Jsa B 7502-2016 PDF

JAPANESE
INDUSTRIAL
STANDARD
Translated and Published by
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Japanese Standards Association
JIS B 7502 :2016
(JMA/JSA)
Micrometers
les 17.040.30
Reference number: JIS B 7502 : 2016 (E)
Copyright Japanese Standards Association PROTECTED BY COPYRIGHT 25 S

B 7502 : 2016
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Date of Establishment: 1952-03-08

Date of Revision: 2016-08-22
Date of Public Notice in Official Gazette: 2016-08-22
Investigated by: Japanese Industrial Standards Committee
Standards Board for ISO area
Technical Committee on Basic Engineering
JIS B 7502 : 2016, First English edition published in 2017-01
Translated and published by: Japanese Standards Association

Mita MT Building, 3-13-12, Mita, Minato-ku, Tokyo, 108-0073 JAPAN
In the event of any doubts arising as to the contents,

the original JIS is to be the final authority.
© JSA 2017
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized
in any form or by any means, electronic or mechanical, including photocopying and microfilm, without
permission in writing from the publisher.
Printed in Japan KK/HN
Copyright Japanese Standards Association PROTECTED BY COPYRIGHT

B 7502 : 2016
Contents
Page
Introduction································································································· 1
1 Scope································································································· 1
2 Normative references············································································ 1
3 Terms and definitions··········································································· 2
4 Design specification (design characteristics) ·············································3
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4.1 General .............................................................................................. 3
4.2 Names of main parts ............................................................................ 3
4.3 Dimensions ......................................................................................... 6
4.4 Measuring range················································································ ·10
4.5 Types of indicating devices············· ........................................... ···········11
4.6 Protection of electronic digital indication for field use······························ ·13
4.7 Insulation plate················································································· ·13
4.8 Measuring faces················································································ ··14
4.9 Measuring-force limiting device ............................................................ ·14
4.10 Adjustment devices············································································ ·14
4.11 Spindle······························································································14
5 Metrological characteristics and performance .......................................... 14
5.1 General···························································································· ·14
5.2 Metrological characteristics································································· ·15
5.3 Performance······················································································ ·20
6 Marking on product documents ............................................................ ·28
7 Proof of conformance with specifications················································ ·28

7.1 General············ ................................................................................ ·28
7.2 Measurement standard for calibration of metrological characteristics
and performance················································································ ·29
7.3 Standard reference temperature··························································· ·29
8 Inspection························································································· ·29
9 Marking ........................................................................................... ·29
Annex A (informative) Example of an error-of-indication curve························ ·30

Annex B (informative) Notes on use .............................................................. 31
Annex C (informative) Typical data sheet for design specification (design

characteristics), metrological characteristics and
performance ............................................................. ·32
Annex D (informative) Relation to the GPS matrix model ................................ ·33
(i)

B 7502 : 2016
Annex JA (informative) Marking on product documents··································· 35

Annex JB (informative) Comparison table between JIS and corresponding
International Standard············································· 36
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(ii)

B 7502 : 2016
Foreword
This translation has been made based on the original Japanese Industrial
Standard revised by the Minister of Economy, Trade and Industry
through deliberations at the Japanese Industrial Standards Committee
as the result of proposal for revision of Japanese Industrial Standard
submitted by Japan Precision Measuring Instruments manufacturers
Association (JMA)I Japanese Standards Association (JSA) with the draft
being attached, based on the provision of Article 12 Clause 1 of the In-
dustrial Standardization Law applicable to the case of revision by the
provision of Article 14.
Consequently JIS B 7502:1994 is replaced with this Standard.
JIS B 7502:1994 may be applied in the JIS mark certification based on
the relevant provisions of Article 19 Clause 1, etc. of the Industrial
Standardization Law until August 21, 2017.
This JIS document is protected by the Copyright Law.
Attention is drawn to the possibility that some parts of this Standard
may conflict with patent rights, applications for a patent after opening to
the public or utility model rights. The relevant Minister and the Japanese
Industrial Standards Committee are not responsible for identifying any of
such patent rights, applications for a patent after opening to the public or
utility model rights.
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(iii)

JAPANESE INDUSTRIAL STANDARD JIS B 7502 : 2016
Micrometers
Introduction
This Japanese Industrial Standard has been prepared based on the second edition of
ISO 3611 published in 2010 with some modifications of the technical contents in order
to correspond to the practical manufacture and use.
The portions given sidelines or dotted underlines are the matters in which the con-
tents of the corresponding International Standard have been modified. A list of modi-
fications with the explanations is given in Annex JB.
This Standard is one of geometrical product specifications (GPS) under the GPS
Basic Standard (see ISO/TR 14638 : 1995) and related to the chain link 5 for the chain
of standards on size. The details on the relation between this Standard and other GPS
Standards are given in Annex D.
1 Scope
This Standard specifies micrometer for external measurements, __
R~:u:~~h~I>_~g :mj~:rQJ)J~
,~_t~r__ fQr_int~r1;19:1_)))&~$_l}X~}J).gnt~1_}J).j~XQm~J&J;_J~rr_$.p_~rr_))l~_~$~}x~mgnt~_QfJ~~thl-_~ng_mj_-_
~XQm~t~x __ l)g~g ___(h~r~J~Jt~r __ x~f~rx~g ___ tQ ___ ~$___ mj_~x~m~t~xl ___\l:rrl~~$___ Qth~xwi_~~ __ J?I>_~~ifj_~_Q.)l
equipped with analogue indication, mechanical or electronic digital indication.
NOTE: The International Standard corresponding to this Standard and the
symbol of degree of correspondence are as follows.
ISO 3611 : 2010 Geometrical product specifications (GPS) - Dimen-
sional measuring equipment: Micrometers for external measurements -
Design and metrological characteristics (MOD)
In addition, symbols which denote the degree of correspondence in the
contents between the relevant International Standard and JIS are IDT
(identical), MOD (modified), and NEQ (not equivalent) according to
ISO/lEe Guide 21-1.
2 Normative references
The following standards contain prOVISIons which, through reference in this text,
constitute provisions of this Standard. The most recent editions of the standards (in-
cluding amendments) indicated below shall be applied.
JIS B 0641-1 Geometrical Product Specifications (GPS) - Inspection by measure-
ment of workpieces and measuring equipment - Part 1 : Decision
rules for proving conformance or nonconformance with specifica tions
NOTE: Corresponding International Standard : ISO 14253-1 Geometrical prod-
uct specifications (GPS) -Inspection by measurement of workpieces and
measuring equipmen t - Part 1 : Decision rules for proving conformity or
nonconformity with specifications
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B 7502 : 2016
JIS B 0642 Geometrical product specifications (GPS) - General concepts and re-
quirements for GPS measuring equipment
NOTE: Corresponding International Standard: ISO 14978 Geometrical product
specifications (GPS) - General concepts and requirements for GPS
measuring equipment (MOD)
JIS_B_QQSQ ____ G:?_Q!!H;fri/;/Jl_P!:9Jj1d[ltSp-~9ia~~tiQ!J§_{({PS)_~_St~nrjJJxqxf!ffJ!:~l]Q1._tf!.m_-
PfJ!:~tJJ);:fJ_fQTgfJQmf!txic;~!PI:[HizH;t§P?_c;jfj9!!ljQn_~prj_~~I:ifi~iJ_tiQ!l
JIS_B_'14aQ ____ Qptic;~!fl?,t~

JIS _B_'14a1____ Qptic;~!PiJxf1!l?l$
JIS _B_'1 RQQ ____ G:iJ_lJg~ ))}Q~4$
JIS_B_'1RaQ ___ }j;l?_c;tI:ic;~!_c;QmR/!J:~_~QJ:$.
JIS _B_'1 Ras ___ _A._utQ~QlJjm!!l9);:~
JIS C 0920 Degrees ofprotection provided by enclosures UP Code}
NOTE: Corresponding International Standard: IEC 60529 Degrees of protection
provided by enclosures UP Code} (IDT)
JIS_Z__8_l0_9.. ____ G:JQ§§~!'y_9.ft?J:m§__l!_~f!dj!J_mf!.~$.lJr:?PJ~l]t
3 Terms and definitions

