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Tetramethylammonium hydroxide
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Common masking materials for long etches in TMAH include silicon dioxide (LPCVD and thermal) and
silicon nitride. Silicon nitride has a negligible etch rate in TMAH; the etch rate for silicon dioxide in
TMAH varies with the quality of the film, but is generally on the order of 0.1 nm/minute.
References
1. ^ J. T. L. Thong, W. K. Choi, C. W. Chong, TMAH etching of silicon and the interaction of
etching parameters, Sensors and Actuators A: Physical, Volume 63, Issue 3, December 1997,
Pages 243-249, ISSN 0924-4247, DOI: 10.1016/S0924-4247(97)80511-0.
(http://www.sciencedirect.com/science/article/B6THG-3S9D11W-
3V/2/46a49827456cb9320e8b0173ba32b1bf)
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