustrated in Figure 2. The total product measurement
error (
2 ) will respond with one unit change when there is a unit change in gage, appraiser, or true
σm′
product variance, i.e. NOT with standard deviations.
In the AIAG original study (1), the constants d2,e, d2,m, and d2,o are all assumed equal to d2 for
the different sample sizes in the subgroup. However, these three values may be equal to either d2 or d2*,
depending on the number of subgroups and the sample size of the subgroup. If the number of subgroups
is greater than or equal to 25, then d2 should be used in the calculation, otherwise d2* should be used.
The number of subgroups and subgroup size depends on the number of parts, operators, and trials used
in the R&R study. For d2e, the total number of within ranges used to calculate the average is the number
of subgroups (nxk) while the number of trials (r) of each part will be the sample or subgroup size. For
d2,m and d2,o the number of subgroups is always equal to unity and the sample size is the number of parts
(n) tested, or the number of operators (k) in the measurement study, respectively. For example, if a
measurement study used 5 parts, each part measured twice by each of the three operators then d2e would
be based on only k=15 subgroups for the sample size equal to 2 (and d 2 ,e * = 1.15 ). The d2,m value
would be based on only one subgroup and a sample size of 5 (and d 2 , m * = 2.48 ), while d2,o would
be based on only one subgroup and a sample size of 3 (and d 2 ,o * = 1.91 ). Therefore for this exam-
ple, d2,e, d2,m, and d2,o should all use d2* instead of d2. The values of d2* (and d2) are given in Table 5.
In addition, a more accurate estimate of the operator or appraiser variance can be obtained, i.e., a correc-
tion factor should be used to eliminate the contamination caused by the measurement equipment vari-
ance in the data. The modified equation is:
2
⎛ ⎞ σˆ 2e
⎜ ⎟
σˆ o2 = ⎜ o ⎟ −
R
⎜ d * ⎟ (n)(r)
⎝ 2,0 ⎠ (7)
σˆ 2e
where is the correction factor (C.F. #1).
(n)(r)
The estimation of the true product or part variation can be improved by also including a correction factor
in its calculation, although it will not be large. The correction factor is similar to C.F. #1 but with a dif-
ferent denominator in the last term. The improved estimation of the part or product variation is as fol-
lows:
2
⎛ ⎞ σˆ 2
⎜ R ⎟
σˆ 2p = ⎜ p ⎟ −
e
⎜ d * ⎟ (k)(r)
⎝ 2, m⎠ (8)
σˆ 2e
where is the relatively small correction factor (C.F. #2)
(k)(r)
Given the changes above, the new measurement study will be more accurate, as well as correct.
Summarizing the Results Obtained by Different R&R Studies
Table 2 shows the results of using different Gage R&R studies on the same set of measurement data
from Table 3 (Data Set A), where the ANOVA Method is the most accurate since it uses all of the data,
not just the ranges. The last column shows the correct percent variations calculated from the New
Method described in the previous section. It should be noted that with the New Method, the % Repeat-
ability and the % Reproducibility and % Part Variation add up to 100%, which is not true with the AIAG
Method (1). Comparing the AIAG R&R Method (1) with the ANOVA (for the Random Effects Model)
Method, which uses all of the data for its analysis, and the NEW method, it can be seen that the Gage
R&R from AIAG exaggerates the effect of the percentages for E.V., A.V. and P.V.; that is, the %E.V.,
%A.V., and %P.V. as obtained in the AIAG R&R study are incorrectly greater than the actual results, as
shown in the second column. This is due to their incorrect approach of comparing the standard devia-
tions to the total standard deviation versus the correct approach of using the additive law of variances.
This mistake in the AIAG R&R study could lead to a judgment that the measurement process is incapa-
ble when the measurement process is actually capable (4). Thus, mistakes like these will mislead the
organization to direct their improvement effort to improve a capable measurement process, while the
same effort should be used in reducing the process or product variance.
The results of the ANOVA Method and New Method agreed closely. This can be seen by comparing the
results from the ANOVA method with the New Method in Table 2, i.e., the third column versus the
fourth column. Therefore the NEW Method should be employed for a proper measurement process
study, as given in Table 4.
Solving the Identified Problem Areas of the Measurement Process
The next step will be solving any identified problems and improving the measurement process capability
or resolution (6). For a measurement process with a problem in the equipment/gage variation area, there
are several steps to check for the root cause of the problem. The first step is to check whether the meas-
urement system has an adequate number of decimal places; i.e., a resolution good enough for measuring
the product variation. If the actual product measurement unit is larger than the gage standard division or
unit, the measurement unit is considered inadequate for the product. That is, the gage is not capable to
perform a measurement that requires such accuracy. If this problem of resolution occurs, one must con-
sider using a measurement unit that is smaller than the gage standard division.
However, if the measurement unit cannot be changed, then the organization has to use an alternate gage
or measuring device with better resolution to perform the measurement. For example, if the measure-
ment unit of a data set is 0.01, then the gage standard division must be smaller than 0.01, e.g., .001, in
order to have a resolution good enough for the study.
Another possible area in the improvement of gage accuracy is to calibrate the gage on a regular basis.
Although most of the measurement gage manufacturers provide calibration services to their customers, it
is the gage users’ responsibilities to make sure their gages are calibrated before a Gage R&R Study. The
users should also make sure that their gages are performing at the standard claimed by the gage manu-
facturers (7).
When an operator bias effect is detected, the problem can be temporarily solved by offsetting the amount
of bias to all the measurements made by that particular appraiser. However, the long term solution is to
understand why that appraiser/operator has a bias on all the measurements; whereas, when an appraiser
inconsistency effect is detected, the questionable operator is usually having problems using the equip-
ment properly. For example, they may not align the product correctly before taking a measurement or
have a problem reading the finer marks on the gage. Also, they may not have clear instructions on
which part of the product should be measured. Many of these problems are the result of insufficient
training of the appraiser or an ineffective training program. Therefore, either the operator will need to
undergo a training program or a new training program will be needed for effective gage measurements,
depending on the situation.
If the measurement problems cannot be identified by the above methods, there are many tools available
to help finding the root cause. Some examples are DOE and some of the other basic quality tools (e.g.,
Fishbone diagram, Check sheet, Scatter Plot, Pareto Diagram, etc.). No matter what type of quality tool
is used, it is always important to have the personnel that are affected by the problem involved in the
problem solving process. This will provide a better understanding of the measurement problem and fa-
cilitate communications within the company.
Summary
A graphical analysis helps in understanding the components of the measurement system, and their rela-
tive importance. Current AIAG R&R methods may be misleading, and should be modified according to
the methods given in this paper. At the same time, with the widespread availability of computers, appro-
priate software could be used to calculate the correct d2* values and the correction for part variation as a
basis for a more precise variable measurement study. Thus, this paper shows how important reliable
measurement data and its analysis is, and hopefully will help all quality conscientious organizations fur-
ther improve the quality of their products and the productivity of their processes.
Donald S. Ermer, Ph.D., P.E., & CMfg.E.