For the purpose of this Standard, the terms and definitions given in JIS B 0641-1,
JIS B 0642, JlS_Z__8.1Q3, and the following apply.
3.1 micrometer for external measurements
measuring instrument which gives the evaluation of a dimensional quantity of an ex-
ternal feature of a workpiece on the basis of movement of a spindle with a measuring
face, moving relatively to a material measure and a fixed anvil, with the movement
genera ted by a screw thread
NOTE 1 The guiding elements of the spindle and of the anvil are connected by a
frame.
NOTE 2 Usually, micrometers for external measurements have a thread as a
material measure with the anvil, spindle and screw mechanism ar-
ranged linearly.
3.2 bar-shaped micrometer for internal measurements
measuring instrument which gives the evaluation of a dimensional quantity of an in-
ternal feature of a workpiece on the basis of movement of a spindle with a measuring
face, moving relatively to an adjusting anvil fixed on the body, with the movement
generated by a screw thread (hereafter referred to as "micrometer for internal meas-
urements")
This type of micrometers does not include extendable micrometers whose measuring
range can be expanded.
NOTE 1 An adjusting anvil and an anvil fixed on the spindle have a spherical
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B 7502 : 2016
measuring face.
NOTE 2 Micrometers for internal measurements have a screw thread as a mate-
rial measure with the adjusting anvil, anvil, spindle and screw mecha-
nism arranged linearly.
3.3 micrometer for span measurements of teeth
micrometer for external measurements to be mainly used for the measurement of the
base tangent length of the involute gear
NOTE: The micrometer has a disc-shaped measuring face.
3.4 micrometer head
measuring instrument which gives the evaluation of a displacement of a workpiece on
the basis of movement of a spindle with a measuring face, with the movement gener-
ated by a screw thread
NOTE 1 The micrometer head has a mounting part to fix the instrument.
NOTE 2 The micrometer head has the spindle and screw mechanism arranged
linearly.
3.5 measuring face contact
contact between the measuring face and a feature of a workpiece
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3.5.1 full measuring face contact

contact between the full area of the measuring face and a feature of a workpiece
3.5.2 partial measuring face contact
contact between a partial area of the measuring face and a feature of a workpiece
3.6 error of indication
indication of a micrometer minus a true value of the corresponding input quantity
NOTE: The conventional true value is used because it is impracticable to deter-
mine a true value.
4 Design specification (design characteristics)

4.1 General
The general design specification (design characteristics) of the micrometer shall be
such that its metrological characteristics comply with the requirements of this Stand-
ard under all operational orientations, unless otherwise specified by the manufacturer
(supplier) .
.NOJ.~E_: ___ An_g~~J)Jp.l~_Qf_(l~tg __E2hg~t_Jm::'J;;'p'~_Qi~i~_~tjfHJ._JTIgrkin.K_in_th~_~~Bg__9J_RXQyid~.
.inKth~_in.fQKm~_tiQn_fQK_1l_E2~r$__i_$_gjSg}ljn_A!1JJ.g~_J]:
4.2 Names of main parts
The names of main parts of micrometer shall be as given in Table 1.
The figures are intended to indicate the names but not intended to give the design

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B 7502 : 2016
details.
Table 1 N ames of micrometer

Main parts
Classifica tion
shown in:
Micrometer for external
Figure 1
measurements
Micrometer for internal
Figure 2
measurements
Micrometer for span
Figure 3
measurements of teeth
Micrometer head Figure 4
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B 7502 : 2016
2 3 6 7 9 10
1 measuring face 6 clamp

2 anvil 7 sleeve
3 spindle 8 fiducial line
4 frame 9 thimble
5 thermally insulating plate 10 fast drive (measuring-force limiting device)
Figure 1 Main parts of micrometer for external measurements
1 measuring face 6 sleeve

2 adjusting anvil 7 fiducial line
3 body 8 thimble
4 grip (thermally insulating part) 9 anvil
5 clamp
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Figure 2 Main parts of micrometer for internal measurements

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B 7502 : 2016
2 3 4 7 8 10 11
1 measuring face 7 clamp

2 anvil disc 8 sleeve
3 spindle disc 9 fiducial line
4 spindle 10 thimble
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5 frame 11 fast drive (measuring-force limiting device)

6 thermally insulating plate
Figure 3 Main parts of micrometer for span measurements of teeth
1 2 3 4 6 7
1 measuring face 4 sleeve

2 spindle 5 fiducial line
3 attaching face 6 thimble
7 fast drive (measuring-force limiting device)
Figure 4 Main parts of micrometer head
4.3 Dimensions
The main shapes and dimensions of the micrometer shall be as follows.
a) Micrometer for external measurements shall be as given in Table 2.
b) Micrometer for internal measurements shall be as shown in Figure 5.
c) Anvil disc and spindle disc of micrometer for span measurements of teeth shall be
as given in Table 3.
d) The mounting part of micrometer head shall be as shown in Figure 6.
The clearance between the spindle and the guide hole of micrometer for external

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B 7502 : 2016
measurements, micrometer for span measurements of teeth and micrometer head

shall be as given in Table 4.
Table 2 Shape and dimensions of micrometer for external measurements
- ~ ~~==:~I -+--+--+':-:-:-~};--- --~

Q -a-+--
~ L4
Dimensions Nominal value

Anvil length, Ll -
Spindle length in end position, Lz, -
Maximum measurable dimension, L3 -
Measuring span, L4 25 mm a)
Frame depth, L5 b) -
Spindle and anvil diameter, Dl 6.35 mm, 6.5 mm, 7.5 mm, 8 mm a)
NOTE: Dl, Ll and Lz, dimensions are important as a compatibility of device to be attached
on the measuring face.
Notes a) At the manufacturer's discretion. Other diameters are possible.
b) Usually, L5 is determined to permit the measurement of the diameter of the cyl-
inder equal to the maximum measurable dimension.
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B 7502 : 2016
Unit: mm
Figure 5 Radius of curvature of measuring face of micrometer for

internal measurements
Table 3 Shapes and dimensions of anvil disc and spindle disc of

micrometer for span measurements of teeth
Unit: mm
20° max.
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Maximum measurable dimension D T

50 or under 15 to 20 0.5 to 1.0
over 50 up to and incl. 100 18 to 25 0.5 to 1.2
Anvil discs and spindle discs of other maximum measurable dimensions
shall be as agreed between the parties concerned with delivery.

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B 7502 : 2016
Unit: mm
Figure 6 Shape and dimensions of mounting part of micrometer head
Table 4 Clearance between a spindle and its guide hole
Unit: mm
Classifica tion Clearance
Micrometer for external e = 0.01 max.
measurements
Micrometer for span
measurements of teeth
Micrometer head e = 0.015 max.
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4.4 Measuring range

The types of measuring ranges of the micrometer shall be as given in Table 5.
Table 5 Types of measuring ranges

Unit: mm
Measuring range
Micrometer for ex- Micrometer for in- Micrometer for span Micrometer head
ternal measure- ternal measure- measurements of
ments ments teeth
o to 25 -
o to 25 o to 25
25 to 50 25 to 50
50 to 75 50 to 75 50 to 75
75 to 100 75 to 100 75 to 100
100 to 125 100 to 125 100 to 125
125 to 150 125 to 150 125 to 150
150 to 175 150 to 175 150 to 175
175 to 200 175 to 200 175 to 200
200 to 225 200 to 225 200 to 225
225 to 250 225 to 250 225 to 250
250 to 275 250 to 275 250 to 275 -
275 to 300 275 to 300 275 to 300

300 to 325 300 to 325
325 to 350 325 to 350
350 to 375 350 to 375
375 to 400 375 to 400 -
400 to 425 400 to 425

425 to 450 425 to 450
450 to 475 450 to 475
475 to 500 475 to 500
Micrometers having other measuring ranges shall be as agreed between the parties con-
cerned with delivery.
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B 7502 : 2016
4.5 Types of indicating devices

4.5.1 General
The types of indicating devices shall be as follows.
a) Analogue indicating devices
b) Digital indicating devices with mechanical digital display
c) Digital indicating devices with electronic digital display
On micrometers with analogue indicating devices, the scale interval and its unit
shall be labelled.
On micrometers with a digital indicating device, the unit of the indication shall be
labelled.
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NOTE: Combinations of analogue and digital indicating devices are possible.
4.5.2 Analogue indicating devices
4.5.2.1 General
The spindle shall have a thread pitch of 0.5 mm or 1 mm. In the case of micrometers
with spindles having a pitch of 0.5 mm, the 0.5 mm graduation lines on the main scale
shall be clearly distinguishable from the 1 mm graduation lines by means of their ar-
rangement above and below the fiducial line. The secondary scale on the thimble shall
have a scale graduated with 50 (pitch 0.5 mm) or 100 (pitch 1 mm) graduation lines,
each scale interval representing 0.01 mm.
4.5.2.2 Graduation
The graduation of sleeve and thimble shall be as given in Table 6 and Figure 7, un-
less otherwise specified.
Table 6 Graduation
Unit: mm
Thread pitch Thimble Sleeve
0.5 50 divisions Scale interval 0.5
1.0 100 divisions Scale interval 1.0
o 5 10 15 20 25
11111111111111111111111111
1111111111111111111111111
ro_
lE]
o 5 10 15 20 25
11111111111111111111111111
Sleeve Thimble Sleeve Thimble

a) 0.5 mm thread pitch b) 1.0 mm thread pitch
Figure 7 Graduation (measuring range 0 mm to 25 mm)

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B 7502 : 2016
4.5.2.3 Fiducial line and graduation line

The thickness of sleeve fiducial line and thimble graduation line shall be as given in
Table 7, unless otherwise specified.
Table 7 Thickness of graduation line

Unit: mm
Item Thickness Unevenness in
thickness
Sleeve fiducial line
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0.08 to 0.20 0.03 max.

