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Code No: 56014

Set No. 1
JAWAHARLAL NEHRU TECHNOLOGICAL UNIVERSITY HYDERABAD
III B.Tech. II Sem., II Mid-Term Examinations, April 2012
NANO TECHNOLOGY
Objective Exam
Name: ______________________________ Hall Ticket No.
A

Answer All Questions. All Questions Carry Equal Marks.Time: 20 Min. Marks: 10.

Choose the correct alternative:

1.

What we can see with our naked eye is about

(a) 100 m
(b) 250 m
(c) 100 nm

(d) 250nm

2.

Which of the following approaches are used to make the nanomaterials?

(a) Top down approach
(b) Bottom up approach
(c) Both (a) and (b)
(d) None of the above

3.

Carbon nano tube comes under the following category

(a) Dry nanotechnology
(b) Wet nanotechnology

(c) both

DNA comes under the following category

(a) Dry nano technology
(b) Wet nano technology

(c) Both

4.

R
O

D
L

[
(d) none of these

[
(d) None of these

5.

Which of the following materials have zero dimensional or one dimensional structure?
(a) Discrete nanomaterials
(b) Nanoscale device materials
(c) Bulk nanomaterial
(d) All the above

6.

Nanomaterials represent almost the ultimate is

(a) Increase in surface area
(b) Decrease in surface area
(c) Both (a) and (b)
(d) None of the above

7.

A chip built to identify mutations or alterations in the DNA code is called DNA chip.
[
(a) Protein chip
(b) DNA chip
(c) Computer chip
(d) none of these

8.

LED means
(a) Light Emitting Diodes

W
U

T
N

(b) Liquid Crystal Diodes

(c) Both

9.

Lithography using ions rather than light beams is called

(a) Electron beam lithography
(b) Optical lithography
(c) Ion beam lithography
(d) none of these

10.

MEMS means
(a) Micro Electro Magnetical Systems
(c) Nano Electro Magnetical Systems

[
]
(d) none of these
[

[
(b) Micro Electro Mechanical Systems
(d) None of these

Cont2

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Code No: 56014

:2:

Set No. 1

II

Fill in the blanks

11.

___________ technique that uses the characteristic spectrum of x-rays emitted by the specimen
after excitation by high-energy electrons to obtain information about its elemental composition.

12.

XPS detects all elements with an ____________

13.

__________is the process of transferring patterns of geometric shapes in a mask to a thin layer of
radiation-sensitive material (called resist) covering the surface of a semiconductor wafer.

14.

____________ is the technical field of using microscopes to view samples and objects that cannot
be seen with the unaided eye (objects that are not within the resolution range of the normal eye).

15.

If is Bragg angle, is wavelength of X-ray beam and B is the line broadening indicating the
extra peak width of the sample in comparison to the standard, then the thickness, t of the
crystallite in angstroms is given by ______________

16.

The interaction force between AFM tip and the sample is of the order of ________ newton

17.

______________ are not detectable by some systems of EDX analysis.

18.

The mathematical form of Braggs law is _____________

19.

The microscopy which uses electrons as source to form images is called____________

20.

The electrons are emitted in the electron gun by the 'thermionic emission' from____________

D
L

R
O

W
U

T
N

-oOo-

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Code No: 56014

Set No. 2
JAWAHARLAL NEHRU TECHNOLOGICAL UNIVERSITY HYDERABAD
III B.Tech. II Sem., II Mid-Term Examinations, April 2012
NANO TECHNOLOGY
Objective Exam
Name: ______________________________ Hall Ticket No.
A

Answer All Questions. All Questions Carry Equal Marks.Time: 20 Min. Marks: 10.

Choose the correct alternative:

1.

DNA comes under the following category

(a) Dry nano technology
(b) Wet nano technology

(c) Both

[
(d) None of these

2.

Which of the following materials have zero dimensional or one dimensional structure?
(a) Discrete nanomaterials
(b) Nanoscale device materials
(c) Bulk nanomaterial
(d) All the above

3.

Nanomaterials represent almost the ultimate is

(a) Increase in surface area
(b) Decrease in surface area
(c) Both (a) and (b)
(d) None of the above

4.

A chip built to identify mutations or alterations in the DNA code is called DNA chip.
[
(a) Protein chip
(b) DNA chip
(c) Computer chip
(d) none of these

5.

