Professional Documents
Culture Documents
Barry T. Neyer
Director of Research and Development
PerkinElmer Optoelectronics
NDIA Fuze Conference
April 29 - May 1, 2002
Are qualification and LAT requirements rational …
Ø Recommendations
Ø Assume component is
empty cavity with one or empty cavity
more entry holes
Ø Bombard component with
internal cavity of volume V in
l = L (1 − e− LT /V ) e− Lt /V P / Patm
helium atmosphere for time
T at pressure P, and
measure indicated leak rate, Weld
l, within time t, to determine
true leak rate, L
Ø Back up with gross leak test
to ensure all helium does not
leak out before making the
helium measurement Glass to
Metal Seal
Distribution of Threshold Values, Mean 1000, Std Dev 25, 10% Duds
25
20
15
Number
10
0
900 910 920 930 940 950 960 970 980 990 1000 1010 1020 1030 1040 1050 1060 1070 1080 1090 1100 Duds
Threshold Voltage
1040
1020
Stimulus (V)
1000
980
960
940
920
0 20 40 60 80 100
Specimen Number
Ø Leak tests
• Eliminate requirement for gross test after fine leak test
• Examine real leak requirements
Ø Electrical tests
• Eliminate pin-to-pin ESD test with resistor
• Examine real Hi-Pot requirements
Ø Radiographic inspections
• Eliminate blanket requirement, use when appropriate
Ø Functional tests
• Eliminate dent requirement, use when appropriate
Ø Threshold tests
• Use modern test, and adapt when necessary
• Do not rely on threshold tests to prove reliability