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IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, VOL. 7, NO.

1, MARCH 2019 41

FPGA-Based Real-Time Simulation of High-Power


Electronic System With Nonlinear IGBT
Characteristics
Chen Liu , Student Member, IEEE, Rui Ma , Student Member, IEEE, Hao Bai , Student Member, IEEE,
Zhongliang Li, Member, IEEE, Franck Gechter, and Fei Gao , Senior Member, IEEE

Abstract— The hardware-in-the-loop simulation plays a vital gm Forward transconductance.


role in the test of high-power electronic system. Although the td_ON Turn-ON delay time, inductive load.
application of field-programmable gate array (FPGA) embedded
tr Rise time, inductive load.
system has enabled the real-time system simulating below 500 ns,
the transient characteristic of high-voltage insulated-gate bipolar td_OFF Turn-OFF delay time, inductive load.
transistor (HVIGBT) is largely compromised. In this paper, tf Fall time, inductive load.
a new piecewise HVIGBT model, considering its driver circuit ICE Collector–emitter current.
effect and parasite parameter, is proposed for FPGA-based real- Vce Collector–emitter saturation voltage.
time simulation applications. With the attempt to reduce the
Ls Stray inductance module.
simulation latency, we propose an FPGA solver with a parallel
structural to divide the system into several layers. The model VD Diode forward voltage.
could not only provide accurate system-level performance of
the power electronic converter but also give an insight into the
transient behavior effect of high-power electronic system. Finally, I. I NTRODUCTION
a case study about emulation of traction system of high-speed
train is also presented. Implementations are made on an FPGA
Kintex-7 embedded in National Instruments FlexRIO PXIe-7975.
The obtained results show that the proposed modeling algorithm
T HE high-voltage insulated-gate bipolar transistor
(HVIGBT) is widely used in the electrified transportation
where high voltage and current are required. Advancements
can achieve both accuracy and efficiency within a fixed real-time in power electronics applications demand IGBT operating in
simulation time step of 25 ns. high switching speed as well as high switching frequency [1].
Index Terms— Field-programmable gate array (FPGA), Due to deadtime, switching time, delay time, and voltage
hardware-in-the-loop (HiL), high-power electronic system, high- drops, the output voltage and current are distorted with respect
voltage insulated-gate bipolar transistor (HVIGBT) model, to an ideal switch performance [2]. Its model precision is cru-
traction system. cial for model-based motor control strategy [3]. Researching
HVIGBT model is an important stream for theses megawatt
N OMENCLATURE power electronic system simulation.
Vces Collector–emitter saturation voltage. In recent years, there are three types of IGBT model
VGEth Gate threshold voltage. used in real-time simulation. The most accurate model is
RG Internal gate resistor. numerical model, which solves the physical equations in ana-
Cies Input capacitance. lytical expression describing carriers and electrical behavior.
Cres Reverse transfer capacitance. The analytical model utilizes the parameter extracted from
testing waveform and solves high-order physical equations.
Manuscript received February 28, 2018; revised June 25, 2018, Despite these physical or device level models are assumed
August 12, 2018, and September 13, 2018; accepted September 14, 2018. Date
of publication October 1, 2018; date of current version February 11, 2019. to be too complex to be implemented in field-programmable
This work was supported by European Commission H2020 Grant ESPESA gate array (FPGA), references [4]–[6] reported using physi-
(H2020-TWINN-2015) under Grant 692224. Recommended for publication cal or device level semiconductor simulation in FPGA. They
by Associate Editor Liqiang Yuan. (Corresponding author: Chen Liu.)
C. Liu, H. Bai, and F. Gao are with the FEMTO-ST Institute, Univer- are impressive for an FPGA implementation seeking low
sité Bourgogne Franche-Comté, UTBM, CNRS, 90010 Belfort, France, and steps within acceptable on-chip resource utilization. How-
also with FCLAB, Université Bourgogne Franche-Comté, UTBM, CNRS, ever, these implementations are not suitable for an HVIGBT
90010 Belfort, France (e-mail: chen.liu@utbm.fr; fei.gao@utbm.fr).
R. Ma is with the School of Automation, Northwestern Polytechnical with high switch frequency and high switch speed. The
University, Xi’an 710072, China (e-mail: rui.ma@utbm.fr). relative slow calculation speed in their execution results a
Z. Li is with the LSIS Laboratory (UMR CNRS 7296), Aix-Marseille high latency between simulator and controller, which could
University, 13397 Marseille, France (e-mail: zhongliang.li@lsis.org).
F. Gechter is with Le2i (UMR CNRS 6306), FRE2005, Arts et Métiers, largely affect the simulator’s response to the controller. As for
Université Bourgogne Franche-Comté, UTBM, 90010 Belfort, France (e-mail: the behavioral model [7]–[9], it treats semiconductor devices
franck.gechter@utbm.fr). as ideal or nearly ideal switches when the semiconductors
Color versions of one or more of the figures in this paper are available
online at http://ieeexplore.ieee.org. are in either completely ON -state or completely OFF -state.
Digital Object Identifier 10.1109/JESTPE.2018.2873157 This idealization is suitable for the fast computation speed
2168-6777 © 2018 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.
See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.
42 IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, VOL. 7, NO. 1, MARCH 2019