Procter & Gamble Bascom Professor Emeritus in Total Quality
Departments of Industrial & Systems Engineering and Mechanical Engineering
University of Wisconsin-Madison
1513 University Avenue
Madison, WI 53706
Phone: 608-262-2557
FAX: 608-265-2316
Email: ermer@engr.wisc.edu
Bibliography
1. Brown, L.A., Daugherty, B.R., Lowe, V.W., “Measurement Systems Analysis,” Auto Industry Action
Group (AIAG), Troy, MI, May 2003, Second Edition.
2. Duncan, A.J., Quality Control and Industrial Statistics, 5th Ed., Richard D. Irwin, Inc., Homewood,
Illinois, 1986.
3. Prond, P. and Ermer, D.S., “A Geometrical Analysis of Measurement System Variations,” ASQC An-
nual Quality Congress Transactions, 1993.
4. Ermer, D., “Pythagorean Theorem to the Rescue or Reliable Data is an Important Commodity,” The
Standard, The Measurement Quality Division of ASQ, Vol. 15, No. 1, Spring 2001/Winter 2000.
5. Wheeler, D.J., “Problems With Gage R&R Studies,” ASQ Annual Quality Congress Transactions,
May, 1992.
6. Stein, Philip, “All You Ever Wanted to Know About Resolution,” Quality Progress, July 2001.
7. Bucher, J.L., The Metrology Handbook, ASQ, 2004.
Repeatability-
Equipment E .V . = WR * K1 WR =Avg. of the within range of the trials of
Variation (E.V.)
each part (
Re )
%E.V.=100[E.V./T.V.] Trials (r) 2 3
K1 4.56 3.05
Reproducibility-
Appraiser
Variation (A.V.)
A.V . = (X Diff )2
* K2 −
( E .V .) 2
n*r
X Diff
= Range of the operator averages (R0)
%A.V.=100[A.V./T.V.] Operators (k) 2 3

n=number of parts K2 3.65 2.70
r=number of trials
Part Variation P.V.=Rp*K3 Rp=Range of the part averages
(P.V.)
%P.V.=100[P.V./T.V.] Parts (n) 5 10
K3 2.08 1.62
Repeatability %R&R<10%--process is capable
and Reproduci- R&R= ( E .V .) 2 + ( A.V .) 2 10%<R&R<20%--barely capable
bility (R&R) %R&R=100[R&R/T.V.] over 20%--requires improvement
Total Variation
(T.V.) ( R & R ) 2 + ( P.V .) 2
T.V.=
Table 1—SUMMARY OF EQUATIONS (FOR ONE STANDARD DEVIATION) USED IN
THE AIAG GAGE R&R STUDY(1)
MEASUREMENT AIAG Method ANOVA (uses all NEW Method

UNIT ANALYSIS of the data) (using d2*, and
Variances)
I II III IV
E.V. 3.783 4.41 3.710
A.V. 4.286 3.50 4.293
R&R 5.717 5.63 5.674
P.V. 23.45 23.05 23.43
T.V. 24.13 23.71 24.11
%(E.V./T.V.) 15.68% 3.45% 2.45%
%(A.V./T.V.) 17.76% 2.18% 3.09%
%(P.V./T.V.) 97.18%
94.37% 94.46%
TOTAL ”130.62%”
100.00% 100.00%
TABLE 2—SUMMARY OF RESULTS FROM DIFFERENT R&R STUDIES
(DATA SET A IN TABLE 3)
I. Data Set A
Operator A A WR B B WR C C WR Part
(A) (B) (C) Average
Trial 1 2 1 2 1 2
Part 1 67 62 5 55 57 2 52 55 3 58.0
Part 2 110 113 3 106 99 7 106 103 3 106.2
Part 3 87 83 4 82 79 3 80 81 1 82.0
Part 4 89 96 7 84 78 6 80 82 2 84.8
Part 5 56 47 9 43 42 1 46 54 8 48.0
5.6 3.8 3.4

