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(R + r
2
)
2
+ w
2
(L + l
2
)
2
, (1)
= tg
1
w(L + l
2
)
R + r
2
. (2)
For ease of description, the switch will be closed on sample
k=k
o
and the voltage phase angle is set to be +
o
. The
local voltage v
A
(k) is represented by a sinusoidal function, as
follows:
v
A
(k) = V
A
sin
w(k k
o
)
f
s
+
o
+
. (3)
Before fault inception (k < k
o
), the switch is opened and
the current in steady-state normal system operation is given
by:
i
A
(k) =
V
A
|Z|
sin
w(k k
o
)
f
s
+
o
. (4)
Fig. 3 depicts the equivalent circuit after fault inception (k
k
o
). The impedance Z
f
=R
f
(r)+jwL
f
(r) is a function of the
fault resistance r as follows:
|Z
f
| =
R
f
(r)
2
+ w
2
L
f
(r)
2
, (5)
f
= tg
1
wL
f
(r)
R
f
(r)
, (6)
where
R
f
(r) = xR + r
r + r
2
+ xR
(r + r
2
+ xR)
2
+ w
2
(l
2
+ xL)
2
r
2
, (7)
L
f
(r) = xL +
(l
2
+ xL)
(r + r
2
+ xR)
2
+ w
2
(l
2
+ xL)
2
r
2
. (8)
The time constante of the system is now:
f
=
L
f
(r)
R
f
(r)
, (9)
Fig. 3. Equivalent circuit after fault inception.
Neglecting all harmonic components and fault-induced
noises, the current at local end after fault inception (k k
o
)
might be expressed by two components: alternating (ac) and
unidirectional (dc), as follows:
i
A
(k) = i
ac
(k) + i
dc
(k), (10)
i
ac
(k) =
V
A
|Z
f
|
sin
w(k k
o
)
f
s
+
o
+
f
, (11)
i
dc
(k) = I
o
e
(kko)
f
s
f
, (12)
where f
s
is the sampling rate and I
o
is the dc offset value at
fault inception (I
o
=i
dc
(k
o
)), expressed as follows:
3
I
o
=
V
A
|Z|
sin(
o
)
V
A
|Z
f
|
sin(
o
+
f
). (13)
The rst term of Eq. (10) is related to a new steady-state
operation after fault inception. The second term is nonperi-
odic and decays exponentially with a time constant
f
. This
nonperiodic term is called dc offset.
Rearranging the Eq. (13), yields:
I
o
= V
A
|Z Z
f
|
|Z|.|Z
f
|
sin(
o
), (14)
where
= tan
1
|Z|sin(
f
)
|Z
f
| |Z|cos(
f
)
. (15)
According to Eqs. (12) and (13), the dc offset depends
of various parameters: fault location (x.R and x.L), system
loading (r
2
and l
2
), fault resistance (r) and the fault inception
angle (
o
). The effects of these parameters on dc offset will
be addressed in the further subsections.
In order to demonstrate the fault parameter effects, two test
cases based on the circuit depicted in Fig. 2 are used. The
sampling rate is f
s
=15360 Hz and the fundamental frequency
is f=60 Hz. In this way, one cycle of power-frequency k
has 256 samples. The rated voltage is V
1
=120 V; the load
impedance parameters are: r
2
= 50 and l
2
= 150mH. Two
different transmission line parameters are used, as follows:
1) Circuit 1: R = 2 and L = 66.66mH.
2) Circuit 2: R = 2 and L = 20mH.
The switch S is initially opened. After two cycles, the
switch is closed. The total simulation time was set to be 8
cycles. All of the simulation were performed by MATLAB
R
2
+ w
2
L
2
, (18)
f
= tg
1
wL
R
, (19)
f
=
L
R
, (20)
The circuit parameter values of each conguration are:
1) Circuit 1:
xR = 1, r
2
= 50, r = 0, xL = 33.33mH, l
2
=
150mH, |Z| = 96.83, = 57.52
o
, |Z
f
| = 12.60,
f
= 85.45
o
,
f
= 33.33ms (2 cycles).
2) Circuit 2:
xR = 1, r
2
= 50, r = 0, xL = 10mH, l
2
=
150mH, |Z| = 82.53, = 50.94
o
, |Z
f
| = 3.90,
f
= 75.14
o
,
f
= 10.00ms.
After two cycles of steady-state simulation (2k = 512
samples), the switch was closed on k
o
= 2k. The time in
this point was set to be the reference. In this way,
o
indicates
the fault inception angle on the current. According to Eqs. 4
and 10, the current related to each conguration with the fault
inception angle
o
= 0
o
is the follows
1
:
1) Circuit 1:
i
A
(k) =
1.2sin(1.4(k k
o
)) , if k < k
o
9.5sin(1.4(k k
o
) 27.9
o
) + 4.46e
kok
511.9
2) Circuit 2:
i
A
(k) =
1.5sin(1.4(k k
o
)) , if k < k
o
30.8sin(1.4(k k
o
) 24.2
o
) + 12.61e
k
o
k
153.6
According to the previous considerations, the dc offset
depends of the fault inception angle. Fig. 4 depicts the fault
currents for each circuit with
o
= 0
o
. In fact, the effects of
the decaying dc current could be seen on the current in both
analyzed circuit 1 and 2.