required by the real time, but it is incapable of showing


detailed switching characteristics. Another related works have
reported the piecewise switch method based on volt–ampere
characteristics. In [10], the IGBT is composed by a fixed
turn-ON delay time, fixed turn-ON rise time, fixed turn-OFF
delay time, and fixed turn-OFF fall time. But the model
will not change with electromagnetic environment and it is
only accurate under a specific current and voltage level. The
Fig. 1. Two-level inverter topology.
implementation in [11] has reported in a simulation step of
12.5 ns with a lookup table method in FPGA, which requires
amounts of experiment data from double-pulse test.
In sum, the main hurdles in the IGBT transient simulation
in hardware-in-the-loop (HiL) application are how to consider
the effect of different voltage levels and how to minimize the
latency between simulator and controller. Aiming to address
the above questions, one of the main objectives in this paper
is to build the nonlinear characteristic of the IGBT model for
FPGA-based real-time applications. Compared with the draw- Fig. 2. Current paths for different switching conditions (phase current
back of the existing approach for modeling IGBT, the proposed I0 > 0). (a) S1 turns ON and S2 turns OFF. (b) S1 turns OFF and S2 turns
ON . (c) S1 turns OFF and S2 turns OFF. (d) S1 turns ON and S2 turns ON .
model has the following benefits.
1) The computation time of IGBT model is largely reduced.
2) It provides the switch with a natural behavior that does
not require a priori knowledge of the circuit topology
nor operation.
3) It can be applied to high-voltage level and high switch-
ing speed.
Besides, in order to apply this model to a high-power appli-
cation, the traction system in the high-speed train is used as a
case study. Analysis and design of such railway traction system Fig. 3. Current paths for different switching conditions (phase current
I0 < 0). (a) S1 turns ON and S2 turns OFF. (b) S1 turns OFF and S2 turns
is often a challenging task when facing such a complex system. ON . (c) S1 turns OFF and S2 turns OFF. (d) S1 turns ON and S2 turns ON .
First, it is a complex hybrid system containing dozens of
semiconductors. Second, it involves stiff problem. Apart from
the semiconductor switch devices, there are also asynchronous
motors. The mutual effect of different components in the
traction system should be evaluated. An HiL platform, which
solves the above problem, could offer the ability to connect to
real physical equipment in hardware to validate motor drive
system controllers as well as its associated algorithm [12].
The remainder of this paper is structured as follows. The
illustration of voltage distortion caused by different IGBT
models is shown in Section II. Section III illustrates the
IGBT model considering parasite parameter and driver circuit.
Section IV proposes a parallel discrete solver in FPGA includ-
ing the implementation of IGBT model. The traction system
of high-speed train, which is used as case study, is shown in Fig. 4. Driving pulses and inverter output voltage. (a) Driving pulses with
Section V. Section VI gives the conclusion of this paper. deadtime. (b) and (c) Output voltage when phase current I0 > 0. (d) Output
voltage when phase current I0 < 0.

II. VOLTAGE D ISTORTION W ITH D IFFERENT the current will flowthrough the parallel diode of S2 rather than
IGBT M ODELS the IGBT device. Fig. 2(c) considers the effect of deadtime.
In Fig. 1, a traditional two-level IGBT leg is shown. Vdc is During this period, both S1 and S2 are OFF. The output voltage
a dc-link voltage and I0 is the phase current. The following is determined by the direction of output current. Special case
analysis and comparison of voltage transient assume that the is the shoot-through status used in Z source inverter [13],
driver circuit of IGBT S1 and S2 is the same. as shown in Fig. 2(d). The current path is decided by i dc
When phase current I0 > 0, different combinations of the rather than phase current. The similar results can be obtained
switching states are shown in Fig. 2. Fig. 2(a) shows the most in Fig. 3 when phase current I0 < 0.
commonly states. Fig. 2(b) shows a case when the switch unit The transient performance of IGBT with different working
S2 gets a turn-ON signal, while S1 is OFF. In this situation, statuses is shown in Fig. 4. The signal drive circuit has
LIU et al.: FPGA-BASED REAL-TIME SIMULATION OF HIGH-POWER ELECTRONIC SYSTEM 43

a deadtime period, as shown in Fig. 4(a). The black line


in Fig. 4(b) and (d) represents the ideal voltage output, and
the blue line is an actual output phase voltage Vn . The actual
transient output voltage usually consists of four different time
stages, the turn-ON delay time (t0 ∼t1 ), the turn-ON time
(t1 ∼t2 ), the turn-OFF delay time (t4 ∼t5 ), and the turn-ON time
(t5 ∼t6 ). Dashed line in Fig. 4(c) is a different dc voltage Vdc∗

condition. The fixed time stage model is represented with red


dashed line, and the actual output voltage is presented with
blue dashed line. Despite the turn-ON delay time and turn- Fig. 5. IGBT equivalent circuit.
OFF delay time can be assumed to be the same, a different
voltage level usually has a different turn-ON time (t1 ∼t3 ) and
the turn-ON time (t5 ∼t7 ).
When phase current I0 > 0, the voltage error area [3] with
the ideal switch model can be calculated as follows:


