<<GenRad 228x debug technique>>

*Be careful not to reverse--bias polarized capacitors. *Use the SWAP command only on non--polarized capacitors. *Use the RER=NN Debug command to determine the stability of the test. *Use the SURROUND command to obtain a list of surrounding components. *Guarding components connected to the source side of the measurement usually produces desired results. Guarding components on the measure side usually makes things worse. This is not always the case, so try as many combinations as possible. *If changing guard points does not improve stability, try switching from a CS to a CP

The diode forward voltage value defaults to 650 mV and the dynamic resistance defaults to 20 ohms unless you specify a different value in the diode circuit description files.

The SWAP and GUARD commands permit you to easily swap the source and measure nodes and modify the guard node list for 4--terminal tests. SWAP swaps the Channel A (Source node) and Channel B (Measure node) nail lists and removes any guard nails. Use the GUARD command to easily add guard nails to the Channel C and GND channels. The + character is an indicator to the Run--Time System (RTS) that the specified

nail or nails are to be added to the current list of nails. Using this character is a shorthand method of adding nails and nodes to an existing list without having to enter all the nails. The RTS also accepts the minus (--) character as a shorthand method of specifying that the nails or nodes are to be removed from an existing list. Channel A (Source node), Channel B (Measure node), Channel C/D guard. Use the GUARD command to easily add guard nails to the Channel C and GND channels. Use SWAP swaps the Channel A (Source node) and Channel B (Measure node) nail lists and removes any guard nails.

To display the test program statements that correspond to the steps of the digital display, type:
UNTRA

These test statements display:

1: IC(66,11) IL(66,11) OS(7) OH(7); 2: IH(11); 3: IH(66) OL(7); 4: IL(11); DEBUG]>

To rerun the burst n times, you can type the following at the Debug prompt:
RER=n

Correct statement 4 by typing the following debug command:

4 OH(7)

Debug command: Rer n, rerun Ctrl+z, abrot Ctrl+e

ABSOLUTE, ACCEPT Force PU, PD, PB, and PN ALLFAULT
ALLFAULT [[/DELAY=msecs] | [/MAXDLY=msecs]] [/FULL] [/OR_BIDIR] [/DIAG][/APPEND] [/NOBUS] [/NODIGF] [/NORERUN] [RERUNS=nn] [/SHOWRERUNS][/NOFAULT] [/NODIAG][file_name]

FAULT
[/PIN=pnum,pnum...][/ALL][/DEVICE=component name] [DELAY=msecs][/OR_BIDIR] [/DIAG] [/NOAPPEND] [/NOFAULT] [/NODIAG] [file-name]

ARITH ASSIGN LGC BSDEBUG BURST

BURST = ntimes

BUSTEST BUSUNTRA

CALLS CANCEL CHECKPOINT = number

CHECKPOINT = number

CLOCK
CLOCK [TSn]

COF
Takes all subsequent bursts out of SOF (stop--on--failure) mode

COMPONENT
COMPONENT = name

CONTACT

FREE
This command prints to the MESfile a list of nails that are not being used in the current test and that do not cause mux conflicts with any nails in the current test. The FREE nail command,

HD (Hold)
HD (nail[s])

Allows the specified nails to remain in their last assigned runtime state.

MONITOR NAIL
NAIL = nail number

NN NODE

NODE = nodename

NOS OL (Output Low)

OL (nail[s])

OH (Output High)
OH (nail[s])

Example:
OH(78,89)

Makes the expected output state high for the specified nail(s).

OPENS
The TEST OPENS statement checks to make sure that all nails in the specified nail list are shorted together, that is, the impedance between the nails must be less than the value pecified by R=. A failure is reported if any of the nails in the list are not shorted.

OS (Output Sense)
OS (nail[s])

PROBE
PROBE = name

PS
! 7 volts at 15 amps ! 20 volts at 8 amps ! 60 volts at 2.5 amps GR228X software allows the programmer to control them using high level SET PS, TEST PS, MEAS PS, and CLEAR PS programming statements.

PWRCHK
The PWRCHK test measures the voltage on the power nodes at the beginning of test execution to make sure the voltage is less than 200 mV. If the measured voltage is greater than 200 mV, the RTS branches to the end of the program and asks you to make sure UUT voltages are discharged properly before testing begins. Executing analog tests with voltages above 200 mV may cause damage to the testers scanner relays.

RESET
Causes the test program to halt, and returns the system to the Reset or Waiting-for--Start state. Press the Reset key for the same effect. Unlike the MONITOR and ABORT commands, this command does not return you to the monitor.

SHORTS
The TEST SHORTS statement checks to make sure that all nails in the specified nail list are not shorted together; the impedance between the nails must be greater than the value specified by R=. A failure is reported if any of the nails in the list are shorted.

SIC Command
(Single Input Connect)
25 SIC 93<RET> connects nail 93 at step 25 and disconnect it at step 26:

SID Command
(Single Input Disconnect)

SIH Command
(Single Input High)

SIL Command
(Single Input Low)

SHD Command
(Single Hold)

SOH Command
(Single Output High)

SOL Command
(Single Output Low)

SOI Command
(Single Output Ignore)

SOS Command
(Single Output Sense)

SOF Command
(Stop--On--Fail)

STM
The STM commands allow you to control and monitor the various devices on the systems self test module.

SURROUND
SURROUND nail#

Prints the names of all the components connected to the specified nail and lists the nails connected to the other pins of the components. For example, if nail 5 connects to U31 pin 1 and U12 pin 2, nail 2 connects to U31 pin 2, and so on, the following command prints a message that lists the U31--1 and U12--2 connections to pin 5, and so on.
DEBUG]> SUR = 5

SWAP

SYNC TIME UNTRANSLATE

Changes the display from digital debug timing display to the burst display. The Untranslate mode allows you to make changes to any of the digital test statements.

WD
WD [UP,DOWN,LEFT,RIGHT,PRINT,PRIALL,<test step>]