Within Range Average (
WR )
Operator Average 81.0 72.5 73.9
Overall Within Range Average 4.267

( WR )
(R ) p
58.16
7
Range of Part Average
Range of Operator Average, 8.5
X diff ( Ro )
TABLE 3—RAW DATA FOR COMPARISON OF DIFFERENT R&R STUDIES
General Information
Part No. & Name: Data Set A Gage Name: Date: / /
Characteristics: Gage No.: Performed by:
Specification: Gage Type: Plant:
Tolerance: Gage Calibration Exp.: / / Gage Resolution:
Part Information from Data Sheet
No. of Trials (r) = 2 No. of Appraisers (k) = 3 Number of Parts (n) = 5
WR = 4.267 Ro = 8.5 Rp = 58.167 X = 75.8
Measurement Unit Analysis

Repeatability—Equipment Variation (E.V.)
( E.V .) 2 (3.710) 2
× 100 = ×100 = 2.45%
WR/ d * (T .V .) 2 (24.11) 2
2, e
E.V. =
= 4.267/1.15
= 3.71 = σe
Reproducibility—Appraiser Variation (A.V.)

( A.V .) 2 (4.293) 2
2 × 100 = ×100 = 3.09%
⎛ Ro ⎞ ⎛ E .V .2 ⎞ (T .V .) 2 (24.11) 2
⎜ ⎟ ⎜ ⎟
⎜ d *⎟ −⎜ n×r ⎟
⎝ 2 ,o ⎠ ⎝ ⎠
A.V. =
2
⎛ 8.5 ⎞ ⎛ 13.76 ⎞
⎜ ⎟ −⎜ ⎟
⎝ 1.91 ⎠ ⎝ 10 ⎠
=
= 4.293 = σo
Repeatability and Reproducibility (R&R)
( R & R) 2 (5.674) 2
× 100 = × 100 = 5.54%
E.V .2 + A.V .2 (T .V .) 2 (24.11) 2
R&R =
(3.710 ) 2 + ( 4.293) 2
=
= 5.674
Product or Part Variation
( P.V .) 2 (23.43) 2
2 ×100 = ×100 = 94.46%
⎛ R p ⎞ ⎛ E .V .2 ⎞ (T .V .) 2 (24.11) 2
⎜ ⎟ ⎜ ⎟
⎜ d *⎟ −⎜ k ×r ⎟
⎝ 2 , m ⎠ ⎝ ⎠
P.V. =
2
⎛ 58.167 ⎞ ⎛ 13.76 ⎞
⎜ ⎟ −⎜ ⎟
⎝ 2.48 ⎠ ⎝ 6 ⎠
=
= 23.43 = σp
Total Variation Check:
94.46% + 3.09% + 2.45% = 100%
(R & R )2 + ( P.V .) 2
T.V. =
(5.674 ) 2 + ( 23.43) 2
=
= 24.11
TABLE 4—OUTPUT FOR “NEW” METHOD
Values of d2*, d2, and d3

Sample Size (n)
Number of 2 3 4 5 6 7
subgroups (k)
1 1.41 1.91 2.24 2.48 2.67 2.83
2 1.28 1.81 2.15 2.40 2.60 2.77
3 1.23 1.77 2.12 2.38 2.58 2.75
4 1.21 1.75 2.11 2.37 2.57 2.74
5 1.19 1.74 2.10 2.36 2.56 2.73
6 1.18 1.73 2.09 2.35 2.56 2.73
7 1.17 1.73 2.09 2.35 2.55 2.72
8 1.17 1.72 2.08 2.35 2.55 2.72
9 1.16 1.72 2.08 2.34 2.55 2.72
10 1.16 1.72 2.08 2.34 2.55 2.72
11 1.16 1.71 2.08 2.34 2.55 2.72
12 1.15 1.71 2.07 2.34 2.55 2.72
13 1.15 1.71 2.07 2.34 2.55 2.71
14 1.15 1.71 2.07 2.34 2.54 2.71
15 1.15 1.71 2.07 2.34 2.54 2.71
16 1.15 1.71 2.07 2.34 2.54 2.71
17 1.15 1.71 2.07 2.34 2.54 2.71
18 1.15 1.71 2.07 2.33 2.54 2.71
19 1.14 1.70 2.07 2.33 2.54 2.71
20 1.14 1.70 2.07 2.33 2.54 2.71
25 1.14 1.70 2.07
30 1.14 1.70
50 1.13
d2 1.128 1.6926 2.0588 2.3258 2.5344 2.7044
d3 0.8525 0.8884 0.8798 0.8641 0.8480 0.8332

Source: A.J. Duncan, “The Use of Ranges in Comparing Variabilities,” Ind.
Qual. Control, Vol. 40, No. 5, February, 1955; No. 8, April, 1955. (note for k=1
and n=10, d2* = 3.18)
TABLE 5—CONSTANTS FOR CONVERTING A RANGE TO A STANDARD DEVIATION
MEASUREMENT QUALITY DIVISION OFFICERS AND COMMITTEE CHAIRS

