Analysis of traces in aluminum Application

Note
ARL ADVANT’XP Sequential X-Ray
Fluorescence Spectrometer

Introduction
The new ARL ADVANT’XP sequential XRF
spectrometer has been used to analyze various trace
elements in aluminum samples. Analysis of trace
elements in metals demands high sensitivity and
accuracy of measurement. The range of elements
and their concentrations require specific and
optimized analytical conditions in order to achieve
the best results.
Nr. 504
Analytical conditions and results
Table 1 gives a summary of analytical results obtained
using a set of international standards. The elements
and analytical lines used, crystal/detector pairs, X-ray
tube conditions and limits of detection (LOD) achieved
are listed. Excellent LOD's, most of them below
1 ppm, are achieved for all elements. A precision test
consisting of 10 repeat measurements on a low alloy
aluminum sample with counting time of 100s per
element was conducted. Precision values obtained at
specific concentrations are included in the table.

Element Line Crystal/ kV/mA LoD Precision at concentration

Detector [ppm] 1 sigma [ppm] [ppm]
Si Kα PET/FPC 30/100 2.6 3.1 300
Ca Kα LiF200/FPC 50/60 0.6 0.3 20
Ti Kα LiF200/FPC 50/60 0.7 0.5 100
V Kα LiF200/FPC 50/60 0.7 0.5 110
Cr Kα LiF200/FPC 50/60 0.8 0.4 100
Mn Kα LiF200/FPC 50/60 0.7 0.4 100
Fe Kα LiF200/FPC 50/60 0.9 0.6 300
Ni Kα LiF200/Sc 60/50 0.7 0.4 100
Cu Kα LiF200/Sc 60/50 0.7 0.4 100
Zn Kα LiF200/Sc 60/50 0.6 0.3 100
Ga Kα LiF200/Sc 60/50 0.6 0.3 100
Ag Kα LiF200/Sc 60/50 2.0 1.1 50
Cd Kα LiF200/Sc 60/50 1.7 0.6 15
Sn Kα LiF200/Sc 60/50 2.3 1.2 50
Pb Lα LiF200/Sc 60/50 1.3 1.1 35

FPC = flow proportional counter Sc = scintillation counter

Table 1: Analytical results obtained with international standards

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UniQuant® results Conclusion

Two packages are available for analysis of totally ARL ADVANT’XP with its optimized geometry
unknown samples: QuantAS (ARL Semi-Quant) and and flexible analytical configuration providing high
UniQuant® (Omega Data Systems B.V.). The former sensitivity can be effectively used for the analysis of
is based on scans and the latter is based on peak trace elements in aluminum and its alloys.
hopping as done in quantitative analysis. Table 2
shows the results of analysis by UniQuant® on two When high accuracy is required, full calibration
low alloy aluminum standards. should be performed using certified standards,
otherwise semi-quantitative analysis packages like
UniQuant® can be used for a standardless analysis.

Sample A Sample B
Element Certified UniQuant® Element Certified UniQuant®

Mn 0.35 0.38 Mn 0.40 0.45

Fe 0.22 0.22 Fe 0.19 0.19
Si 0.092 0.093 Si 0.076 0.075
Cu 0.052 0.058 Cu 0.054 0.060
Zn 0.050 0.057 Zn 0.049 0.055
Ti 0.045 0.048 Ti 0.055 0.059
Ni 0.034 0.037 Ni 0.020 0.023
Ga 0.028 0.030 Ga 0.026 0.024
Pb 0.026 0.028 Pb 0.027 0.027
Sn 0.026 0.032 Sn 0.026 0.032
V 0.027 0.030 V 0.025 0.028
Cr 0.024 0.023 Cr 0.024 0.028
Bi 0.025 0.024 Bi 0.022 0.023
Zr 0.018 0.022 Zr 0.013 0.018
Ca 0.0060 0.0072 Ca 0.0067 0.0086
Sr Not certified 0.0026 Sr 0.0036 0.0042
P Not certified 0.0065 P 0.002 0.0064

The descriptions contained herein were cor rect at the

time of printing and are subject to alteration without
notice. All orders are accepted subject to our current Conditions
of Sale, copies of wich are available on request.
© ARL-CH publication XRF-05-911-0400-CH-e A Thermo Electron company