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  • IOSR Journal of Electrical and Electronics Engineering (IOSR-JEEE) e-ISSN: 2278-1676, p-ISSN: 2320-3331, Volume 7, Issue 6 (Sep. - Oct. 2013), PP 40-51

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    This document discusses a new method for detecting faults in transmission lines using wavelet transform and support vector machines. Transmission line faults cause problems in power systems and must be identified quickly. The proposed method uses wavelet analysis to extract features from fault signals and then classifies the faults using a support vector machine, which can identify faults like line-to-ground, line-to-line, and double line-to-ground faults with over 90% accuracy.

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    This document discusses a new method for detecting faults in transmission lines using wavelet transform and support vector machines. Transmission line faults cause problems in power systems and must be identified quickly. The proposed method uses wavelet analysis to extract features from fault signals and then classifies the faults using a support vector machine, which can identify faults like line-to-ground, line-to-line, and double line-to-ground faults with over 90% accuracy.

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    © All Rights Reserved
    Download as DOCX, PDF, TXT or read online from Scribd
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    4 views1 page

    IOSR Journal of Electrical and Electronics Engineering (IOSR-JEEE) e-ISSN: 2278-1676, p-ISSN: 2320-3331, Volume 7, Issue 6 (Sep. - Oct. 2013), PP 40-51

    Uploaded by

    durgendra
    This document discusses a new method for detecting faults in transmission lines using wavelet transform and support vector machines. Transmission line faults cause problems in power systems and must be identified quickly. The proposed method uses wavelet analysis to extract features from fault signals and then classifies the faults using a support vector machine, which can identify faults like line-to-ground, line-to-line, and double line-to-ground faults with over 90% accuracy.

    Copyright:

    © All Rights Reserved
    Download as DOCX, PDF, TXT or read online from Scribd
    Flag for inappropriate content
    of 1

    IOSR Journal of Electrical and Electronics Engineering (IOSR-JEEE) e-ISSN: 2278-

    1676,p-ISSN: 2320-3331, Volume 7, Issue 6 (Sep. - Oct. 2013), PP 40-51


    www.iosrjournals.org

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