Chair (2003-2005), Immediate Past Chair / Nominating Chair
Program Chair (2005-2006) Duane Allen
Joe Simmons Scholarship MQD Representative U. S. Navy,
Dilip A. Shah P. O. Box 5000, Code MS11,
E = mc3 Solutions Corona, CA 92878-5000
197 Great Oaks Trail #130 Voice (909) 273-4783 / Fax (909) 273-4599
Wadsworth, Ohio 44281-8215 E-mail: duane.allen@navy.mil
Voice (330) 328-4400 / Fax (330) 336-3974
E-mail: emc3solu@aol.com, dashah@aol.com Joe Simmons Scholarship
Norm Belecki
Chair-Elect, Examining Chair 7413 Mill Run Dr
Graeme C. Payne Derwood, MD 20855-1156
GK Systems, Inc. Voice (301) 869-4520
4440 Weston Drive SW, Suite B E-mail: n.belecki@ieee.org
Lilburn, GA 30047 USA
Voice: (770) 931-4004 / Fax (866) 887-9344 Historian
E-mail: Graeme@gksystems.biz Keela Sniadach
Promega Corp.
Treasurer 5445 East Cheryl Parkway
Karl Wigdal Madison, WI 53711
Promega Corp. Voice (608) 298-4681 / Fax (608) 277-2516
5445 East Cheryl Parkway E-mail: keela.sniadach@promega.com
Madison, WI 53711
Voice (608) 277-2633 / Fax (608) 277-2516 Regional Councilors
E-mail: karl.wigdal@promega.com Region 5
Secretary, Newsletter Editor/Publisher, Richard A. Litts
Share Point Administrator 100 Evergreen Dr
Jay L. Bucher Downingtown, PA
Bucherview Metrology Services E-mail: ralitts@aol.com
6700 Royal View Dr.
De Forest, WI 53532-2775 Region 7
Voice (608) 277-2522 / Fax (608) 846-4269 Randy D. Farmer
E-mail: jay.bucher@promega.com, Metrology Solutions
yokota-69@charter.net 1488 Via Hacienda
Chula Vista, CA 91913
Certification Chair, Website Manager, (619) 934-4948 / (858) 688-2672 cell
NCSL International Representative E-mail: farmerrd2@cox.net
Christopher L. Grachanen
Manager, Houston Metrology Group Hewlett-Packard Region 14
P. O. Box 692000 MS070110 Keith Bennett
Houston, TX 77269-2000 Transcat
Voice (281) 518-8486 / Fax (281) 518-7275 Voice (713) 465-4395
E-mail: Chris.Grachanen@hp.com E-mail: kbennett@transcat.com
Standards Committee Representative ASQ Division Administrator

Bill McCullough Ms. Karen Prosser
McCullough Consulting Voice (800) 248-1946, x7471
1936 June Cr E-mail: Kprosser@asq.org
Carson City, NV 89706
Voice: (775) 883-3042 Fax: (775) 883-3042
Cell: (775) 220-6424
E-mail: billmccullough@gbis.com
ASQ MEASUREMENT QUALITY DIVISION REGIONAL COUNCILORS
Regional Councilors represent the Division to members and Sections in their

geographic areas. Regional Councilors are appointed for renewable two-year
terms, and are advisory members of the Division leadership team.
Region 1 (CT, MA, ME, NH, RI, VT) Region 9 (IN, KY, OH)
Volunteer Opportunity! Volunteer Opportunity!
Region 2 (NJ, NY, PA) Region 10 (OH, MI)
Region 3 (CT, NJ, NY) Region 11 (NC, SC, TN, VA)
Mr. Eduardo M. Heidelberg Volunteer Opportunity!
Pfizer
Parlin, NJ 08859 Region 12 (IL, MN, ND, SD, WI)
E-mail: eheidelb@yahoo.com
Dr. Donald S. Ermer
Region 4 (Canada) ASQ Fellow; Eugene L. Grant Medal
(2001)
Mr. Alexander T. C. Lau University of Wisconsin—Madison
ExxonMobil Madison, WI 53706
Whitby, ON L1R 1R1 E-mail: Ermer@engr.wisc.edu
E-mail: alex.t.lau@exxonmobil.com
Region 13 (CO, IA, KS, MO, NE, SD, WY)
Region 5 (DC, DE, MD, PA, VA)
Volunteer Opportunity!
Mr. Richard A. Litts
Litts Quality Technologies Region 14 (AR, LA, NM, OK, TX, part of
Downington, PA 19335 Mexico)
E-mail: info@littsquality.com Mr. R. Keith Bennett
TRANSCAT
Region 6 (AK, CA, HI, ID, MT, OR, UT, WA, Kingwood, TX 77339
WY) E-mail: kbennett@transcat.com
Volunteer Opportunity!
Region 15 (AL, FL, GA, LA, MS, Puerto Rico)
Region 7 (AZ, CA, NV, part of Mexico) Mr. E. Bryan Miller
Mr. Randy D. Farmer ASQ Fellow
Metrology Solutions Bryan Miller Consulting
Chula Vista, CA 91913 Florence, AL 35633
E-mail: farmerrd2@cox.net E-mail: milleb@mindspring.com
Region 8 (OH, PA) Region 25 (all other countries)

R
Advances in Science
2005
NCSLI Workshop
& Symposium
and Technology –
Washington, DC Their Impact on Metrology
August 7–11, 2005
Washington
Hilton & Towers
Get the know-how you need – now!