⎨ E (t0 ∼t1 ) = (t1 − t0 )(Vd + Vdc )




1
⎨ E (t1 ∼t2 ) = 2 (t2 − t1 )(Vd + Vdc + Vces )

E (t ∼t ) = (t4 − t2 )Vces (1)
⎨ 2 4


⎨ E (t ∼t ) = (t5 − t4 )(V dc − Vce )
⎨ 4 5

⎨ 1
⎩ E (t5 ∼t6 ) = (t6 − t5 )(Vdc − Vce ).
2
Compared with fixed time stage behavior model, the voltage Fig. 6. Turn-ON waveform under inductive load. (a) Forward diode turn-OFF
distraction area can be expressed as waveform. (b) IGBT turn-ON waveform.


⎨ E (t0 ∼t1 ) = (t1 − t0 )Vd VG− in series with an external gate resistance RG . L s is




1 ∗ the parasitic inductance of the power electronic system. The
⎨ E (t1 ∼t3 ) = (t3 − t2 )(V dc − Vces )
⎨ 2 switching transient performance is divided into several stages
E (t3 ∼t4 ) = (t4 − t3 )Vces (2)

⎨ with different time intervals.

⎨ E (t4 ∼t5 ) = (t5 − t4 )V ces

⎨ A. Inductive Turn-ON Behavior Modeling
⎨ 1
⎩ E (t5 ∼t7 ) = (t7 − t6 )(V ∗dc − Vces + Vd ).
2 The turn-ON waveforms with inductive load considering
From the above comparison in (1) and (2), it can be noted the stray inductance L s influence are shown in Fig. 6. The
that at the high-voltage condition (Vdc  Vd and Vdc  Vces ), tail voltage is represented by Vtail , which is approximated by
the main error comes from the voltage turn- ON rate and turn- Vtail = ktail · (Vdc + Vd ). The switching time intervals of tail
OFF rate of different voltage levels. voltage is defined as ttail . The switching time intervals defined
in Fig. 6 can be calculated as follows:
III. IGBT T RANSIENT M ODEL t0 = 0, t1 = t0 + td(ON)
Although highly detailed IGBT models, which consider all I0
t2 = t1 + d I (τ )
the capacitances, inductances, and resistances associated with ce 1
dt
the IGBT, can be found in simulation programs with integrated
(1 − k) · (Vd + Vdc ) − L s Icedt(τ1 ) − Vces
circuit emphasis such as CAD tools, SPICE, and SABER, for t3 = t2 + d V ce (τ2 )
real-time simulation with an ultrafast calculation speed, such dt
models are neither necessary nor possible to execute (at least at t4 = t3 + ttail . (3)
the present time), due to the computational effort. As discussed
And the rate-of-rise of voltage d Vce /dt and of current
in Section II, the main error comes from the voltage turn-ON
d Ice /dt during the turn-ON process in (3) can be expressed
rate and turn-OFF rate of different voltage levels. Thus, only
as [18]–[20]
turn-ON rate and turn-OFF rate features of the IGBT are taken
di ce (τ1 ) gm (Vg − Vth ) − I0
into account. =
To control the switching behavior of HVIGBT, the digital dt Rg Cies + gm L σ
control circuits as part of the gate drive unit are commonly dv ce (τ2 ) Vth − Vg+ + I0 /gm
= . (4)
used [14]. The basic idea is to use a set of parameters dt Rg Ccg
of HVIGBTs with the attempt to simulate achieve certain During [t0(ON) , t1(ON) ], there is a turn-ON delay time td(ON) ,
properties of the switching transients caused by the digital within which the MOSFET channel is formed and IGBT
gate control unit. Its overall structure with a behavioral IGBT is OFF. Ic and Vce are defined as
model can be seen in Fig. 5. The IGBT is replaced by its
active region equivalent circuit model [15]–[17]. The gate Ice = 0
is driven by an ideal step voltage source between VG+ and Vce = Vdc . (5)
44 IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, VOL. 7, NO. 1, MARCH 2019

Fig. 7. Turn-OFF waveform under inductive load. (a) Forward diode turn-ON
waveform. (b) IGBT turn-OFF waveform.