Fig. 4. Fault current with fault inception angle
o
=0
o
and zero fault
resistance: a) circuit 1; b) circuit 2.
According to the fault parameters, a fault in a generic circuit
may produce a current without dc offset (I
o
=0). From Eq. 14,
I
o
=0 whether:
o
= n, (21)
with n={0,1,2,...}. For instance, the decaying dc current in the
assessed circuits is null if n=0. In this way:
1) Circuit 1:
o
=31.87
o
.
2) Circuit 2:
o
=25.36
o
.
Fig. 5 depicts the fault currents for both circuit 1 and 2 with
fault inception angle
o
=31.87
o
and
o
=25.36
o
, respectively.
In fact, there is no decaying dc offset for these phase current
angles.
1
P.S.: Phase angles of all trigonometric functions in this paper are in degree.
In this way, w(k k
o
)/f
s
rad = (k k
o
)/128 rad = 1.4(k k
o
) degree.
4
Fig. 5. Fault current without DC offset: a) circuit 1; b) circuit 2.
The decaying dc current is maximum in circuit 1 and
2 when the fault inception angle is
o
=31.87
o
+90
o
and
o
=25.36
o
+90
o
, respectively. The voltage and current related
to circuit 1 and 2 congurations with fault inception angle of
o
=121.87
o
and
o
=115.36
o
, respectively, are the follows:
1) Circuit 1:
v
A
(k) = 120sin(1.4(k k
o
) + 179.39
o
),
i
A
(k) =
1.2sin(1.4(k k
o
) + 121.87
o
) , if k < k
o
9.5sin(1.4(k k
o
) + 93.94
o
) 8.44e
kok
511.9
2) Circuit 2:
v
A
(k) = 120sin(1.4(k k
o
) + 166.30
o
),
i
A
(k) =
1.5sin(1.4(k k
o
) + 115.36
o
) , if k < k
o
30.8sin(1.4(k k
o
) 91.16
o
) 29.45e
kok
153.6
Fig. 6 depicts the voltage and the fault current of the
circuit 1, with the fault inception angle
o
=121.87
o
. These
signals related to circuit 2 regarding
o
=115.36
o
are depicted
in Fig. 7. The maximum dc offset magnitude occurs in a
specic fault inception angle according to system parameters
and fault resistance and location. In the used model (Fig. 2),
the maximum dc offset does not occur on maximum voltage
(Figs. 6 and 7).
Fig. 8 depicts the decaying dc currents of the circuit 1 with
o
=0
o
(Fig. 4 (a)) and
o
=121.87
o
(Fig. 6 (a)).
Fig. 6. Signals regarding to a fault inception angle in circuit 1 that results
in maximum DC offset: a) voltage; b) fault current.
Fig. 7. Signals regarding to a fault inception angle in circuit 1 that results
in maximum DC offset: a) voltage; b) fault current.
Fig. 8. Decaying dc current of the circuit 1 relate to the fault inception
angle: a) o=0
o
; b) o=121.87
o
.
The decaying dc time constant (
f
) dened in Eq. 9 is a
constant according to the fault inception angle. Considering a
xed current sample k
x
, the component e
(k
x
k
o
)/f
s
f
from
Eq. (12) is a constant and the dc offset is in accordance with
the fault inception angle as follows:
i
dc
(
o
) = C
1
sin(
o
), (22)
where
C
1
= V
|Z Z
f
|
|Z|.|Z
f
|
e
(k
x
k
o
)/f
s
f
. (23)
With regard to circuit 1, three distinctive samples were
evaluated to investigate the fault inception angle effects on
the decaying dc current: k
x
= {k
o
, k
o
+k/2, k
o
+k}. The
dc offset for each evaluated instant is the follows:
i
dc
(
o
) = 5.0sin(
o
31.87
o
), for k
x
= k
o
.
i
dc
(
o
) = 3.9sin(
o
31.87
o
), for k
x
= k
o
+k/2.
i
dc
(
o
) = 3.0sin(
o
31.87
o
), for k
x
= k
o
+k.
Fig. 9 depicts the fault inception angle effects on dc offset
of the fault current for those distinctive samples after fault
inception according to the previous equations.
The dc offset magnitude of the fault current with both xed
system and constant fault impedance is affected by the fault
inception angle according to a sinusoidal function. On the
other hand, decaying dc time constant is not affected by fault
inception angle.
5
Fig. 9. Fault inception angle effects on decaying DC component.
In order to evaluate the fault inception angle effects on CT
saturation and fault diagnostic method, only the angles laying
on the range 0
o
to 180
o
are necessary. In fact, the angle values
o
and
o
+180
o
provide the same effects with decaying dc in
opposite directions.
B. Fault Resistance Effects
In order to quantify the inuence of the fault resistance on
dc offset, the fault resistance values laying on the range 0 to
1k were investigate. For ease of description, the fault was
applied at middle of the transmission line (x=0.5).