• Learn from top experts
• Network with your colleagues
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ADVANCES IN SCIENCE AND TECHNOLOGY —
THEIR IMPACT ON METROLOGY
Advances in Science and Technology continue at an ever increasing rate. This is especially true in the fields of Medicine, Nanotechnology, Biology, and
Space Sciences. The 2005 NCSLI Workshop and Symposium, to be held in Washington, DC, is designed to provide a forum for people in metrology and
calibration to learn, and to share ideas. To help people in the world of calibration meet the challenges created by these advances, the 2005 NCSLI
Workshop and Symposium includes workshops covering quality, management, and international issues, plus many technical sessions that provide a
person with education in the latest advances in standards and calibration processes.
Also, there are many NCSLI working committees that will be meeting to discuss issues of mutual interest, including the development of the future Z540
standards, intrinsic standards, ISO standards, Small Business needs, etc. You are invited to become active and begin working with peers from around
the world in setting the direction metrology will take in the future.
TECHNICAL PROGRAM SUMMARY
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
KEYNOTE
The 2005 NCSLI Technical Program will cover ten sessions spread over four days, with over
150 speakers and panelists covering a wide range of metrology topics and issues. Because of
the strength of the abstracts received, the Technical Program has been expanded from five to
Dr. Hratch G. Semerjian is the acting six parallel tracks in each session this year.
director of NIST. As the U.S. National
Metrology Institute (NMI), NIST is PLENARY SESSIONS: DEVELOPMENTS IN NATIONAL MEASUREMENT SYSTEMS
THE BIPM, ILAC, AND MRA
constantly expanding the frontiers of
measurement to promote innovation, advance U.S. > Management of the UK National Measurement System
manufacturing, facilitate trade, improve public safety and > Experiences of the National Measurement Institute of Japan
security, and improve the quality of life. Through cutting > BIPM/ILAC Collaboration
edge research in areas as diverse as nanotechnology, > Issues for NMIs in the Asia Pacific Metrology Program (APMP)
biotechnology, quantum computing, and homeland > The ILAC MRA Mark
security, NIST supports U.S. industry needs for new and
unique metrology and measurement services. While NIST
SPECIAL TOPICS
is expanding its measurement capabilities into new areas, > 2005 NCSLI Benchmarking Survey
it is continuing to address the measurement challenges > 2005 State Laboratory Program Workload Survey
posed in creating an “electronic” kilogram and measuring > Update on the Revision of the VIM
frequency to the femtosecond level. > Status of the GUM Supplements
The commissioning of NIST's new Advanced Measurement TECHNICAL PRESENTATIONS

Laboratory in 2004 has provided NIST scientists and > ISO 17025 Revision and Laboratory Accreditation
engineers with a unique facility that allows both cutting > Traceability Issues in Industrial Laboratories
edge research and > Temperature Calibration at Fixed Points
state-of-the-art > Pressure, Mass, Capacitance, AC, and Flow Measurements
measurement capabil- > NIST Optical Short Courses
ities. These include the > Dimensional Measurements and Temperature Control
provision of calibrations, > Legal Metrology Issues
standard reference > Uncertainty Evaluations and Software
materials (SRM's),
standard reference data (SRD) and accreditation of labora- PANEL DISCUSSIONS
tories, both for calibration and testing. The services > Future of Metrology Education and Training
themselves, and the ways in which they are provided, are > Metrology Educators Forum
being improved, as NIST strives to meet new demands by > Measurement Needs in the Year 2020
its customers and by changing technology. Dr. Semerjian > Testing Laboratory Calibration Needs
will describe NIST's response to today's measurement and > Equipment Management Forum
standards challenges. > ASQ Certified Calibration Technician
> Small Business Panel
> Conventional vs. Bayesian Statistical Methods
www.ncsli.org
BENEFITS OF ATTENDING
Get the KNOWLEDGE you need-now! Network with your colleagues