Thimble graduation line
NOTE: The thickness of thimble graduation line should be equal to
that of sleeve fiducial line.
4.5.2.4 Scale spacing of thimble

The centre distance between the adjacent thimble graduation lines shall be 0.8 mm
or over.
4.5.2.5 Arrangement of scales
The arrangement of sleeve's main scale and thimble's secondary scale, and the di-
mensions of thimble scales shall be as shown in Figure 8.
Unit: mm
3 4 1
1 thimble
2 sleeve
3 main scale (sleeve)
4 secondary scale (thimble)
Figure 8 Arrangement between main scale and secondary scale, and

the dimensions of thimble scales
4.5.3 Mechanical digital display

The example of mechanical digital display is shown in Figure 9. The mechanical dig-
ital display shall have a digital step of 0.01 mm or 0.001 mm. The digits of the display
shall provide a good contrast with the background.

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B 7502 : 2016
1 mechanical digital display

Figure 9 Example of mechanical digital display
4.5.4 Electronic digital display

4.5.4.1 General
The example of electronic digital display is shown in Figure 10. The electronic digital
display shall have a digital step of 0.01 mm or 0.001 mm.
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1 2
1 electronic digital display

2 control buttons
Figure 10 Example of electronic digital display
4.5.4.2 Error messages

Micrometer with electronic digital indication ,$h::\Ujn~htQ._~ __ ~ __ d~_Y..i~_~__ Q.?JH!R!~L9f_~l.i:?_~
__ __ __ __ __
p.l~yin.g_~n Q'pgI;~ti9.n ~n!J_B..y::?_t~nt_~rxm:~_)I)g$_~~g~B.. wJ)gn_x_~.p_id $.p_in~n~ r9_t~ti9_n Qn~ld __
,Q~ll_$_~_ th~ _
WTQDg jnQ.j_G~ti9.n _Qr _wJ)gn _RQW~r_-_$ll-p.Rly _YQ! t::\g~__ d~Qlin~:?_._
4.5.4.3 Interface
In the case of micrometer with electronic digital indication having an interface, the
manufacturer shall describe the transmission format of the data outputs (interface)
with as much detail as possible in product documentation.
4.6 Protection of ,~I~(!t:r_Qp.i(!__digiJ~ljndi(!~tiQn for field use
Wh~n_mj_Gx9.m~t~x __wj_th__ ~l~~_tr9x),i~__ gjgit~l_in9j~JAtinn_gTI~x~nt~~_$_Jlvict __?_n~L_d1-!B..t_Rr9_~
,t~~_tiQn,
the manufacturers shall indicate clearly which kind of fluid and dust protec-
tion (Ip code, according to JIS C 0920) in the body or in product documents.
4. 7 .lJJ~\ll~tjJJ.g-plat.~.
For hand-held micrometers, the frame .QX_Jh~__ RQdyjmj_GX9.m~t~Lf9x_jnt~n.l::\Lxn~~:?_~

,1)X~J.l)gnt~L~hn~ld be insulated to prevent hand heat from being transmitted.

14
B 7502 : 2016
4.8 Measuring faces

Measuring faces shall have a wear-resistant and suitable surface finish. rhE;__ h~xd~
n~_~~_Qf_m~~~1-!rirrKJ~~E;_i? __ $h~ltJ~E;__ D-gt_l_~~~__ tl~~rr __ IQQ_JlY__9x __ <3.Q_HEQl._R-nd_th~_}):)&~_i?:tJ.x~~,
mgnt_~h~nJ)_E;__ <;_~xri~ct_Q1-!t__9)),_tJ)g);n~~~JJring_f~_G~_Qr_9)),_thE;__Gyli_nd~r_i?:tJ.xf~_G~_within_l_mm
~W~y_ fl;'Q m_ th~ _m~~_~!JxiD-K f~<;g_.
4.9 Measuring-force limiting device

Micrometer for external measurements and })-J.i~XQm_~tE;x_JQL_~p.~n_m_~_~_i?~x~m~D-t~__ Qf
tg~th shall be provided with a measuring-force limiting device {:r_~_t~JH~t_i?t9P__ Q:r_Jd~_tiQD
~tQP} integrated in the thimble or in the fast drive. M_i<;xQm~tgxJJE;J~._di?__w_i_thg~_tmgR-_~~X~
i))gJQr<;~Jimj_tiD-.K_d~~i~~_~x~_p_Q_~~iRl~: __ The measuring-force limiting device shall func-
tion smoothly.
The measuring force generated by the measuring-force limiting device shall be
measured as given in 5.3.2.4, and shall supersede the frictional force of the spindle.
Usually, the micrometers have a measuring force between 5 Nand 15.. N. Th~_mg_~_i?~X~
ingJQ:r_G~_di_~p.~r~_i9)),_~_h~n_pg_n9_t_mgr~.th~)),_Q_N:
4.10 Adjustment devices

Micrometer for external measurements, m_i<;XQm~t_E;x_f9xjnt_E;xn~tm~~~!Jx~m~rrt$__ 9::rrfl
m_iGxQm~t.~x_JQL_$p_~n __ m~~~!Jx~m~rrt_i?__ gL_t~~_th shall be provided with user-accessible
means for setting the micrometer to zero or to the reference point.
An adjustment device shall be provided to compensate for wear of the spindle and
nut threads.
NOTE 1 To set the reference point, the reference point setting bars or gauge
blocks should be used.
NOTE 2 The dimensional tolerance on nominal dimension of reference point set-
ting bar is obtained by the following formula.
M=±{l+fo)
where, M: dimensional tolerance on nominal dimension of reference
point setting bar (/lm)
L: nominal dimension of reference point setting bar (mm)
On a conspicuous position of reference point setting bar, the nominal
dimension and dimensional tolerance shall be described.
4.11 Spindle
The hardness of spindle thread shall be not less than 700 HV or 60 HRC, and it shall
be measured on the thread or on the neighbouring cylinder surface. The hardness of
stainless steel thread shall be not less than 530 HV or 51 HRC.
5 Metrological characteristics and performance

5.1 General
The metrological characteristics and performance of micrometers specified in this
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15
B 7502 : 2016
Standard shall apply QDlY:_wh~n_th~_K~f~I~))gE;_j)_9_i:Qtj~__ ~_~_t_~_~jng_th~_)J~inim!Jm__ m~9:~_l;!r_~

?:'9..1~J:lj}.).).gn~_i9x~.
The metrological characteristics and performance of a micrometer can
be measured by a suitable instrument and a measurement standard with clear uncer-
tainty, for example a gauge block specified in JJS_lt'Z9.Q6. The measurement standard
shall be able to measure the metrological characteristics and performance of a mI-
crometer over the whole measuring range.
~IQTE__ l _____~{Qj&$__Qn_l;!~_~__?:.r~_gjygnj:Q_A:Qn~~_J3!
,N_QTE__ 2. ____ Ang~_~}:AP.l~_QfQ.~t9:_~_h~~t_fQx_~m~<;_iJi~9:tj_Qn_m9:IkinK_i_n_tJ)g_G~_~~_Qf
p.r_Qyj_~]j:Qg_t_h~jnfQKm_~tiQn_fQK_~_~~r$_j_$_gjy~)}jn_Anng~ __C!
5.2 Metrological characteristics
5.2.1 Cl~mpjI1g of spindle

When clamped (in cases where the frame is equipped with a clamping device), a
spindle ~h~Jtb..~_JjgJ.).:.tlY__~~~_l;!rgQ,. The indication shall not change by more than 2 !-lm.
5.2.2 Maximum permissible error of indication (MPE)
5.2.2.1 General
The error-of-indication characteristics apply to any indications based on the zero set-
ting stated in 5.1. The tolerance on error of indication shall be limited by the maximum
permissible error (MPE).
Th~_K~P-~9:tJlJ)jlity_(5_._2_._2_~a2_J:l.p.p.li~~_QnJY_wh~njtjB.._J::~_CJ.l;!iJ::~ct_bY__ tbg_m~n\lJ9:~t~K~r_(QJ::
,th_~_~!JP.pli~r)_J~9:~_~_g_9_n_th~__g~_$jK1Jo_$'p_~_Gjfi<;_~_tiQn_-<ct~$jKn_<;)}9:r?:.<;t~rj_~ti<;_$>-"
,NQ_TE_: ___ Th~ __ $Y}:A9..9l~__ Qf_~rKQr~9fi1Jocti~~tiQn_~h~J::9:<;_t~ri$_ti~$__ ~n_(1_t)}~ir_~9xx~~n9_nd~,
.i:QKm_~xkj_ng~__?:.r_~_giYE;njn_AnnE;~_JA!
5.2.2.2 Full surface contact error J(maximum permissible error JM~E)

a) Maximum permissible error of indication by full measuring face contact, as follows.
The full surface contact error refers to the error of indication when full measur-
ing face contact (3.5.1) is employed at any position of the measuring range, ~n_(~tJh~
,m~XimJJnLj)_~xm_i$_~jbJg_~rKQr_JMJ:'.E._QfjnQ.iG~t.iQ:Q __QyJlJlL}:A~_?:.$JJri1Jog_f~_G~ __GQnt9:<;_t_Df_~
,mi~r_QD)gt~r__$h~ll_R~_~B.._gi~~n_i1Jo_r~blE;__8..
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---