Fig. 10 depicts the decaying dc time constant
f
as a
function of the fault resistance for both circuit 1 and 2, with
o
=0
o
. Under low fault resistance inuence,
f
is almost
constant and depends of the system conguration and fault
location. However, for increasing of the fault resistance the
decaying dc time constant is noticeably affected. The decaying
dc time constant is very fast (almost zero) for high fault
impedances without circuit conguration distinction.
Fig. 10. Fault resistance effects on decaying dc time constant.
Fig. 11 depicts the decaying dc magnitude as a function
of the fault resistance for some fault inception angles. The
dc offset values were computed at the fault inception instant
(k=k
o
i
dc
(k
o
)=I
0
).
Fig. 11. Fault resistance effects on dc offset: (a) circuit 1; (b) circuit 2.
According to Fig. 11, the dc offset magnitude is almost
constant for low fault resistance and their values depend of the
fault inception angle, fault location, and system conguration.
On the other hand, the dc offset magnitude tends to zero for
high fault resistance.
With regard to circuit 1, as aforementioned,
o
=31.87
o
de-
notes the fault inception angle in which the dc offset is null for
zero fault resistance. As a matter of fact, I
o
0 on low fault
resistances for this angle (Fig. 11(a)). However, increasing
fault resistance the dc offset values increase and after decrease
to zero. On the other side,
o
=121.87
o
=90
o
+31.87
o
denotes
the fault inception angle in which the decaying dc component
is maximum for zero fault resistance (Fig. 9). In this case, I
o
value decreases for increasing of fault resistance (Fig. 11(a)).
Similar features can be seen in Fig. 11(b), but the high fault
resistance region ranges with the system conguration.
Fig. 12 depicts the fault resistance effects on the fault
current of the circuit 1 with
o
=121.87
o
, applied on the middle
of the line with various fault resistances (r=1, 10 and 100
). The decaying dc components of these fault currents are
depicted in Fig. 13.
The fault resistance noticeably affects the dc offset magni-
tude and decaying dc time constant. The increasing of the fault
resistance damps the dc component effects. According to Fig.
9, the dc offset in the circuit 1 is maximum for
o
=121.87
o
.
However, for this phase angle the dc offset is vary damping
for r=100 with fault located on the middle of the line.
Fig. 12. Fault current of the circuit 1 with fault inception angle
o
=121.87
o
,
applied on the middle of the line with fault resistance of: (a) 1; (b) 10;
c) 100.
Fig. 13. Decaying dc current of the circuit 1 with fault inception angle
o
=121.87
o
, applied on the middle of the line with various fault resistances.
With regard to circuit 1, as aforementioned,
o
=121.87
o
denotes the fault inception angle in which the dc offset
magnitude is maximum for zero fault resistance. However,
increasing the fault resistance value the dc offset magnitude
will present its maximum value at another fault inception
angle. Fig. 14 depicts the fault inception angle versus the
fault resistance in order to produce the maximum dc offset
magnitude in both circuit 1 and 2.
6
Fig. 14. Fault inception angle at the current to produces the maximum dc
offset according to fault resistance.
According to Fig. 14, the point on current waveform in
which the hardest dc offset occurs changes with the fault
resistance. Analogous results can be expected in the voltage.
Fig. 15 shows the frequency analysis of two decaying
dc components according to the fault resistances r=1 and
r=10. The noticeable frequency components lie on the
low frequency spectrum and the respective modulus are in
accordance to the fault resistance.
Fig. 15. Frequency analysis of the decaying dc current of the circuit 1 with
fault inception angle
o
=121.87
o
, applied on the middle of the line with fault
resistance: (a) 1; (b) 10.
C. Fault Location Effects
In order to quantify the inuence of the fault location on
dc offset, short-circuits were applied from 10% of the line
length near the source until the line remote end. In other words,
0.1 x 1.0.
Fig. 16 depicts the dc offset values of the circuit 1 as a
function of the fault location for some fault resistances and
o
=121.87
o
. The current values were computed at the fault
inception instant k=k
o
i
T
(k
o
)=I
0
.
Fig. 16. Fault location effects on transient current of the circuit 1.
According to Fig. 16, the dc offset is damped with the
increasing of the fault location. The decaying dc component is
hardly affected with faults located near the monitoring point.
IV. CONCLUSIONS
Considering both xed system and constant fault im-
pedance, the dc offset magnitude of a fault current is affected
by the fault inception angle according to a sinusoidal function.
On the other hand, decaying dc time constant is not affected
by the fault inception angle.
Under low fault resistance inuence, the decaying dc time
constant depends of both the system conguration and the fault
location. In this situation, the dc offset magnitude depends
of the system conguration, fault location and fault inception
angle. On the other hand, under high fault impedances, the
decaying dc time constant is very fast and the dc offset
magnitude is very damped. In addition, The point on voltage
and current waveforms in which the hardest dc offset occurs
changes with the fault resistance.
The inuence of fault location was also quantied. The dc
offset is damped with fault located from away of monitoring
point. On the other hand, the decaying dc component is hardly
affected with fault located near the monitoring point.
The frequency analysis of the decaying dc components
states that the noticeable frequency components lie on the low
frequency spectrum.
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