LED means
(a) Light Emitting Diodes

D
L

R
O

W
U

(b) Liquid Crystal Diodes

(c) Both

6.

Lithography using ions rather than light beams is called

(a) Electron beam lithography
(b) Optical lithography
(c) Ion beam lithography
(d) none of these

7.

MEMS means
(a) Micro Electro Magnetical Systems
(c) Nano Electro Magnetical Systems

8.

What we can see with our naked eye is about

(a) 100 m
(b) 250 m
(c) 100 nm

T
N

[
]
(d) none of these
[

[
(b) Micro Electro Mechanical Systems
(d) None of these

(d) 250nm

9.

Which of the following approaches are used to make the nanomaterials?

(a) Top down approach
(b) Bottom up approach
(c) Both (a) and (b)
(d) None of the above

10.

Carbon nano tube comes under the following category

(a) Dry nanotechnology
(b) Wet nanotechnology

(c) both

[
(d) none of these

Cont2

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Code No: 56014

:2:

Set No. 2

II

Fill in the blanks

11.

____________ is the technical field of using microscopes to view samples and objects that cannot
be seen with the unaided eye (objects that are not within the resolution range of the normal eye).

12.

If is Bragg angle, is wavelength of X-ray beam and B is the line broadening indicating the
extra peak width of the sample in comparison to the standard, then the thickness, t of the
crystallite in angstroms is given by ______________

13.

The interaction force between AFM tip and the sample is of the order of ________ newton

14.

______________ are not detectable by some systems of EDX analysis.

15.

The mathematical form of Braggs law is _____________

16.

The microscopy which uses electrons as source to form images is called____________

17.

The electrons are emitted in the electron gun by the 'thermionic emission' from____________

18.

___________ technique that uses the characteristic spectrum of x-rays emitted by the specimen
after excitation by high-energy electrons to obtain information about its elemental composition.

19.

XPS detects all elements with an ____________

20.

__________is the process of transferring patterns of geometric shapes in a mask to a thin layer of
radiation-sensitive material (called resist) covering the surface of a semiconductor wafer.

D
L

R
O

W
U

T
N

-oOo-

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Code No: 56014

Set No. 3
JAWAHARLAL NEHRU TECHNOLOGICAL UNIVERSITY HYDERABAD
III B.Tech. II Sem., II Mid-Term Examinations, April 2012
NANO TECHNOLOGY
Objective Exam
Name: ______________________________ Hall Ticket No.
A

Answer All Questions. All Questions Carry Equal Marks.Time: 20 Min. Marks: 10.

Choose the correct alternative:

1.

Nanomaterials represent almost the ultimate is

(a) Increase in surface area
(b) Decrease in surface area
(c) Both (a) and (b)
(d) None of the above

2.

A chip built to identify mutations or alterations in the DNA code is called DNA chip.
[
(a) Protein chip
(b) DNA chip
(c) Computer chip
(d) none of these

3.

LED means
(a) Light Emitting Diodes

(b) Liquid Crystal Diodes

D
L

(c) Both

R
O

4.

Lithography using ions rather than light beams is called

(a) Electron beam lithography
(b) Optical lithography
(c) Ion beam lithography
(d) none of these

5.

MEMS means
(a) Micro Electro Magnetical Systems
(c) Nano Electro Magnetical Systems

6.

What we can see with our naked eye is about

(a) 100 m
(b) 250 m
(c) 100 nm

W
U

[
]
(d) none of these
[

[
(b) Micro Electro Mechanical Systems
(d) None of these

T
N

(d) 250nm

7.

Which of the following approaches are used to make the nanomaterials?

(a) Top down approach
(b) Bottom up approach
(c) Both (a) and (b)
(d) None of the above

8.

Carbon nano tube comes under the following category

(a) Dry nanotechnology
(b) Wet nanotechnology

[
(d) none of these

(c) both

DNA comes under the following category

(a) Dry nano technology
(b) Wet nano technology

[
(d) None of these

(c) Both

9.

10.

Which of the following materials have zero dimensional or one dimensional structure?
(a) Discrete nanomaterials
(b) Nanoscale device materials
(c) Bulk nanomaterial
(d) All the above

Cont2

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Code No: 56014

:2:

Set No. 3

II

Fill in the blanks

11.