NCSLI brings metrology to life. You meet face-to-face with the top experts NCSLI attracts high-caliber attendees from around the world, so you can
in their field. “You can learn more in three days at an NCSLI Workshop learn from them, as well as at the technical sessions and social events.
and Symposium than you may ever learn on your own!” You will develop a valuable network of peers. And you’ll make friends –
good business starts with a handshake.
Discover the keys to success with NCSLI
NCSLI focuses on giving you the knowledge you need to solve your Boost your smarts, skills, and success
metrology and business problems, from accreditation to quality systems There is no better investment than in yourself. Come to the 2005 NCSLI
to uncertainty analysis to procedures. From the experts you’ll discover Conference and see your knowledge grow and expand. In just a few days
what’s important (and what’s not), and how to make it all work for you you’ll gain abundant new ideas, insight, and detailed know-how you can
right now. not get anywhere else. Don’t miss this year’s unique opportunity!
Learn what you NEED to know about metrology Lunch with the Speakers
With dozens of NCSLI technical, quality, and management sessions to At NCSLI you’re welcomed into the community and are provided lunch
choose from – including committee meetings and impromptu discussions every day at discussion round-tables! What better way to meet and learn
– you can discuss your ideas and learn. than by joining the speakers during lunch? Ask questions, share your
solutions, and learn more about current topics.
Learn from experts
NCSLI gives you a unique opportunity to expand your education and Who should attend?
conquer your technical challenges in an in-depth, friendly, and relaxed, The technical, educational and quality sessions are valuable for technical
personal setting. Educational sessions are presented by leading experts, executives and managers, scientists, consultants, engineers, tech
and include the likes of the acting director of NIST, well-known scientists, administrators, business solution providers, trainers, and anyone who
and corporate pros, all dedicated to your success. This mix of expertise wants to learn about the top products, key technologies and best
ensures that you get the real story on how it all works. practices in metrology.
Explore hot solutions and services Team up to win . . . and save money
In the Exhibition Hall you’ll discover what’s new in calibration hardware To get the maximum benefit, don’t miss out on any of the educational
and software. You’ll also find innovative software and management tools. sessions and workshops. Bring colleagues with you! By registering three
Best of all, you meet and talk to calibration education and training or more people from your organization, you can effectively cover all of
organizations, and effectively determine what will best work for you. the sessions and thereby take home the maximum knowledge. Plus, the
team can focus on priority projects free from office distractions.
EXHIBITORS
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A.K.O. Inc. Diversified Data Systems, Inc. Laboratory Accreditation Bureau Rice Lake Weighing Systems
A2LA Dynamic Technology, Inc. Lockheed Martin Technical Operations Richard J. Bagan, Inc.
ACLASS East Hills Instruments Masy Systems, Inc. Rohde & Schwarz, Inc
AcuCal, Incorporated Edison ESI Measurements International SanSueB Software
Agilent Technologies Electronic Development Labs Mensor Corporation Sartorius Corp.
AMETEK, Test & Calibration Inst. ESSCO Calibration Laboratory Metronom U.S. Inc. SIM
Andeen-Hagerling, Inc. EUROMET Mettler Toledo SIMCO Electronics
Army Primary Standards Laboratory EXELON NACLA Solance Technologies
ARTEL Flow Dynamics, Inc National Assoc. For Proficiency Testing Standards Council of Canada
Asia Pacific Metrology Programme Flow Systems National Physical Laboratory Sypris Test & Measurement
AssetSmart Fluke Corporation National Research Council of Canada TAC/TourAndoverControls
ATC, Inc. GE Infrastructure Sensing Naval Surface Warfare Center TEGAM, Inc.
BAE SYSTEMS GE Instrumentation Services Navy Primary Standards Laboratory Tektronix
Beamex GE Pressurements NIST/Calibration Program Testo Inc.
Bios International Corporation GE Ruska Instrument Corporation NIST/NVLAP The Bionetics Corporation
Blue Mountain Quality Resources, Inc. GIDEP Northrop Grumman Corporation The Modal Shop, Inc.
Brother International Corporation Guildline Instruments Inc. Northwest Metrology Thunder Scientific Corp.
Bruel & Kjaer Hart Scientific Norvada, LLC Tovey Engineering, Inc.
Buck Research Instruments, LLC Heusser Neweigh Oak Ridge Metrology Center Transcat
Cal Lab Magazine ICL Calibration Laboratories, Inc. On Time Support, Inc. Troemner, LLC
Cal Lab Solutions IET Labs, Inc. OPTO-CAL, Inc. Unified Industries Incorporated
Clarke-Hess Communication Research IndySoft Pacific Edge, Inc. Universal Label Technologies
Colorado Engineering Experiment INSCO Metrology Parameter Generation & Control, Inc. Vaisala, Inc.
Station, Inc. Instrulab Inc. Paroscientific, Inc. Veriteq
Condec Instrument Rental Labs PolyScience Western Environmental Corp.
Crystal Engineering Interface, Inc. Pond Engineering Laboratories, Inc. Workplace Training
Data Proof International Accreditation Service, Inc. Prime Technology, LLC Wyle Laboratories
Davis Inotek Instruments ISOTECH North America Process Instruments, Inc. Yokogawa Corporation of America
DH Instruments Kaymont Consolidated QUAMETEC
DH-Budenberg Inc. King Nutronics Corporation RH Systems
TUTORIALS Discover how to identify, manage, and master your measurement challenges at NCSLI 2005.
SATURDAY, AUGUST 6 8:00 — 12:00 PM HALF DAY SESSIONS

> T1 Fundamentals of Temperature Calibration Ron Ainsworth and Tom Wiandt
> T2 Balance and Scale Calibration and Use Val Miller
SATURDAY, AUGUST 6 1:00 — 5 :00 PM HALF-DAY SESSIONS

> T3 Temperature Calibration Uncertainty Analysis Ron Ainswoth and Tom Wiandt
> T4 Balance and Scale, and Weighing Process Uncertainties Val Miller
> T5 Measurement Uncertainty Made Easy Mike Ouelette
SUNDAY, AUGUST 7 8:00 — 12:00 PM HALF DAY SESSIONS

> T6 Very Low Pressure Calibration Kurt Kurtz, Mike Bair, Matt Daniels
> T7 Practical Modeling of Measurements for the Uncertainty Evaluation Klaus-Dieter Sommer
> T8 Laboratory Accreditation: The Process from A to Z Dana Leaman
> T9 Running an Effective Laboratory: The Measurements Beyond Metrology Gregg Powell and Malcolm Smith
> T10 Good, Bad, or Indeterminate: Using Guardbands to Help Make the Call David Deaver
> T11 Measurement of Customer Satisfaction: An Application of “Soft” Metrology Jean Claude Krynicki
SUNDAY, AUGUST 7 1:00 — 5:00 PM HALF DAY SESSIONS

> T12 Very Low Pressure Applications Kurt Kurtz, Mike Bair, Matt Daniels
> T13 Evaluating Measurement Uncertainty in Chemical Laboratories Wolfgang Richter, Klaus-Dieter Sommer
> T14 Pipette Calibration and Use: Methods for Reducing Variability via Uncertainty Analysis Ron Ainsworth, Tom Wiandt
and Bench-top Verification
> T15 Force Calibration: Methods and Uncertainties Mike Tovey
> T16 The Shocking Aspects of ESD: Things You Should Know About Electronic Discharge Patrick Andre
> T17 Measurement System Analysis Handbook for the Automotive Industry Steve Stahley
FRIDAY, AUGUST 12 8:00 — 12:00 PM HALF DAY SESSIONS

