Professional Documents
Culture Documents
Francisco Alhanati
John Sheldon
C-FER Technologies
Outline
• Industry Adoption
– Status and Common Challenges
• ESP-RIFTS JIP:
– ESP Reliability Information and Failure Tracking System (RIFTS) JIP
• Objectives include:
– Understand the factors that affect ESP Run-Life
– Determine attainable Run-Life targets for different applications
– Identify ways to improve ESP Run-life across Participant’s operations
– Find ways to increase the inherent reliability of the equipment
• Mean Time To Failure and Failure Rate used as the main KPIs
– Estimates as per ISO 14224, Annex C (items C3, C5)
– Also concepts from ISO 12489
– JIP uses actual Operating Time, not Up Time, whenever possible
• as defined in ISO 14224, Table 4
• C-FER continues to work with industry to show that these are not good
predictors of failures or workovers in subsequent years
– With some limited success…
March 2017 ISO Standardization Seminar - Delft NL 19
Common Misuses
Run-Life Measures Example