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Gate Field Induced Electronic Current Modulation in A Single Wall Boron Nitride Nanotube Molecular Scale Field Effect Transistor
Gate Field Induced Electronic Current Modulation in A Single Wall Boron Nitride Nanotube Molecular Scale Field Effect Transistor
X
i
~ri
~
e
g
X
i
~ri; 1
where H0 is the equilibrium many body Hamiltonian;
~
e
t
is the
applied dipole electric eld along the tube axis;
~
e
g
is the applied
electric gate eld perpendicular to the tube axis, and ~ri is
the coordinate of the electron i. This many body approach allows
us to explicitly obtain the true non-equilibrium energy spectra
including the Stark shift. It should be noted that the convergence
thresholds for energy, maximum and root mean square electron
density are set at 10
6
a.u., 10
6
a.u. and 10
8
a.u. respectively to
ensure tight convergence during self-consistent calculation.
Subsequently, we constructed the non-equilibrium Greens func-
tion, G, as:
Ge
t
; e
g
E I H
NT
e
t
; e
g
R
l
e
t
; e
g
R
r
e
t
; e
g
1
; 2
where H
NT
e
t
; e
g
is the orthogonalized non-equilibrium Kohn
Sham (KS) Hamiltonian matrix for the BNNT part of the active de-
vice region obtained by suitable partitioning of He
t
; e
g
; E is the
injection energy of the tunneling electron; and I is the identity ma-
trix. R
l;r
e
t
; e
g
are the self-energy functions [21,22] calculated from
the eld dependent coupling matrices and the Greens function of
the gold lead as done in our previous work [22]. This approach al-
lows us to explicitly handle the non-equilibrium nature of the true
contact at the electronic level. The current in the BNNT-gold junc-
tion is calculated as [21,22]:
I
2e
h
Z
l
2
l
1
TE; V f E; l
2
f E; l
1
dE; 3
where the chemical potential l
1
E
f
g eV, l
2
E
f
1 g
eV; E
f
is the equilibrium Fermi energy (4.3 eV). f is the Fermi
distribution function. The asymmetry term g is introduced to take
into account the asymmetry of the junction on either side of
the BNNT; on one side of the junction, we have a B ring, and on
the other side we have a N ring. The value of g (=0.715) is calculated
as: g
q
l
q
l
q
r
; q
l
and q
r
are the average Mulliken charges of the gold
atoms on the left and right side of the junction respectively,
obtained from the self-consistent electronic structure calculation.
TE; V is the bias dependent transmission function [22] obtained
from non-equilibrium Ge
t
; e
g
and R
l;r
e
t
; e
g
. The integration grid,
dE, for calculating the current is taken as 0.005 eV and is tested
for robustness. Fig. 1. A prototype of a BNNT eld effect transistor.
R. Pati et al. / Chemical Physics Letters 482 (2009) 312315 313
3. Results and discussions
Using the above procedure, we have calculated the channel cur-
rent, I
sd
, as a function of the applied bias, V
sd
, in the presence and
absence of gate eld e
g
. It should be noted that we have applied di-
pole electric eld (e) in the increment of 0.0002 a.u. along the tube
axis connecting the two electrode. From the length (L) of the BNNT
(12.29 ) between the gold electrode, we converted the electric
eld into potential difference (V
sd
) using e V
sd
=L, which gives
the corresponding increment in bias to 0.125 V. This approach al-
lows us to include the electric eld effect for each applied bias,
V
sd
, explicitly in our calculation within the many-body framework.
The results are summarized in Fig. 1. First, in the absence of gate
eld, a relatively small current for the low applied bias conrms
the poor conductance property of the BNNT. However as V
sd
in-
creases, the channel current increases steadily. This increase in
current can be understood from the fact that at zero applied bias
the highest occupied (H0) and the lowest unoccupied (L0) molecu-
lar orbitals are symmetrically distributed along the BNNT. At nite
bias, due to presence of the dipole electric eld e
t
, which breaks the
symmetry of the wavefunction [22,23], the unoccupied orbitals
start to localize on one side of the BNNT thus resulting in a lower-
ing of their energies. This leads to a reduction in energy gap and
hence current.