> T18 Advanced Topics in Uncertainty Analysis Howard Castrup
> T19 Laboratory Data Management: If the Data Don’t Match, the Answers Won’t Hatch Don Wyatt
> T20 Inventory Data Normalization: The Whys, Whats, and Techniques Charlie Motzko
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .
A special opportunity to tour the new NIST Advanced Measurement Laboratories (AML).
NIST TOURS All Day Friday – very limited attendance space.
> Category 1: Physical/Dimensional Labs

The Standard Kilogram; Dimensional Metrology: Ultra-High Accuracy Coordinate; The NIST Small Force Metrology Laboratory.
Maximum number of participants: 36.
> Category 2: Electrical Labs

Voltage Metrology; Resistance Metrology; Power and Energy Metrology. Maximum number of participants: 36.
> Category 3: Optical/Physics Labs.

High Accuracy Cryogenic Radiometry; Spectral Irradiance and Radiance Responsivity using Uniform Sources (SIRCUS);
Quantum Information Processing with Neutral-Atom Qubits. Maximum number of participants: 36.
> Category 4: NIST Center for Neutron Research (NCNR) and Advanced Measurement Laboratory (AML) Nanofabrication Facility
NIST Center for Neutron Research and Nanofabrication Facility. Maximum number of participants: 24.
www.ncsli.org
SCHEDULE
SATURDAY AUGUST 6
> 8:00 AM – 12:00 PM Tutorials: T1, T2
> 1:00 PM – 5:00 PM Tutorials: T3, T4, T5
SUNDAY AUGUST 7
> 8:00 AM – 12:00 PM Tutorials: T6, T7, T8, T9, T10, T11
WASHINGTON ROOM RATES > 1:00 PM – 5:00 PM Tutorials: T12, T13, T14, T15, T16, T17
HILTON & TOWERS > 7:00 PM – 9:00 PM Exhibitors’ Reception

Single - $153
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Washington, DC 20009 Towers single – $185
> 8:00 AM – 8:30 AM Exhibit Viewing
202-483-3000 Towers double - $195
> 8:00 AM – 5:00 PM Registration
Group Code: NSL
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> 10:45 AM – 12:15 PM Technical Sessions
> 12:15 PM – 1:45 PM Lunch
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> 2:30 PM – 4:00 PM Technical Sessions
> 4:00 PM – 4:30 PM Exhibit Viewing
> 4:15 PM – 6:00 PM Committee Meetings
> 6:00 PM – 8:00 PM NCSLI President’s Reception
TUESDAY AUGUST 9
> 8:00 AM - 8:30 AM Exhibit Viewing
> 8:30 AM - 10:00 AM Plenary Session
> 10:45 AM - 12:15 PM Technical Sessions
> 12:15 PM - 1:45 PM Lunch
> 1:45 PM - 2:30 PM Exhibit Viewing
> 2:30 PM - 4:00 PM Technical Sessions
GOLD SPONSORS > 4:00 PM - 4:30 PM Exhibit Viewing
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> 7:00 PM - 10:30 PM NCSLI Annual Banquet
WEDNESDAY AUGUST 10
> 8:30 AM - 10:00 AM Plenary Session
> 10:45 AM - 12:15 PM Technical Sessions
> 12:15 PM - 1:45 PM Lunch
> 1:45 PM - 2:30 PM Exhibit Viewing
> 2:30 PM Exhibits Closed
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THURSDAY AUGUST 11
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> 10:00 AM – 10:45 AM Break
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> 12:15 PM – 1:45 PM Lunch
> 1:45 PM – 3:15 PM Technical Sessions
FRIDAY AUGUST 12
NCSLI PRESIDENT’S RECEPTION SPONSOR
> 8:00 AM – 12:00 PM Tutorials: T18, T19, T20
> 9:00 AM – 4:00 PM NIST Tours
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Member $110 $130
Non-Member $140 $160
NIST ADVANCED MEASUREMENT LAB TOUR
August 12, 2005 $35 (select one tour)

> Tour A Physical/Dimensional
> Tour B Electrical
> Tour C Optical/Physics
> Tour D Neutron Research/Nanofabrication
INTERNATIONAL EVENT
NCSLI promotes competitiveness and success of its
Sunset dinner cruise on the Potomac members by improving the quality of products and services
aboard the Dandy riverboat $75 through excellence in calibration, testing, and metrology
education and training.
NCSL INTERNATIONAL
2995 Wilderness Place, Suite 107
Boulder, Colorado 80301-5404
2006 call for papers.ai 1/7/2005 12:00:39 PM
CALL FOR PAPERS

