S2 PUMA

for Slag Analysis

Process Control in EAF Steel Making
Made Quick, Easy and Cost Effective

EDXRF
Innovation with Integrity

Slag processing in steel making
Slag processing in steel making
2
Enhance Efficiency
in Steelmaking!
Precisely Access the
Furnace Condition
with S2 PUMA’s
Results!
For Steelmakers seeking to manufacture steel more profitably,
it is essential to adopt technologies and processes that allow
for monitoring and sampling slag more efficiently and cost
effectively. Because of the highly integral role of slag in steel
manufacturing, it is critical that these prospective technolo-
gies and processes are at a minimum: reliable, repeatable,
accurate, and that the instrument functions properly in difficult
manufacturing environments.
Slag is an important agent in high temperature metallurgical
processes and is tuned to an equilibrium condition for maxi-
mum action on the metal purity, least attack on the refrac-
tory lining, and optimal physical properties. Dosage of slag
enhancing additives such as lime, dolomite, or other additives
is performed based on the chemical composition of the slag
determines the subsequent by-product sale, creating an addi-
tional revenue generating product.
The Perfect Fit – S2 PUMA Slag Analyzer
The S2 PUMA is a ruggedized benchtop energy dispersive
X-ray analyzer developed for tight process control in industrial
applications. It is optimal to measure the composition of slags
on the shop floor enabling plant operators to achieve analysis
within 10 to 15 minutes total (from sample prep to results
given) in time to ensure optimum additions to the slag. The
S2 PUMA will achieve the analytical accuracy and precision
required at the steel plant, enables dramatic cost savings and
improvements in efficiency.
Measurement Parameters
Measurements were performed on an S2 PUMA with
XFlash® detector and in vacuum. Table 1 lists the
measurement conditions used. In order to achieve the
best measurement statistics, a counting time of 120 s
for light elements (Mg to S) and 60 s for heavy ele-
ments (Ca to Fe) was used with the current set to limi-
ted count rate mode (100 kcps). These conditions were
selected to take advantage of the excellent resolution
and count rate stability of the XFlash® detector. The
overall processing time per sample was ~5 minutes.
Sample Preparation – the key to quick and
optimal results
The slag samples were prepared as pressed powder
pellets with the aid of a binding agent. 15 g of sample
and 1 g of grinding aid tablet were ground together in
a tungsten carbide grinding vessel (~3 min). A magnet
was passed over the sample to remove any metal prills
that remained in the sample. The powder was then
pressed in an aluminum cup (40 mm in diameter) at
30 tons of pressure for 30 s.

S2 PUMA Single for quick process control of slags Pressed pellets – the optimal quick sample preparation for slag
analysis

Table 1: Optimal measurement conditions for slags on the S2 PUMA

Voltage Beam filter Measurement time Elements

[kV] [s] analyzed

20 No Filter 120 Mg, Al, Si, P, S

40 500 µm Al 60 Ca, Ti, Cr, Mn, Fe

3
 A set of 8 certified reference materials (CRMs) stan-
dards and 8 validated secondary standards were used
to calibrate the instrument for MgO, Al2O3, SiO2, P 2O5,
S, CaO, TiO2, Cr2O3, MnO, and FeO (See Table 2).
The standards were prepared as pressed pellets using
the same recipe as the unknown samples. The pur-
pose of adding secondary standards is to help extend
the calibration ranges in which the certified reference
materials do not cover and to compensate for the
different particle size between the CRMs and unknown
samples, especially for the light elements of MgO and
Al2O3.
The calibration was performed with the powerful analy-
tical software operated from an external PC connected
to the S2 PUMA. This integrated XRF spectroscopy
package offers a wide range of matrix and interference
corrections.

Table 2: Calibration range for electric arc furnace (EAF)

slags

EAF concentration range with certified

Element and secondary calibration standards SiO2 Kα
[Wt. %] E = 1.74 keV

MgO 2 - 17

Al2O3 2 - 10

Al2O3 Kα
SiO2 8 - 49
E = 1.5 keV

P2O5 0.01 - 8 MgO Kα

E = 1.25 keV
S 0.04 - 0.2

CaO 1 - 45

TiO2 0.1 - 4

Cr2O3 0.6 - 54

MnO 3 - 28
The XFlash® detector has excellent energy resolution
as seen in which shows the low-energy range of the
FeO 9 - 50
spectrum for a typical EAF slag sample

4
Measurement Accuracy and Precision
Measurement of one unknown EAF slag pellet was repeated 25 times against the calibration. The sample was unloa-
ded and reloaded between measurements. Tables 3 and 4 demonstrate the impressive accuracy and stability of the
results obtained with the S2 PUMA. The precision is well within the expected range for the analysis of slag material.