The interaction force between AFM tip and the sample is of the order of ________ newton

12.

______________ are not detectable by some systems of EDX analysis.

13.

The mathematical form of Braggs law is _____________

14.

The microscopy which uses electrons as source to form images is called____________

15.

The electrons are emitted in the electron gun by the 'thermionic emission' from____________

16.

___________ technique that uses the characteristic spectrum of x-rays emitted by the specimen
after excitation by high-energy electrons to obtain information about its elemental composition.

17.

XPS detects all elements with an ____________

18.

__________is the process of transferring patterns of geometric shapes in a mask to a thin layer of
radiation-sensitive material (called resist) covering the surface of a semiconductor wafer.

19.

____________ is the technical field of using microscopes to view samples and objects that cannot
be seen with the unaided eye (objects that are not within the resolution range of the normal eye).

20.

If is Bragg angle, is wavelength of X-ray beam and B is the line broadening indicating the
extra peak width of the sample in comparison to the standard, then the thickness, t of the
crystallite in angstroms is given by ______________

D
L

R
O

W
U

T
N

-oOo-

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Code No: 56014

Set No. 4
JAWAHARLAL NEHRU TECHNOLOGICAL UNIVERSITY HYDERABAD
III B.Tech. II Sem., II Mid-Term Examinations, April 2012
NANO TECHNOLOGY
Objective Exam
Name: ______________________________ Hall Ticket No.
A

Answer All Questions. All Questions Carry Equal Marks.Time: 20 Min. Marks: 10.

Choose the correct alternative:

1.

LED means
(a) Light Emitting Diodes

(b) Liquid Crystal Diodes

(c) Both

2.

Lithography using ions rather than light beams is called

(a) Electron beam lithography
(b) Optical lithography
(c) Ion beam lithography
(d) none of these

3.

MEMS means
(a) Micro Electro Magnetical Systems
(c) Nano Electro Magnetical Systems

4.

What we can see with our naked eye is about

(a) 100 m
(b) 250 m
(c) 100 nm

[
(b) Micro Electro Mechanical Systems
(d) None of these

D
L

R
O

W
U

Which of the following approaches are used to make the nanomaterials?

(a) Top down approach
(b) Bottom up approach
(c) Both (a) and (b)
(d) None of the above

6.

Carbon nano tube comes under the following category

(a) Dry nanotechnology
(b) Wet nanotechnology

T
N

DNA comes under the following category

(a) Dry nano technology
(b) Wet nano technology

(d) 250nm

5.

7.

[
]
(d) none of these

(c) both

[
(d) none of these
[
(d) None of these

(c) Both

8.

Which of the following materials have zero dimensional or one dimensional structure?
(a) Discrete nanomaterials
(b) Nanoscale device materials
(c) Bulk nanomaterial
(d) All the above

9.

Nanomaterials represent almost the ultimate is

(a) Increase in surface area
(b) Decrease in surface area
(c) Both (a) and (b)
(d) None of the above

10.

A chip built to identify mutations or alterations in the DNA code is called DNA chip.
[
(a) Protein chip
(b) DNA chip
(c) Computer chip
(d) none of these

Cont2

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Code No: 56014

:2:

Set No. 4

II

Fill in the blanks

11.

The mathematical form of Braggs law is _____________

12.

The microscopy which uses electrons as source to form images is called____________

13.

The electrons are emitted in the electron gun by the 'thermionic emission' from____________

14.

___________ technique that uses the characteristic spectrum of x-rays emitted by the specimen
after excitation by high-energy electrons to obtain information about its elemental composition.

15.

XPS detects all elements with an ____________

16.

__________is the process of transferring patterns of geometric shapes in a mask to a thin layer of
radiation-sensitive material (called resist) covering the surface of a semiconductor wafer.

17.

____________ is the technical field of using microscopes to view samples and objects that cannot
be seen with the unaided eye (objects that are not within the resolution range of the normal eye).

18.

If is Bragg angle, is wavelength of X-ray beam and B is the line broadening indicating the
extra peak width of the sample in comparison to the standard, then the thickness, t of the
crystallite in angstroms is given by ______________

19.

The interaction force between AFM tip and the sample is of the order of ________ newton

20.

______________ are not detectable by some systems of EDX analysis.

D
L

R
O

W
U

T
N

-oOo-

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