Measurement Science Conference
“The Science, Technology, and Control of Measurements”
Past, Present, and Future
2006 Disneyland Hotel, Anaheim, February 27 – March 3, 2006
MEASUREMENT SCIENCE
C O N F E R E N C E MSC features topics of interest to the test, metrology & calibration, and precision
measurement communities. MSC exists to promote education and professionalism in the
measurement science and related disciplines. Technical and managerial experts in the
measurement sciences are invited to lead sessions, panel discussions, and to present
papers or workshops on topics of importance to the global measurement community.
Participants from government, aerospace, medical, and environmental backgrounds
meet to share the most up-to-date information.
Authors
You are invited to participate in the 2006 Conference by presenting a paper on any
topic of interest to those involved in the application of measurement disciplines.
Please notify the Program Chairman as soon as possible of your interest.
The deadline for submitting your abstract is April 30, 2005. To present
at MSC, you must submit a paper.
Session Developers
If you are interested in developing a technical session, please
contact the Program Chairman. Send your name, address,
telephone number, and a short biographical sketch to the
C
Program Chairman and indicate your area of interest.
Preference will be given to the developers with a full slate of
M papers.
Y Tutorial Workshops
CM MSC has an extensive tutorial workshop program, which are
half-day (4-hour) instructional seminars. You are invited to
MY
submit a tutorial workshop proposal in addition to, or instead of, a
CY
conference paper.
CMY
PROPOSED TRACKS
K
LAB MANAGEMENT ACCREDITATION TECHNOLOGY MATH AND STATS
AUTOMATION OF MEASUREMENT RF AND MICROWAVE
Suggested Topics
Technical Topics
Electrical Pressure Resistance Capacitance
Temperature Vibration Time Frequency
Mass Gas, Liquid Flow Humidity RF & Microwave
Air Quality Optical Short Wave Light Transducers Verification
Coordinate Measuring Machines Automation Advanced Technologies (NANO, etc.)
Fields
Chemical Process Manufacturing Pharmaceutical
Environmental Medical Biological Homeland Defense
Management Topics
Traceability Laboratory Accreditation Laws & Regulations
Interval Adjustment Procedures Development Automation
Technician Training Error & Data Analysis Metrology Budgets
Outsourcing Services Audits & Quality Control Equipment Development
On-Site Calibration Reference Standard Maintenance Equipment Management
ISO and Other Written Standards Hazardous Materials Handling Quality Standards
Capability Maturity Model Integration
Please Reply by Mail, eMail or Website Directly
www.msc-conf.com to the Contact on the Back of this Postcard.

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Vol. 19, No.

This is an optical illusion...

CHAIR’S COLUMN For all these activities to happen, we require a core

Chair-Elect’s Column issue, nor is it unique to MQD. I noted that past

(Continued from page 4) term development. At least one member must

(Continued from page 5)

On that note, this edition contains a brief introduc-

I suppose it is time to write about The Metrology

ASQ RECERTIFICATION PRIMER quality standards, shifting industry accepted prac-

THE STANDARDS COMMITTEE on the value of an effective quality management

THE LEARNING CURVE observations he expressed concerning the Ameri-

METROLOGY JOB DESCRIPTION INITIATIVE

As of this writing (end of April 2005), the National Conference of Stan-

Jay Bucher – Promega Corporation

MQD PHONE CONFERENCE

Identify and analyzer existing roadmaps for the future

(Continued from page 15)

(Continued from page 16)

Financial Report (March 2005)

Plato (The Republic)

(Continued from page 8) Unit, FT is Full Time, PT is Part Time

Let us now discuss the recertification process. The

To make the ASQ recertification process as un-

(Continued from page 14) that offers a four-year degree

(Continued from page 19)

(Continued from page 21)

This column has been a little longer than usual, but

Speaker: Keith Bennett

CORRECT AND IMPROVED GAGE R&R MEASUREMENT STUDIES*

Why Do We Need Correct Quality Measurement Studies?

The Gage R&R Study in the AIAG Manual

The Correct Calculation of R&R

σ 2p = True Variance of Product

σ 2e = Variance of Measurement Equipment Error

Introduction of Appraiser Variation (A.V.)

R0 = Range of the operator averages

(4): σ m2′ = σ 2p +σ 2e +σ o2 (5)

Summarizing the Results Obtained by Different R&R Studies

Solving the Identified Problem Areas of the Measurement Process

Donald S. Ermer, Ph.D., P.E., & CMfg.E.

%A.V.=100[A.V./T.V.] Operators (k) 2 3

MEASUREMENT AIAG Method ANOVA (uses all NEW Method

5.6 3.8 3.4

Overall Within Range Average 4.267

Part Information from Data Sheet

No. of Trials (r) = 2 No. of Appraisers (k) = 3 Number of Parts (n) = 5

WR = 4.267 Ro = 8.5 Rp = 58.167 X = 75.8

Measurement Unit Analysis

Reproducibility—Appraiser Variation (A.V.)

TABLE 4—OUTPUT FOR “NEW” METHOD

Values of d2*, d2, and d3

d3 0.8525 0.8884 0.8798 0.8641 0.8480 0.8332

MEASUREMENT QUALITY DIVISION OFFICERS AND COMMITTEE CHAIRS

Standards Committee Representative ASQ Division Administrator

ASQ MEASUREMENT QUALITY DIVISION REGIONAL COUNCILORS

Regional Councilors represent the Division to members and Sections in their

Region 8 (OH, PA) Region 25 (all other countries)

Get the know-how you need – now!

TECHNICAL PROGRAM SUMMARY

The commissioning of NIST's new Advanced Measurement TECHNICAL PRESENTATIONS

Get the KNOWLEDGE you need-now! Network with your colleagues

SATURDAY, AUGUST 6 8:00 — 12:00 PM HALF DAY SESSIONS

SATURDAY, AUGUST 6 1:00 — 5 :00 PM HALF-DAY SESSIONS