In the presence of a nite E
g
, a profound effect on channel cur-
rent is noted. A strong non-linear feature is observed for the chan-
nel current at 0.1 V/ of E
g
. First, at small V
sd
, the channel current
starts to increase slowly, and then a sudden increase in channel cur-
rent is observed between 1 V and 2.25 V for V
sd
. After 2.25 V again a
steady increase in the channel current is obtained. This signicantly
higher current state after 2.25 V when compared to the lower
current in the absence of the gate eld can be referred to as the
ON state of a switch. The conductance state in the absence of gate
eld can be referred to as the OFF state of a switch. The ONOFF
current ratio (gate eld induced modulation) at V
sd
of 3 V is found
to be 18 revealing eld effect transistor property (see Fig. 2). This
result is consistent with a recently reported result [24].
To understand this intriguing gate eld induced feature in the
channel current, we have calculated the bias dependent transmis-
sion function as a function of injection energy in the presence and
absence of E
g
. The results are summarized in Fig. 3. The chemical
potential window is denoted by the dotted lines. The asymmetry
in the chemical potential around the Fermi energy arises from
the asymmetric junction (B-ring on one side and N-ring on the
other side of the wire) considered in our study. Comparing the
transmission within the chemical potential window for E
g
0
and 0.1 V/, we found an appearance of the transmission peak at
0.5 eV for E
g
0:1 V=. This explains the much higher current
observed in the presence of the gate eld. A closer examination
of both transmission curves in Fig. 3 reveals a giant shift of
1.45 eV towards the Fermi energy in the transmission peak posi-
tion within the chemical potential window. To identify the origin
of such a signicant shift in the transmission peak position, we
have calculated the eigenvalue spectrum of H
NT
e
t
; e
g
by diagonal-
izing H
NT
. The results are presented by the solid (straight) line in
Fig. 3. By careful analysis, we found a signicant shift in energy lev-
els in the presence of the gate eld. The energies of the ve unoc-
cupied states (L0, L1, L2, L3, and L4) in the Fig. 3 are lowered to
produce the occupied HG4, HG3, HG2, HG1, and HG0 levels. The
unoccupied states LG0, LG1, LG2, LG3, LG4, LG5 and LG6 are pro-
duced by lowering the L5, L6, L7, L8, L9, L10, and L11 energy levels.
It should be noted that the L9 energy level, which is almost degen-
erate with L10 and L11, shifted together with L8 towards the Fermi
energy (zero in the energy scale of the Fig. 3) to produce the LG3
and LG4 states. These two states contribute to the transmission
peak at 0.5 eV for E
g
0:1 V=. The transmission peak position
further suggests that the unoccupied states contribute signicantly
to the channel current thus conrming the p-type character of the
BNNT [15]. Inspection of the transmission curve and eigen value
spectrum in Fig. 3 further ascertains that the physics, including
the large ONOFF ratio discovered here, is not expected to change
even if we consider a symmetric junction (B or N-ring on both
ends).
4. Summary
In summary, we have performed rst-principles quantum
transport calculations in a single wall BNNT junction to explore
the response of the gate eld on channel current for transistor
operation. The electric eld effect is explicitly included in our cal-
culation within a many body framework. The non-equilibrium
Greens function approach is used to calculate electron transport
properties of the BNNT in device geometry. The gate eld is found
Fig. 2. Calculated channel current (I
sd
) as a function of applied bias (V
sd
) in the
presence and absence of gate eld (Eg ).
Fig. 3. Bias dependent transmission as a function of injection energy E in the
presence and absence of gate eld Eg . Fermi energy is set to zero in the energy scale;
dotted lines in each panel represents the chemical potential window. Dotted (curve)
line elucidate a giant 1:45 eV shift in the transmission peak position. The solid
lines denoted by H0, H1, H2, . . . are the occupied energy levels; L0, L1, L2, . . . are the
unoccupied energy levels. The solid lines denoted by HG0, HG1, HG2, . . . are
occupied energy levels in the presence of gate eld; LG0, LG1, LG2, LG3, . . . are the
unoccupied energy levels in the presence of gate eld.
314 R. Pati et al. / Chemical Physics Letters 482 (2009) 312315
to have a profound effect on the electronic channel current be-
tween the source and drain. The large ONOFF ratio of 17.7 at
3.0 V of V
sd
is observed for a relatively small gate eld of 0.10 V/
. Analysis of the transmission function reveals a giant shift in
the transmission peak position resulting in a large ONOFF ratio.
The realization of the eld effect transistor behavior in a smaller
diameter BNNT with a large ONOFF ratio as observed here would
be an important step towards their potential application in molec-
ular electronics.
Acknowledgement
This work is supported by NSF through Grant No. ECCS-
0643420.
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