16
B 7502 : 2016
Table 8 Maximum permissible error of indication by full measuring face contact e/MPE
Unit: !-lm
Measuring range Micrometer for Micrometer for Micrometer for Micrometer head
(mm) external meas- internal meas- span measure-
urements urements ments of teeth
o to
25 ±2 -
±4 ±2
25 to 50
50 to 75 ±4 ±6
75 to 100 ±3
100 to 125 ±5 ±7
125 to 150
150 to 175 ±4 ±6 ±8
175 to 200
200 to 225
225 to 250 ±5 ±9
250 to 275 ±7 -
275 to 300
300 to 325 ±6
325 to 350
350 to 375 ±8
375 to 400 ±7 -
400 to 425
425 to 450 ±9
450 to 475 ±8
475 to 500
JMPE of the micrometer having other measuring ranges shall be as agreed between the parties
concerned with delivery.
b) Measurement of full surface contact error The full surface contact error shall be
tested as follows.
1) Measure the full surface contact error using an instrument such as gauge block.
2) When the micrometer has a rotating measuring spindle, the following gauge block
dimensions should be used in order to enable the spindle to be measured at points
with integer multiple of the thread pitch and at the intermediate positions.
If the minimum measurable dimension is not zero, that value plus the dimen-
sion corresponding to the minimum measurable dimension are the preferable
gauge block dimension.
2.5 mm, 5.1 mm, 7.7 mm, 10.3 mm, 12.9 mm, 15.0 mm, 17.6 mm, 20.2 mm, 22.8
mm and 25.0 mm
When the measurement is performed using the gauge block dimensions above,
the error of indication at various rotational angles of a spindle can be obtained.
3) In the case of large micrometers, it suffices to measure the minimum and maxi-
mum measurable dimensions of the micrometer by a gauge block in consideration
for the influence of the measuring force on the body, provided that the measuring
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---

17
B 7502 : 2016
head has been measured separately (measurement of spindle screw feed error).
NOTE: Using the error-of-indication curve is the easest method to evaluate
the performance of a micrometer, and the effective method to verify
the measurement result. An example of an error-of-indication curve
is given in Annex A.
4) The full surface contact error shall be measured as given in Table 9.
Table 9 Measurement of full surface contact error

Type Measuring method Figure Measuring
instruments
Microme- After setting the reference Gauge block
ter for point using measuring- of grade 0
external force limiting device with or 1 speci-
meas- the minimum measurable fied in JIS
urements dimension of a micrometer, B 7506, or
place each gauge block of a the gauge
selected length between equal or
measuring faces. Subtract superIOr
the gauge block dimension thereto
from the indication of the
micrometer using the same
device.
Microme- Method 1 Gauge block
ter for in- Bring two flat jaws (Type of grade 0
ternal A) into close contact with or 1 speci-
meas- the gauge block having the Flat jaw fied in JIS
urements nominal dimension equal to (Type A) B 7506, or
the minimum measurable gauge equal
dimension of the microme- or supenor
ter, and fix them with a thereto
Micrometer
gauge block holder. Set the
reference point of the mi-
crometer by measuring the
distance between the two
faces, and measure the di- Flat jaw '-------fL-....--------'I
mension using each gauge (Type A)
block of the selected length.
Subtract the gauge block
dimension from the indica-
tion of the micrometer.
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---

18
B 7502 : 2016
Table 9 (continued)
instruments
Microme- Method 2 Electrical
ter for in- After setting the reference comparator
ternal point of a measuring in- having the
meas- strument with the gauge scale inter-
urements block having the nominal Electrical comparator val of 111m
(conclud- dimension equal to the or less and
ed) minimum measurable di- the instru-
mension of the micrometer, Micrometer mental er-
set the reference point of ror of ±O.5
the micrometer. Then ad- 11m as spec-
just the scale of the mi- ified in JIS
crometer to any indication, B 7536, or
clamp it, and measure the length
length with the length meaSUring
measuring instrument. Add instrument
the minimum measurable having an
dimension to the indication accuracy
of the length measuring in- equal or
strument at that time. superIOr
Subtract that dimension thereto.
micrometer.
Microme- After setting the reference Gauge block
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---
ter for point using measur- of grade 0

span ing-force limiting device or 1 speci-
meas- with the minimum meas- fied in JIS
urements urable dimension of a mi- B 7506, or
of teeth crometer, and place each gauge equal
gauge block of a selected or superIOr
length between measuring thereto
faces (the position indicat-
ed in the figure). Subtract
the gauge block dimension
micrometer using the same
device.
Microme- Method 1 Gauge block
ter head After setting the reference of grade 0
Steel Micrometer
point at the minimum ball or 1 speci-
head
measurable dimension of a fied in JIS
micrometer, place each B 7506, or
gauge block of a selected gauge equal
length between the meas- to or supe-
uring face and the steel rior thereto
ball and subtract the gauge
block dimension from the
indication of the microme- /:
ter head.

19
B 7502 : 2016
Table 9 (concluded)
instruments
Microme- Method 2 Length
ter head Measure the spindle screw meaSUring
(conclud- feed of the micrometer instrument
ed) head by the length meas- having the
uring instrument. scale inter-
vall/-lm or
less and the
error of in-
dication ±l
/-lm or less
5.2.2.3 Repeatability R (maximum permissible error &J?E.)

This is the closeness of agreement between the results of successive measurements of
the same measurand under the same conditions of measurement, when a full measur-
ing face contact (3.5.1) is employed fm~:~_miG;r:9_m~t~;r:J.QL~~t~xn~Lm~~B_v:r~_m~))J_~ __~n(lmi~
,~XQm~t~x_)}~~d __9x__ wh~n_~_J~~;r:ti~1 __m~}~)?llxjng_f~<;g __ ~9)}t~_Gt_(3--J5..._~) __ i~ __~_I))-p.lQy-~_<j_J9.r__ mj_-_
~XQm~t~x_f.Q;r:_BI>_~n_mg~_~}JJ.:~m~p:t&_QfJ~~th_~n~Lm_i<;_Qxm~t~x_fQx_inJ~Dl~l_m~~~}J.x~m~nt_$.
The repeatability shall be measured, for example by using gauge blocks having any
dimension (within the measuring span).
,NQ_TE_: ____Th~ __m~PllJ~<;_t}J.X~r__ ~9}11~til))&$_J~~rQyi<j~$__ tJ)&_Qgt?cil~_.Qf_I~I>_~_~_t~RiUtY__~R.QP'
X~gll_~_~tJrQ_I))_Jh~_)I$gX~
5.2.2.4 Partial surface contact error E(maximum permissible error EM:rE}

The partial surface contact error applies to __ __
mj.GIQ_m~_t~rJQx $.p_~n m~~$_v:r~J))&:nt~ __QJ
,t~~tb-__ ~n~LI))j<;xQm_~J&rJQX __~~t.~xn~lm~~~~;r:~_m~nt$.
The error of indication applies when
partial measuring face contact (3.5.2) is employed on successive measurements of the
same measurand, carried out at any position of the measuring faces. If the micrometer
has a rotating measuring spindle, the measurements ,$hQ_v..ld be carried out at points
with integer multiple of the thread pitch and at their intermediate positions .
.f.9.r__ th~_J~r?c~ti~_~l __ R}J.;r:RQ$_~_$, __ tl~~ __m~~$_v:r~_I))_~_:nt_Qf_t_h~ __p.~rtj~l __$}JXf~_G~ __<;_Qnt~~t __ ~Ir.Q;r:
$h~U_J)_~__ tq.k~n_~~_th~t__ Qf_th~_Jlgt_:n~_$J~ __Qf_m_~~~}J.XiPK_f~~~__ gn~lJ~~;r:~U~h$m__ Qf_m~_?c$llxj_:ng
f~~g.
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---

20
B 7502 : 2016
5.3 Performance
5.3.1 Performance of micrometer
5.3.1.1 Micrometer for external measurements
The performance of micrometer for external measurements shall be as given in Table
10, when measured according to 5.3.2.1 to 5.3.2.3 and 5.3.2.5.
Table 10 Performance of micrometer for external measurements

Unit: f.1m
Measuring Flatness of Parallelism Spindle Frame deflection
range (mm) meaSUring of measuring screw feed per 10 N
face face error
o to 25 0.6 2 3 2
25 to 50
50 to 75 3
75 to 100 3
100 to 125 4
125 to 150 5
150 to 175 6
175 to 200 4
200 to 225 7
225 to 250 8
250 to 275
275 to 300 5 9
300 to 325 1 10
325 to 350
350 to 375 11
375 to 400 6 12
400 to 425
425 to 450 13
450 to 475 14
475 to 500 7 15
Performance of micrometer having other measuring ranges shall be as agreed
between the parties concerned with delivery.
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---

21
B 7502 : 2016
5.3.1.2 Micrometer for internal measurements

The performance of micrometer for internal measurements shall be as given in Table
11 when measured according to 5.3.2.3.
Table 11 Performances of micrometer for internal measurements

Unit: 11m
Measuring range (mm) I Spindle screw feed error
500 max. I 3
Performance of micrometer having other measuring
ranges shall be as agreed between the parties con-
cerned with delivery.
5.3.1.3 Micrometer for span measurements of teeth

The performance of micrometer for span measurements of teeth shall be as given in
Table 12 when measured according to 5.3.2.1 to 5.3.2.3 and 5.3.2.5.
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---
Table 12 Performance of micrometer for span measurements of teeth

Unit: 11m
Measuring Flatness Parallel- Spindle Frame deflection
range (mm) of meas- ism of screw feed per 10 N
uring face meaSUring error
face
o to 25 1 4 3 2
25 to 50
50 to 75 6 3
75 to 100
100 to 125 1.3 7 4
125 to 150 5
150 to 175 8 6
175 to 200
200 to 225 1.6 7
225 to 250 9 8
250 to 275
275 to 300 9
Performance of micrometer having other measuring ranges shall be
as agreed between the parties concerned with delivery.
5.3.1.4 Micrometer head

The performance of micrometer head shall be as given in Table 13 when measured
according to 5.3.2.1, 5.3.2.3 and 5.3.2.6.