Table 3: Accuracy test of S2 PUMA's results, excellent recovery

MgO Al2O3 SiO2 P2O5 S CaO TiO2 Cr2O3 MnO FeO

[wt. %] [wt. %] [wt. %] [wt. %] [wt. %] [wt. %] [wt. %] [wt. %] [wt. %] [wt. %]

Average
10.47 5.72 14.52 0.62 0.06 29.56 0.49 1.54 5.91 30.44
XRF Value
Expected
10.43 5.58 14.65 0.51 0.06 29.74 0.54 1.59 5.84 30.48
Value

Table 4: Precision test of S2 PUMA's results, instrument precision better than 0.4% R.S.D. for all relevant elements

MgO Al2O3 SiO2 P2O5 S CaO TiO2 Cr2O3 MnO FeO

Sample V-Ratio B3-Ratio
[wt. %] [wt. %] [wt. %] [wt. %] [wt. %] [wt. %] [wt. %] [wt. %] [wt. %] [wt. %]

Rep-01 10.48 5.73 14.52 0.62 0.062 29.49 0.50 1.52 5.92 30.48 2.03 1.42

Rep-02 10.49 5.70 14.51 0.62 0.063 29.50 0.49 1.55 5.91 30.45 2.03 1.43

Rep-03 10.45 5.68 14.50 0.61 0.061 29.50 0.49 1.54 5.92 30.39 2.03 1.43

Rep-04 10.50 5.72 14.52 0.62 0.060 29.63 0.49 1.55 5.90 30.41 2.04 1.43

Rep-05 10.51 5.73 14.52 0.62 0.061 29.55 0.49 1.54 5.92 30.36 2.04 1.42

Rep-06 - 20 … … … … … … … … … … … …

Rep-21 10.52 5.73 14.54 0.63 0.061 29.53 0.49 1.53 5.92 30.33 2.03 1.42

Rep-22 10.45 5.73 14.53 0.63 0.061 29.49 0.50 1.52 5.92 30.38 2.03 1.42

Rep-23 10.44 5.72 14.58 0.63 0.060 29.52 0.49 1.53 5.89 30.37 2.02 1.42

Rep-24 10.50 5.71 14.49 0.62 0.060 29.59 0.50 1.56 5.92 30.51 2.04 1.43

Rep-25 10.45 5.75 14.55 0.62 0.061 29.63 0.49 1.56 5.92 30.36 2.04 1.43

Average 10.47 5.72 14.52 0.62 0.06 29.56 0.49 1.54 5.91 30.44 2.04 1.43

Abs. Std.
0.029 0.020 0.032 0.006 0.001 0.056 0.006 0.014 0.014 0.084 … …
Dev.
Rel. Std.
0.28 0.35 0.22 0.94 1.82 0.19 1.14 0.88 0.23 0.28 … …
Dev.

EAF Viscosity (V) Ratio = CaO / SiO2

EAF Basicity (B3) Ratio = CaO / (SiO2 + Al2O3 + TiO2)
5
 S2 PUMA – quick results and best
performance at your fingertips
In process control every minute counts! Whenever
you receive a sample, results are needed fast. The S2
PUMA Single is the perfect tool: Load the sample,
touch the button and get results within minutes. Best
quality results is as easy 1-2-3, thanks to TouchControl,
the S2 PUMA’s intuitive user interface.

S2 PUMA with TouchControl™:

Intuitive, failsafe ease-of-use
zz
Island Mode: Full functionality without PC,
zz
keyboard and mouse
Free language selection:
zz
English, German, French, Spanish, Portuguese,
Italian, Russian, Chinese, Japanese
No training required – get results from day one
zz
Adjustable touchscreen, glove-friendly
zz

