Submitting Samples for XPS (ESCA) Analysis.

XPS samples should be submitted

with this form. Samples can be
brought to the dessicator in the D21
hallway, with this form.
If shipping, mail by UPS or ed!"
to# $onathan Shu, 1%2 Sciences
Dri&e, 'lar( )all D21, 'ornell
Uni&ersity, Ithaca, *+ 1%,-..
/ ''01 'oral account is re2uired
for all users 3sign4up lin( below5.
*on4'ornell users must also fa"
purchase order to 67842--4.9-8
*ame, e4mail# Date#
Department 3Institution5# /d&isor#
Do you ha&e a ''01 'oral account: +es *o
If *;, re2uest one online &ia ''01 website.
'oral account< to use 3if more than
one5#
Date analysis is
needed by, if any#
=ype of sample, film, powder, composition, etc.# /re the sample and substrate
conducti&e: 3circle one5
+es *o Don>t (now
Please label samples 31,2,.,%,?5. If samples cannot be clearly labeled, or certain regions
must be analy@ed, describe them here or include a drawing#
< of samples#
15 /re these nanoparticle samples: 3A177 nm in two or three dimensions5. 3circle one5 +es *o
25 'an the sample be cut, modified, or bro(en:3circle one5 +es *o
.5 Do you need this sample bac(: 3circle one5 Samples must be pic(ed up within 1 month or
may be discarded
+es *o /ll /s much as possible 0ail to#
%5 ill in elements below. !ach element added will li(ely mean additional analysis. If you don>t (now
e"actly what you need, describe what information are you trying to determine with XPS. If you
(now the energy ranges of interest, fill in below 3use another page if more description is needed5#
)S means high count rate B low pea( width resolution, for atomicC determination
)1 means low count rate B high resolution of pea( width, for possible chemical bonding information
Survey/wide scan: (01200 eV unless noted)
_______________________________
HS (trace
elements):_______________________________________________________
_________
HR (chemical
ondin!):________________________________________________________
___
"#S/$S%& 're(uently &s)ed *uestions:
/ll users must ha&e a ''01 'oral account 3re2uest at http#DDwww.ccmr.cornell.eduDfacilitiesDre2uest.php 5
Can users outside of Cornell have samples run?
Users from other institutionsDcompanies may send samples. / 'oral account and purchase order number is
re2uired for wor( to be performed. See cost information below. /dd EF1- for return shipping.
Do you offer XPS training?
ull training is beneficial to fre2uent 3Gmonthly5 XPS users. Hess fre2uent users an still perform parts of the
analysis! which will reduce setup costs below. ully4trained users will learn how to independently prepare
samples, run ultra4high &acuum e2uipment, transfer samples in &acuum, turn on "rays, set up analysis scans,
e"port data, and analy@e data.
X"ray si#e! sample si#e and $uantity?
=ypical "4ray analysis spot is a 1"2 mm ellipse. / 1cm
2
sample is easy to analy@e, but samples can be smaller,
and larger, up to ,7mm diameter. Standard mounting can accept as many samples as will fit on an ,7mm
diameter area. Some techni2ues may limit the number of samples that can be mounted on one sample holder.
Analysis depth
=ypically analysis depth is E-nm for metals and E17nm for polymers and is dependent on material and
photoemission angle. =he I0P =PP20 program pro&ides electron escape depths for &arious elements and can
be downloaded for free at www.2uases.com. Simplest emission angle is -- degrees 3.- degree ta(e4off angle5.
/n analysis depth wor(sheet is at www.ccmr.cornell.eduDfacilitiesDinde"2.php:idI.1 for more calculations.
%o& to prepare samples?
15 Condutivity is good. If choosing a substrate, smooth, conducti&e substrates li(e doped silicon wafers
3undoped is rare5 wor( well. 'onducti&e films on insulating substrates can be clamped or taped with
double4sided carbon tape.
25 'ransport. luoroware container with cur&ed bottom may protect a flat, face4down sample, as may a
glass &ial.
.5 Po&der samples. Small glass &ials are good for transport. =ypically powders are pressed onto a small
s2uare of double4stic( carbon tape. / &ery small amount 3A few mg5 is used for analysis.
%5 (abel samples andDor containers well.
a. )umber 1,2,.,%? Scratching a sampleID onto the bac(side of a substrate with a diamond
scribe may wor( well. =ry to a&oid writing on the sample with mar(er or using Scotch tape as
these may outgas in &acuum.
b. *ar+ings. If front and bac( loo( identical, ma(e sure you identify which surface is to be
analy@ed. If a certain spot on the wafer needs to be analy@ed, include a drawingDpicture.
c. Cleanliness is of utmost importance. =ry not to touch the surface of your sample with anything
3fingers, glo&es, twee@ers, breath, acetone, alcohol, etc.5.
-5 (i$uid Samples may be drop4cast onto silicon, gold film, or carbon tape depending on pea(s of interest
%o& muh does XPS analysis ost?
/cademic and corporate rates are posted online http#DDwww.ccmr.cornell.eduDfacilitiesDratesD
=ypically, a sur&ey scan or high resolution scan can ta(e 17467 minutes depending on sample 2uality, surface
roughness, or surface contamination. In addition to actual "4ray beam time, there is a setup fee 31 hour5 for
manager labor which includes sample mounting, pumpdown, and assistance with basic analysis. 0onitored runs
3such as depth profiling5 and e"tensi&e analyses may be charged more labor depending on the wor( in&ol&ed.
,or estimation of ost! one hour of mahine time per sample is a good starting point! but may be more or
less depending on the types of sans re$uired. Users are encouraged to learn basic analysis methods, and
other methods as needed 3high resolution, /1XPS, etc5. 'asaXPS is used for data analysis and instructions and
a registration code is a&ailable to all 'ornell users. *on4'ornell users can use the 'asaXPS demo &ersion with
all capabilities e"cept for sa&ing and printing. See www.casa"ps.com for licensing and other information.
/ny 2uestions not co&ered here: $ust email or call, Jbs2%Kcornell.edu, 67842--49,...