22
B 7502 : 2016
Table 13 Performance of micrometer heads

Unit: J.lm
Measur- Flatness Spindle Perpendicularity of
Ing range of meas- screw measuring face to spindle
(mm) UrIng feed error axial line
face
o to 25 2 3 2
Performance of micrometer having other meaSUring ranges
shall be as agreed between the parties concerned with deliv-
ery.
5.3.2 Measurement of performance

5.3.2.1 Flatness of measuring face
The flatness of measuring face shall be measured as given in Table 14.
Table 14 Measurement of flatness of measuring face

Type Measuring methods Figure Measuring
instruments
Micrometer Bring an optical flat or op- Optical flat of
for external tical parallel into close con- grade 1 or 2
measure- tact with the measuring specified in
ments, face, and count the number JIS B 7430, or
micrometer of red interference fringes optical paral-
for span produced by the white light. Optical flat lel of grade 1
measure- Count a red interference or specified in
ments of fringe as 0.3 J.lm. optical parallel JIS B 7431
teeth,
micrometer
head
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---

23
B 7502 : 2016
5.3.2.2 Parallelism of measuring face

The parallelism of measuring face shall be measured as given in Table 15.
Table 15 Measurement of parallelism of measuring face

instruments
Microm- Method 1 Optical par-
eter for Bring a combination of gauge allelof
external block and optical parallel, or grade 1
meas- optical parallel into close con- specified in
urements tact with the measuring face JIS B 7431,
of the anvil (to the degree that Optical parallel and gauge
a single colour or closed curve block of
of interference fringe is ob- Gauge block grade 0 or 1
served). Count the number of specified in
red interference fringes pro- JIS B 7506,
duced by the white light on or gauge
the measuring face of a spin- Optical parallel equal or su-
dIe using a measuring-force perior
limiting device of the microm- thereto
eter' and take it as a parallel-
ism. It is preferable to obtain
the maximum value of succes-
sive measurements both at
the position of integer rota-
tions of the spindle and at
more than one position where
the fraction of number of rota-
tions equals to the multiple of
a fraction of one rotation.
When the maximum measur-
able dimension exceeds 175
mm, Method 2 may be used.
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---

24
B 7502 : 2016
Table 15 (concluded)
instruments
Microm- Method 2 Gauge block
eter for Place a gauge block in the of grade 0 or
external centre of both measuring fac- 1 specified
meas- es, and read the indication Gauge blocks in JIS B
urements using a measuring-force lim- 7506, or
(conclud- iting device of the micrometer. gauge equal
ed) Place separately the gauge or superIOr
blocks in four corners of the thereto
measuring face, read each in-
dication, and obtain the
maximum difference. Measur-
Alternatively, bring the gauge ing face
block (equal to the minimum
The mark x represents
measurable dimension) into
a measuring point.
close contact with the centre
of anvil measuring face. Place
separately another gauge
blocks between the gauge
block and the spindle me as -
uring face, in centre and four
corners of the measuring face.
Read each indication, and ob-
tain the maximum difference.
Microm- Place separately gauge blocks Gauge block
eter for in four corners of measuring of grade 0 or
span face, read each indication us- 1 specified
meas- ing a measuring-force limiting in JIS B
urements device of the micrometer, and 7506, or
of teeth obtain the maximum differ- gauge equal
ence. or superIOr
Alternatively, bring the gauge thereto
block (equal to the minimum
measurable dimension) into
close contact with the centre The mark x represents
of anvil measuring face, place a measuring point
separately another gauge
blocks between the gauge
block and the spindle me as -
uring face in four corners of
measuring face. Read each in-
dication, and obtain the
maximum difference.
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---

25
B 7502 : 2016
5.3.2.3 Spindle screw feed error

The spindle screw feed error shall be measured as given in Table 16.
Table 16 Measurement of spindle screw feed error

instruments
Microm- Fix an anvil holder to the Anvil holder Spherical
eter for frame (body) so that the centre \ ~auge block an viI, an viI
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---
external of measuring face of a spindle holder,
meas- comes into contact with the ~ ~ T) gauge block
ure- centre of the spherical anvil at ~ ~'-' JI( of grade 0 or
~
ments, the position of minimum 1 specified
mIcrom- measurable dimension, apply Spherical anvil in JIS B
eter for the measuring force and set Example of micrometer for 7506, or
internal the reference point. external measurements gauge equal
meas- Place separately gauge blocks or superlOr
ure- of different length between the Micrometer Gauge block thereto
n'~_+_~ ~f_i£l
ments, measuring face of a spindle
mIcrom- and the spherical anvil, apply
eter for the measuring force and read ~ ~145 ~ rtll
span the indication.
meas- Obtain the difference between
Anvil holder Spherical
urements the maximum and the mini- anvil
of teeth mum from the differences be-
tween the indications of the Example of micrometer for
micrometer and the dimen- internal measurements
sions of the gauge block.
In the case of the micrometer
for external measurements
having the maximum meas-
urable dimension of 150 mm
or less, the difference between
the maximum and the mini-
mum of the full surface con-
tact error (Table 9) may be
obtained.
Microm- Determine the difference be-
eter head tween the maximum and the
minimum of the full surface
contact error at each measur-
able dimension obtained by
the method in Table 9.

26
B 7502 : 2016
5.3.2.4 Measuring force and its dispersion

5.3.2.4.1 Measuring force
The measuring force shall be measured as given in Table 17.
Table 17 Measurement of measuring force

instruments
Microm- Use a load cell or balance. Load cell of
eter for When using a load cell, ar- sensitivity
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---
external range the centre of load cell in 0.2 N or less,

meas- the centre axil of spindle. automat-
Load cell
ure- When using a balance, place a ic-indicating
ments, steel ball between loading spring scale
mIcrom- point of the balance and the balance of
eter for measuring face centre of spin- Gauge block scale inter-
span dle. Arrange the spindle and val 20 g or
meas- the balance so that the spindle less, or
urements axis is vertical and the bal- equivalent
of teeth, ance indicates zero. instrument
mIcrom- Read the maximum indication
eter head of a load cell or balance using
a measuring-force limiting de-
VIce.
Repeat this procedure five
times, and average the values.
5.3.2.4.2 Measuring force dispersion

The measuring force dispersion shall be measured as given in Table 18.
Table 18 Measurement of measuring force dispersion

instruments
Microm- Obtain the difference between Same as Table 1 7 Same as Ta-
eter for the maximum and the mini- ble 17
external mum of measuring force ob-
meas- tained by the method of
ure- 5.3.2.4.1, and take it as a
ments, measuring force dispersion.
mIcrom-
eter for
span
meas-
urements
of teeth,
mIcrom-
eter head

27
B 7502 : 2016
5.3.2.5 Frame deflection

The frame deflection shall be measured as given in Table 19.
Table 19 Measurement of frame deflection

instruments
Microm- Aim the anvil of a micrometer Reference
eter for downward and secure the mi- point setting
external crometer with the spindle axis bar or other
meas- kept vertical. bar equal or
ure- Place the gauge block of any superlOr
ments, length or the reference point Gauge blocks thereto
mIcrom- setting bar between both or reference
eter for measuring faces using a point setting Weight
span measuring-force limiting de- bar l'
meas- vice, and read the indication.
urements Apply the load of 50 N (sus-
of teeth pend a weight of 5 kg) to the
frame of anvil side, place the
gauge block or the reference
point setting bar using a
measuring-force limiting de-
vice, and read the indication.
Obtain the frame deflection
per ION from the difference
between two indications.
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---

