Professional Documents
Culture Documents
3, 2003
Key Words
1. Introduction
2. Power Supply
Table 2 Table 3
Values of Short-Circuit Current during Effect of Voltage Regulation on Short-Circuit
Regulation Current of HV Side of TT
90 101 90 80
80 101 70 77
70 103 65 72.5
60 109 54 62
54 113 37 40
50 111 23 23
∗ 100% of voltage corresponds to 380 V and 100% of
45 100
short-circuit current corresponds to 32317.6 A.
∗∗ I
40 65 sc is the short-circuit current at the HV winding of
TT when it is connected in series with VR in testing
30 40 circuit.
20 22
Note: 100% of voltage corresponds to 380 V and 100%
of short-circuit current corresponds to 32317.6 A.
At the present time there are two IEC recommendations R/X Minimum
regarding pollution test:
Salt Fog Solid Layer Short Circuit
1. HV test technique, Part 2: test procedure publication Current (A)
Method Method
60-2, 1973
2. Artificial pollution tests on high-voltage insulators to 0.05 0.05 5
be used on AC systems, publication 507, 1975 0.05–0.15 0.05–0.15 7
The first recommendation defines the requirements for 0.15–0.5 0.15–0.3 10
the transformer test circuit as:
0.5–1.5 0.3–0.5 15
The voltage in the test circuit should be stable enough
to be practically unaffected by varying leakage cur-
Various HV laboratories all over the world have dif-
rents. Partial discharges, or pre-discharges in the test
ferent voltage source characteristics. Table 6 shows the
object, should not reduce the test voltage to such an
voltage source characteristics of some testing facilities [5].
extent and for such a time that the measured disrup-
It should be noted here that the above-mentioned
tive discharge voltage of the test object is affected [3].
recommendations, which were in effect in the 1980s, are
This is usually achieved if, simultaneously, (1) the total not sufficient. It is more accurate to relate the creepage
capacitance of the test object and any additional capacitor distance (mm/kV) to short-circuit current of the testing
is not less than about 1000 pF; and (2) the steady-state circuit. Table 7 shows this relationship.
171
Table 6
Voltage Source Characteristics of Some Testing Facilities
173