During [t1(ON) , t2(ON) ], the current I L starts to transfer from


the freewheeling diode to the IGBT. The stray inductance L s
will cause the drop of Vce as
di ce (τ1 ) Fig. 8. Turn-ON transient performance of IGBT (800 V/1000 A). (a) Turn- ON
Ice = (t − t1(ON) ) current. (b) Turn-ON voltage.
dt
dv ce (τ1 )
Vce = v dc − Ls . (6)
dt In period [t1(OFF) , t2(OFF) ], the diode is still reverse biased,
During [t2(ON) , t3(ON) ], the IGBT voltage will decrease to which causes Ic unchanged
Vtail , while current remains at I0
Ice = I0
Ice = I0 dv ce (τ3 )
dv ce (τ1 ) dv ce (τ2 ) Vce = v ces + (t − t1(ON) ). (11)
Vce = Vdc + Vd − Ls + (t − t2(ON) ). (7) dt
dt dt In period [t2(OFF) , t3(OFF) ], the diode becomes forward
Once the voltage reaches Vtail , a Miller capacitance Cgc biased. The collector current Ic starts falling and the voltage
occurs. With the time period of tail voltage ttail , we can v ce still continues increasing to Vdc + Vrrm because of the
approximate the tail voltage transient. existence of stray inductance L s
di ce (τ4 )
B. Inductive Turn-OFF Behavior Modeling Ice = I0 + (t − t3(ON) )
dt
The inductive turn-OFF switching is shown in Fig. 7. The
switching time intervals defined in Fig. 3 can be calculated as Vce = Vdc + Vrr . (12)

t0 = 0 and t1 = t0 + td(OFF) The overvoltage on the IGBT can be approximated by Vrr =


L s (di ce /dt). As long as the collector current Ice reaches zero,
Vdc − Vces the voltage v ce falls back to Vdc − Vd
t2 = t1 + d V ce (τ3 )
dt Ice = 0
Vdc − Vces I0 Vce = Vdc − Vd . (13)
t3 = td(OFF) + d V ce (τ3 )
+ di ce (τ4 )
. (8)
dt dt
And the rate-of-rise of voltage d Vce /dt and current C. Model Validation
d Ic /dt during the turn-OFF process in (8) can be expressed The above IGBT model utilizes the current and voltage
as [18]–[20] rates in transient. In this part, a double-pulse test is made
di ce (τ4 ) gm (Vg− − Vth ) − I L to validate the rate during turn-ON and turn-OFF period. The
=
dt Rg Cies + gm L σ IGBT module used in this paper is FZ1200R33KF2C. It is
a 3300-V IHV 190-mm single switch IGBT module, which
dv ce (τ3 ) Vth − Vg− + I L /gm
= . (9) is generous application for traction and industry [26]. The
dt Rg Ccg double-pulse test results are shown in Figs. 8 and 9. The
The turn-OFF process begins with a drop in the gate voltage parameter of the IGBT in the test is given in Table I.
Vge . When it drops to the Miller plateau, the IGBT starts to The measuring results and the calculated di /dt and dv/dt
build a reverse voltage. During [t0(OFF) , t1(OFF) ], the capacitance during turn-ON and turn-OFF period are shown in Figs. 8 and 9
Cge discharges. Vce and Ic stays at their steady values with a gate resistor RG = 1.5 . In Fig. 8, the overshoot
Ice = I0 phenomenon is caused by the freewheeling diode to the IGBT.
With the maximum reverse current value Irrm of the freewheel-
Vce = Vces . (10) ing diode and the diode reverse process period trr , the behavior
LIU et al.: FPGA-BASED REAL-TIME SIMULATION OF HIGH-POWER ELECTRONIC SYSTEM 45

TABLE I
U NITS FOR IGBT PARAMETER

Fig. 10. Predictor–corrector solver.

where A, B are the state-space matrices, x is the sate vector,


and u is the input vector. For a power electronic simulation,
variables are the voltage across the capacitance and the current
flowing through the inductance. Compared with the common
explicit method using only the known value x[n] from last
time point, our method is written in two steps: prediction step
(P-step) and corrector step (C-step).
P-step: Compute the predictor x̂ n+2 by an explicit numeric
solver method;
C-step: Apply the x̂ n+1 using an implicit method to obtain
the corrector x n+1 .
The time sequence of the method is shown in Fig. 10. In the
current time point tn , it calculates the predictor value x̂ n+2 at
time point tn during the process of solving x n+1 with known
value x n . In the next step tn+1 , when we estimate the value
of x n+2 , the value of x̂ n+2 will be already known from the
previous step tn . Thus, x̂ n+2 and x n+2 are known at the same
time. Given the ordinary differential equation ẋ = f (x, u),
the combination of the two-step Euler backward methods are
given by
Fig. 9. Turn-OFF transient performance of IGBT (800 V/1000 A). (a) Turn-
OFF current. (b) Turn- OFF voltage.
P − step : x̂ n+2 = x n + 2h · f (tn , x n ) (15)

