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Schottky Diodes
by Rick Cory, Skyworks Solutions, Inc.
S
chottky diodes have been ISAT = saturation current, A
used for several decades n = ideality factor
as the key elements in fre- (typically 1.0)
quency mixer and RF power and
detector circuits. In 1938 Walter
Schottky, the son of German
mathematician Friedrich
Schottky, explained the manner
in which a junction comprised
of specific combinations of met- where
als and a doped semiconduc- A = Area, cm2
tor material can rectify. The A** = Modified Richardson
Schottky diode is the result of constant, (A/K)2/cm2
this work. K = Boltzmann’s Constant
T = absolute temperature, K
The Schottky Junction Figure 1: Current vs. Forward Voltage Curves for Silicon ΦB = barrier height, V
The Schottky diode junction is Schottky Diodes with High, Medium, Low and “ZBD”
formed by plating a very pure Barrier Heights Barrier height is a design
metal, typically by evapora- variable for a Schottky diode,
tion or sputtering while under Diffusion continues until the is described by the law of the whereas it is fixed for a pn
vacuum, onto a wafer that has semiconductor is so positive junction equation. The deriva- junction. This is another
been doped with either p-type with respect to the metal that tion is given in many text books advantage of a Schottky junc-
or n-type dopant atoms. As no more electrons can go into (for example, Maas). Some tion relative to a pn junction: a
soon as these materials are the metal. The internal voltage examples of current vs. volt- Schottky junction can have sig-
brought into contact and ther- difference between the metal age curves for Schottky diodes nificantly lower forward volt-
mal equilibrium is established, and the semiconductor is called of various barrier heights are age at a given forward current
their Fermi levels become equal. the contact potential, and is shown In Figure 1. than a comparable pn junction.
Electrons from the semiconduc- usually in the range 0.3 – 0.8 V Schottky diodes have been A Schottky diode is a virtu-
tor lower their energy level by for typical Schottky diodes. commercially available for sev- ally ideal rectifier whose for-
flowing into the metal. Charge When a positive voltage is eral decades. Silicon Schottky ward voltage can be selected by
accumulates at the interface, applied to the metal, the inter- diodes can be produced with design. This makes Schottky
distorting the energy bands in nal voltage is reduced, and elec- several different barrier heights, diodes very well-suited for use
the semiconductor. This cre- trons can flow into the metal. as shown in the table below, but as power detectors, especially
ates an energy barrier, known Only those electrons whose for practical reasons four main at very low signal levels, and as
as the Schottky barrier, which thermal energy happens to be barrier heights are offered: high the switching elements in com-
prevents more electrons from many times the average can barrier, medium barrier, low mutating mixers.
flowing from the n-type mate- escape, and these “hot electrons” barrier and “zero bias detec-
rial into the metal without assis- account for all the forward cur- tor (ZBD)” barrier. The first Junction Capacitance
tance from an external energy rent from the semiconductor three of these types are typi- The depletion region of the
source of the correct polarity to into the metal. One important cally made with n-type Si and Schottky diode is an insulator
elevate their energy above that thing to note is that there is no the appropriate metal; ZBD that separates two conductive
of the Schottky barrier height. flow of minority carriers from diodes generally are made with regions (the metal layer and the
External energy of the opposite the metal into the semiconduc- p-type semiconductor materi- doped semiconductor layer), so
polarity increases the barrier tor and thus no neutral plasma al. Gallium Arsenide (GaAs) it constitutes a parallel-plate
height, thus preventing conduc- of holes and electrons is formed. Schottky diodes are fabricated capacitor. The capacitance
tion. Therefore, if the forward volt- with n-type doping only. of this region is determined
When metal is brought into age is removed, current stops The equation that relates the by the physical dimensions of
contact with an n-type semi- within a few picoseconds and current through a Schottky junc- the junction as well as the
conductor during fabrication of reverse voltage can be estab- tion to the voltage across it is: doping profile of the semicon-
the chip, electrons diffuse out lished in this time. There is no ductor layer. The thickness
of the semiconductor into the delay effect due to charge stor- of the depletion layer can be
metal, leaving a region known age as in junction diodes. This affected by the magnitude of
as the “depletion layer” under accounts for the predominant an externally-applied voltage:
the contact that has no free use of surface barrier diodes in a forward bias will reduce the
electrons. This region contains microwave mixers, where the where thickness of the depletion layer,
donor atoms that are positively diode must switch conductance K = Boltzmann’s constant, effectively moving the plates
charged because each lost its states at the rate of the fre- 1.38044 X10-23 J/K of the capacitor closer togeth-
excess electron. This charge quency of a microwave local q = electronic charge, er; and, a reverse bias volt-
makes the semiconductor posi- oscillator. The voltage-current 1.60206X10-19 C age increases the thickness of
tive with respect to the metal. relationship for a barrier diode T = Temperature, K the depletion layer, effectively
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