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I. INTRODUCTION
Voltage fluctuation is considered as one of the most
severe power quality problems and more attention has
been paid to it lately [1]. Voltage fluctuations are
systematic variations of the voltage envelope or a series
of random voltage changes. The magnitude of these
fluctuations is between 10 %. One of the voltage
fluctuation effects is to cause the light to flicker. Voltage
fluctuation, being an electromagnetic phenomenon, is
always referred to as voltage flicker [2]. Beside its effect
on light, other flicker effects reduce the life of electronic,
incandescent, fluorescent and cathode ray tubes [3]. The
malfunction of phase lockedloops PLLs, misoperation
of the electronic controllers and protection devices are
other samples of flicker effects.
The mitigating devices were first based on SVC such
as Thyristor Switched Capacitor (TSC) [4], Thyristor
Controlled Reactor (TCR) [5], and Fixed Capacitor
Thyristor Controlled Reactor (FCTCR) [6], [7]. All of
these techniques achieved an acceptable level of
mitigation but their operation depends on complicated
control algorithms because the injected current from the
mitigating devices should be related somehow to the
reactive component of the arc furnace currents, as well
as all of these mitigation devices inject a large amount of
current harmonics to the system so the mitigating
devices should be accompanied with a group of tuned
and detuned filters like in [7].
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B. System Model
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1
V ao
1
V a + = 3 1
1
V a
1
a
a2
a2
a
V a
V b
V c
(1)
V bo
V b +
V b
V co
V c +
V c
= a
a
= a
a
V ao
V a 1
V a 2
V ao
V a 1
V a 2
(2)
(3)
Where,
a =1 120 0 , a 2 = 1 240 0
G2
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Unbalance Index =
v
v+
(4)
(5)
Flick er Index = v / V
v = VP1 VP 2
(6)
VP1 is the maximum positive peak.
V p 2 is the minimum positive peak.
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VI. CONCLUSIONS
This paper proves that the UPQC is an effective
mitigating device to suppress the voltage flicker since it
could reduce the flicker index from 0.018 to 0.0045 at
PCC. The unbalance in the primary distribution could
also be compensated since the unbalance is reduced from
0.072 to 0.036, which is so important especially for the
drive systems. Finally, UPQC is employed to improve
the supply power factor since the UPQC works as a
variable serious capacitor.
VII. REFERENCES
[1] M. Walker, "Electric Utility flicker Limitations," IEEE
Transactions on Industry applications, Vol.IA-15, No. 6, November
/December 1979, pp. 644-655.
[2] W . B . Jervis ,"An Assessment of Power System Voltage
Disturbances in Terms of Lamp Flicker Perception," Central Electricity
Generating Board, U.K.
[3] A.A. Girgis, J.W. Stephens, E.B. Makram, Measurement and
Prediction of Voltage Flicker Magnitude and Frequency, IEEE
Transactions on Power Delivery, Volume: 10 Issue: 3, July 1995
Page(s): 1600 1605.
[4] L. Gyugi, A. A. Otto, Static Shunt Compensation for Voltage
Flicker Reduction and Power Factor Correction. American Power
Conference 1976, pp. 1271-1286.
[5] Y. Hamachi, M. Takeda, Voltage Fluctuation Suppressing System
Using Thyristor Controlled Capacitors. 8th. U.I.E. Cngress, 1976.
[6] F. Frank, S. Ivner, TYCAP, Power-factor correction equipment
using thyristor-controlled capacitor for arc furnaces. ASEA Journal 46
(1973): 6, pp. 147-152.
[7] I. Hosono, M. Yano, M. Takeda, S. Yuya, S. Sueda, Suppression
and Measurement of Arc Furnace Flicker With a Large Static VAR
Compensator, IEEE Transaction on Power Apparatus and Systems,
Vol. PAS-98, No. 6, Nov./Dec. 1979, pp. 2276-2282.
[8] M W. Marshall, PE, Using Series Capacitors to Mitigate Voltage
Flicker Problems, IEEE Transaction on Power Delivery, 1998.
[9] H. Fujita, H. Akagi,The Unified Power Quality Conditioner: The
Integration of Series- and Shunt-Active Filters, , IEEE Transaction
on Power Electronics, Vol .13,No. 2, March 19986, pp. 315-322.
[10] J. R. Clouston, J. H. Gurney, Filed Demonestration of a
Distribution Static Compensator Used to Mitigate Voltage Flicker,
IEEE Transaction on Power Delivery, 1998.
[11] K. Karthik, J.E. Quaicoe, Voltage compensation and harmonic
suppression using series active and shunt passive filters, Electrical and
Computer Engineering, 2000 Canadian Conference ON, Volume: 1,
2000 Page(s): 582 -586 vol.1
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