model of the IGBT considering the effect of the freewheeling C − step : x n+1 = x n + h · f (tn+1 , x̂ n+1 ). (16)
diode can be obtained [27]. The coefficient of the tail voltage
is set to ktail = 0.1; the duration of the tail voltage is 550 ns. Assume that the truncation error is Rn+1 , the exact solution
In Fig. 9, the overshoot in the turn-OFF voltage is caused value X n+1 at time point t (n + 1) can be calculated
by the stray inductance L s . The value of the L s is 110 nH,
X n+1 = Rn+1 + x n + h · Fn+1 (17)
which causes the overvoltage Vrr reaching about 770 V. The
comparison illustrates that the current or current transient rate where Fn+1 = f (tn , X (tn+1 ))
can be approximated by this model in an acceptable way. Assume X n+2−i = x n−i , (i = 2, 3 . . . k − 1), we can use the
identity
IV. C IRCUIT S OLVER W ITH FPGA
The high parallelism offered by FPGAs and their imple- X n+1 − x n+1 = Rn+1 + h(Fn+1 − f (tn+1 , x̂ n+1 ))
mentation have made it conduct a simulation within hundreds
∂ f (tn+1 , εn+1 )
of nanoseconds. With FPGA platform, many papers have pro- = Rn+1 + h (X n+1 − x̂ n+1 )
vided various methods to write the state-space-based method ∂x
for modeling and simulating power electronic cases [21]. They (18)
usually use lower order explicit integration method with a
circuit partitioning to achieve a high execution speed. It usually where εn+1 is a value between X n+1 and x̂ n+1 .
introduces step latency between different subcircuits, thus the Since function f satisfies the Lipschitz continuity theory,
accuracy could be compromised. The method proposed in this a Lipschitz constant L f meeting the conditions of | f (x1) −
section is a parallel method which suited for modeling power f (x2)| ≤ L f |x1 − x2| for allx1, x2 ∈ I , hence
electronic system.  
 ∂ f (tn+1 , εn+1 ) 
  ≤ L f.
A. Formulation and Solver of State Equations  ∂x 
The state-space model of a linear element is given by The global error of the predictor equation (forward Euler
dx method) is O(h), and the global error of the corrector equation
= Ax + Bu (14)
dt (backward Euler method) is O(h 2 ). Thus, the above equation
46 IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, VOL. 7, NO. 1, MARCH 2019

Fig. 12. Implementation of the circuit element model.

The stage 1 is prior to the operation of another stage. The


stage 2 read the parameter from stage 1 and is driven by the
turn-ON or turn-OFF signals from semiconductor driver circuit.
It calculates the turn-ON or turn-OFF rate. The stage 3 has a
compare unit, where judges different stages. Finally, the unit
calculates the voltage and current change.
There are total 12 equations [(5)–(7) and (10)–(13)] about
the behavior model of the IGBT to be implemented on
FPGA. A reorganized generic formulation is developed, which
contains only four equations, to be implemented in the FPGA.
Each equation is independent and can be calculated at the
same time. Consider the proposed generic expression in the
following:
Ice = Ice0 + A x + Bx · h
Vce = Vce0 + C x + Dx · h. (20)
The coefficient in (20) is determined by equation [(5)–(7)
and (10)–(13)] under different IGBT transient stages during
turn-ON or turn-OFF periods. It should be noted Bx and Dx is
the slop as expressed in (1); the numerical value (Vce (t + 2h)
Fig. 11. Implementation of the IGBT model. (a) Overall structure of the and Ice (t+2h)) can also be obtained at the current time point t.
IGBT model. (b) Detailed structure of behavior unit and comparison unit.
Their detailed structure is as shown in Fig. 11(b).

can be rewritten as C. Circuit Element Simulation


The internal hardware structure of circuit element unit is
|X n+1 − x n+1 | ≤ |Rn+1 | + h · L f · |X n+1 − x̂ n+1 | shown in Fig. 12. Every element unit can be executed at the
p
= |Rn+1 | + h·L f · |Rn+1 |# same time. Inside the framework, the circuit element has two
= O(h 2 ) + h·L f · O(h) layers. One is the C-step layer which calculates output variable
x(t+h). The other layer is the P-step layer which executes with
= O(h 2 ). (19)
a time step 2h to predict x̂(t + 2h). Both of these two layers
Thus, the equation proves that the order of the corrector have a similar math calculation unit, consisting of fixed-point
equation and its corresponding parallel equation are 2. With multiplications and sub/add operation. After the calculation is
this solver, we could reach the same speed as the forward done, results are stored in register.
Euler Method but more accurate. Since both P-step and C-step are executed at the same time,
This method can be used when the simulation time step is the total calculation time in this framework is determined by
relatively small. Based on the above parallel strategy, a circuit the longest route in prediction step or correction step. This
partitioning method, which utilizes the predictor values to framework is based on the explicit and implicit Euler method,
separate the IGBT semiconductor and circuit elements devices which has the least number of math operation unit. Advantage
into different subsystems, could be achieved. could involve of a fast calculation speed and accurate solver
process.
B. IGBT Behavior Model Implementation
The internal hardware structure of IGBT unit [shown V. H IGH -P OWER T RACTION S YSTEM
in Fig. 11(a)] illustrates the interface with circuit element. S IMULATION S TUDY
The operation has three stages. The whole system starts to Traction system in high-speed train is a type of megawatt
operate under the reset signal coming from the FPGA board. power electronic system that provides the train with a signifi-
External voltage Vdc and current Ic is the prediction value cantly faster speed than the traditional rail traffic. The applica-
from the circuit. The IGBT parameters are stored in register. tion of high-efficiency and high-power converters associating
LIU et al.: FPGA-BASED REAL-TIME SIMULATION OF HIGH-POWER ELECTRONIC SYSTEM 47