28
B 7502 : 2016
5.3.2.6 Measuring face perpendicularity to spindle axial line

The measuring face perpendicularity to spindle axial line shall be measured as given
in Table 20.
Table 20 Measurement of measuring face perpendicularity to spindle axial line

instruments
Microm- Method 1 Electrical Electrical
eter head Fix the mounting part of a ' / comparator comparator
micrometer head to a slidable I specified in
V-block. JIS B 7536,
Move the V-block, and read or length
the indication of an electrical meaSUring
comparator when the meas- instrument
uring face is applied to the of an accu-
stopper. V block racy at least
Read separately the indica- equivalent
tions of the electrical com par- thereto
ator, and take a half the
maximum difference of indica-
tions as a perpendicularity.
Method 2 Autocolli-
Rotate the spindle of a mi- mator speci-
crometer head, read the fied in JIS B
runout of measuring face us- Autocollimator 7538
#-;;-~-~-:11~
ing an au tocollima tor, and
obtain the perpendicularity by
the following formula.
y=D 1 ·x/400
where,
y: perpendicularity of
spindle ()lm)
D J : diameter of spindle
()lm)
x: runout of autocollima-
tor (s)
6 Marking on product documents

For reference, the examples of marking the maximum permissible error in product
documents or figures are given in Annex JA.
7 Proof of conformance with specifications

7.1 General
For the proof of conformance and non-conformance with specifications, fh~j)}t~rn~~,
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---
__ __ ___ __ __ __
t_i9.n~L_~~~gJ!_t~n~~ c;xit~xjQn_wh~x~ th~ E2P.~dfj~~t_i9_:n ~_Q)}~__ gll\l_~lB___th~ ~~c;g:D_t~n~~ ~Qn~,

29
B 7502 : 2016
(~_imp.l~_R-_G~~.p_ta.nG~)_j_~_:tJ._~~Q.:,
,NO_TE_: ___ .Th~_jnt~r)}~tj_Qn~l_~~c;ggt~n~~_c;xjt~xiQnx~f~x~_.tQ_ISQ(TR_.l12_Q_3_~6_:_2Q.l2:,
7.2 Measurement standard for calibration of metrological characteristics and perfor-
mance
A measurement standard shall be properly selected and used according to JIS. When
such a measurement standard is not available, the one traceable to national standards
shall be used.
7.3 Standard reference temperature
The specifications for performances given in this Standard shall be the values at the
standard reference temperature of 20°C as specified in JIS B 0680.
8 Inspection
The dimensions, measuring range, type of indicating device, measuring face, meas-
uring-force limiting device, spindle, metrological characteristics and performance of
micrometer shall be inspected and conform to 4.3 to 4.5, 4.8, 4.9, 4.11 and clause 5. For
the micrometers with measuring faces of anvil and spindle made of cemented carbide
alloys, the measurements of hardnesses may be omitted.
9 Marking
On a conspicuous position of a micrometer, the following items shall be indelibly de-
scribed.
a) Scale interval QLmjnim1J_l))__ digit.~tB..t~p.
b) Measuring range (see Table 5)
c) NR-_l))_~__QJ_tb.~_})1~ql1J£~_c;t1-!r~x_(~:tJ..p.p.li~r2_Qr._it~_~RRX~Y:i~t.i9_1;1
d) Manufacturing number (alphanumeric)
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---

30
B 7502 : 2016
Annex A (informative)
Example of an error-of-indication curve
Figure A.1 shows an example of an error-of-indication curve. This is a simplified da-
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---
ta set (for data points) in order to illustrate the characteristics of the micrometer. The
details of indicating and specifying metrological characteristics are specified in .Gl~J}J?g.
'1_ gf JJS_ J~_ Q~1_~__:__~Q 1Q.
~
-
3
I~+c
2
a /'1 ~\
v /'
/'
/"/
, /'-
...... _ /'
/' \
\\
I
JIll,
, I
/
/
...::::
\
\
\ /'
/'
...... ,
......
o - ;
I 'J
- V
-
......
\ / L,mm
\ / \1
-1 ill
-2
I~-c
-3
0.0 2.5 5.1 7.7 10.3 12.9 15.0 17.6 20.2 22.8 25.0
Symbol
L length indication
J error of indication
h error-of-indication span
c .~r:rQr_-_QfjJ}9j~<;~ti_Qn MPE
a error-of-indication curve
Figure A.I Error-of-indication curve

31
B 7502 : 2016
Annex B (informative)
Notes on use
B.l To obtain reliable repeatable measuring values, ~_m_~_~_~}Jxi;t).gJm:·_G~Jimit_i:nKd~~i.G~~

wJ)'J~~_:nJ~r9.yid~~tin_~__mi~r_Q))).g_t~r, shall be used to rotate the spindle smoothly.
B.2 In order to avoid heat transfer from the hand, the micrometers shall be held as
much as possible by the insulating plate or h~__11B_~-,;tw.ith_~_mi.GrQJ».g_t~r_$.t~nd.
B.3 The micrometer shall be verified periodically, based on the frequency and condi-
tions of use. The abnormalities of spindle (e.g. sluggish rotation, hesitation), if any, can
result from its deformation, dirt in the screw, etc.
B.4 Before use, the micrometer shall be reset to zero or reference point in the posture
of use. Gauge blocks or reference point setting bar should be used for this setting.
,a_._Q____ A:n_.th~_.G~~~__ Qfgl~.GtxQniG __(~Ugit~_~_inQ.j<;_~_tiQD_~l_.P_~.Y-_BJ;~~<;j_~l_~t_t~D_tiQ:n_.t9._~n~ixQnm_~n~

,t~l f~<;.t9.r_~!
,a!J}____ At.t~:nti9)}_~hm-JJQ.__ R~_ll_~_id_t9__ tl)&_t~nd~)}<;y__ th~t_m~~$_l}x~))).g_1}t __~t __th~ __di$_G_g_1}d_Qf_~

,mi~r_Qm_~_t~r_J9x__~p.~n_m~~B_11r~_m~:nt~_Qf_t~~_th-__G~:t:l_$~~_~_r~l~tiYE?J.Y-J~rg~_gxrQr_J)_E?_G~}J_~~_tl~i~
,ty'p'~_QfJni<;xQm~t_E?x_dQ~~_nQt_~_dh~r_~__t9._tbg_GQD_d_i_tiQn~_p.x~$_GriR~~tinJh~_ARR~:B_J~riD_.Gip.l~_.,
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---

32
B 7502 : 2016
Annex C (informative)
Typical data sheet for design specification (design
characteristics), metrological characteristics and
performance
The following data sheet shows an example of product information in catalogues,
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---
brochures, etc., provided with the user by the manufacturer (or the supplier). In many
cases, these items of information are shown by the forms of dimensional drawings and
reference charts.
N arne of equipment
Product profile
D Design specification (design characteristics)

Type .________________________________________________ _
Types of indicating devices
Minimum reading value / scale interval/minimum digital step : ___________________ mm
Measuring range .________________________ t.Q ______________________ mm
Dimensions
Diameter of spindle and anvil (Dl) mm
Length of anvil (Ll) mm
Depth of frame (L5) mm
Thread pitch of spindle ._________________________________________________ mm
D Metrological characteristics and performance

Maximum permissible error of indication (MPE)
Maximum permissible error of indication by full measuring face contact ~PE
:____________________ J.lm
Maximum permissible error of indication by partial measuring face contact EMPE
Flatness of measuring face :____________________ J.lm
Parallelism of measuring face :____________________ J.lm
Maximum permissible error of repeatability RMPE : ____________________ J.lm (if necessary)
Company name
Date, number of edition, etc.

33
B 7502 : 2016
Annex D (informative)
Relation to the GPS matrix model
D.1 General
For details about the GPS matrix model, see ISO/TR 14638 .
.NQ-'J~~E_l ____ ThE?_J~t~~tgQj_ti5n)'__QfJS_QITR_1463a_i_~_lSQ_116g~__:__Z_0_lQ~
.NQTE__2. ____ Th~_~hginljn~J)__GQn'J~$p_Qn.Jl~_tQ_thE?_~hginljn~_:E_~pE?_Gifi~g_inlSQ_l16..3_s.._:_.
2_0_15_.
D.2 Information about this Standard and its use

This Standard provides the most important design specification (design characteris-
tics), metrological characteristics and performance of micrometers equipped with ana-
logue, mechanical or electronic digital indication.
D.3 Position in the GPS matrix model

This Standard is a general GPS standard, which influences the chain link 5 of the
chain of standards on size in the general GPS matrix, as shown in Figure D.l.
Global GPS standards
General G PS standards
Chain link number a) 1 2 3 4 5 6
Size x
Distance
Radius
Angle
Form of a line independent of datum
Form of a line dependent of datum
Fundamen-
Form of a surface independent of datum
tal GPS
Form of a surface dependent of datum
standards
Orientation
Location
Circular run-out
Total run-out
Datums
Roughness profile
Waviness profile
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---
Primary profile
Surface imperfections
Edges
Note a) The representation of chain link number is as follows.
Chain link 1 : symbols and indications Chain link 4 : measurement
Chain link 2 : feature requirements Chain link 5 : measurement equipment
Chain link 3 : Feature properties Chain link 6 : calibration
Figure D.1 GPS matrix model

