This document discusses several techniques for characterizing surfaces, including optical microscopy, magneto-optical imaging, x-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), Auger electron spectroscopy (AES), and scanning tunneling/atomic force microscopy. XPS and AES use electron or x-ray beams to eject electrons from sample surfaces, allowing analysis of elemental composition and chemical state. SEM images surfaces using secondary electrons or emitted x-rays. Magneto-optical imaging visualizes magnetic fields using the Faraday effect in garnet films. Scanning probe microscopies like STM and AFM use sharp tips to image surfaces at atomic resolution by measuring tunneling current or interatomic forces.
This document discusses several techniques for characterizing surfaces, including optical microscopy, magneto-optical imaging, x-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), Auger electron spectroscopy (AES), and scanning tunneling/atomic force microscopy. XPS and AES use electron or x-ray beams to eject electrons from sample surfaces, allowing analysis of elemental composition and chemical state. SEM images surfaces using secondary electrons or emitted x-rays. Magneto-optical imaging visualizes magnetic fields using the Faraday effect in garnet films. Scanning probe microscopies like STM and AFM use sharp tips to image surfaces at atomic resolution by measuring tunneling current or interatomic forces.
This document discusses several techniques for characterizing surfaces, including optical microscopy, magneto-optical imaging, x-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), Auger electron spectroscopy (AES), and scanning tunneling/atomic force microscopy. XPS and AES use electron or x-ray beams to eject electrons from sample surfaces, allowing analysis of elemental composition and chemical state. SEM images surfaces using secondary electrons or emitted x-rays. Magneto-optical imaging visualizes magnetic fields using the Faraday effect in garnet films. Scanning probe microscopies like STM and AFM use sharp tips to image surfaces at atomic resolution by measuring tunneling current or interatomic forces.
What is a surface? that volume of the solid that a specific measurement technique samples Optical Microscopy Magneto-Optical Imaging
The Magneto-Optical technique is a method of magnetic flux
visualization using the Faraday Effect in ferrimagnetic Bi-doped iron garnet films, Y3Fe5O12 (YIG). Magneto-Optical Imaging Magneto-Optical Imaging Spectroscopic Surface Methods X-ray Photoelectron Spectroscopy (XPS) • primary beam - x-ray photons • secondary beam - electrons Scanning Electron Microscope (SEM) Electron Spectroscopy • count the number of electrons • measure the energy X-ray Photoelectron Spectroscopy • qualitative analysis information • structure information • oxidation state information A + h => A+* + e- Spectroscopic Surface Methods Auger Electron Spectroscopy (AES) • primary beam - electrons • secondary beam - electrons Auger Electron Spectroscopy A + ei- => A+* + e’i- + eA- where ei- => incident electron e’i- => after interaction w/ A eA- => electron ejected from A A+* => A++ + eA- eA- = Auger electron A+* => A+ + hf hf => fluorescence photon Auger Electron Spectroscopy Auger emission types • KLL • LMM • MNN favored by low atomic number elements Scanning Electron Microscope (SEM) Scanning Electron Microscope Two most common types of detection: • secondary electrons • x-ray emission Scanning Electron Microscope control x, y, and z and rotate sample magnification from 10x to 100,000x Scanning Tunneling Microscope Scanning Tunneling Microscope Tip of Atomic Force Microscope Iron Atoms 1 2