The motor model here is a generalized model based on the


stator stationary reference frame. This model is described with
electrical and rotor fluxes [22], [23]. The mechanical char-
acteristic can use the rotor electrical speed as state variable.
The input variables u sα , u sβ are the voltage Uil , U j l , Ukl after
the Clark transformation. The model can be described by the
following:
⎡ ⎤
dϕ rα
⎢ dt ⎥
⎢ ⎥ ⎡ ⎤ ⎡ ⎤
⎢ dϕ rβ ⎥ ϕrα u sα
⎢ ⎥
⎢ dt ⎥ ⎢ ϕrβ ⎥ ⎢ u sβ ⎥
⎢ ⎥ ⎢ ⎥ ⎢ ⎥
⎢ di sα ⎥ = A · ⎣ i sα ⎦ + B · ⎣ 0 ⎦ (26)
Fig. 13. Architecture diagrams of traction system. ⎢ ⎥
⎢ ⎥ i sβ 0
⎢ dt ⎥
⎣ di ⎦
with motors under each carriage is one of its main features. sβ
Fig. 13 gives “ac–dc–ac” type of traction system in high- dt
speed train. It consists of two parts: the four-quadrant converter where
(4QC) and two-level inverter. ⎡ ⎤
1 Lm
⎢ − −ω 0 ⎥
A. Circuit Modeling ⎢ Tr Tr ⎥
⎢ 1 Lm ⎥
⎢ ω − 0 ⎥
The model for the traction system is based on the formation ⎢ Tr Tr ⎥

A = ⎢ Lm ⎥
of state-space equation. The current i s1 is calculated by the Lm ω Rs L r + Rr L m
2 2

⎢ − 0 ⎥
the following: ⎢σ L s L r Tr σ L s L r Tr σ Ls Lr
2 ⎥
⎢ ⎥
di s1 ⎣ −L m ω Lm Rs L r + Rr L m⎦
2 2
L s1 = u s1 − Rs1i s1 − Uab . (21) 0 −
dt σ L s L r Tr σ L s L r Tr σ L s L r2
Its discretization formulation with predictor–corrector can ⎡ ⎤
0 0 0 0
be expressed as follows: ⎢0 0 0 0 ⎥
⎢ ⎥ L 2m
2h ⎢ 1 ⎥ Lr
i̇ˆs1(n+2) = i s(n) + (u s1(n) − Rs1i s1(n) − Uab(n) ) B =⎢0 0

0 ⎥; σ = 1−

; Tr =
L s1 σ Ls Ls Lr Rr
⎣ 1 ⎦
h 0 0 0
i s1(n+1) = i s1(n) + (u s1(n+1) − Rs1i̇ˆs1(n+1) − Ûab(n+1)). σ Ls
L s1
where L m is the mutual inductance, L ls and L lr are the
(22) stator and rotor inductances, Rs and Rr are the stator and rotor
resistances, n p is the number of poles, and J is the total rotor
Similarly, the current is 2 can be calculated by the following:
inertia. ωr is the electrical rotor speed, which is calculated by
2h
i̇ˆs2(n+2) = i s(n) + (u s2(n) − Rs2 i s2(n) − Ucd(n) ) the following:
L s2
dω n 2p L m np
h = (i sβ ϕrα − i sα ϕrβ ) − TL . (27)
i s2(n+1) = i s1(n) + (u s2(n+1) − Rs2 i̇ˆs2(n+1) − Ûcd(n+1) ). dt J Lr J
L s2
(23) B. FPGA Implementation
As for the voltage u dc , the mathematical expression can be The implementation of a hardware calculation in real time
described as follows: is benefited from parallel calculation method in Section III.
dUc It only consists of accumulators and addition or subtraction
Cd = i dc − i dc1 − i dc2 (24) operation. Each subsystem can predict or calculate the state
dt
where of single circuit element. With the prediction value, the whole
circuit is divided into several levels of parallel subsystems,
Idc = −IT 1 − IT 2 − IT 5 − IT 6 shown in Fig. 14(a). The calculation time is able to reduce
largely in this way. Compared with Forward Euler method,
Idc1 = IS1 + IS3 + IS5
the accuracy and stable are enhanced with the introduction of
Idc2 = IS7 + IS9 + IS11 . both prediction and correction processes.
The hardware setup for the case studies is presented
Its discretization formation can be obtained in the following: in Fig. 14. The Kintex-7 XC7K410T FPGA is embedded in
2h the NI PXIe-7975R FlexRIO PXI Express FPGA module [24],
û c(n+2) = u c(n) + · (i dc(n) − i dc1(n) − i dc2(n) )
Cd which has 400-Mb/s single-ended configuration rates [25].
h Each unit in Fig. 14(a) is realized by the single-cycle timed
u c(n+1) = u c(n) + · (i̇ˆdc(n+1) − i̇ˆdc1(n+1) − i̇ˆdc2(n+1) ). (25) loop (SCTL) provided by LabVIEW FPGA module. The shift
Cd
48 IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, VOL. 7, NO. 1, MARCH 2019