34
B 7502 : 2016
D.4 Related Standards

The related standards are included in the chain of standards in Figure D.l.
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---

35
B 7502 : 2016
Annex JA (informative)
Marking on product documents
For better visibility and clarity, the symbols given in this Standard can be replaced
by the corresponding symbols given in Table JA.1, which have fewer subscripts.
Table JA.l Symbols in this Standard and corresponding symbols used

for product documents or figures
Symbols in this Standard Corresponding symbols
JMPE MPEJ
EMPE MPEE
RMPE MPER
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---
Bibliography
[1] ISO/TR 14253-6 : 2012 Geometrical product specifications (GPS) - Inspection by
measurement of workpieces and measuring equipment - Part 6 : Generalized
decision rules for the acceptance and rejection ofinstruments and workpieces
[2] ISO/TR 14638 : 2015 Geometrical product specifications (GPS) - Matrix model
[3] ISO/TR 14638 : 1995 Geometrical product specification (GPS) - Masterplan

td w
-:]m
01
o
t:-,:)
Annex JB (informative)
t:-,:)
Comparison table between JIS and corresponding International Standard o
f-'
JIS B 7502: 2016 Micrometers ISO 3611 : 2010 Geometrical product specifications (GPS) - Dimension- m
al measuring equipment: Micrometers for external measurements -
Design and metrological characteristics
(1) Requirements in JIS (II) Inter- (III) Requirements in (IV) Classification and details of technical (V) Justification for the
national International Standard deviation between JIS and the Interna- technical deviation and
Standard tional Standard by clause future measures
number Classifica -
No. and Content No. of Content Detail of technical deviation
""d
~ title of clause tion by
o
r-3 clause clause
t:rj
(1 1 Scope Specify bar-shaped 1 Specify only Addition Add bar-shaped micrometer Add micrometers actually
r-3
t:rj micrometer for internal micrometer for for internal measurements, used in Japan. Addition
U
t:d measurements, external micrometer for span proposal will be considered
~
(1
micrometer for span measurements in the measurements of teeth, and to ISO as necessary.
o measurements of teeth, scope. micrometer head to the
""d
;:3 and micrometer head scope, in addition to
o"""" in addition to micrometer for external
::r:: micrometer for measurements.
r-3
external
measurements.
2
Normative
references
3 Terms 3 Almost identical Addition Add bar-shaped micrometer Addition of terms, and no
and with JIS. for internal measurements, substantive deviation.
definitions micrometer for span
measurements of teeth,
micrometer head, and the
requirement for the error of
indication.
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---
Copyright Japanese Standards Association

number Classifica -
title of clause tion by
clause clause
4 Design 4.2 Names of main 4.1 Almost identical Addition Individually describe For clarification, describe
specifica- parts with JIS. bar-shaped micrometer for types of micrometers in
tion (design internal measurements, different subclauses before
characteris- micrometer for span indicating the names of
tics) measurements of teeth, and main parts.
micrometer head.
""d
~ Mention that the figures
o indicate names but not the
r-3
t:rj
o design details.
r-3
t:rj 4.3 Dimensions 4.2 Mark dimensional Addition Add bar-shaped micrometer Add types of micrometers
U
t:d lines and symbols in for internal measurements, actually used in Japan.
~ the figure of micrometer for span
o
o structure, and measurements of teeth, and
""d
~ specify all nominal micrometer head in addition
~
""""
(1 values of dimensions to micrometer for external
::r: by symbols in the measurements (Figures 5
r-3
table. and 6, Tables 3 and 4).
4.4 Measuring range -
Addition Add the table of measuring Add the description in the
range for each micrometer. previous edition to clarify
the types of measuring
range.
4.5.2.2 Graduation 4.3.2.2 Exemplify only 0.5 Addition Exemplify 1.0 mm of thread Enable more practical use
mm of thread pitch. pitch in the figure. by concrete description.
Cd
-
4.3.2.2 Describe the vernier Deletion Delete the vernier scale with Deleted because the -l
scale with an an interval of 0.001 mm. prevalence of digital 01
o
~
interval of 0.001 mm products results in a
in the figure. decrease in demand for ~
o
this type of vernier scale. I--' c.c
m -l
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---

td w
-:]00
01
o
t:-,:)
national International Standard deviation between JIS and the Interna- technical deviation and t:-,:)
o
Standard tional Standard by clause future measures f-'
m
number Classifica -
clause clause
4 Design 4.5.2.3 Fiducial line -
Addition Add the specification for Specified because they
specifica- and graduation line thickness and its unevenness influence the error of
tion (design for graduation line. indication therefore are
""d
characteris- important.
~ tics)
o 4.5.2.4 Scale spacing of -
Addition Add the specification for the Specified because it
r-3 (continued) thimble centre distance between the influences the error of
t:rj
(1
r-3 adjacent thimble graduation indication therefore is
t:rj
U lines. important.
t:d 4.5.2.5 Arrangement of 4.3.2.4 Addition Add the bevel angle of Specified because it affects
~
(1 scales thimble ends. the visibility for reading of
o the scale.
""d
;:3 4.5.4.2 Error messages 4.3.4.2 Specify that all error Alternation Limit to the cases where Limited for better
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---
o"""" messages of handling rapid spindle rotation could understanding.
::r::
r-3 and system need to cause the output of wrong
be indicated when an indication or where
electronic digital power-supply voltage
display is used. declines.
4.6 Protection of 4.4 Al terna tion Limit the marking of Limited because it is
electronic digital protection code to electronic impractical to require the
indication for field use digital indication with marking of protection code
guaranteed fluid and dust for all types of
protection. micrometers.
Specification for Deletion -
Deleted because the
electromagnetic field indication of
protection electromagnetic field
protection is impractical.

number Classifica -
clause clause
4 Design 4.7 Insulating plate 4.5 Frame Alternation Delete the specification for Specify the insulating
specifica- the rigidity of frame. plate only because the
tion (design rigidity of frame is
characteris - specified within the
tics) subclause of frame
(continued) deflection.
""d 4.8 Measuring face 4.6 Measuring face Addition Specify the hardness of Add the description in the
~
o measuring face and previous edition to
r-3
t:rj measurement point. maintain the constant
o
r-3 quality.
t:rj
U 4.9 Measuring-force 4.7 Measuring-force Alternation Add the micrometer for span Specify micrometers added
t:d limiting device limiting device measurements of teeth and in the scope. Alter the
~
o specify that a micrometer maximum standard value
o head need not be equipped from 10 N to 15 N for the
""d
~ with the measuring-force stability of measurement
~
""""
(1 limiting device. Alter the by a large micrometer.
::r: maximum standard Also specify the measuring
r-3
measuring force to 15 N. force dispersion because it
Specify that the measuring affects the measurement
force dispersion shall be not therefore is important.
more than 3 N.
4.10 Adjustment 4.8 Adjustment Addition Add micrometer for internal Specify micrometers added
equipment equipment measurements and in the scope.
Dimensional tolerances micrometer for span
on nominal dimensions measurements of teeth. Cd
of reference point -
Addition Define the method to obtain Describe the dimensions of -l
01
setting bar dimensional tolerances on reference point setting bar o
~
the nominal dimension of considering their
reference point setting bar. importance for use of ~
o
micrometers. I--' c.c
m \.D
--`,,`,

td~
-:]0
01
o
t:-,:)
national International Standard deviation between JIS and the Interna- technical deviation and t:-,:)
o
m
number Classifica -
clause clause
4 Design -
4.9 Manufacturers shall Deletion Delete the description about Impractical to use the data
specifica- Design specify the design data sheet given in ISO. sheet given in ISO.
tion (design charac- characteristics
""d
characteris- teris- (manufacturer's
~ tics) tics specification)
o
r-3 (concluded) (manu- indicated in ISO.
t:rj
(1
r-3 factur-
t:rj
U
er's
t:d specifi-
~
(1 cation)
o 4.11 Spindle -
Addition Add the subclause to specify Add the description in the
""d
;:3 the spindle thread hardness previous edition to
o"""" and its measurement point. maintain the constant
::r:: quality.
r-3
5 5.1 General 5.1 Apply the floating Alternation Evaluate metrological In practical use, the
Metrological zero point to characteristics and measurement is carried
characteris - metrological performance only when the out after the reference
tics and characteristics. reference point setting at the point is set.
performance minimum measurable
dimension of a micrometer is
performed.
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---
5.2.1 Clamping of 5.2 No change in Alternation Express that the spindle Achieve the convenience of
spindle dimensions of the shall be tightly secured. use by plain description.
sipndle when it is
clamped.