Quick and easy sample

loading on S2 PUMA

Ease of operation with Island mode: No PC, keyboard and mouse required in
TouchControl – routine operation
intuitive usage, broad
language selection
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EDXRF made easy, only with S2 PUMA
Thanks to TouchControl™, the operation of the
S2 PUMA is easy and straightforward
The times of never-ending training, manuals that weigh
a ton and difficult belong to the past. With TouchCon-
trol, any user can perform measurement jobs on the
S2 PUMA. First, select the application and type in the
sample ID. You can also add additional information,
like preparation or sample weight. Then simply start
the measurement and view the results on-screen. This
starts a predefined automatic application – and that’s it!
Elemental analysis cannot be easier!
Energy-dispersive X-ray fluorescence (EDXRF) with the
S2 PUMA offers all you need to measure and monitor
elements in your samples, independent of the industry
or environment in which you are working. The outstan-
ding strength of EDXRF is the wide range of elements
covered by the technique, from very light elements like
C, to heavy elements like U.

S2 PUMA with HighSense – the top-performing

EDXRF for slag analysis
Instrument precision is the key for tight process con-
trol. The S2 PUMA delivers excellent precision with ®

it’s HighSense™ technology, the 50-Watt power of the

X-ray tube and the all-new closely coupled beam path.
This superior stability guarantees process control at its
best with a very narrow range for the results, minimi-
zing waste and maximizing yield in your process.

S2 PUMA with SampleCare™: Unique contamination

protection of important system components
guarantees highest instrument uptime

XFlash® detector for optimal performance with

SampleCare™ protection cap – ruggedness in design!

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 Technical Data
S2 PUMA Single S2 PUMA XY Autochanger
Element range Sodium to uranium (Na – U) with standard XFlash®
Carbon to uranium (C – U) with XFlash® Light Element (LE)
Concentration range From ppm to 100 %
X-ray tube Pd or Ag anode; max. power 50 W, max. voltage 50 kV
Primary beam filters 10-position automatic filter changer; for wide range elemental analysis
pre-installed filters: 5 μm Ag, 20 and 500 μm Al, 100 and 250 μm Cu
®
Detector XFlash Silicon Drift Detector: Peltier cooled (no need for liquid nitrogen)
Standard XFlash® detector: resolution typ. 135 eV at Mn Ka and 100 000 cps
®
XFlash detector LE: resolution typ. 141 eV at Mn Ka and 100 000 cps
Mode Air mode
Gas flushing (optional): N2 or Helium for liquids and loose powders
Vacuum pump (optional): Enhanced light element performance, low cost of
operation
TouchControl™ Integrated 12.1” TFT touchscreen, multilingual user interface
Connectivity Built-in Ethernet port RJ45, 4x USB ports for mouse, keyboard, printer
Power requirements 100-240 V, 50/60 Hz, max. power consumption 600 VA
Automation Connectivity to conveyor belt (optional)
Sample types Loose powders, granules, solids, pressed pellets, fused beads and liquids up to
50 mL
Sample rotation Optional
S2 PUMA Single S2 PUMA XY Autochanger
Sample sizes Up to 51.5 mm Ø samples. Liquids, Up to 40 mm Ø and 38 mm height
loose powders and smaller samples in in sample holders, max. weight 200
liquid cups: up to 50 mL g or 51.5 mm Ø as sample ring.
Sample loader Single position, EasyLoad XY sample tray, 20-po-

Bruker AXS is continually improving its products and reserves the right to change specifications without notice.
manually sition, removable. Grabber with
automatic sample detection
Dimensions 66 x 70 x 37 cm; 81 kg 66 x 70 x 60 cm; 112 kg
width x depth x height; weight 26 x 27.6 x 14.6“; 179 lbs 26 x 27.6 x 23.6“; 247 lbs
Quality & safety DIN EN ISO 9001:2008; CE-certified Machinery directive 2006/42/EC; Electrical equip-
ment 2006/95/EC; Electromagnetic Compatibility 2004/108/EC; Fully radiation-protected
system; radiation < 1 μSv/h (H*); German type approval (BfS) for X-ray safety; Conform to
ICRP, IAEA, EURATOM

TouchControl™, SampleCare™, EasyLoad™, HighSense™

and DustShield™ are trademarks of Bruker AXS Inc.;
XFlash® is a registered trademark of Bruker Nano Analytics
DuraBeryllium® is a trademark of Moxtek® Inc.
Order No. DOC-B80-EXS016. © 2015 Bruker AXS GmbH.

Bruker AXS GmbH

Karlsruhe · Germany
Phone +49 721 5 09 97-0
Fax +49 721 5 09 97-56 54
info.baxs@bruker.com

www.bruker.com