Experiment 405:

Diffraction

Charl Joseph B. Santiago, PHY13L/A4

charljosephsantiago@[Link]

Abstract

The Experiment 405 is all about diffraction which is the slight bending of light as it
passes around the edge of an object. By using Snell’s Law formula, we were able to get the
angle of refraction. Based on our results, the light waves reaching a given point on the screen
each arrive from a different part of the slit, so their amplitudes must be added, and a pattern
results. In conclusion, the absolute minima or maxima is directly proportional to their
pattern’s positions.

Key Words: Diffraction, Interference

Introduction
The experiment will involve on the diffraction of light. Diffraction is the apparent
bending of waves around small obstacles and the spreading out of waves past small openings.
The diffraction process is clarified by Huygens ’ Principle which states that light is a form of
electromagnetic wave and the different portions of the slit behave as if they were separate
sources of light waves. [3]

Single Slit Diffraction

If light is made of particles, a beam of such particles should pass straight through a
long, narrow slit and form a single spot on a screen placed beyond the slit. [4]. Consider pairs
of points separated by a distance of half the slit width, such as (A,B) or (C,D) in Figure 1
below. There exists a location on the screen for which waves coming from point C are out of
phase with waves from point D by exactly one-half of a wavelength, so their amplitudes add
to zero. [5]

Fig. 1. The Single Slit Diffraction [5]

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 According to Hyugens’ Principle, the slit may be divided into equal area elements,
witheach area elements acting as a source of secondary waves. Having the same light source,
the path difference is equal to the phase difference.

𝑎 𝜆
𝑠𝑖𝑛𝜃 = 𝑝𝑎𝑡ℎ 𝑑𝑖𝑓𝑓𝑒𝑟𝑒𝑛𝑐𝑒 ; 2 = 𝑝ℎ𝑎𝑠𝑒 𝑑𝑖𝑓𝑓𝑒𝑟𝑒𝑛𝑐𝑒
2
𝑎 𝜆 𝜆
𝑠𝑖𝑛𝜃 = → 𝑠𝑖𝑛𝜃 =
2 2 𝑎
If the slit is divided into many elements,
𝑚𝜆
𝑠𝑖𝑛𝜃 = ; 𝑚= + + +
−1, −2, −3, …
𝑎
For light, the wavelength is very small.
𝑚𝑥𝜆
𝑌𝑚 = 𝑎 (1)

Two Slit Interference

Interference is quiet similar to that of diffraction. Waves passing through one of two
long, as shown in Figure 2, narrow slits will diffract in passing through each slit as described
above, but in addition there will be interference with the waves from the other slit.

Fig. 2. Two Slit Interference

There is constructive interference causing intensity maxima at points on the screen for
which
𝑚𝜆
𝑠𝑖𝑛𝜃 = , 𝑚 = 0, + + +
−1, −2, −3, … (2)
𝑑

The interference is completely destructive (intensity minima) where

1
(𝑚+ 𝜆)
𝑠𝑖𝑛𝜃 = 2
, 𝑚 = 0, + + +
−1, −2, −3, …
𝑑

Methodology

To start with this experiment, as shown in Fig. 3, we were given a piece of optical
bench with screen, a piece of diode laser, a piece of single slit disk with holder, a piece of
multiple slit disk with holder, and a ruler. We were given precautions before we start the
experiment. We must never look into the diode laser when the laser has been turned on since

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it may cause permanent damage to your eyes. Also, we must avoid touching the laser diode
laser. Lastly, we must make sure to plug in the diode laser at the right voltage.

Fig. 2. The materials used in Experiment 405

In order for this experiment to be done, we must first set-up the apparatus. We must
place the optical bench on a table and position the image screen at the 100 cm mark. When
the optical bench is properly set, we can place the diode laser at the 0 cm mark. We should
take note that the diode laser must be facing the screen at the other end of the optical bench.
Also, the lights must be turn off to make sure that the diffraction pattern is visible.

1. Single Slit Diffraction

In the first part of the experiment, the single slit disk must be incident on the single
slit of width 0.16, 0.08, and 0.04 mm. We then determine the central bright fringe of the
diffraction pattern formed on the screen by using a ruler. This central bright fringe is located
at y = 0 with the y-axis along the line of the diffraction pattern. Since the dark fringes are still
visible, we can determine their positions.

Fig. 3. The set-up in single slit diffraction.