TABLE III
U NITS FOR M AGNETIC P ROPERTIES

Fig. 14. Real-time simulation software and hardware setup. (a) Implemen-
tation structure in FPGA. (b) PXIe-8135 NI platform.
TABLE II
H ARDWARE R ESOURCE U TILIZATION FOR THE C ASE S TUDY
Fig. 15. IGBT transient performance with different gate driver resistors
(1800 V/1200 A).

register is used to pass data between different units. The hard-


ware consumption in this case study is presented in Table II.
It reports the speed performance and area utilization achieved
by the proposed solvers on the FPGA board. The approach
adopted in this paper relies on the fixed-point representation.
A 40-megahertz frequency is met in final timing routing. With
the 40-MHz clock in the SCTL, the latency in the traction
model is 3 while the latency in the IGBT model and the circuit Fig. 16. Voltage waveform of u cd between capacitance Cd . (a) Simulink
element is only 1. results versus simulator results. (b) Absolute error between Simulink results
and simulator results. (c) Predictor versus corrector. (d) Absolute error
between predictor and corrector.
C. Simulation Results
The IGBT modules used in the inverter is FZ1200R33KF2C falling rate are decreased. Due to the relatively small stray
[26] (3300 V, 1200 A). Simulation parameters in the traction inductance value (10 nH) in the FZ1200R33KF2C module
system are shown in Table III. The input voltage source [26], the overvoltage Vrr is less than 70 V. Consider the voltage
U s1 and U s2 are sinusoid waveform with 3600-V amplitude range (1800 V), both the voltage drop value during turn-ON
and 50-Hz frequency. An open-loop control pulsewidth mod- period and overvoltage value in the turn-OFF voltage are not
ulation pulses (carrier frequency is 2000 Hz, the modulation obvious.
index is 0.4, and output voltage frequency is 50 Hz) are used Fig. 16 represents the voltage u cd . Fig. 16(a) shows the
to control the inverter. On the other hand, with the attempt comparison with MATLAB/Simulink. Their corresponding
to verify the IGBT model diversity, the 4QC will operate in absolute error is shown in Fig. 16(b). Considered its numerical
uncontrollable converter status. value, this absolute error is acceptable. Fig. 16(c) shows the
When the gate resistors changes, the turn- OFFvoltage rate comparison between predictor value and corrector value. The
stage and turn-ON voltage falling rate will change accordingly. zoom-in part consists of 20 simulation steps. The predic-
In Fig. 15, we test the gate resistor Rg with the value of 1.5, tor value û dc(n+2) and corrector value u dc(n+1) has one-step
5.5, and 10 , respectively. As the gate resistance is increased, latency (25 ns). If we add one simulation step delay to the
both the turn-OFF voltage rate stage and turn-ON voltage corrector u dc(n+1) , u dc(n) will have a high agreement with
LIU et al.: FPGA-BASED REAL-TIME SIMULATION OF HIGH-POWER ELECTRONIC SYSTEM 49

Fig. 19. Transient performance of IGBT S1.

Fig. 17. Current waveform of I Ls1 flowing through inductance Ls1.


(a) Simulink results versus simulator results. (b) Absolute error between
Simulink results and simulator results. (c) Predictor versus corrector.
(d) Absolute error between predictor and corrector.