number Classifica -
clause clause
5 5.2.2.1 Maximum 5.3.1 General Alternation Application of repeatability Repeatability largely
Metrological permissible error of depends on the judgement by depends on the skill of the
characteris- indication (MPE) the manufacturer. measurer, so specify that
tics and General the application is at the
performance discretion of the
(concluded) manufacturer.
""d 5.2.2.2 Full surface 5.3.2 Full surface contact Addition Add the list of maximum Add the description in the
~
o contact error error permissible errors. previous edition to
r-3
t:rj maintain the constant
o
r-3 quality.
t:rj
U Maintain ± symbols,
t:d according to ISO and the
~
o previous edition of JIS.
o
""d 5.2.2.3 Repeatability 5.3.3 Repea tabili ty Alternation Specify the contact method. Reflect each micrometers
~
~ actually used.
""""
(1 5.2.2.4 Partial surface 5.3.4 Partial surface Al terna tion Add micrometer for span Reflect each micrometers
::r:
r-3 contact error con tact error measurements of teeth. actually used.
5.3. Performance -
Addition Indicate in the table the Add the description in the
tolerances on flatness and previous edition to specify
parallelism of the measuring other important
face, spindle screw feed error performance items than
and frame deflection, and metrological
their measurement methods. characteris tics.
-
5.5 Instrument Deletion -
Delete the specification
specification sheet because it is impractical to Cd
-l
use the instrument 01
o
specification sheet for ~
making specification ~
agreement with the user. o

I--'~
0)1--'
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---

td~
-:]t:--:l
01
o
t:--:l
national International Standard deviation between JIS and the Interna- technical deviation and t:--:l
o
m
number Classifica -
clause clause
6 Marking Examples of marking -
Addition Add the examples (Annex JA) Consider the convenience
on product the maximum for reference. of users. No technical
documents permissible error in deviation.
""d product documents,
~ figures and others
o
r-3 7 Proof of 7.1 General 6 As specified in ISO Al terna tion Alter the acceptance criteria Add more practical
t:rj
(1
r-3 conformance 14253-l. according to ISO/TR acceptance criteria.
t:rj
U with 14253-6 : 2012.
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---
t:d specifica- Delete the description
~
(1 tions related to the evaluation of
o uncertain ty.
""d
;:3 7.2 Measurement -
Addition When measurement Add the specification for
o"""" standard for standard conforming to JIS measurement standard
::r::
r-3 calibration of is not available, define that a in relation to national
metrological measurement standard standards.
characteristics and traceable to national
performance standards shall be used.
7.3 Standard reference -
Addition Clarify that dimensions and Enable more practical use
temperature error of indication are values by concrete description.
at standard reference
temperature.
S Inspection - - -
Addition Indicate the inspection items Consider JIS certification.
which need to conform to the
requirements.
9 Marking -
7 Almost identical Addition Add the minimum digital Add the marking items in
with JIS. step and the name of the the previous edition which
manufacturer (supplier). are common in Japan.

number Classifica -
clause clause
- -
Annex C Deletion Delete the item of Deleted for clarification.
calibration.
AnnexA Example of an AnnexA Identical - -
(inform a- error-of-indication
tive) curve
Annex B Notes on use Annex E Alternation Include other types of Follow the scope.
""d
~ (inform a- micrometers than those for
o
r-3
t:rj
tive) external measurements.
o Annex C Typical data sheet for Annex B Exam pIe of data Alternation Replace the data sheet for Change the data sheet for
r-3
t:rj
(inform a- design specification sheet communication inside a more practical use.
U
t:d tive) (design company with that for
~
o characteristics) , information from the
o metrological man ufacturer to the user.
""d
~ characteristics and
~
""""
(1 performance
::r: Annex D Relation to the GPS Annex F Identical - -
r-3
(inform a- matrix model
tive)
Annex JA Marking on product -
Marking method of Addition Permit the use of Add a table of
(inform a- documents symbols corresponding symbols correspondence showing
tive) which have the fewer symbols of metrological
subscripts (MPE) therefore characteristics, in
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---
are more understandable. consideration for other
Cd
standards than JIS. -l
01
o
~
~
o
I--'~
m c.c

td~
-l~
01
o
t:-,:)
Overall degree of correspondence between JIS and International Standard (ISO 3611 : 2010): MOD
t:-,:)
NOTE 1 Symbols in sub-columns of classification by clause in the above table indicate as follows: o
f-'
m
- Identical: Identical in technical contents.
- Deletion: Deletes the specification items(s) or content(s) of International Standard.
- Addition: Adds the specification item(s) or content(s) which are not included in International Standard.
- Alteration: Alters the specification content(s) which are included in International Standard.
NOTE 2 Symbol in column of overall degree of correspondence between JIS and International Standard in the above table indicates as follows:
""d
6 - MOD: Modifies International Standard.
r-3
t:rj
(1
r-3
t:rj
U
t:d
~
(1
o
""d
;:3
o""""
::r::
r-3
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---
--`,,`,,`````,,,,`````,````,,-`-`,,`,,`,`,,`---
Errata for JIS (English edition) are printed in Standardization and Quality Conti'oJ, published
monthly by the Japanese Standards Association, and also provided to subscribers of JIS
(English edition) in Monthly InfOl'mation.
Errata will be provided upon request, please contact:

Publishing Group, Japanese Standards Association
Mita MT Building, 3-13-12, Mita, Minato-ku, Tokyo, 108-0073 JAPAN
TEL. 03-4231-8550 FAX. 03-4231-8665

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JAPANESE

JIS B 7502 :2016

Copyright Japanese Standards Association PROTECTED BY COPYRIGHT 25 S

Date of Establishment: 1952-03-08

JIS B 7502 : 2016, First English edition published in 2017-01

Translated and published by: Japanese Standards Association

In the event of any doubts arising as to the contents,

Printed in Japan KK/HN

Copyright Japanese Standards Association PROTECTED BY COPYRIGHT

7 Proof of conformance with specifications················································ ·28

Annex A (informative) Example of an error-of-indication curve························ ·30

Annex C (informative) Typical data sheet for design specification (design

Annex D (informative) Relation to the GPS matrix model ................................ ·33

Copyright Japanese Standards Association PROTECTED BY COPYRIGHT

Annex JA (informative) Marking on product documents··································· 35

Copyright Japanese Standards Association PROTECTED BY COPYRIGHT

Copyright Japanese Standards Association PROTECTED BY COPYRIGHT

Copyright Japanese Standards Association PROTECTED BY COPYRIGHT

JIS_B_'14aQ ____ Qptic;~!fl?,t~

3 Terms and definitions

Copyright Japanese Standards Association PROTECTED BY COPYRIGHT

3.5.1 full measuring face contact

4 Design specification (design characteristics)

Copyright Japanese Standards Association PROTECTED BY COPYRIGHT

Table 1 N ames of micrometer

Copyright Japanese Standards Association PROTECTED BY COPYRIGHT

1 measuring face 6 clamp

Figure 1 Main parts of micrometer for external measurements

1 measuring face 6 sleeve

Figure 2 Main parts of micrometer for internal measurements

Copyright Japanese Standards Association PROTECTED BY COPYRIGHT

1 measuring face 7 clamp

5 frame 11 fast drive (measuring-force limiting device)

1 measuring face 4 sleeve

Copyright Japanese Standards Association PROTECTED BY COPYRIGHT

measurements, micrometer for span measurements of teeth and micrometer head

Table 2 Shape and dimensions of micrometer for external measurements

- ~ ~~==:~I -+--+--+':-:-:-~};--- --~

Dimensions Nominal value

Spindle length in end position, Lz, -

Maximum measurable dimension, L3 -

Copyright Japanese Standards Association PROTECTED BY COPYRIGHT

Figure 5 Radius of curvature of measuring face of micrometer for

Table 3 Shapes and dimensions of anvil disc and spindle disc of

Maximum measurable dimension D T

Copyright Japanese Standards Association PROTECTED BY COPYRIGHT

Figure 6 Shape and dimensions of mounting part of micrometer head

Table 4 Clearance between a spindle and its guide hole

Copyright Japanese Standards Association PROTECTED BY COPYRIGHT

4.4 Measuring range

Table 5 Types of measuring ranges

275 to 300 275 to 300 275 to 300

400 to 425 400 to 425

Copyright Japanese Standards Association PROTECTED BY COPYRIGHT

4.5 Types of indicating devices

Sleeve Thimble Sleeve Thimble

Copyright Japanese Standards Association PROTECTED BY COPYRIGHT

4.5.2.3 Fiducial line and graduation line

Table 7 Thickness of graduation line

0.08 to 0.20 0.03 max.

4.5.2.4 Scale spacing of thimble

Figure 8 Arrangement between main scale and secondary scale, and

4.5.3 Mechanical digital display

B.l To obtain reliable repeatable measuring values, ~_m_~_~_~}Jxi;t).gJm:·_G~Jimit_i:nKdi.G

,a_._Q____ A:n_.th~_.G~~~ Qfgl~.GtxQniG (~Ugit~_~_inQ.j<;_~_tiQD_~l_.P_~.Y-_BJ;~~<;j_~l_~t_t~D_tiQ:n_.t9._~n~ixQnm_~n~

,a!J}____ At.t~:nti9)}_~hm-JJQ.__ R~_ll_~_id_t9__ tl)&_t~nd~)}<;y__ th~t_m~~$_l}x~))).g_1}t ~t th~ __di$_G_g_1}d_Qf_~