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2. Two Slit Interference

In this part of the experiment, we need to replace the single slit disk used in the first
part with the multiple slit disk. The disk must be placed incident on the double slit marked slit
width 0.08 mm and the slit separation 0.50 mm. We can adjust, if needed, the vertical and
horizontal knobs of the diode laser until it is perfectly centered on the double slit and a clear
pattern is formed on the screen. After that, we can determine the middle of the central bright
fringe, y = 0, and the positions of the bright fringes.

Fig. 4. The set-up in two slit interference.

Results and Discussion

1. Single Slit Diffraction

The data we obtained in Table 1.1, 1.2, and 1.3 shows that as the absolute minima
increases, the higher the position of the slit is. The results gathered were correct since the
single slit diffraction pattern have small slit size which is relative to the wavelength of light
and the percent error to the accepted value of a wavelength (660 nm to 680 nm) is less than
10.

Table 1.1. The gathered data in a slit width of 0.16 mm

a = 0.16 mm x = 90 cm
𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
1 0.3667 cm 651.91 nm
2 0.7333 cm 651.82 nm
3 1.1000 cm 651.85 nm
-1 0.3667 cm 651.91 nm
-2 0.7333 cm 651.82 nm
-3 1.1000 cm 651.85 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 651.86 nm

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a = 0.16 mm x = 75 cm
𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
1 0.3 cm 640 nm
2 0.6 cm 640 nm
3 0.9 cm 640 nm
-1 0.3 cm 640 nm
-2 0.6 cm 640 nm
-3 0.9 cm 640 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 640 nm

a = 0.16 mm x = 60 cm
𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
1 0.2667 cm 711.20 nm
2 0.5333 cm 711.07 nm
3 0.8000 cm 711.11 nm
-1 0.2667 cm 711.20 nm
-2 0.5333 cm 711.07 nm
-3 0.8000 cm 711.11 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 711.13 nm

Table 1.2. The gathered data in a slit width of 0.08 mm

a = 0.08 mm x = 90 cm
𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
1 0.7667 cm 681.51 nm
2 1.5333 cm 681.33 nm
3 2.3000 cm 681.48 nm
-1 0.7667 cm 681.51 nm
-2 1.5333 cm 681.33 nm
-3 2.3000 cm 681.48 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 681.44 nm

a = 0.08 mm x = 75 cm
𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
1 0.6 cm 640 nm
2 1.2 cm 640 nm
3 1.8 cm 640 nm
-1 0.6 cm 640 nm
-2 1.2 cm 640 nm
-3 1.8 cm 640 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 640 nm

a = 0.08 mm x = 60 cm

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 𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
1 0.4667 cm 622.27 nm
2 0.9333 cm 622.20 nm
3 1.4000 cm 622.22 nm
-1 0.4667 cm 622.27 nm
-2 0.9333 cm 622.20 nm
-3 1.4000 cm 622.22 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 682.23 nm

Table 1.3. The gathered data in a slit width of 0.04 mm

a = 0.04 mm x = 90 cm
𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
1 1.5 cm 666.67 nm
2 3.0 cm 666.67 nm
3 4.5 cm 666.67 nm
-1 1.5cm 666.67 nm
-2 3.0 cm 666.67 nm
-3 4.5 cm 666.67 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 666.67 nm

a = 0.04 mm x = 75 cm
𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
1 1.3 cm 693.33 nm
2 2.6 cm 693.33 nm
3 3.9 cm 693.33 nm
-1 1.3 cm 693.33 nm
-2 2.6 cm 693.33 nm
-3 3.9 cm 693.33 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 693.33 nm

a = 0.04 mm x = 60 cm
𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
1 1.0 cm 666.67 nm
2 2.0 cm 666.67 nm
3 3.0 cm 666.67 nm
-1 1.0 cm 666.67 nm
-2 2.0 cm 666.67 nm
-3 3.0 cm 666.67 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 666.67 nm

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2. Two Slit Interference

The data we obtained in Table 2.1, 2.2, and 2.3 also shows that as the absolute
maxima increases, the higher the position of the slit is. The results gathered were correct
since the interference at a small distance from a maximum will be very destructive and the
maxima will be extremely narrow because of the great number of slits and the percent error to
the accepted value of a wavelength (660 nm to 680 nm) is less than 10.

