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FREE SEMINAR

THE MICRO-XRF, HIGH END FTIR AND TGA FOR RESEARCH ANALYSIS

DATE

16 AUGUST 2016 (TUESDAY)

Time

9.00 AM 1.00 PM

Venue

Mini Theatre, FIST, UMP Gambang


TIME

9.00AM-9.30AM

TOPIC / AGENDA

Registration

9.30AM-10.30AM
10.30AM-10.45AM

Non-destructive Micro-XRF Elemental


Mapping Microanalysis in Material
Sciences and Failure Analysis

Q&A session
Coffee Break

10.45AM-11.45AM

11.45AM-12.30PM
12.30PM- 1.30PM
FREE REGISTRATION:
Name : .
Position : ...
Institute : ..
IC/Passport :
Phone No :.
Email : .
* Certificate & Lunch will be provided

Kindly submit your form to Central Laboratory


before 12 August 2016 (FRIDAY)
PLEASE CONTACT US FOR ANY INFORMATION:
SYAHIDAH ALWI /HAIRUNNISA OSMAN
T: 09-5493336/ 5493335 / 5493351
F: 09-5493353
E: syahidah@ump.edu.my / hairunnisa@ump.edu.my

The Capability of High End Research


FTIR Spectrometer

Q&A session

Introduction to Mettler Toledo


TGA/DSC 3+

Q&A session
Lunch

SPEAKERS:MS CHIEW MOI YEE


MICRO-XRF PRODUCT APPLICATION
SPECIALIST,
BRUKER SINGAPORE
MS RENEE TEO YONG YIN
FTIR APPLICATION SPECIALIST,
BRUKER OPTICS MALAYSIA
MS JOEY CHEE
SENIOR SALES CONSULTANT,
METTLER-TOLEDO MALAYSIA

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