Professional Documents
Culture Documents
by
August–December 2003
c C. D. Cantrell (06/2003)
The University of Texas at Dallas Erik Jonsson School of
Engineering & Computer Science
c C. D. Cantrell (11/2002)
The University of Texas at Dallas Erik Jonsson School of
Engineering & Computer Science
DETECTOR MATERIALS
c C. D. Cantrell (07/2002)
The University of Texas at Dallas Erik Jonsson School of
Engineering & Computer Science
• p-n photodiodes
Electron-hole pairs are created in the depletion region of a p-n junction
in proportion to the optical power
Electrons and holes are swept out by the electric field, leading to a current
• p-i-n photodiodes
Electric field is concentrated in a thin intrinsic (i) layer
• Avalanche photodiodes
Like p-i-n photodiodes, but have an additional layer in which an average of
M secondary electron-hole pairs are generated through impact ionization
for each primary pair
◦ Leads to a responsivity
ηq
R=M
ω
c C. D. Cantrell (07/2002)
The University of Texas at Dallas Erik Jonsson School of
Engineering & Computer Science
p-n PHOTODIODES
c C. D. Cantrell (07/2002)
The University of Texas at Dallas Erik Jonsson School of
Engineering & Computer Science
p-i-n PHOTODIODES
c C. D. Cantrell (07/2002)
The University of Texas at Dallas Erik Jonsson School of
Engineering & Computer Science
1.2
1.1
1
0.9
0.8
Responsivity ( A/ W)
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
800 900 1000 1100 1200 1300 1400 1500 1600 1700 1800
Wavelength (nm)
Agilent 5988-5927EN.pdf
The University of Texas at Dallas Erik Jonsson School of
Engineering & Computer Science
-17
Optical Sensitivity (dBm)
-19
-21
-23
-25
-27
Agilent 5988-5927EN.pdf
The University of Texas at Dallas Erik Jonsson School of
Engineering & Computer Science
AVALANCHE PHOTODIODES
• Internal gain
Electron-hole pairs created by absorption of photons are accelerated to en-
ergies at which more pairs are created, then the new pairs are accelerated
and create more pairs, in an “avanlanche”
◦ Overall gain is M pairs generated for each pair created optically
1
M≈
1 − (vd/VBR)n
where vd = reverse bias voltage, VBR = breakdown voltage, and n > 1
Avalanche multiplication creates excess noise
Scales nonlinearly with M , while the signal scales linearly
Therefore there’s an optimal value, Mopt
◦ Typically 3 Mopt 9
Much better signal-to-noise ratio than with external amplification
• Typical sensitivities for a BER of 10−10 are −32 dBm at a bit rate B = 2.5
Gb/s, or −22 dBm at a bit rate B = 10 Gb/s
c C. D. Cantrell (07/2002)
The University of Texas at Dallas Erik Jonsson School of
Engineering & Computer Science
• Front end
High-impedance preamplifier
◦ Bandwidth is
1
∆f =
2πRLCT
where CT = total capacitance and load impedance RL Rs
◦ Conflicting design goals: RL must be high for high sensitivity, but must
be low for high bandwidth
Transimpedance preamplifier
◦ High sensitivity and high bandwidth
c C. D. Cantrell (07/2002)
The University of Texas at Dallas Erik Jonsson School of
Engineering & Computer Science
• Linear channel
Transfer function
Hout(ω) = HT (ω)Hp(ω)
◦ HT = transfer function of linear channel
◦ Hp = transfer function of photodetector
Intersymbol interference (ISI) occurs if the time-domain output signal for
a “one” bit extends beyond the bit-slot boundaries
◦ To minimize ISI, try to ensure that Hout is the transfer function of a
raised-cosine filter,
1
2 [1 + cos(ω/2B)], if ω < 2πB;
Hout(ω) =
0, if ω ≥ 2πB
c C. D. Cantrell (07/2002)
The University of Texas at Dallas Erik Jonsson School of
Engineering & Computer Science
• Data recovery
Clock recovery
◦ Purpose: Isolate a spectral component at the line rate of the signal
(f = B) in order to synchronize the sampling times with the bit slots
of the received bit stream
For RZ, can pass the signal through a narrow bandpass filter
For NRZ, have to square and rectify the signal spectral component
at f = B/2
The spectral component recovered from the signal is used in a phase-
locked loop to control the frequency of a local oscillator in such a way
that there is negligible drift when some data transitions are absent
Frequency recovery is not enough; one must also have an edge detector
Decision circuit
◦ Compares the sampled linear-channel output to a threshold level
c C. D. Cantrell (10/2002)
The University of Texas at Dallas Erik Jonsson School of
Engineering & Computer Science
Behzad Razavi, Monolithic Phase-Locked Loops and Clock Recovery Circuits, Theory and Design (IEEE Press, 1996)
The University of Texas at Dallas Erik Jonsson School of
Engineering & Computer Science
c C. D. Cantrell (10/2002)
Product Bulletin
ERM 577
2.5 Gb/s High Gain
Avalanche Photodiode
Optical Receiver Modules
Applications
• High sensitivity digital receivers
• Long haul SONET/SDH receivers
ERM 577 2.5 Gb/s High Gain | 2
Avalanche Photodiode Optical Receiver Module
Voltage, Vb 1.91
8 - Gnd
Note: APD breakdown voltage is equal to Vb 10.0 min
9 - Gnd
10 - Output (inverted)
11 - Output (non-inverted) 2.54
1.25 meters
12 - Gnd Gold Plated Kovar 25.4
Maximum Ratings 13 - NC
14 - NC 7.60
3.71
Parameter Min Typ Max Units 0.9 O.D. Fiber
Detail A
Operating Temperature 0 70 °C 0.39 ±0.05 Pins 8 through 14 shown.
Pins 1, 3, 5, 7, 8, 9 and 12
Storage Temperature -40 85 °C 0.25 ±0.04
grounded through device
package as shown.
Supply Voltage (-) -6 VDC
APD Supply Voltage Vb V
Optical Input Power 1.0 mW
ERM 577xxx FJS FC/SPC 900 µm buffer with FC/SPC connector 4.50
Pin Configuration
ERM 577xxx FJS FC/APC 900 µm buffer with FC/APC connector 1 - Gnd 25.35 12.70 BOTTOM VIEW
2 - VPD (Bias: +) 19.05
0.9 O.D. Fiber
3 - Gnd
4 - V supply (-5.2 V) 3.17 7 1
5 - Gnd
M3 x 0.5
6 - Thermistor 2.54 DEEP
7 - Gnd 4 PLCS
2.54 12.70
8 - Gnd
9 - Gnd Detail A
10 - Output (inverted)
0.39 ±0.05
11 - Output (non-inverted)
12 - Gnd
0.25 ±0.04
13 - NC
14 - Gnd
ERM 577 2.5 Gb/s High Gain | 3
Avalanche Photodiode Optical Receiver Module
Figure 1 Figure 2
20mV 100mV
/div. /div.
trig'd. trig'd.
T T
-500mV
-99.5mV 55.61ns 100ps/div 56.61ns
55.61ns 100ps/div 56.61ns
VSS
0.033µF//10µF
ERM 577 Typical Transfer Function
600 4
500
Output Voltage (mV)
100
ERM577
0 2
0 20 40 60 80 100 0.033µF//10µF
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