Table 2.1. The gathered data in a slit width of 0.04 mm

a = 0.08 mm / d = 0.50 mm x = 90 cm
𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
0 0.0 cm 0 nm
1 1.2 cm 666.67 nm
2 2.4 cm 666.67 nm
3 3.6 cm 666.67 nm
-1 1.2 cm 666.67 nm
-2 2.4 cm 666.67 nm
-3 3.6 cm 666.67 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 666.67 nm

a = 0.08 mm / d = 0.50 mm x = 75 cm
𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
0 0.00 cm 0 nm
1 0.95 cm 633.33 nm
2 1.90 cm 633.33 nm
3 2.85 cm 633.33 nm
-1 0.95 cm 633.33 nm
-2 1.90 cm 633.33 nm
-3 2.85 cm 633.33 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 633.33 nm

a = 0.08 mm / d = 0.50 mm x = 60 cm
𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
0 0.00 cm 0 nm
1 0.80 cm 666.67 nm
2 1.60 cm 666.67 nm
3 2.40 cm 666.67 nm
-1 0.80 cm 666.67 nm
-2 1.60 cm 666.67 nm
-3 2.40 cm 666.67 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 666.67 nm

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 Table 2.2. The gathered data in a slit width of 0.04 mm

a = 0.08 mm / d = 0.25 mm x = 90 cm
𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
0 0.00 cm 0 nm
1 0.25 cm 694.44 nm
2 0.50 cm 694.44 nm
3 0.75 cm 694.44 nm
-1 0.25 cm 694.44 nm
-2 0.50 cm 694.44 nm
-3 0.75 cm 694.44 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 694.44 nm

a = 0.08 mm / d = 0.25 mm x = 75 cm
𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
0 0.0 cm 0 nm
1 0.2 cm 666.67 nm
2 0.4 cm 666.67 nm
3 0.6 cm 666.67 nm
-1 0.2 cm 666.67 nm
-2 0.4 cm 666.67 nm
-3 0.6 cm 666.67 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 666.67 nm

a = 0.08 mm / d = 0.25 mm x = 60 cm
𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
0 0.00 cm 0 nm
1 0.15 cm 625 nm
2 0.30 cm 625 nm
3 0.45 cm 625 nm
-1 0.15 cm 625 nm
-2 0.30 cm 625 nm
-3 0.45 cm 625 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 625 nm

Table 2.3. The gathered data in a slit width of 0.04 mm

a = 0.04 mm / d = 0.50 mm x = 90 cm
𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
0 0.00 cm 0 nm
1 0.12 cm 666.67 nm
2 0.24 cm 666.67 nm
3 0.36 cm 666.67 nm
-1 0.12 cm 666.67 nm

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 -2 0.24 cm 666.67 nm
-3 0.36 cm 666.67 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 666.67 nm

a = 0.04 mm / d = 0.50 mm x = 75 cm
𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
0 0.0 cm 0 nm
1 0.1 cm 666.67 nm
2 0.2 cm 666.67 nm
3 0.3 cm 666.67 nm
-1 0.1 cm 666.67 nm
-2 0.2 cm 666.67 nm
-3 0.3 cm 666.67 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 666.67 nm

a = 0.04 mm / d = 0.50 mm x = 60 cm
𝑚 𝑌𝑚 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆
0 0.000 cm 0 nm
1 0.075 cm 625 nm
2 0.150 cm 625 nm
3 0.225 cm 625 nm
-1 0.075 cm 625 nm
-2 0.150 cm 625 nm
-3 0.225 cm 625 nm
𝑎𝑣𝑒𝑟𝑎𝑔𝑒 𝑐𝑎𝑙𝑐𝑢𝑙𝑎𝑡𝑒𝑑 𝜆 625 nm

Conclusion

In this experiment, we were able to explore the phenomenon of diffraction of light,

and to compare a single slit diffraction and two slit interference. The diffraction is described
as the apparent bending of waves around small obstacles and the spreading out of waves past
small openings, while the interference is two waves superimpose to form a resultant wave of
greater or lower amplitude. Constructive interference occurs when the phase difference
between the waves is a multiple of 2π, whereas destructive interference occurs when the
difference is π, 3π, 5π, etc. The pattern formed by the interference and diffraction of coherent
light is distinctly different for a single and double slit. The single slit intensity envelope is
shown by the dashed line and that of the double slit for a particular wavelength and slit width
is shown by the solid line.

References:
Book
[1] Halliday, Resnik, Walker, Principles of Physics. 9th ed., John Wiley & Sons, Inc. USA
(2011)

9
Manual
[2] Benzon, AM, Diffraction. Physics Lab Manual, 48- 61 (2014)

Others
[3] [Link]
[4] [Link]
[5] [Link]
[6] [Link]

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