Fig. 20. Flux waveform (the stationary reference frame) in the traction
motor. (a) Simulink results versus simulator results (φrα). (b) Absolute error
between Simulink results and simulator results (φrα). (c) Simulink results
Fig. 18. Transient performance of phase-to-phase voltage VFG . versus simulator results (φrβ). (d) Absolute error between Simulink results
and simulator results (φrβ).
predictor û dc(n) . Their difference is shown in Fig. 16(d) with
the expression with absolute error. The maximum absolute
error is 1e-5 V.
Fig. 17 shows the current waveform of I Ls1 . When the
current is positive, it flows through the antiparallel diode in T 1.
Otherwise, the current path is through diode in T 3. The
comparison with MATLAB/Simulink is shown in Fig. 17(a),
accompanied by the absolute error [shown in Fig. 2(b)].
Fig. 17(c) shows the comparison between predictor value and
corrector value. The zoom-in part contains 20 simulation steps.
The correction value is one-time step (25 ns) behind the
prediction value, but the absolute error [Fig. 17(d)] between
them is less than 3e-5 A. It is consistent with the modeling
time sequence of circuit solver. Fig. 21. Current waveform in the traction motor. (a) Simulink results (isa1,
The transient behavior of the phase-to-phase voltage isb1, and isc1). (b) Simulator results (isa1, isb1, and isc1). (c) Simulink results
versus simulator results (isa1). (d) Absolute error between Simulink results
VFG and transient performance of IGBT S1 can ben seen and simulator results (isa1).
in Figs. 18 and 19, respectively. In Fig. 18, the blue line is
a voltage output with ideal switch model. Different turn-ON
The simulation results show that the proposed method
and turn-OFF rates of the voltage in red line are caused by
can simulate the transient performance of the HVIGBT with
different current rates flowing through the IGBT. Fig. 19 shows
different voltages and current external environments. The pre-
the transient performance of the IGBT during turn-ON and diction value and correction value in the results have a highly
turn-OFF periods.
agreement, which can be used as the data communication
The machine is connected to a constant rotor speed
among different units.
(80 rad/s). Fig. 20 shows the flux waveform of the rotor in the
stationary reference frame. Fig. 20(a) shows the rotor flux in
the d frame. The difference with MATLAB/Simulink results is VI. C ONCLUSION
lower than 7e-3. Fig. 20(b) shows the rotor lux in the q frame. This paper presented a piecewise behavior model of IGBT
The absolute error is less than 8e-3 wb. Fig. 21 shows the stator considering the parasite parameter and the driver resistance
current comparison with MATLAB/Simulink. As can be seen with the condition of inductive load. Compared with former
from Fig. 21(d), the absolute error is less than 4 A. The model work considering the transient performance, it benefits from
has a high agreement with the Simulink results. the following aspects.
50 IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, VOL. 7, NO. 1, MARCH 2019

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LIU et al.: FPGA-BASED REAL-TIME SIMULATION OF HIGH-POWER ELECTRONIC SYSTEM 51

Zhongliang Li (M’14) received the bachelor’s Fei Gao (S’08–M’10–SM’15) received the master’s
and master’s degrees in electrical engineering from degree in electrical and control system engineering
Tsinghua University, Beijing, China, in 2009 and and the Ph.D. degree in renewable energy (with
2011, respectively, and the Ph.D. degree in automa- distinguished youth doctor reward) from the Univer-
tion from the University of Aix-Marseille, Marseille, sity of Technology of Belfort-Montbeliard (UTBM),
France, in 2014. Belfort, France, in 2007 and 2010, respectively.
From 2011 to 2014, he was a co-trained Ph.D. From 2011 to 2017, he was an Associate Professor
student with the LSIS Laboratory (UMR CNRS with UTBM, where he is currently a Full Professor
6168), Marseille and FCLAB (CNRS 3239), Belfort, and the Head of the Energy Production Division,
France. From 2014 to 2016, he was a Post-Doctoral School of Energy and Computer Science.
Research Associate with the FEMTO-ST Laboratory Dr. Gao is the fellow of IET and the holder of
(UMR CNRS 6174) and FCLAB Laboratory (CNRS 3539), Belfort. Since the French research expertise bonus (PEDR) by the French Ministry of
2016, he has been an Associate Professor with the LIS Laboratory (UMR Higher Education and Research. He is also an Associate Editor of the IEEE
CNRS 7020), Aix-Marseille University. His current research interests include T RANSACTIONS ON I NDUSTRIAL E LECTRONICS , the IEEE T RANSACTIONS
modeling, control, diagnosis and prognosis with applications to fuel cell ON I NDUSTRY A PPLICATIONS, and the IEEE T RANSACTIONS ON T RANS -
systems, electric vehicles, and other energy systems. PORTATION E LECTRIFICATION , and the Chair of fuel cell system architecture
optimization research axis of the national Fuel Cell Research Federation
FCLAB in France. He is nominated as the Conferences/Workshops Committee
Chair of the IEEE Transportation Electrification Community in 2017 and has
been the Chair of the Technical Committee on Transportation Electrification
Franck Gechter received the Ph.D. degree in com- of the IEEE Industry Electronic Society since 2018.
puter science from University H. Poincare Nancy I,
Nancy, France, in 2003.
From 1999 to 2004, he was an Assistant Professor
with University H. Poincare Nancy I and also a
Researcher with Laboratoire Lorrain de Recherche
en Informatique et ses Applications, Villers-lès-
Nancy, France. In 2004, he joined the Univer-
sité de Technologie de Belfort-Montbeliard, Belfort,
France, as an Associate Professor in computer
science and also with the Systèmes et Transport
Laboratory, Belfort, where he is a member of the Computer Science: Commu-
nications, Agents, and Perception Team. He is focusing on reactive multiagent
models applied to problem solving, to decision processes, and to data fusion.
In 2012, he joined the Fuel Cell Laboratory (CNRS federation of laboratories),
Belfort, as an Associate Researcher, where he was focused on fuel cell systems
simulation considering multilevel and multiphysics aspects. In 2013, he passed
his Habilitation to lead research work (HDR) with Franche Comté University,
Besançon, France. In 2016, he joined the Digital Technology Group, Computer
Laboratory, University of Cambridge, Cambridge, U.K., as an Academic
Visitor. Since 2017, he has been the Head of the LE2I-SeT Research Team,
Laboratoire Electronique, Informatique et Image.

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